Bidirectional Reflectometry. Part I.: A High Resolution Laser Bidirectional Reflectometer With Results on Several Optical Coatings

A laser-source bidirectional reflectometer that is fully automated and has angular resolution on the order of one degree has been designed and built. The direction of incidence and viewing can be independently varied over an entire hemisphere except for directions more than 77.5° from the normal, and the two directions must be at least 2.5° apart. Bidirectional reflectances for 15 samples of black and white coatings are presented.     

Development of a Bolometer Detector System for the NIST High Accuracy Infrared Spectrophotometer

A bolometer detector system was developed for the high accuracy infrared spectrophotometer at the National Institute of Standards and Technology to provide maximum sensitivity, spatial uniformity, and linearity of response covering the entire infrared spectral range. The spatial response variation was measured to be within 0.1 %. The linearity of the detector output was measured over three decades of input power. After applying a simple correction procedure, the detector output was found to deviate less than 0.2 % from linear behavior over this range. The noise equivalent power (NEP) of the bolometer system was 6 × 10⁻¹² W/Hz at the frequency of 80 Hz. The detector output 3 dB roll-off frequency was 200 Hz. The detector output was stable to within ± 0.05 % over a 15 min period. These results demonstrate that the bolometer detector system will serve as an excellent detector for the high accuracy infrared spectrophotometer.     

Bidirectional Scattering Distribution Function (BSDF): A Systematized Bibliography

In conjunction with the development of a bidirectional scattering metrology project, a large number of papers pertaining to the theory and measurement of bidirectional scattering from optical surfaces were collected and categorized. This collection includes papers that deal with various aspects of the bidirectional scattering distribution function (BSDF), its measurement, interpretation, use, and implications. Each paper is classified in one or more subject categories on the basis of its technical content. The subject categories are included just to serve as a key to the most salient characteristics of each paper cited. Because of the interest in this field, this bibliography is being published as a service to the public.     

Diffuse Reflectance Spectroscopy; Applications,Standards, and Calibration (With Special Reference to Chromatography)

The multitude of areas in which diffuse reflectance spectroscopy can be applied has been described in several books and reviews and ranges from color measurements of textiles, pharmaceuticals, building materials, paper and pulp materials etc., to adsorption studies and other basic investigations in physical, inorganic and organic chemistry.The major area of application is still the measurement of color which has become indispensible in the quality control of colored products, dyes and pigments. Color matching practices and techniques with sophisticated instrumentation which can be fully computerized as well as the use of simpler filter instruments for quality control are mentioned.Transferability of reflectance data i.e., color coordinates, depends on the quality of standards particularly when absolute measurements are desired. The difficulty of finding suitable “white standards” with good reflection properties at low UV and with a good long term stability is discussed. Similar arguments hold for sphere coating materials. For the measurement of fluorescing surfaces suitable standards are lacking which renders transfer of such data almost impossible.The usefulness of diffuse reflectance techniques to study adsorption phenomena on small particle adsorbents is demonstrated with a malachite green-o-carboxylic acid lactone system studied by Kortüm. This or similar systems could be adopted to the measurement of relative surface areas on certain chromatographic adsorbents yielding more realistic values than the BET-method.The most recent area of application has been in the field of chromatography for the in situ evaluation of chromatographic zones in flat-bed chromatography, electrophoresis and isoelectric focusing.In chromatography, standardization is less problematic since usually relative measurements are sufficient. On the other hand one has to find suitable calibration procedures. The use of the Kubelka-Munk function is often questionable since we are usually not dealing with layers of infinite thickness and below 300 nm the conventional adsorbents such as silica gel, alumina or cellulose are strongly absorbing. Experiences with a new function combining the laws of Kubelka-Munk and Lambert-Beer are therefore presented.The problem is also to find calibration techniques which account for chromatographic parameters. Until recently it was believed that a quantitative evaluation of chromatograms required a number of reference zones to be developed on the same chromatogram. In our experience this is no longer true. A novel calibration technique which utilizes the concept of transferable calibration factors is discussed. With this approach a quantitative evaluation of a chromatogram with only one reference spot is possible. Here again scanning and data acquisition can be fully automated. The application of proper calibration procedures to differential reflectance techniques and the measurement of multi-component systems is briefly mentioned.Finally it is demonstrated that it is possible to carry out in situ quantitative measurements on low UV absorbing compounds (down to 190 nm) separated on silica gel surfaces, provided suitable techniques and instrumentation are used.     

The NIST High Accuracy Scale for Absolute Spectral Response from 406 nm to 920 nm

We describe how the National Institute of Standards and Technology obtains a scale of absolute spectral response from 406 nm to 920 nm. This scale of absolute spectral response is based solely on detector measurements traceable to the NIST High Accuracy Cryogenic Radiometer (HACR). Silicon photodiode light-trapping detectors are used to transfer optical power measurements from the HACR to a monochromator-based facility where routine measurements are performed. The transfer also involves modeling the quantum efficiency (QE) of the silicon photodiode light-trapping detectors. We describe our planned quality system for these measurements that follows ANSI/NCSL Z540-1-1994. A summary of current NIST capabilities based on these measurements is also given.     

高精度稳频基准频率斩波控制电路

现代测量技术尤其是现代环境监测要检测或监测的物质成分往往都是含量很低的,特别是在痕量成分的分析检测中,在极高的背景噪声中提取很弱的分析信号,一般需采用的锁相技术,必须用斩波控制电路提供稳定的参考频率。所以要确保斩波控制电路能够输出稳定高精度的基准频率,这样才能准确地分析测量。     

近红外无创血糖测量中径向基准位置的模拟及验证

利用近红外光谱进行无创血糖检测时,人体自身状况的变化对测量结果的准确性造成非常大的影响.浮动基准法意在测量血糖的过程中寻找一个径向基准点,在这一位置处的漫反射光对葡萄糖浓度的变化不敏感,可以作为内部基准来消除各种背景变化的干扰.以intralipid溶液作为人体组织模拟液,用蒙特卡罗方法以及实验验证了径向基准位置的存在,并研究了不同光学参数对它的影响.模拟结果表明,1300nm波长下径向基准位置距光源1mm,且生物组织的散射特性对它的影响比吸收特性明显;设计的双光纤连续移动测量样品漫反射光能量的实验确认了模拟结果的正确性,证明了径向基准位置的存在.     

Near Infrared 45°/0° Reflectance Factor of Pressed Polytetrafluoroethylene (PTFE) Powder

Pressed polytetrafluoroethylene (PTFE) powder is commonly used as a reflectance standard for bidirectional and hemispherical geometries. The wavelength dependence of the reflectance factor of PTFE is presented for the near-infrared spectral region (800 nm to 1600 nm) for the 45°/0° geometry, as well as in the visible spectral region (380 nm to 800 nm) for comparison with previously published results.     

高精度6inch F/5.4球面标准具结构研究与设计

193 nm光刻投影物镜光学元件面形精度为纳米级,因此要求检测精度为纳米到亚纳米级.在高精度的光学元件面形检测中,为了保证检测的精度,干涉仪标准球面镜的精度要优于λ/40.根据检测要求,设计了一种新的标准镜装卡结构.采用有限元方法分析了参考面在重力作用下的面形变化情况,其最大面变形变化峰谷(PV)值仅为4.88 nm,...