FPGA开关矩阵中基于通道结构的漏电流优化方法

从通道互连结构角度考虑,该文提出一种降低FPGA中开关矩阵漏电流的方法。根据漏电流与电路输入、输出状态有关的结论,利用连线开关盒(SWB)对信号的传输特性,将FPGA中开关矩阵的漏电优化等效在小规模的矩阵单元中实现。因为能够在有限的输出状态组合中搜寻最小漏电状态,相比仅通过电平恢复器确定SWB输出状态的方法,该算法能有效地降低漏电流,并且兼容电路级的漏电流优化方法。     

Application-Dependent Testing of FPGAs

Testing techniques for interconnect and logic resources of an arbitrary design implemented into a field-programmable gate array (FPGA) are presented. The target fault list includes all stuck-at, open, and pair-wise bridging faults in the mapped design. For interconnect testing, only the configuration of the used logic blocks is changed, and the structure of the design remains unchanged. For logic block testing, the configuration of used logic resources remains unchanged, while the interconnect configuration and unused logic resources are modified. Logic testing is performed in only one test configuration whereas interconnect testing is done in a logarithmic number of test configurations. This approach is able to achieve 100% fault coverage     

基于FPGA的开关盒互连容错算法的研究

FPGA主要由两个基本部分组成,一是可配置逻辑部件,另一部分就是互联网络,负责对可配置逻辑块间的通信。FPGA内部大约80%的晶体管都是作为可编程开关和缓冲器来完成可编程路由网络工作的。文中主要对出现错误的开关盒阵列中可执行的路径数量进行评估,并且使用算法找到合适的路径,避开错误。     

FPGA的布线开关和互连线段的优化设计

文章以TSMC'0.35μm,三层金属CMOS工艺为基础,对FPGA互连资源中布线开关和互连线段进行了具体分析。研究表明,布线开关中同时混合使用传输门和三态缓冲器以及采用不同逻辑长度的互连线段组合时将会产生较好的面积-延时值。     

On the design of multi-wavelength copy interconnects with reduced complexity

A multi-wavelength copy interconnect is a switching network capable of replicating a signal arriving at the input on a specific wavelength to one or more outputs possibly on different wavelengths. Such an interconnect can be useful in building optical multicast switches for wavelength division multiplexing (WDM) networks. In this article, we investigate, for the first time, the problem of designing copy networks that can simultaneously multicast input signals to a set of outputs while changing the wavelength of the replica according to the required routing pattern. We propose a novel multi-wavelength crossbar (MWX) switch that can switch an input signal on a specific wavelength to two different output wavelengths. The proposed MWX is used as a building block to construct two classes of multi-log_2N copy networks, namely, baseline and Bene? interconnects. The design space of the proposed interconnect classes is characterized and their hardware complexity is analyzed. We show that the proposed interconnects are transparent to existing multicast routing algorithms, and present simple routing algorithms for routing of multicast requests over the proposed designs. Comparisons with existing designs confirm that the proposed interconnects require a smaller number of space switches and wavelength conversion processes as compared to most conventional copy networks. In particular, for a large number of wavelengths and for any number of fibers the proposed design requires 50% less switching elements as compared to best available designs.     

延迟优化的统一可编程互连电路设计和实现

本文设计了一种对可编程逻辑单元CLB和可编程输出单元IOB均具有统一结构的可编程互连电路。通过偏移互连线和回线技术,使得同种可编程互连线的负载分布均匀,保证了可编程逻辑器件FPGA芯片中信号传输的可预测性和规整性;同时,设计过程中对编程点和驱动器电路进行专门的优化设计,减少了5%延时。运用该互连电路到实例FPGA芯片--FDP芯片中,流片后实测数据表明：该可编程互连电路中各种互连线功能正确,可以正确地完成各种信号的互连,整个芯片的延迟统一而且可预测。     

An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults

We present an efficient built-in self-test (BIST) architecture for testing and diagnosing stuck-at faults, delay faults, and bridging faults in FPGA interconnect resources. The BIST structure contains self-enabling test pattern generators, self-configurable switch matrices, and response analyzers that all work together and reprogram themselves without any external intervention. This eliminates downloading configuration bitstreams into the FPGA after the start of testing and, hence, reduces test time. Our technique requires only six different switch matrix configurations to test the interconnect, which is fewer than prior methods, while retaining good diagnostic resolution. The area overhead to add self-configurable test structures to Xilinx FPGAs is as low as 0.5%.     

基于SRAM配置技术的FPGA测试方法研究

在FPGA的设计生产过程中,FPGA的测试是一个至关重要的环节.分析了基于SRAM配置技术的FPGA的结构组成及FPGA的基本测试方法.针对6000门可编程资源的FPGA,提出了一种基于阵列和长线线与测试CLB以及采用总线测试开关矩阵相结合的方法.该方法较利用与门或门传递错误信息的所需测试配置次数减少了一半,从而加快了测试速度.     

层次式布线资源FPGA连线开关的设计

提出了一种层次式布线资源FPGA连线开关的设计方法,采用迷宫算法,对连线开关的结构进行了分析.针对连线连接盒CB(connection box),提出了较为节省芯片面积的半连通结构;针对连线开关盒SB(switch box),在给出连通度fs概念后,提出了使SB连通能力达到最大值的设计方法,并通过数学推导予以证明.应用这种设计方法,设计了一种fs＝3的SB;成功地实现了采用这种结构的SB和半连通CB作为连线开关的FPGA芯片FDP-100K.该芯片在电路布通率和芯片面积方面取得了较好的平衡结果.     

Design and implementation of a delay-optimized universal programmable routing circuit for FPGAs

This paper presents a universal field programmable gate array (FPGA) programmable routing circuit,focusing primarily on a delay optimization. Under the precondition of the routing resource's flexibility and routability, the number of programmable interconnect points (PIP) is reduced, and a multiplexer (MUX) plus a BUFFER structure is adopted as the programmable switch. Also, the method of offset lines and the method of complementary hanged end-lines are applied to the TILE routing circuit and the I/O routing circuit, respectively. All of the above features ensure that the whole FPGA chip is highly repeatable, and the signal delay is uniform and predictable over the total chip. Meanwhile, the BUFFER driver is optimized to decrease the signal delay by up to 5%. The proposed routing circuit is applied to the Fudan programmable device (FDP) FPGA, which has been taped out with an SMIC 0.18-μm logic 1P6M process. The test result shows that the programmable routing resource works correctly, and the signal delay over the chip is highly uniform and predictable.     

通用改进扩展Benes型光开关的控制模块设计

分析了通用改进扩展Benes型(GMDB)光开关结构的特性,提出了路由算法设计思路,并详细阐述了4×4GMDB光开关的控制和驱动电路设计。测试结果表明,设计的模块达到了控制的要求。     

A cost-efficient self-configurable BIST technique for testing multiplexer-based FPGA interconnect

FPGA test cost can be reduced effectively by minimizing the number of test configurations. To realize it, a self-configurable structure was proposed before to test the cross-point-based switch box in FPGA. In this paper, a technique of partially self-configurable multiplexers is presented to reduce the test cost of completely multiplexer-based FPGA interconnect cost-efficiently. The additional self-configured structure, called test point here, is only added to the most efficient configuration ports, which is selected through analyzing test configurations, so the test cost can reduce with the minimal area overhead. It is shown that for testing all interconnect stuck-at faults in FPGAs like Virtex-II and Spartan-3 the test configurations can be reduced to 8 with merely about 1.2% area penalty.     

A HW/SW Co-Verification Technique for FPGA Test

Field programmable gate arrays （FPGAs） have wide and extensive applications in many areas. Due to programmable feature of FPGAs, faults of FPGAs can be easily tolerated if fault sites can be located. A hardware/software （HW/SW） co-verification technique for FPGA test is proposed in this paper. Taking advantage of flexibility and observability of software in conjunction with high-speed simulation of hardware, this technique is capable of testing each input/output block （IOB） and configurable logic block （CLB） of FPGA automatically, exhaustively and repeatedly. Fault cells of FPGA can be positioned automatically by the proposed approach. As a result, test efficiency and reliability can be enhanced without manual work.     

Switch fault detection and diagnosis in space vector modulated cascaded H-bridge multilevel inverter

This article investigates the development and online implementation of the power switch open-circuit fault detection and diagnosis in symmetric cascaded H-bridge multilevel inverter. A mathematical modelling technique is presented to understand the effect of the fault on the bridge voltages and output voltage. The modelled values of the output voltage, simulation results and experimental results indicate that the fault diagnostic methods based on the output voltage as the diagnostic feature have certain ambiguity in identifying the fault switch, since the output voltage waveform and its features remain the same for a group of switches under the fault condition. In order to overcome this, fault detection and diagnosis method based on the mean values of the bridge voltages is proposed in this article, which identifies the faulty switch pair and H-bridge in which the fault has occurred. Further, this method has been experimentally validated on a five-level space vector modulated symmetric cascaded H-bridge multilevel inverter.     

Novel Test Approach for Interconnect Resources in Field Programmable Gate Arrays

A novel test approach for interconnect resources(IRs)in field programmable gate arrays (FPGA)has been proposed.In the test approach,SBs (switch boxes)of IRs in FPGA has been utilized to test IRs.Furthermore,configurable logic blocks(CLBs)in FPGA have also been employed to enhance driving capability and the position of fault IR can be determined by monitoring the IRs associated SBs.As a result,IRs can be scanned maximally with minimum configuration patterns.In the experiment,an in-house developed FPGA test system based on system-on-chip(SoC)hardware/software verification technology has been applied to test XC4000E family of Xilinx.The experiment results revealed that the IRs in FPGA can be tested by 6 test patterns.     

Resilient routing implementation in 2D mesh NoC

With the rapid shrinking of technology and growing integration capacity, the probability of failures in Networks-on-Chip (NoCs) increases and thus, fault tolerance is essential. Moreover, the unpredictable locations of these failures may influence the regularity of the underlying topology, and a regular 2D mesh is likely to become irregular. Thus, for these failure-prone networks, a viable routing framework should comprise a topology-agnostic routing algorithm along with a cost-effective, scalable routing mechanism able to handle failures, irrespective of any particular failure patterns. Existing routing techniques designed to route irregular topologies efficiently lack flexibility (logic-based), scalability (table-based) or relaxed switch design (uLBDR-based). Designing an efficient routing implementation technique to address irregular topologies remains a pressing research problem. To address this, we present a fault resilient routing mechanism for irregular 2D meshes resulting from failures. To handle irregularities, it avoids using routing tables and employs a few fixed configuration bits per switch resulting in a scalable approach. Experiments demonstrate that the proposed approach is guaranteed to tolerate all locations of single and double-link failures and most multiple failures. Also, unlike uLBDR it is not restricted to any particular switching technique and does not replicate any extra messages. Along with fault tolerance, the proposed mechanism can achieve better network performance in fault-free cases. The proposed technique achieves graceful performance degradation during failure. Compared to uLBDR, our method has 14% less area requirements and 16% less overall power consumption.     

一种星载IP交换机队列管理器的设计

针对星载IP交换机中硬件存储资源使用受限的情况,提出了一种适用于共享存储交换结构、存储资源占用少的队列管理器。通过添加索引的方法,使得所有的单播队列能够共享一个指针存储区。根据位图映射,将组播指针转化为多个单播指针,即可把组播操作的数据流按照单播操作方式写到相应的逻辑队列路径,达到节约存储器资源的目的。该队列管理器通过链表数据结构的头部和尾部来控制指针索引的写入和输出。最后,在Xilinx的xc6vlx130t FPGA进行了综合实现,结果显示,该方案相比基于指针复制的队列管理器,在8端口的交换机中存储器资源的使用量要节约22%以上。     

Testing of programmable analog neural network chips

Artificial neural network chips can achieve high-speed performance in solving complex computational problems for signal and information processing applications. These chips contain regular circuit units such as synapse matrices that interconnect linear arrays of input and output neurons. The neurons and synapses may be implemented in an analog or digital design style. Although the neural processing has some degree of fault tolerance, a significant percentage of processing defects can result in catastrophic failure of the neural network processors. Systematic testing of these arrays of circuitry is of great importance in order to assure the quality and reliability of VLSI neural network processor chips. The proposed testing method consists of parametric test and behavioral test. Two programmable analog neural chips have been designed and fabricated. The systematic approach used to test the chips is described, and measurement results on parametric test are presented.This research was partially supported by DARPA under Contract MDA 972-90-C-0037 and by National Science Foundation under Grant MIP-8904172.     

A growable packet (ATM) switch architecture: design principles andapplication

The problem of designing a large high-performance, broadband packet of ATM (asynchronous transfer mode) switch is discussed. Ways to construct arbitrarily large switches out of modest-size packet switches without sacrificing overall delay/throughput performance are presented. A growable switch architecture is presented that is based on three key principles: a generalized knockout principle exploits the statistical behaviour of packet arrivals and thereby reduces the interconnect complexity, output queuing yields the best possible delay/throughput performance, and distributed intelligence in routing packets through the interconnect fabric eliminates internal path conflicts. Features of the architecture include the guarantee of first-in-first-out packet sequence, broadcast and multicast capabilities, and compatibility with variable-length packets, which avoids the need for packet-size standardization. As a broadband ISDN example, a 2048×2048 configuration with building blocks of 42×16 packet switch modules and 128×128 interconnect modules, both of which fall within existing hardware capabilities, is presented     

Flexibility of interconnection structures for field-programmablegate arrays

The relationship between the routability of a field-programmable gate array (FPGA) and the flexibility of its interconnection structures is examined. The flexibility of an FPGA is determined by the number and distribution of switches used in the interconnection. While good routability can be obtained with a high flexibility, a large number of switches will result in poor performance and logical density because each switch has significant delay and area. The minimum number of switches required to achieve good routability is determined by implementing several industrial circuits in a variety of interconnection architectures. These experiments indicate that high flexibility is essential for the connection block that joins the logic blocks to the routing channel, but a relative low flexibility is sufficient for switch blocks at the junction of horizontal and vertical channels. Furthermore, it is necessary to use only a few more routing tracks than the absolute minimum possible with structures of surprisingly low flexibility