Cu(In,Ga)Se2太阳电池缓冲层ZnS薄膜性质及应用

在含有ZnSO4,SC(NH2)2,NH4OH的水溶液中采用CBD法沉积ZnS薄膜,XRF和热处理前后的XRD测试表明,ZnS沉积薄膜为立方相结构,薄膜含有非晶态的Zn(OH)2.光学透射谱测试表明,制备的薄膜透过率(λ＞500nm)约为90%,薄膜的禁带宽度约为3.51eV.ZnS薄膜沉积时间对Cu(In,Ga)Se2太阳电池影响显著,当薄膜沉积时间在25～35min时,电池的综合性能最好.对比了不同缓冲层的电池性能,采用CBD-CdS为缓冲层的电池转换效率、填充因子、开路电压稍高于CBD-ZnS为缓冲层的无镉电池,但无镉电池的短路电流密度高于前者,两者转换效率相差2%左右.ZnS可以作为CIGS电池的缓冲层,替代CdS,实现电池的无镉化.     

Cu(In,Ga)Se2太阳电池缓冲层ZnS薄膜性质及应用

在含有ZnSO4,SC(NH2)2,NH4OH的水溶液中采用CBD法沉积ZnS薄膜,XRF和热处理前后的XRD测试表明,ZnS沉积薄膜为立方相结构,薄膜含有非晶态的Zn(OH)2.光学透射谱测试表明,制备的薄膜透过率(λ＞500nm)约为90%,薄膜的禁带宽度约为3.51eV.ZnS薄膜沉积时间对Cu(In,Ga)Se2太阳电池影响显著,当薄膜沉积时间在25～35min时,电池的综合性能最好.对比了不同缓冲层的电池性能,采用CBD-CdS为缓冲层的电池转换效率、填充因子、开路电压稍高于CBD-ZnS为缓冲层的无镉电池,但无镉电池的短路电流密度高于前者,两者转换效率相差2%左右.ZnS可以作为CIGS电池的缓冲层,替代CdS,实现电池的无镉化.     

Compositional engineering of chemical bath deposited (Zn,Cd)S buffer layers for electrodeposited CuIn(S,Se)2 and coevaporated Cu(In,Ga)Se2 solar cells

A comparative study of chemical bath deposition (CBD) of ZnS, CdS, and a mixture of (Cd,Zn)S buffer layers has been carried out on electrodeposited CuIn(S,Se)₂ (CISSe) and coevaporated Cu(In,Ga)Se₂ (CIGS) absorbers. For an optimal bath composition with the ratio of [Zn]/[Cd] = 25, efficiencies higher than those obtained with CdS and ZnS recipes, both on co‐evaporated CIGS and electrodeposited CISSe, have been obtained independent of the absorber used. In order to better understand the (Cd,Zn)S system and its impact on the increased efficiency of cells, predictions from the solubility diagrams of CdS and ZnS in aqueous medium were made. This analysis was completed by in situ growth studies with varying bath composition by quartz crystal microbalance (QCM). The morphology and composition of the films were studied using scanning electron microscopy (SEM) and X‐ray photoelectron spectra (XPS) techniques. Preliminary XPS studies showed that films are composed of a mixture of CdS and Zn(O,OH) phases and not a pure ternary Cd_{1 − x}Zn_xS compound. The effect of the [Zn]/[Cd] molar ratio on properties of the corresponding CISSe and CIGS solar cells was investigated by current voltage [J(V)] and capacitance voltage [C(V)] characterizations. The origin of optimal results is discussed. Copyright © 2008 John Wiley & Sons, Ltd.     

Impact of compositional grading and overall Cu deficiency on the near‐infrared response in Cu(In,Ga)Se2 solar cells

Highly efficient thin film solar cells based on co‐evaporated Cu(In,Ga)Se₂ (CIGS) absorbers are typically grown with a [Ga]/([Ga] + [In]) (GGI) gradient across the thickness and a Cu‐poor composition. Upon increasing the Cu content towards the CIGS stoichiometry, lower defect density is expected, which should lead to increased absorption in the near‐infrared (NIR), diffusion length and carrier collection. Further, optimization of the GGI grading is expected to increase the NIR response. In this contribution [Cu]/([In] + [Ga]) (CGI) values are increased by shortening the deposition stage after the first stoichiometric point. In order to obtain comparable Ga contents at the interface for proper band alignment, the front GGI gradings were actively modified. With a relative CGI increase of 7%, we observe an increased photocurrent, originating from an improved NIR external quantum efficiency response. By characterizing the modified absorber properties by reflection‐transmission spectroscopy, we attribute the observed behavior to changes in the optical properties rather than to improved carrier collection. Cu‐dependent modifications of the NIR‐absorption coefficients are likely to be responsible for the variations in the optical properties, which is supported by device simulations. Adequate re‐adjustments of the co‐evaporation process and of the alkali‐fluorides post‐deposition treatments allow maintaining V_oc and FF values, yielding an overall increase of efficiency as compared to a reference baseline. © 2016 The Authors. Progress in Photovoltaics : Research and Applications published by John Wiley & Sons Ltd.     

Composition and bandgap control in Cu(In,Ga)Se2‐based absorbers formed by reaction of metal precursors

The control of composition and bandgap in chalcopyrite thin‐film absorber layers formed by a metal precursor reaction is addressed. Two processes using reaction with either H₂Se or H₂S as the final step of a three‐step reaction process were compared as follows: a three‐step H₂Se/Ar/H₂S reaction and a three‐step H₂Se/Ar/H₂Se reaction. In both processes, significant Ga homogenization was obtained during the second‐step Ar anneal, but the third‐step selenization resulted in Ga depletion near the Cu(InGa)Se₂ surface, whereas the third‐step sulfization did not. Solar cells were fabricated using absorbers formed using each method, and the surface Ga depletion significantly affected device performances. The solar cell incorporating the sulfization yielded a better device performance, with an efficiency of 14.4% (without an anti‐reflection layer) and an open‐circuit voltage of 609 mV. The bandgap control in the metal precursor reaction is discussed in conjunction with the device behavior. Copyright © 2014 John Wiley & Sons, Ltd.     

Bandgap optimization of submicron‐thick Cu(In,Ga)Se2 solar cells

Reducing Cu(In,Ga)Se₂ (CIGS) absorber thickness into submicron regime provides an opportunity for reducing CIGS solar cell manufacturing time and cost. However, CIGS with submicron‐thick absorber would suffer strong absorption loss in the long‐wavelength region. In this paper, we report a new fabrication route for CIGS solar cells on soda‐lime glass substrates with different Ga content (0.3 < [Ga]/([Ga] + [In]) < 0.6), all with absorber thicknesses around 0.9 µm. Efficiency of 17.52% has been achieved for cells with high Ga content of [Ga]/([Ga] + [In]) = 41%, which is currently the best reported efficiency for submicron‐thick CIGS solar cells. Unlike the normal‐thickness absorber (2–3 µm) that has an optimal [Ga]/([Ga] + [In]) of ~32%, the increased value of optimal [Ga]/([Ga] + [In]) in submicron‐thick absorber greatly enhances the open‐circuit voltage, by nearly 15% compared with that of samples with Ga content optimized at normal absorber thickness. This large gain in V_OC well compensates the absorption loss in the long‐wavelength region and contributes to the enhancement of final solar cell efficiency. Copyright © 2014 John Wiley & Sons, Ltd.     

Influence of the Cu(In,Ga)Se2 thickness and Ga grading on solar cell performance

Thin‐film solar cells with Cu(In,Ga)Se₂ (CIGS) absorber layers ranging from 1.8 to 0.15 μm in thickness were fabricated by co‐evaporation, with both homogeneous and Ga/(Ga + In) graded composition. The absorption of the CIGS layers was determined and compared with corresponding QE measurements in order to obtain the optical related losses. The material characterization included XRD as well as cross‐sectional SEM analysis. Devices with CIGS layers of all thicknesses were fabricated, and down to 0.8–1 μm they showed a maintained high performance (η ∼ 15%). When the CIGS layer was further reduced in thickness the loss in performance increased. The main loss was observed for the short‐circuit current, although the loss was not only due to a reduced absorbance. The open‐circuit voltage was essentially not affected by the reduction of the CIGS thickness, while the fill factor showed a slight decrease. The fill factor loss was eliminated by introducing a Ga/(Ga+In) graded CIGS, which also resulted in an increased open‐circuit voltage of 20–30 mV for all CIGS thicknesses. Device results of 16.1% efficiency at 1.8 μm CIGS thickness, 15.0% at 1.0 μm and 12.1% at 0.6 μm (total area without anti‐reflective coating) were achieved. Copyright © 2002 John Wiley & Sons, Ltd.     

Formation of Methanofullerene Cation in Bulk Heterojunction Polymer Solar Cells Studied by Transient Absorption Spectroscopy

Photogenerated charge carriers for blend films of poly[2‐methoxy‐5‐(3,7‐dimethyloctyloxy)‐1,4‐phenylenevinylene] (MDMO‐PPV) and [6,6]‐phenyl‐C₆₁‐butyric acid methyl ester (PCBM) have been investigated by transient absorption spectroscopy. The blend film with a low PCBM fraction (<10 wt %) exhibits a wide absorption that ranges from 900 to 1000 nm, which is characteristic of the MDMO‐PPV hole polaron and PCBM radical anion. On the other hand, the blend film with a higher PCBM fraction (> 30 wt %) exhibits a major absorption band at ∼900 nm, which is characteristic of the PCBM radical cation. For identification of charge carriers, the absorption spectrum and molar absorption coefficient of each charged species have been evaluated separately using various combinations of electron donor and acceptor materials. Consequently, the MDMO‐PPV hole polaron has been found to have a broad absorption at ∼950 nm and the PCBM radical anion and cation show a distinct absorption at 1020 and 890 nm, respectively. On the basis of these absorption spectra, the transient spectra observed for the blend films have been simulated. The spectrum for a low PCBM fraction is well reproduced by superposition of the absorption spectra of the MDMO‐PPV hole polaron and PCBM radical anion. On the other hand, the spectrum for a high PCBM fraction is well reproduced by superposition of the absorption spectra of the MDMO‐PPV hole polaron, PCBM radical anion, and PCBM radical cation, which indicates that the PCBM radical cation is formed in the blend films with PCBM at a high concentration. Possible mechanisms for the formation of the PCBM radical cation in the blend are also discussed.     

Rear‐Passivated Ultrathin Cu(In,Ga)Se2 Films by Al2O3 Nanostructures Using Glancing Angle Deposition Toward Photovoltaic Devices with Enhanced Efficiency

In this work, for the first time, the addition of aluminum oxide nanostructures (Al₂O₃ NSs) grown by glancing angle deposition (GLAD) is investigated on an ultrathin Cu(In,Ga)Se₂ device (400 nm) fabricated using a sequential process, i.e., post‐selenization of the metallic precursor layer. The most striking observation to emerge from this study is the alleviation of phase separation after adding the Al₂O₃ NSs with improved Se diffusion into the non‐uniformed metallic precursor due to the surface roughness resulting from the Al₂O₃ NSs. In addition, the raised Na concentration at the rear surface can be attributed to the increased diffusion of Na ion facilitated by Al₂O₃ NSs. The coverage and thickness of the Al₂O₃ NSs significantly affects the cell performance because of an increase in shunt resistance associated with the formation of Na₂Se_X and phase separation. The passivation effect attributed to the Al₂O₃ NSs is well studied using the bias‐EQE measurement and J–V characteristics under dark and illuminated conditions. With the optimization of the Al₂O₃ NSs, the remarkable enhancement in the cell performance occurs, exhibiting a power conversion efficiency increase from 2.83% to 5.33%, demonstrating a promising method for improving ultrathin Cu(In,Ga)Se₂ devices, and providing significant opportunities for further applications.     

The structural evolution of Cu(In,Ga)Se2 thin film and device performance prepared through a three-stage process

Cu(In,Ga)Se₂ (CIGS) absorber layer is grown on Mo-coated soda-lime glass (SLG) substrates using co-evaporation deposition technique. The growth characteristics of the CIGS films deposited through a three-stage process are examined by interrupting the deposition along the reaction pathway. In the three-stage process, the absorber layer undergoes several phase transformations with Cu content. The γ-(In,Ga)₂Se₃ layer is formed first and is then converted to α-Cu(In,Ga)Se₂ via β-Cu(In,Ga)₃Se₅. When α-Cu(In,Ga)Se₂ stoichiometry is reached, Cu_2−xSe segregation at the surface and at grain boundaries begins to occur. The Cu_2−xSe improved the densification and grain growth of the absorber layer. Then, as the absorber layer reverts to substoichiometric composition, the Cu_2−xSe phase disappears and the depleted server Cu near the surface instead. This paper reports several types of defects found in absorber layers that act as non-radiative recombination centers, such as impurity phases (Cu_2−xSe and Cu(In,Ga)₃Se₅), deep point defects (In_Cu), grain boundaries, and voids. The highest efficiency at 10.97% was achieved when the bulk [Cu]/([In]+[Ga]) ratio was 0.98 at the third stage of the process. This result is attributed to the low-concentration deep-level defects that act as recombination centers and to the denser structure with larger grain size.     

Electronic properties of Cu(In,Ga)Se2 solar cells on stainless steel foils without diffusion barrier

Compared with rigid glass, manufacturing of Cu(In,Ga)Se₂ (CIGS) solar cells on flexible stainless steel (SS) substrates has potential to reduce production cost because of the application of roll‐to‐roll processing. Up to now, high‐efficiency cells on SS could only be achieved when the substrate is coated with a barrier layer (e.g. SiO_x or Si₃N₄) for hindering the diffusion of impurities, especially Fe, into the CIGS layer. In this paper, the effect of these impurities on the electronic transport properties of the device is investigated. Using admittance spectroscopy, the presence of a deep defect level at around 320 meV is observed, which deteriorates the efficiency of the solar cells. Furthermore, it is shown that reducing substrate temperature during CIGS deposition is an effective alternative to a barrier layer for reducing diffusion of detrimental Fe impurities into the absorber layer. By applying a CIGS growth process for deposition at low substrate temperatures, an efficiency of 17.7%, certified by Fraunhofer Institute ISE, Freiburg, was achieved on Mo/Ti‐coated SS substrate without an additional metal‐oxide or metal‐nitride impurity diffusion barrier layer. Copyright © 2012 John Wiley & Sons, Ltd.     

Growth of Cu(In,Ga)Se2 thin films by a novel single‐stage route based on pulsed electron deposition

We report a novel route for growing Cu(In,Ga)Se₂ (CIGS) thin films, based upon the Pulsed Electron Deposition (PED) technique. Unlike other well‐known deposition techniques, PED process allows the stoichiometric deposition of CIGS layers in a single stage, without requiring any further treatments for Cu/(In + Ga) ratio adjustment nor selenization. The structural properties of polycrystalline CIGS films strongly depend on the growth temperature, whereas post‐deposition annealing enhances the grain size and the <112> out‐of‐plane preferred orientation of the chalcopyrite structure, without affecting the film composition. Preliminary measurements of the performances of solar cells based on these films confirm the great potentiality of PED‐grown CIGS as absorber layers. Copyright © 2011 John Wiley & Sons, Ltd.     

Controllable Formation of Ordered Vacancy Compound for High Efficiency Solution Processed Cu(In,Ga)Se2 Solar Cells

Solution processing of Cu(In,Ga)Se₂ (CIGS) absorber makes it cost-competitive in the photovoltaic market. It is reported that copper-poor ordered vacancy compound (OVC) is crucial for high performance CIGS solar cells. However, in solution process method, controllable formation of OVC is unavailable and limited research has been carried out. In this work, the controllable formation of the OVC phase on the CIGS surface is successful by controlling the selenization temperature and intentional variation of Cu/(In+Ga) stoichiometry in precursors for top layers and bulk layers deposition. The effects of OVC contents on the device performance are investigated. The CIGS thin film with OVC phase exhibits a lower valence band position. Meanwhile, the CIGS devices with optimized OVC content show decreased interface defects density and better carrier collection ability. The above advantages translate into a champion PCE of 16.39% for CIGS device with OVC phase, which is the champion performance among non-hydrazine solution-processed CIGS solar cells. The results demonstrate that the controllable formation of OVC phase approach should make a significant contribution to the efficiency promoting of solution processed CIGS solar cells.     

Advanced Characterization and Optimization of NiOx:Cu-SAM Hole-Transporting Bi-Layer for 23.4% Efficient Monolithic Cu(In,Ga)Se2-Perovskite Tandem Solar Cells

The performance of five hole-transporting layers (HTLs) is investigated in both single-junction perovskite and Cu(In, Ga)Se₂ (CIGSe)-perovskite tandem solar cells: nickel oxide (NiO_x,), copper-doped nickel oxide (NiO_x:Cu), NiO_x+SAM, NiO_x:Cu+SAM, and SAM, where SAM is the [2-(3,-6Dimethoxy-9H-carbazol-9yl)ethyl]phosphonic acid (MeO-2PACz) self-assembled monolayer. The performance of the devices is correlated to the charge-carrier dynamics at the HTL/perovskite interface and the limiting factors of these HTLs are analyzed by performing time-resolved and absolute photoluminescence ((Tr)PL), transient surface photovoltage (tr-SPV), and X-ray/UV photoemission spectroscopy (XPS/UPS) measurements on indium tin oxide (ITO)/HTL/perovskite and CIGSe/HTL/perovskite stacks. A high quasi-Fermi level splitting to open-circuit (QFLS-V_oc) deficit is detected for the NiO_x-based devices, attributed to electron trapping and poor hole extraction at the NiO_x-perovskite interface and a low carrier effective lifetime in the bulk of the perovskite. Simultaneously, doping the NiO_x with 2% Cu and passivating its surface with MeO-2PACz suppresses the electron trapping, enhances the holes extraction, reduces the non-radiative interfacial recombination, and improves the band alignment. Due to this superior interfacial charge-carrier dynamics, NiO_x:Cu+SAM is found to be the most suitable HTL for the monolithic CIGSe-perovskite tandem devices, enabling a power-conversion efficiency (PCE) of 23.4%, V_oc of 1.72V, and a fill factor (FF) of 71%, while the remaining four HTLs suffer from prominent V_oc and FF losses.     

CIGS太阳能电池缓冲层ZnS薄膜的制备与表征

以硫酸锌、(NH4)2S2O3混合溶液为前驱体溶液,加入少量的柠檬酸钠和丙三醇为络合剂和分散剂,采用化学浴沉积法在玻璃衬底上成功制备了表面均匀的ZnS薄膜。研究了沉积时间和退火时间对ZnS薄膜质量的影响,并运用扫描电镜(SEM)、X射线衍射(XRD)、紫外-可见光光度计对薄膜进行分析和表征。结果表明:在沉积时间为90m in,退火温度为200℃时制得的薄膜性能较好,晶体结构为纤锌矿结构。制备的薄膜透过率(λ>400nm)约为80%,薄膜的禁带宽度约为3.75eV。通过添加少量的分散剂丙三醇可以改善ZnS薄膜质量。退火温度为300℃,薄膜表面形貌均匀致密。     

High efficiency low temperature grown Cu(In,Ga)Se2 thin film solar cells on flexible substrates using NaF precursor layers

We report a total‐area efficiency of 15.9% for flexible Cu(In,Ga)Se₂ thin film solar cells on polyimide foil (cell area 0.95 cm²). The absorber layer was grown by a multi‐stage deposition process at a maximum nominal process temperature of 420°C. The Na was added via evaporation of a NaF layer prior to the absorber deposition leading to an enhanced V_oc and FF. Growth conditions and device characterization are described. Copyright © 2011 John Wiley & Sons, Ltd.     

Interconnection between Trait,Structure, and Composition of Grain Boundaries in Cu(In,Ga)Se2 Thin‐Film Solar Cells

Grain boundaries (GBs) are crucial for solar cells incorporating polycrystalline absorbers and particularly for those characterized by small grain sizes (≈2 µm). For example, random GBs in Si solar cells are found to have a detrimental effect on the cell performance being characterized by an increased recombination activity relative to grains. Yet, their role in Cu(In,Ga)Se₂ (CIGS) solar cells still remains controversial. The recent electron‐beam‐induced current (EBIC) study shows that 58% of the GBs in CIGS exhibit enhanced electrical properties considered to be benign (for the device performance). Yet, they coexist with 16% detrimental GBs (reduced electrical properties) and 27% neutral ones (no change in electrical property when compared with the bulk). In the present study, these different GBs are investigated by combining EBIC with electron backscattered diffraction and atom probe tomography techniques on identical GBs. For the first time, a successful correlation is shown (for any device) that interconnects the GB characteristics to its composition. Sufficient statistics demonstrate that the collective fluctuations of all elements at GBs determine its trait. In general, benign (detrimental) GBs are characterized by Cu depletion (enrichment) that favored the formation of donor (acceptor) defects.     

Bandgap imaging in Cu(In,Ga)Se2 photovoltaic modules by electroluminescence

A unique non‐destructive characterization method for apparent bandgap imaging in photovoltaic (PV) devices based on acquisition of two electroluminescence (EL) images in different spectral ranges is presented. The method consists of a calibration procedure and a bandgap imaging procedure. Calibration has to be performed once per module type and EL imaging setup, and must provide a relation between the bandgap and the ratio between two spectrally independent EL images. After calibration, bandgap imaging only requires acquisition of two spectrally independent EL images followed by image processing, making the method very fast and suitable for in‐line PV module characterization with regard to spatial (in)homogeneity and production process stability. The method is demonstrated on a commercial state‐of‐the‐art Cu(In,Ga)Se₂ PV module where apparent bandgap fluctuations between 1.07 and 1.15 eV are detected. Copyright © 2016 John Wiley & Sons, Ltd.