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世界已逐渐进入以物联网和智能制造为主导的工业4.0时代,特别是人工智能和大数据处理的强烈需求,微纳米尺度器件的研发制造及广泛使用的日趋活跃使得小尺度材料得到广泛关注。由于这些材料的几何尺度和微观结构尺度的约束效应,其热疲劳损伤行为与块体材料不同。同时,材料尺度由微米向纳米量级的转变也会引起损伤机制的转变,使材料表现出不同的损伤形式,产生显著的尺寸效应。本文综述了近年来国内外开展的有关金属薄膜/线的热疲劳实验方法、热疲劳损伤行为及演化和热疲劳影响因素的研究进展,探讨了微纳米尺度金属材料热疲劳的微观机制和尺寸效应,并对这一领域的研究前景进行展望。 相似文献
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不锈钢管道焊缝金属疲劳短裂纹行为的实验研究Ⅰ.材料微观结构和?… 总被引:2,自引:0,他引:2
用金相、复型技术和硬度实验测试了1Cr18Ni9Ti不锈钢焊缝金属试样表面的微观结构组成。结果表明:奥氏体基体与富δ铁素体-带状结构组成的柱状晶是焊缝材料的微观结构特征,相邻富δ铁素体带间距离(约40μm)是这一结构的特征参量。试样表面的微观结构依相对焊缝柱状晶取向的不同而不同。考虑疲劳损伤的局部性和区别试样表面不同尺度、位置微裂纹对疲劳损伤贡献的差异,提出了以“有效短裂纹准则”为核心的疲劳短裂纹 相似文献
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针对工业化生产的7N01铝合金板材,采用拉伸实验、疲劳实验和微观组织结构表征等手段研究了预拉伸变形对欠时效态7N01铝合金板材疲劳性能和疲劳断裂特征的影响。结果表明,预拉伸变形量增大至20%,欠时效态7N01铝合金板材中合金相粒子的形状、尺寸、数量、分布以及薄带状晶粒的尺寸和形状基本保持不变。然而,板材表现出明显的加工硬化效应,其屈服强度、抗拉强度和显微硬度分别由181 MPa、233 MPa和95 HV增大至254 MPa、271 MPa和117 HV,延伸率从23.2%降低至5.2%。在应力175 MPa、应力比R=0的疲劳循环加载条件下,随预拉伸变形量的增加,欠时效态7N01铝合金板材的疲劳寿命呈现出先缩短再延长又缩短的趋势。未预拉伸变形试样的疲劳寿命为6.06×105cyc,5%预拉伸变形可将铝板的疲劳寿命延长75%,达到了1.06×106cyc,而3%和20%的预拉伸变形将铝板的疲劳寿命分别缩短至4.21×105和2.89×105cyc。5%~16%预拉伸变形使欠时效态7N01铝合金板材基... 相似文献
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目的研究本底真空对溅射镍铬合金薄膜性能的影响。方法在不同溅射时间下制备了不同厚度的镍铬合金薄膜,采用4、6、8、10 h不同的抽真空时间制备薄膜样品,并在空气、氮气及真空气氛中,对同一工艺条件下制备的镍铬合金薄膜样品分别在300、400、500℃下进行热处理,所有样品分别测试方块电阻。结果不同厚度的镍铬合金薄膜的方块电阻与薄膜厚度之间存在非线性关系,样品的方块电阻随着溅射前抽真空时间的增加而降低。在真空和空气中进行热处理的薄膜的方块电阻变化规律一致,而在氮气中的则相反。结论本底真空残留气体对镍铬合金薄膜的氧化是引起薄膜电阻率增大的主要原因,即射频磁控溅射镍铬合金薄膜被氧化而使电阻率增大,随着溅射时间的增加,残留气体影响减小,导致电阻率降低。前期抽真空时间大于9 h,靶材溅射清洗时间大于110 min时,制备的镍铬合金薄膜电阻率才趋于稳定。 相似文献
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O. Shikimaka A. Prisacaru L. Bruk Yu. Usatyi A. Burlacu 《Surface Engineering and Applied Electrochemistry》2012,48(5):444-449
The quasistatic Vickers indentation of Si (100) were applied to investigate the influence of loading holding time on the changes of electrical resistance and phase transformation in the indentation zone. For all used loading regimes with different holding times (2 s, 10 s, 1 h and 10 h) in combination with constant loading-unloading rate (250 mN/s) the electrical resistance in the region of residual indentations was found to be lower than before indentation. It was shown that this is connected with the formation of semimetallic Si-III phase and amorphous Si of higher pressure induced by creep process developed under long lasting pressure. The longer the holding time, the greater lowering of electrical resistance in the indentation region was observed, with the exception of the holding time above 1 h, this being explained by a decelerating creep rate of Si for this interval of time leading to a halt of further extending of amorphous and Si-III regions of lower electrical resistance. 相似文献
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采用原位反应合成法制备CuO含量为10%的AgCuO电触头材料,使用接触电阻参数测试仪对试样在不同电流条件下开闭次数与接触电阻的关系进行研究,并通过扫描电镜对试样的阴/阳极表面微观形貌进行电侵蚀特性分析。结果表明,低电流条件下AgCuO电触头材料的接触电阻基本都是先升高,然后在某一开闭次数时急剧下降,最后基本趋于一定值,且AgCuO电触头材料接触电阻会随着试验电流的增加而逐渐降低;当电流达到25A时,AgCuO电触头材料的接触电阻最低,且随开闭次数的增加其接触电阻变化不大,材料的接触电阻表现出极佳的稳定性。电弧侵蚀后的形貌分析发现,阳极表面呈凹凸状,并有气孔和裂纹,而阴极表面呈现浆糊状尖峰结构。 相似文献
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M. Sekar N. V. Chandra Shekar P. Ch. Sahu K. Govinda Rajan 《Journal of Alloys and Compounds》2003,350(1-2):1-4
In this paper we report the pressure-induced electrical resistance behaviour of the dialuminides of thorium and uranium up to 8 and 11 GPa, respectively. ThAl2 shows a rapid decrease in resistance up to 2.5 GPa and thereafter it decreases slowly. The electrical resistance of UAl2 also decreases monotonically and it shows a collapse in resistance above a pressure of 9 GPa where our own previous high-pressure X-ray diffraction results indicated the occurrence of a structural phase transition from cubic (MgCu2) to hexagonal (MgNi2) phase. The marked difference in the pressure-induced electrical resistance behaviour of these two systems is discussed by taking into account the contributions from interband scattering and spin-fluctuation scattering mechanisms in ThAl2 and UAl2, respectively. 相似文献
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目的研究不同氧化时间的铝合金表面微弧氧化涂层在电接触条件下的微动磨损行为,并探讨其磨损机理。方法通过控制氧化时间(10、20、30、40、50、60、70 min),在铝合金表面制备不同表面状态的微弧氧化涂层,并利用四线接触法研究其在电接触条件下接触电阻的变化,通过分析摩擦系数、F-D曲线、磨损形貌、三维轮廓及磨痕化学成分来揭示其微动磨损机理。结果电接触微动磨损下,氧化不同时间形成的微弧氧化涂层在相同电接触微动磨损条件下的耐磨性存在明显差异,进而影响其电接触行为。氧化10 min时,涂层磨损最严重,磨损区域的涂层迅速失效,从而导致铝合金基体外露,接触电阻骤降至零;氧化50 min时,涂层厚度最大,具有良好的耐磨性,缓减了接触电阻的衰减,接触电阻曲线在衰减过程中受到磨斑表面裂纹的影响而产生波动。结论氧化时间会影响微弧氧化膜表面形貌、粗糙度以及厚度,对其在电接触条件下的微动磨损行为影响较大。 相似文献
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Noise absorbing properties of two kinds of magnetic thin films (one is electrically conductive Co-Zr-O granular thin film and the other is Ni-Zn ferrite thin film with high electrical resistivity) are analyzed by the finite element method (FEM) with various film thicknesses. For the Ni-Zn ferrite film with high electrical resistivity (~2 × 10 2 Ωm), a low reflection parameter (S11) value is predicted, and the value does not significantly change with increased film thickness up to 10 μm. However, the transmission parameter (S21) is reduced with increased film thickness due to increased power absorption by magnetic loss. For the Co-Zr-O thin films with low electrical resistivity (~1.6 × 10?5 Ωm), however, reflection signal is increased with increased film thickness due to diminished sheet resistance of the thin film. Transmission loss is not very sensitive to the thickness of the conductive film. Large power absorption is, therefore, predicted for conductive film of smaller thickness. It is concluded that film thickness is an important control parameter for the achievement of a highly absorptive thin film with increased electrical conductivity. 相似文献
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Another approach in analysis of paint coatings with EIS measurement: Phase angle at high frequencies
Some electrical parameters could be extracted from EIS measurements of a coated metal like: coating capacitance, coating resistance, double layer capacitance, and charge transfer resistance. Although these elements are very valuable in analysis of electrochemical behavior of a coated system their extraction from EIS results is time consuming and always there are some error in calculation of the results with a model. In this paper an attempt is made to introduce a new parameter that could be easily extracted with no error in calculation. Theta at high frequencies has very good agreement with other extracted parameters. 相似文献
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Damage of the structure of the α phase of plutonium as a result of repeated α ↔ β phase recrystallization and prolonged self-irradiation
was estimated based on the changes in the electrical resistance measured at room temperature before and after phase recrystallization.
Samples with different time of storage were used. An analysis of the results showed that the electrical resistance of samples
grows linearly depending on the number of cycles of phase recrystallization. It has been established that the slope of the
dependences obtained is determined by the maximum temperature of the sample in the cycle. At a maximum temperature in the
cycle equal to 170°C, an increase in the relative electrical resistance of the samples was ∼2.5%/cycle; when heating to 125°C,
∼0.3%/cycle. The variation of the electrical resistance of the samples stored for ∼20 years depending on the number of cycles
of phase recrystallization exhibited a single feature, namely, a decrease in resistance in the first cycle of heating to 170°C
rather than an increase observed in the experiments with the samples stored for ∼2.5 year. This decrease is connected with
the influence of the possible beginning of migration of radiogenic helium. In the subsequent cycles, the change in the electrical
resistance of samples upon prolonged storage was analogous to that of the samples with a short time of storage. 相似文献