Electronic and bonding properties of Fe- and Ni based hydrogenated amorphous carbon thin films by X-ray absorption, valence-band photoemission and Raman spectroscopy

Electronic and bonding properties of Me-based hydrogenated amorphous carbon (a-CH:Me, Me = Fe, Ni) thin films have been studied by X-ray absorption near-edge structure (XANES), valence-band photoemission (VB-PES) and Raman spectroscopy. Raman and XANES results show enhancement of the content of sp³-rich diamond-like carbon (DLC) by doping with Fe and Ni. The VB-PES spectrum of a-CH:Fe shows emergence of a prominent feature due to states of sp³-bonded clusters, indicating that a-CH:Fe induced enhancement of DLC structure. The nano-indentation measurement reveals that a-CH:Fe has a greatly enhanced hardness, while electrical resistance measurement shows that a-CH:Me reduces resistivity.     

Changes in chemical bonding of diamond-like carbon films by atomic-hydrogen exposure

We have deposited unhydrogenated diamond-like carbon (DLC) films on Si substrate by pulsed laser deposition using KrF excimer laser, and investigated the effects of atomic-hydrogen exposure on the structure and chemical bonding of the DLC films by photoelectron spectroscopy (PES) using synchrotron radiation and Raman spectroscopy. The fraction of sp³ bonds at the film surface, as evaluated from C1s spectra, increased at a substrate temperature of 400 °C by atomic-hydrogen exposure, whereas the sp³ fraction decreased at 700 °C with increasing exposure time. It was found that the sp³ fraction was higher at the surfaces than the subsurfaces of the films exposed to atomic hydrogen at both the temperatures. The Raman spectrum of the film exposed to atomic hydrogen at 400 °C showed that the clustering of sp² carbon atoms progressed inside the film near the surface even at such a low temperature as 400 °C.     

Sp3/sp2 character of the carbon and hydrogen configuration in micro- and nanocrystalline diamond

Hot filament and microwave plasma CVD micro- nanocrystalline diamond films are analysed by visible and ultra-violet excitation source Raman spectroscopy. The sample grain size varies from 20 nm to 2 μm. The hydrogen concentration in samples is measured by SIMS and compared to the grain size, and to the ratio of sp² carbon bonds determined by Raman spectroscopy from the 1332 cm^− 1 diamond peak and the sp² 1550 cm^− 1 G band. Hydrogen concentration appears to be proportional to the sp² bonds ratio. The 3000 cm^− 1 CH_x stretching mode band intensity observed on the Raman spectra is decreasing with the G band intensity. Thermal annealing modifies the sp² phase structure and concentration, as hydrogen outdiffuses.     

Hydrogen incorporation,bonding and stability in nanocrystalline diamond films

The hydrogen concentration in hot filament and microwave plasma CVD nanocrystalline diamond films is analysed by secondary ion mass spectrometry and compared to the film grain size. The surface and bulk film carbon bonds are analysed respectively by X-ray photoelectron spectroscopy (XPS) and ultra-violet Raman spectroscopy. XPS results show the presence of the hydrogenated p-type surface conductive layer. The respective intensities of the 1332 cm^− 1 diamond peak, of the G and D bands related to sp² phases, and of the 3000 cm^− 1 CH_x stretching mode band, are compared on Raman spectra. The samples are submitted to thermal annealing under ultra-high vacuum in order to get hydrogen out-diffusion. XPS analysis shows the surface desorption of hydrogen. Thermal annealing modifies the sp² phase structure as hydrogen out diffuses.     

Quantitative evaluation of sp/sp hybridization ratio in cluster-assembled carbon films by in situ near edge X-ray absorption fine structure spectroscopy

We present a near edge X-ray absorption fine structure spectroscopy characterization of nanostructured carbon films containing carbynoid species. By a careful data analysis and normalization of the spectra at the carbon K-edge we have quantitatively evaluated the extent of valence sp hybridization of the films. A sp/sp² ratio between 10% and 25% has been obtained. This result allowed the evaluation of the ratio between the sp and sp² Raman cross section at different excitation laser wavelengths.     

Investigation of the initial growth of ultrananocrystalline diamond films by multiwavelength Raman spectroscopy

The initial growth phase of ultrananocrystalline diamond/amorphous carbon nanocomposite films (UNCD/a-C) has been investigated by scanning electron microscopy, atomic force microscopy and especially Raman spectroscopy. As due to resonance effects Raman spectra of carbon materials strongly depend on the excitation wavelength, a multiwavelength analysis has been performed with λ_exc ranging from the UV region (325 nm) over the visible range (488 and 514 nm) to the IR region (785 nm). In addition, a set of measurements has been performed with a confocal Raman microscope, i.e. depth resolved, with a wavelength of 532 nm. The samples investigated were deposited with constant parameters, the deposition time being the only parameter varied, resulting in film thicknesses from 100 to 500 nm. It turned out that the diamond fraction and also the grain boundary material do not vary during that stage whereas there are slight but distinct changes of the nature of the amorphous matrix which reflect, among others, in a shift of the graphite-related G band to higher wavenumbers and in an increase of the ratio of D and G bands with increasing film thickness. These changes are discussed in terms of the above mentioned resonance effects; the major changes are a transition of hydrogen containing sp² chains to hydrogen-free condensed sp² rings when the material is no longer in the surface region of the films but becomes incorporated within the film bulk.     

Chemical analysis and vibrational properties of boronated tetrahedral amorphous carbon films

Boronated tetrahedral amorphous carbon (ta-C:B) films were prepared by filtered cathodic vacuum arc technique using boron mixed graphite targets. The effect of boron content on the chemical bonding and vibrational properties of these films has been investigated by X-ray photoelectron spectroscopy, Raman spectroscopy and Fourier transform infrared spectroscopy. It has been found that boron atoms are predominantly configured in a graphitic network, while the carbon atoms in the ta-C:B films are mainly in sp³ hybridization which tend to decrease as boron content increases. The Raman and infrared spectra of ta-C:B films both show prominent features in the regions of 1100–1900 cm^− 1 and 900–1600 cm^− 1 respectively. It was identified that the Raman parameters are strongly correlated with the boron content which is due to the clustering of sp² domains induced by B introduction. The activation of infrared spectrum of ta-C:B film is a consequence of heteroatomic (C–B) vibration combined with changes in the sp² carbon configuration. And the enhanced infrared absorption of ta-C:B with increased boron incorporation results from the increased effective charges in the delocalized sp² carbon phase.     

Effects of thermal annealing and Si incorporation on bonding structure and fracture properties of diamond-like carbon films

The effects of thermal annealing and Si incorporation on the structure and properties of diamond-like carbon (DLC) films were investigated. As-deposited DLC film (DLC) and Si incorporated DLC film (Si-DLC), both with and without thermal annealing, were analyzed for bonding structure, residual stress, film thickness, elastic modulus and fracture properties using Raman spectroscopy, wafer curvature, nanoindentation, four-point bend fracture testing, and X-ray photoelectron spectroscopy (XPS). Raman spectroscopy clearly showed that thermal annealing of DLC films promotes more sp² bonding character, whereas Si incorporation into the films promotes more sp³ bonding character. Interfacial fracture energies, film hardness and elastic modulus, and residual film stress were all found to vary strongly with the degree of sp³ bonding in the DLC film. These changes in mechanical properties are rationalized in terms of the degree of three dimensional inter-links within the atomic bond network.     

Dependence of the composition and bonding structure of carbon nitride films deposited by direct current plasma assisted pulsed laser ablation on the deposition temperature

Carbon nitride films were deposited by direct current plasma assisted pulsed laser ablation of a graphite target under nitrogen atmosphere. Atomic force microscopy (AFM), Fourier transform infrared (FTIR), Raman, and X-ray photoelectron spectroscopy (XPS) were used to characterize the surface morphology, bonding structure, and composition of the deposited films. The influence of deposition temperature in the range 25–400 °C on the composition and bonding structure of carbon nitride films was systematically studied. AFM images show that surface roughness and cluster size increase monotonically with deposition temperature. XPS, FTIR, and Raman spectra indicate directly the existence of CN, CN, and CN bonds in the deposited films. The increase of deposition temperature results in a drastic decrease in the N/C ratio, the content of CN bond and N atoms bonded to sp³ C atoms, in addition to the increase in the content of disorder sp² C atoms and N atoms bonded to sp² C atoms in the deposited films. Raman spectra show that the intensity ratio of D peak over G peak increases with increasing deposition temperature to 200 °C, then decreases with the further increase of deposition temperature, which results from the continuous growth of sp² cluster in the films.     

Effect of substrate bias voltage on the properties of diamond-like carbon thin films deposited by microwave surface wave plasma CVD

Diamond-like carbon (DLC) thin films were deposited on silicon and ITO substrates with applying different negative bias voltage by microwave surface wave plasma chemical vapor deposition (MW SWP-CVD) system. The influence of negative bias voltage on optical and structural properties of the DLC film were investigated using X-ray photoelectron spectroscopy, UV/VIS/NIR spectroscopy, Fourier transform infrared spectroscopy and Raman spectroscopy. Optical band gap of the films decreased from 2.4 to 1.7 with increasing negative bias voltage (0 to − 200 V). The absorption peaks of sp³ CH and sp² CH bonding structure were observed in FT-IR spectra, showing that the sp²/sp³ ration increases with increasing negative bias voltage. The analysis of Raman spectra corresponds that the films were DLC in nature.     

Experimental comparison of N(1s) X-ray photoelectron spectroscopy binding energies of hard and elastic amorphous carbon nitride films with reference organic compounds

In this work, hard and elastic amorphous carbon nitride (a-CN_x) films were deposited by DC magnetron sputtering on heated Si(001) substrates at 400 °C. Nanoindentation results confirmed that the films were highly compliant and had high elastic recovery. X-ray photoelectron spectroscopy (XPS) was used to investigate nitrogen bonding by directly comparing the N(1s) spectra of a-CN_x with the N(1s) peak positions of a variety of organic compounds that were characterized in the same XPS system. The N(1s) XPS spectra of hard and elastic a-CN_x is resolved into two dominant intensity contributions at 398.5 and 400.6 eV. We show that the N(1s) spectra of a-CN_x do not conclusively support a film-structure model with nitrogens bonded to sp³ carbons. We offer an alternate interpretation based on the presented data and previous XPS, nuclear magnetic resonance (NMR), and computational work. Together, the data suggest that hard and elastic a-CN_x consists of an sp² carbon network and that single-atom vacancy defects, as found in a graphite layer, may be present in the material. This implies that the low binding energy N(1s) component at 398.5 eV may be due to pyridine-like nitrogen bonded at the perimeter of a vacancy defect.     

Structure analysis of coals by resolution enhanced solid state 13C n.m.r. spectroscopy

The application of experimental n.m.r. and chemical resolution enhancement techniques in cross-polarization/magic angle spinning (CP/MAS) ¹³C-n.m.r. spectroscopy yields spectra of coals and coalderived solids which contain structural information within the hybridization resonance envelopes. The sp²- and sp³-carbon resonance manifolds are partitioned into components arising from carbon centres bonded directly to oxygen, hydrogen and only other carbon atoms. The unique, observable chemical shift bands in the spectrum are increased from three (the relative areas of the sp²- and sp³-carbon resonance envelopes and a separate carbonyl band) to nine. This resolution permits the principal structural changes in chemically-modified coals to be mapped in unprecedented detail. The reductive alkylation of a typical bituminous coal has been examined by this method.     

Interpretation of the Raman spectra of ultrananocrystalline diamond

It has long been known that by slightly altering the deposition conditions for diamond in plasma-enhanced chemical vapor deposition (PECVD), a transition from a microcrystalline to a nanocrystalline diamond morphology can be affected. The method of this transition, however, is not clear. This work investigates that transition by using transmission electron microscopy (TEM), scanning electron microscopy (SEM), and Raman spectroscopy. These experiments show that far from being a continuous transition, there is competitive growth between microcrystalline and nanocrystalline diamonds. Additionally, this work confirms the interpretation that certain peaks in the Raman spectrum previously attributed to “nanocrystalline diamond” are indeed due to the presence of hydrogen at the grain boundaries. For ultrananocrystalline diamond (UNCD) films, we verify that none of the spectral features observed using visible Raman spectroscopy can be attributed to sp³-bonded carbon, although the sample is composed of ∼95% sp³-bonded carbon. Thus, the Raman signal in UNCD can be considered to be solely due to the disordered sp²-bonded carbon at the grain boundaries.     

Structure of the silver containing diamond like carbon films: Study by multiwavelength Raman spectroscopy and XRD

In the present study structure of silver containing diamond like carbon (DLC:Ag) films deposited by reactive magnetron sputtering was investigated by X-ray diffractometry (XRD) and multiwavelength Raman spectroscopy. In the case of the DLC:Ag films containing low amount of silver, crystalline silver oxide prevails over silver. While at higher Ag atomic concentrations formation of the silver crystallites of the different orientations was observed. Surface enhanced Raman scattering (SERS) effect was detected for high Ag content in the films. For UV excited Raman spectra sp³ bonded carbon related Raman scattering T peak at ~ 1060 cm^− 1 was detected only for the films with the highest amount of silver (34.3 at.%). The dependence of the Raman scattering spectra parameters such as position of the G peak, G peak full width at half maximum (FWHM(G)), D/G peak area ratio on Ag atomic concentration in DLC:Ag film as well as Raman scattering spectra excitation wavelength were studied. The dependence on Ag amount in film was more pronounced in the case of the Raman scattering spectra excited by higher wavelength laser beam, while in the case of the spectra excited by 325 nm and 442 nm laser beams only weak dependence (or no dependence) was observed. Overall tendency of the decrease of the dispersion of the G peak with the increase of Ag atomic concentration was found. Thus sp³/sp² bond ratio in DLC:Ag film decreased with the increase of Ag atomic concentration in the films.     

Substrate bias effect on structure of tetrahedral amorphous carbon films by Raman spectroscopy

Diamond-like carbon (DLC) films form a critical protective layer on magnetic hard disks and their reading heads. Now tetrahedral amorphous carbon films (ta–C) thickness of 2 nm are becoming the preferred means due to the highly sp³ content. In this paper, Raman spectra at visible and ultraviolet excitation of ta–C films have been studied as a function of substrate bias voltage. The spectra show that the sp³ content of 70 nm thick DLC films increases with higher substrate bias, while sp³ content of 2 nm ultra-thin films falls almost linearly with bias increment. And this is also consistent with the hardness measurement of 70 nm thick films. We proposed that substrate bias enhances mixing between the carbon films and either the Si films or Al₂O₃TiC substrate such that thin films contain less sp³ fraction. These mixing bonds are longer than C–C bonds, which inducing the hardness decreasing of ultra-thin DLC films with bias. But for 70 nm DLC, the effect of mixing layer can be negligible by compared to bias effect with higher carbon ion energy. So sp³ content will increase for thick films with substrate bias.     

Deposition of hydrogenated amorphous carbon films with enhanced sp3-C bonding on nanocrystalline palladium interlayer

The present study deals with the deposition of hydrogenated amorphous carbon (a-C:H) films on Si (100) substrates with and without an interlayer of nanocrystalline palladium (nc-Pd) on them, by high-voltage electro-dissociation of N,N-dimethyl formamide (DMF). Significant improvement in the sp³ carbon content has been observed for a-C:H films grown on nc-Pd interlayer as revealed by Fourier transformed infrared (FTIR), Raman, X-ray photoelectron spectroscopy (XPS) and photoluminescence (PL) spectroscopic techniques. It is inferred that H₂ activation on palladium sites leads to the stabilization of sp³-C bonding, thereby improving the quality of the deposits grown on them.     

Resonant Raman studies of tetrahedral amorphous carbon films

Resonant Raman scattering has been used to study the tetrahedral amorphous carbon films deposited by the filtered cathodic vacuum arc technique. The excitation wavelengths were 244, 488, 514 and 633 nm, corresponding to photon energies of 5.08, 2.54, 2.41 and 1.96 eV, respectively. In the visible Raman spectra only vibrational modes of sp²-bonded carbon (G and D peaks) are observed, while a wide peak (called the T peak) can be observed at approximately 1100 cm⁻¹ by UV-Raman spectra which is associated with the vibrational mode of sp³-bonded carbon. Both the position and the width of the G peak decrease almost linearly with increasing excitation wavelength, which is interpreted in terms of the selective ππ* resonant Raman scattering of sp²-bonded carbon clusters with various sizes. The G peak position in the UV-Raman spectra, the T peak position and the intensity ratios of I_D/I_G and I_T/I_G all exhibit maximum or minimum values at the carbon ion energy of 100 eV. The changes of these spectral parameters are discussed and correlated with the sp³ fraction of carbon atoms in the films.     

Effect of surface treatments on the electronic properties of ultra-nanocrystalline diamond films

We present the soft x-ray spectroscopic study of the ultra-nanocrystalline diamond (UNCD) films with different surface treatments. The samples were prepared by means of microwave plasma enhanced chemical vapor deposition (MPECVD) and the different surface treatments are applied to alter their field emission properties. The electronic properties were subsequently examined by the soft x-ray absorption and x-ray emission spectroscopy at carbon 1s threshold. From the experimental results, there is no significant variation in electronic structure of oxygen- and hydrogen-plasma treated UNCD films. On the other hand, the biased treated UNCD film shows more remarkable change on the sp² and sp³ states. The formation of sp² bonding and the reduction of sp³ bonding are the consequence of the improved electron field emission properties.     

Hard and sp2-rich amorphous carbon structure formed by ion beam irradiation of fullerene,a-C and polymeric a-C:H films

In this work, we present a comparative study of the ion irradiation effect on the mechanical and optical properties of fullerene, amorphous carbon (a-C) and polymeric hydrogenated amorphous carbon (a-C:H) films, irradiated with N ions at 400 keV in the fluence range from 10¹³ to 3×10¹⁶ N cm⁻². Modifications in the carbon structure, as function of the irradiation fluence, were investigated using the Rutherford backscattering spectrometry (RBS), nuclear reaction analysis (NRA), Fourier transform infrared (FTIR), Raman spectroscopy, UV–Vis–near infrared (NIR) spectrophotometry and nanoindentation techniques. After high fluence, the three carbon samples are transformed into very similar hard (≈14 GPa) and non-hydrogenated amorphous carbon layers with very low optical gap (≈0.2 eV) and an unusual sp²-rich bonded atomic network. The mechanical properties of the irradiated films correlated with the bonding topologies of this new sp² carbon phase are investigated through the constraint-counting model. The results show that the structural modifications and the unusual rigidity were achieved by the distortion of the sp² carbon bond angles, giving origin to a constrained three-dimensional sp² carbon bonded network.     

New insights on electrochemical hydrogen storage in nanoporous carbons by in situ Raman spectroscopy

In situ Raman spectroscopy was exploited to analyze the interaction between carbon and hydrogen during electrochemical hydrogen storage at cathodic conditions. Two different activated carbons were used and characterized by different electrochemical techniques in two electrolytes (6 M KOH and 0.5 M Na₂SO₄). The in situ Raman spectra collected showed that, in addition to the D and G bands associated to the graphitic carbons, two bands appear simultaneously at about 1110 and 1500 cm⁻¹ under cathodic conditions, and then they disappear when the potential increases to more positive values. This indicates that carbon–hydrogen bonds are formed reversibly in both electrolytes during cathodic conditions. Comparing the two activated carbons, it was confirmed that, in both electrolytes, the hydrogenation of carbon atoms is produced more easily for the sample with lower amount of surface oxygen groups. In KOH medium, for the two samples, the formation of carbon–hydrogen bonds proceeds at more positive potential with respect to the thermodynamic potential value for hydrogen evolution. Furthermore, changes in the shape of the D band (due to an intensity increase of the D1 band) during the formation of carbon–hydrogen bonds suggest that hydrogenation of the carbon atoms increases the number of edge planes.