具有片上多段基准源的14位宽温度范围高SNDR全差分逐次逼近型模数转换器

介绍了一种带有片上多段带隙基准源的14位低功耗自定时全差分逐次逼近型模数转换器。采用一个在-40到120℃温度范围内具有1.3ppm/℃温度系数的片上多段带隙基准电压源来为逐次逼近型模数转换器提供高精度基准电压源。设计中用格雷码代替二进制编码来减少衬底噪声从而增加整个系统的线性度。采用自定时位循环来增加时间利用率。该14位模数转换器利用TSMC 0.13μm CMOS工艺流片。该逐次逼近型模数转换器在室温2M/s 转换速率条件下能够获得81.2dB SNDR (有效位数13.2) 和85.2dB SFDR,并且在2M/s转换速率下在-40到120℃温度范围内能够保持12位以上有效位数。     

A low power 12-bit 200-kS/s SAR ADC with a differential time domain comparator

A low power 12-bit 200-kS/s SAR ADC is proposed.This features a differential time domain comparator whose offset is cancelled by using a charge pump and a phase frequency detector instead of the preamplifiers usually needed in a high resolution comparator.The proposed ADC is manufactured in 0.18-μm CMOS technology and the measured SNR and SNDR are 62.5 dB and 59.3 dB,respectively,with a power consumption of 72μW at a 200-kS/s sampling rate.The device operates with a 1.8-V power supply and achieves a FOM of 477 fJ/conversion-step.     

一种采用差分时域比较器的12位200KS/s低功耗逐次逼近型模数转换器

A low power 12-bit 200-kS/s SAR ADC is proposed.This features a differential time domain comparator whose offset is cancelled by using a charge pump and a phase frequency detector instead of the preamplifiers usually needed in a high resolution comparator.The proposed ADC is manufactured in 0.18-μm CMOS technology and the measured SNR and SNDR are 62.5 dB and 59.3 dB,respectively,with a power consumption of 72μW at a 200-kS/s sampling rate.The device operates with a 1.8-V power supply and achieves a FOM ...     

11有效位数，精度可编程且非校正的时间模式逐次逼近模数转换器

设计了一种10或者12位的可编程差分逐次逼近模数转换器,用于桥梁应力监测系统。该模数转换器采用了一种新颖的时域比较器,且提出了几种提高时域比较器精度的技术。该芯片在UMC 0.18um工艺上实现。当模数转换器工作于12位模式100K采样率时,输入47.7kHz正弦波时, 有效位数为11,无杂散动态范围为77.48dB, 最大微分非线性为0.2/-0.74LSB,最大积分非线性为 1.27/-0.97LSB,总功耗为558uW。     

8位12MS/s带片上参考电压的异步逐次逼近模数转换器

This paper proposes an 8 bit asynchronous successive approximation register ADC for wireless transceivers.A split capacitor DAC is used to reduce power and area consumption and the value of the split capacitor is calculated theoretically to ensure linearity.Asynchronous control logic is proposed to eliminate the high internal clocks and significantly speeds up the successive approximation algorithm.An on-chip reference with a fully integrated buffer and decoupling capacitor is adopted for avoiding an extra pin for the off-chip reference. The prototype,fabricated in UMC 0.18μm CMOS technology,achieves an effective number of bits of 7.64 bits at a sampling frequency of 12 MS/s.The total power consumption is 0.918 mW for a 1.8 V supply,while the onchip reference consumes 53%of the total power.It achieves a figure of merit of 180 fJ/conv-step,excluding the reference’s power consumption.     

A 25-GS/s 6-bit time-interleaved SAR ADC with design-for-test memory in 40-nm low-leakage CMOS

This paper presents a 25-GS/s 6-bit time-interleaved (TI) SAR ADC in a 40-nm CMOS low-leakage (LL) process. The prototype utilizes 4 × 12 hierarchical sampling architecture to reduce the complexity of track-and-hold circuits and the timing skew calibration. The single-channel SAR ADC adopts asynchronous processing with two alternate comparators. A partially active reference voltage buffer is designed to reduce the power consumption. The method based on sinusoidal signal approximation is employed to calibrate timing skew errors. To characterize the ultra-high-speed ADC, an on-chip design-for-test memory is designed. At 25 GS/s, the ADC achieves the SNDR of 32.18 dB for low input frequency and 27.28 dB for Nyquist frequency. The chip consumes 800 mW and occupies 1.3 × 2.6 mm², including the TI ADC core and memory.     

An 8-bit 180-kS/s differential SAR ADC with a time-domain comparator and 7.97-ENOB

This paper presents a differential successive approximation register analog-to-digital converter(SAR ADC) with a novel time-domain comparator design for wireless sensor networks.The prototype chip has been implemented in the UMC 0.18-μm 1P6M CMOS process.The proposed ADC achieves a peak ENOB of 7.98 at an input frequency of 39.7 kHz and sampling rate of 180 kHz.With the Nyquist input frequency,68.49-dB SFDR,7.97-ENOB is achieved.A simple quadrate layout is adopted to ease the routing complexity of the co...     

一种8-b 180KSPS的带有新颖的时域比较器且有效位数7.97的差分逐次逼近模数转换器

This paper presents a differential successive approximation register analog-to-digital converter (SAR ADC) with a novel time-domain comparator design for wireless sensor networks. The prototype chip has been implemented in the UMC 0.18-μ m 1P6M CMOS process. The proposed ADC achieves a peak ENOB of 7.98 at an input frequency of 39.7 kHz and sampling rate of 180 kHz. With the Nyquist input frequency, 68.49-dB SFDR, 7.97-ENOB is achieved. A simple quadrate layout is adopted to ease the routing complexity of the common-centroid symmetry layout. The ADC maintains a maximum differential nonlinearity of less than 0.08 LSB and integral nonlinearity less than 0.34 LSB by this type of layout.     

一种用于红外读出电路的低温SAR ADC

本文提出了一种用于低温红外读出系统的连续逼近模数转换器（SAR ADC）电路。为了在很宽的温度范围内保证电路的性能,ADC中采用了一种温度补偿时域比较器结构。该比较器可在从室温到77K的极端工作温度条件下,实现稳定的性能和极低的功耗。该转换器采用标准的 0.35 μm CMOS 工艺制造,在77K的温度下,其最大微分非线性（DNL）和积分非线性（INL）分别为0.64LSB和0.59LSB。在采样率为200kS/s时可实现9.3bit的有效位数。在3.3V的电源电压下其功耗为0.23mW,占用的芯片面积为0.8*0.3 mm2。     

A 10-bit 110 MHz SAR ADC with asynchronous trimming in 65-nm CMOS

A 10-bit 110 MHz SAR ADC with asynchronous trimming is presented. In this paper, a high linearity sampling switch is used to produce a constant parasitical barrier capacitance which would not change with the range of input signals. As a result, the linearity of the SAR ADC will increase with high linearity sampled signals. Farther more, a high-speed and low-power dynamic comparator is proposed which would reduce the comparison time and save power consumption at the same time compared to existing technology. Additionally, the proposed comparator provides a better performance with the decreasing of power supply. Moreover, a highspeed successive approximation register is exhibited to speed up the conversion time and will reduce about 50% register delay. Lastly, an asynchronous trimming method is provided to make the capacitive-DAC settle up completely instead of using the redundant cycle which would prolong the whole conversion period. This SAR ADC is implemented in 65-nm CMOS technology the core occupies an active area of only 0.025 mm² and consumes 1.8 mW. The SAR ADC achieves SFDR > 68 dB and SNDR > 57 dB, resulting in the FOM of 28 fJ/conversion-step. From the test results, the presented SAR ADC provides a better FOM compared to previous research and is suitable for a kind of ADC IP in the design SOC.     

A cryogenic SAR ADC for infrared readout circuits

A cryogenic successive approximation register(SAR) analog to digital converter(ADC) is presented. It has been designed to operate in cryogenic infrared readout systems as they are cooled from room temperature to their final cryogenic operation temperature.In order to preserve the circuit’s performance over this wide temperature range,a temperature-compensated time-based comparator architecture is used in the ADC,which provides a steady performance with ultra low power for extreme temperature(from room temperature down to 77 K) operation.The converter implemented in a standard 0.35μm CMOS process exhibits 0.64 LSB maximum differential nonlinearity (DNL) and 0.59 LSB maximum integral nonlinearity(INL).It achieves 9.3 bit effective number of bits(ENOB) with 200 kS/s sampling rate at 77 K,dissipating 0.23 mW under 3.3 V supply voltage and occupies 0.8×0.3 mm~2.     

一种基于电压窗口技术的超低功耗SAR ADC

本文提出了一种应用于生物医学的超低功耗逐次逼近型模数转换器(SAR ADC).针对SAR ADC主要模块进行超低功耗设计.数模转换(DAC)电路采用vcm-based以及分段电容阵列结构来减小其总电容,从而降低了DAC功耗.同时提出了电压窗口的方法在不降低比较器精度的情况下减小其功耗.此外,采用堆栈以及多阈值晶体管结构来减小低频下的漏电流.在55nm工艺下进行设计和仿真,在0.6V电源电压以及l0kS/s的采样频率下,ADC的信噪失真比(SNDR)为73.3dB,总功耗为432nW,品质因数(FOM)为11.4fJ/Conv.     

基于分段电容阵列的改进型逐次逼近型ADC

为缩短高速模数转换器(ADC)中高位(MSB)电容建立时间以及减小功耗,提出了一种基于分段式电容阵列的改进型逐次逼近型(SAR)ADC结构,通过翻转小电容阵列代替翻转大电容阵列以产生高位数字码,并利用180 nm CMOS工艺实现和验证了此ADC结构。该结构一方面可以缩短产生高位数码字过程中的转换时间,提高量化速度;另一方面其可以延长大电容的稳定时间,减小参考电压的负载。通过缩小比较器输入对管的面积以减小寄生电容带来的误差,提升高位数字码的准确度。同时,利用一次性校准技术减小比较器的失配电压。最终,采用180 nm CMOS工艺实现该10 bit SAR ADC,以验证该改进型结构。结果表明,在1.8 V电源电压、780μW功耗、有电路噪声和电容失配情况下,该改进型SAR ADC得到了58.0 dB的信噪失真比(SNDR)。     

一个低功耗的带片上参考电压缓冲器的12位30兆采样率的CMOS流水线模数转换器

介绍了一个在0.13µm 1P8M CMOS工艺下实现的12位30兆采样率流水线模数转换器。提出了一种消除前端采样保持电路的低功耗设计方法。除了第一级之外,带双输入的两级cascode补偿的运算放大器在相邻级间共享以进一步地减小功耗。该模数转换器在5MHz的模拟输入和30.7MHz的采样速率下达到了65.3dB的SNR,75.8dB的SFDR和64.6dB的SNDR。该芯片在1.2V电源电压下消耗33.6mW。FOM达到了0.79pJ/conv step。     

一个11位、采样率22MS/s、0.6毫瓦采用寄生电容补偿技术的逐次逼近型模数转换器

本文介绍了一个11位22MS/s采样率功耗为0.6毫瓦的逐次逼进型模数转换器,采用了中芯国际65nm低漏电工艺,工作电压为1.2V。采用了桥接电容阵列来降低总电容值和芯片面积。但是桥接电容阵列的低位寄生电容会影响模数转换器的线性度并且难于校正。本文提出了一种寄生电容补偿技术避免使用复杂的校正电路来消除低位寄生电容带来的不利影响。本文的数字逻辑采用了动态电路来降低功耗并且缩短关键路径的延迟时间。芯片面积为300微米×200微米,测试结果表明采样率为22-MS/s ,在1.2V的工作电压下功耗为0.6毫瓦,输入信号为低频信号时信号噪声失真比为59.3dB,无杂散动态范围为72.2 dB。品质因数为36.4fJ/conversion-step。     

A low power 12-bit 30 MSPS CMOS pipeline ADC with on-chip voltage reference buffer

A 12-bit 30 MSPS pipeline analog-to-digital converter(ADC) implemented in 0.13-μm 1P8M CMOS technology is presented.Low power design with the front-end sample-and-hold amplifier removed is proposed.Except for the first stage,two-stage cascode-compensated operational amplifiers with dual inputs are shared between successive stages to further reduce power consumption.The ADC presents 65.3 dB SNR,75.8 dB SFDR and 64.6 dB SNDR at 5 MHz analog input with 30.7 MHz sampling rate.The chip dissipates 33.6 mW from 1.2 V power supply.FOM is 0.79 pJ/conv step.     

一种基于时域比较器高SFDR的6-bit 20-MS/s 逐次逼近模数转换器

This paper presents a 6-bit 20-MS/s high spurious-free dynamic range(SFDR) and low power successive approximation register analog to digital converter(SAR ADC) for the radio-frequency(RF) transceiver frontend, especially for wireless sensor network(WSN) applications.This ADC adopts the modified common-centroid symmetry layout and the successive approximation register reset circuit to improve the linearity and dynamic range. Prototyped in a 0.18-μm 1P6M CMOS technology,the ADC performs a peak SFDR of 55.32 dB and effective number of bits(ENOB) of 5.1 bit for 10 MS/s.At the sample rate of 20 MS/s and the Nyquist input frequency,the 47.39-dB SFDR and 4.6-ENOB are achieved.The differential nonlinearity(DNL) is less than 0.83 LSB and the integral nonlinearity(INL) is less than 0.82 LSB.The experimental results indicate that this SAR ADC consumes a total of 522μW power and occupies 0.98 mm~2.     

A 10-bit 50 MS/s SAR ADC in 65 nm CMOS with on-chip reference voltage buffer

This paper presents the design of a 10-bit, 50 MS/s successive approximation register (SAR) analog-to-digital converter (ADC) with an on-chip reference voltage buffer implemented in 65 nm CMOS process. The speed limitation on SAR ADCs with off-chip reference voltage and the necessity of a fast-settling reference voltage buffer are elaborated. Design details of a high-speed reference voltage buffer which ensures precise settling of the DAC output voltage in the presence of bondwire inductances are provided. The ADC uses bootstrapped switches for input sampling, a double-tail high-speed dynamic comparator and split binary-weighted capacitive array charge redistribution DACs. The split binary-weighted array DAC topology helps us to achieve low area and less capacitive load and thus enhances power efficiency. Top-plate sampling is utilized in the DAC to reduce the number of switches. In post-layout simulation which includes the entire pad frame and associated parasitics, the ADC achieves an ENOB of 9.25 bits at a supply voltage of 1.2 V, typical process corner and sampling frequency of 50 MS/s for near-Nyquist input. Excluding the reference voltage buffer, the ADC consumes 697 μW and achieves an energy efficiency of 25 fJ/conversion-step while occupying a core area of 0.055 mm².     

1-V电源65nm GP CMOS工艺下一款十位80MS/s 1.6mW逐次逼近型模数转换器

This paper presents a 10-bit 80-MS/s successive approximation register(SAR) analog-to-digital converter (ADC) suitable for integration in a system on a chip(SoC).By using the top-plate-sample switching scheme and a split capacitive array structure,the total capacitance is dramatically reduced which leads to low power and high speed.Since the split structure makes the capacitive array highly sensitive to parasitic capacitance,a three-row layout method is applied to the layout design.To overcome the charge leakage in the nanometer process,a special input stage is proposed in the comparator.As 80 MS/s sampling rate for a 10-bit SAR ADC results in around 1 GHz logic control clock,and a tunable clock generator is implemented.The prototype was fabricated in 65 nm 1P9M (one-poly-nine-metal) GP(general purpose) CMOS technology.Measurement results show a peak signal-to-noise and distortion ratio(SINAD) of 48.3 dB and 1.6 mW total power consumption with a figure of merit(FOM) of 94.8 fJ/conversion-step.     

A low-power 6-bit MOS CML flash ADC with a novel multi-segment encoder for UWB applications

This paper introduces a novel structure of multi-segment encoder with MOS current mode logic (MCML) multiplexers. As the benefit, the more segments would lead higher performance speed. Moreover, in the high-resolution flash analog-to-digital converter (ADC), the encoder structure will be simpler compared to conventional ones. As the simplest type, the two-segment encoder is used in this paper. By assistance of some MCML multiplexers, each segment encodes the most significant bits (MSBs) and the least significant bits (LSBs) separately. The figure of merit (FOM) of the proposed ADC is 0.225 pJ/conversion-step.