共查询到19条相似文献,搜索用时 62 毫秒
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《中国计量学院学报》2015,(3):347-352
掌纹识别是近年发展起来的一种生物识别技术,掌纹特征提取是掌纹识别核心部分之一,传统Gabor滤波器特征提取速度慢致使掌纹识别速度不能满足实时性的要求.将传统Gabor、改进Gabor和迭代Gabor应用于掌纹特征提取,对比研究了它们在掌纹识别中特征提取速度和识别精度的问题,旨在探求识别精度高且特征提取速度更快的Gabor滤波器,进而改良掌纹特征提取方法.实验表明,迭代Gabor滤波器能确保掌纹识别系统在高识别精度的前提下具有更快的识别速度. 相似文献
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在指纹识别系统中,图像增强效果的好坏对特征提取及指纹鉴别的识别率具有决定性的影响。本文详细介绍了Gabor二维函数、Gabor滤波器的图像增强算法、方向图计算、纹线频率计算的步骤及方法,从而去除了噪声,达到了增强图像的目的。在算法设计上提高了运算速度,节省了运算的时耗。 相似文献
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针对被检测目标在视角变化和遮挡时较难识别的问题,提出联合利用Gabor特征和视角变换时共有的LIOP特征对目标进行多角度识别的新算法。首先,用4个方向、16个尺度的二维Gabor滤波器组对输入图像进行滤波,得到64组含有方向信息的Gabor特征响应图,进而对相邻尺度和相应位置计算局部响应最大值,得到具有尺度及平移不变的特征向量。其次,通过几何变换算法获得不同视角下的LIOP特征向量。然后,为了降低时间复杂度,通过主成分分析算法对联合特征降维。最后,把降维后的特征向量输入支持向量机(SVM)进行训练学习,得到检测器模型。为了定量评估算法精度和鲁棒性,在Caltech-101和UIUC car两个标准数据库进行测试,实验结果表明,本文在两个标准数据集上的平均识别率分别达到了92.1%和95.4%,能较好检测不同尺度、不同角度的目标。 相似文献
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交变电磁场检测技术(alternating current filed measurement, ACFM)是利用电磁感应原理,通过拾取缺陷处的磁场畸变信号,分析判断缺陷信息的一种电磁无损检测方法。ACFM检测技术在探头扫描方向与裂纹走向一致的情况下检测效果最佳。但在实际检测中,检测的金属表面通常都有油漆层保护,并不知道裂纹走向。因此,该文重点研究裂纹长度、裂纹深度、探头扫描方式、探头起落波动、探头偏离裂纹的水平距离及探头提离高度对ACFM检测信号的影响。实验结果表明:不同的扫描模式,检测信号具有不同的特征,可以从不同的模式特征对裂纹特征进行综合评价。该研究成果可为表面裂纹的检测与评价提供参考。 相似文献
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《成像科学杂志》2013,61(4):200-210
AbstractThis paper is an extension of previous work on the image segmentation of electronic structures on patterned wafers to improve the defect detection process on optical inspection tools. Die-to-die wafer inspection is based upon the comparison of the same area on two neighbourhood dies. The dissimilarities between the images are a result of defects in this area of one of the dies. The noise level can vary from one structure to the other, within the same image. Therefore, segmentation is needed to create a mask and apply an optimal threshold in each region. Contrast variation on the texture can affect the response of the parameters used for the segmentation. This paper shows a method of anticipating these variations with a limited number of training samples and modifying the classifier accordingly to improve the segmentation results. 相似文献
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为满足柔性电路板缺陷检测在生产线上的检测要求,讨论了基于机器视觉的柔性电路板缺陷实时检测系统试验所需要的关键技术.并且针对传统的基于模板匹配的算法的速度慢、准确率低等问题,提出将柔性电路板的缺陷分为全局缺陷和局部缺陷,对全局缺陷采用直方图匹配和八连通域面积的计算,淘汰两者均存在缺陷的产品;对未被排除的产品图像采用投影匹配和相关系数的计算,实现局部缺陷的识别.改进的算法经过实验验证表明其准确率和检测速度优于传统的检测算法,符合柔性电路板生产线的检测要求. 相似文献
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Linear feature detection is an important technique in different applications of image processing. To detect linear features in different types of images, a simple but effective algorithm based on a multiple-structuring-element center-surround top-hat transform is proposed. The center-surround top-hat transform is discussed and analyzed. Based on the properties of this transform for image feature detection, multiple structuring elements are constructed corresponding to the possible linear features at different directions. The whole algorithm is divided into four parts. First, the algorithm uses the center-surround top-hat transform to detect all the possible linear features at different directions through constructing multiple structuring elements. Second, the detected linear feature regions at each direction are processed by a closing operation to remove the possible holes or unconnected regions. Third, the processed results of the detected linear feature regions at all directions are combined to form all the possible detected linear feature regions. Fourth, the combined result is refined by using some simple operations to form the final result. Experimental results on different types of images from different applications verified the effective performance of the proposed algorithm. Moreover, the experimental results indicate that the proposed algorithm could be used in different applications. 相似文献