共查询到20条相似文献,搜索用时 15 毫秒
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Nagle H.T. Fritzemeier R.R. Van Well J.E. McNamer M.G. 《Industrial Electronics, IEEE Transactions on》1989,36(2):151-163
As the level of microprocessor complexity increases to several hundred thousand transistors for a single-chip machine, it is becoming very difficult to test commercially available designs to the level of fault coverage desired by some customers. In order to achieve near 100-percent coverage of single stuck-at faults, future microprocessors must be designed with special testing features (designed for testability). The authors describe the testing problem for microprocessors, including the various methods of generating test sets and their application by the user. A survey of the testability features of some of today's commercially available microprocessors is presented. Suggestions for testability features for future-generation microprocessors are also discussed 相似文献
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The microprocessor market is expanding at an amazing rate. The only element of this market more surprising than its rate of growth is its escalating number of new vendors. The time has already arrived when you cannot tell the players without a score card. The score cards in the microprocessor world consist of chip sets, memory, I/O controls, specifications, schematics, support devices, and available software for the various microprocessors. These score cards are the prototyping kits that are so popular today. 相似文献
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We verified that contemporary microprocessors follow a form of Rent's rule as applicable for functionally partitioned circuits and, hence, present far fewer pins than that predicted by the SIA. We have also suggested a correction scheme for application of Rent's rule to recent VLSI circuits that would yield the correct (slower) rate of increase in pin requirements of these circuits. Finally, the reasons for using such a large number of power and ground pins in current VLSI circuits have been elaborated in detail 相似文献
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《Proceedings of the IEEE. Institute of Electrical and Electronics Engineers》1986,74(12):1605-1622
The rapid pace of advancement of microprocessor technology has shown no sign of diminishing, and this pace is expected to continue in the future. Recent trends in such areas as silicon technology, processor architecture and implementation, system organization, buses, higher levels of integration, self-testing, caches, coprocessors, and fault tolerance are discussed, and expectations for further advances are highlighted. How these trends and expectations will drive the markets and applications, and vice versa, is also explored. 相似文献
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Robert Cravotta 《电子设计技术》2006,13(11):151-152,154,156,158,160,162-166,168,170,172-173
欢迎您参阅第33届年度EDN微处理器/微控制器指南。本次指南中所涉及的公司和器件数目与去年相比继续保持增长,因此我们再次大幅扩展了公司名单和器件与内核列表。除此之外,本次指南资料可以允许您基于应用领域进行选择和浏览,并且比以前包含了更多的图表。本指南的目标,是帮助您在考量处理器选项的过程中获得更多的透明性资料,以便使您快速缩小针对特定项目的备选处理器清单。欲查看本指南的全部详细资料,请浏览http://www.edn.com/micpodipectcopy。 相似文献
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应用微处理器微电子技术制作热继电器,克服双金属片热继电器的缺陷。分析电机发热的主要原因,通过微处理器和电子电路对电机进行保护。 相似文献