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加速度传感器电激励等价性测试方法的研究 总被引:1,自引:0,他引:1
研究了采用电信号激励代替机械激励测试伺服加速度传感器动态特性的方法。理论上分析了电激励测试与机械激励测试结果的等价性及原理性误差。针对恒压源型的加速度计提出了一种新的等价性测试方法。实验结果进一步证实了理论分析及实验方法的正确性。 相似文献
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本文对影响放映机画面动态分辨率的主要因素——影片颤动,按其不同来源作了分析;对放映机片槽内影片颤动的动态测试方法,提出了采用光栅位移传感器的设想。 相似文献
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爆炸焊接条件下金属动态屈服强度的分析与计算 总被引:3,自引:0,他引:3
用比值的方法分析和计算了爆炸焊接条件下,爆炸复合材料结合区中塑性变形金属的动态屈服强度值。结果指出,在此高压、高速和瞬时的塑性变形过程中,金属的动态屈服强度值比其静态下的屈服强度值高1~3个数量级。因此,此时的金属仍是一个刚体,不能将其假设为不可压缩的流体。 相似文献
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研究了不同热处理状态的20Cr和40Cr钢在不同冲击速度(V)下,应变速率(ε)和动态屈服强度(σa)的变化规律,研究表明:σa=σ0exp(Aliε)、ε=aexp(Bv),σa=σ0exp(Cv)其中只两个是独立的,并用粘塑性本构理论分析了同作用机制。 相似文献
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金属材料动态强化机制的探讨 总被引:2,自引:0,他引:2
对纯铁在不同冲击速度和不同冲击交数下的动态屈服强度进行了试验研究,并对其微观结构进行了观察,探讨了在不同冲击条件下体心立方金属材料动态屈服强度上升的微观机理,给出了材料微观结构演化与其力学性能之间关系。 相似文献
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针对等直径转轴动态扭矩测试方法计算模型和测量装置复杂以及测试范围受限等问题,提出了一种基于DASP的光电反射式动态扭矩测试方法。建立由光电反射式传感器和DASP系统等组成的动态扭矩测试系统,利用传感器光电脉冲信号的时差和相对转角,来实现动态扭矩测量。实测结果表明,通过调整传感器的位置,就可以实时、精确地实现扭矩的非接触式测量。这种测试方法为转轴的扭矩测试提供了一种新的技术途径。 相似文献
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通过对橡胶阻尼材料动态热机械性能进行测试,研究了测试频率、升温速率、测试模式等参数对测试结果的影响。结果表明:测试频率和升温速率都对测试结果有较大影响,橡胶阻尼材料的动态力学性能参数随着测试频率和升温速率的增大均向高温方向移动,为了更好地表征材料的阻尼性能,最好采用较低的升温速率;另外,测试模式的选择、静态力动态力以及振幅的设定都会影响测试结果的准确性。 相似文献
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Numerous process capability indices have been proposed in the manufacturing industry to provide unitless measures on process performance, which are effective tools for quality improvement and assurance. Most existing methods for capability testing are based on the distribution frequency approaches. Recently, Bayesian approaches have been proposed for testing capability indices Cp and Cpm but restricted to cases with one single sample. In this paper, we consider estimating and testing capability index Cpm based on multiple samples. We propose accordingly a Bayesian procedure for testing Cpm. Based on the Bayesian procedure, we develop a simple but practical procedure for practitioners to use in determining whether their manufacturing processes are capable of reproducing products satisfying the preset capability requirement. A process is capable if all the points in the credible interval are greater than the pre‐specified capability level. To make the proposed Bayesian approach practical for in‐plant applications, we tabulate the minimum values of for which the posterior probability p reaches various desirable confidence levels. Copyright © 2004 John Wiley & Sons, Ltd. 相似文献
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《Quality Engineering》2006,18(3):391-395
Process capability indices are used to measure whether a manufacturing process meets the specifications. The studies of these indices are usually based on the assumption that the process follows a normal distribution. These include the indices Cp, Cpk, Cpm, and Cpmk. When the investigator is uncertain whether the process follows a normal distribution, a test of normality may be used to resolve the uncertainty. If the test accepts the null hypothesis that the process follows a normal distribution, the investigator uses Cp, Cpk, Cpm, or Cpmk. If the test rejects the null hypothesis, the investigator uses indices under non-normal distributions. Therefore the test of normality is a preliminary test that determines the form of the distribution and the index to use. In this paper we study the effect of the preliminary test of normality on the estimation of the four process capability indices mentioned above. 相似文献
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Toni Lupo 《Quality and Reliability Engineering International》2015,31(2):305-312
The process capability analysis is a crucial activity to evaluate if the process outcome meets the design specifications. Classically, such analysis is performed by verifying the in‐control condition of the process and evaluating suitable capability indices, by assuming the process in‐control steady‐state condition. However, the in‐control period of the process characterizes only a part of the system functioning cycle, the one with the lower defective rate. In particular, the system functioning cycle is also characterized by the out‐of‐control period, during which a greater defective rate is produced, and such increasing is not considered by the widely adopted capability indices. As consequence, the classical approaches to perform the process capability analysis involves an overestimation of the process capability level. For this reason, in order to overcome the previously described limitation, in the present paper it is proposed a new capability index based on the real defective rate of the process. Thus, such new index is able to estimate the real process capability level. Finally, in order to compare the new index to the conventional Cp capability index, a numerical comparison study related to a process capability analysis is carried out, and the related practical considerations are given. Copyright © 2013 John Wiley & Sons, Ltd. 相似文献
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M. Kargar M. Mashinchi A. Parchami 《Quality and Reliability Engineering International》2014,30(5):615-621
Process capability indices provide numerical measures to compare the output of a process to client's expectations. However, most of the existing researches have used traditional distribution frequency method by using a single sample due to assess process capability. An alternative to this approach is to use the Bayesian method. In this paper, we utilize a Bayesian approach based on subsamples to check process capability via capability index Cpk. As a new suggestion, we used the informative normal prior distribution and the characteristics of sufficient statistic of the parameter to drive the posterior distribution. The capability test is done, and the posterior probability p, for which the process under investigation is capable, is derived both based on the most popular index Cpk. Finally, a numerical example is given to clarify the method. Copyright © 2013 John Wiley & Sons, Ltd. 相似文献
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Dynamic Testing of Waveform Recorders 总被引:3,自引:0,他引:3
《IEEE transactions on instrumentation and measurement》1983,32(1):12-17
Four waveform recorder tests are presented that characterize dynamic performance using sine-wave sources. Each test illuminates different aspects of dynamic performance, and in some cases indicate the specific errors limiting performance. Pitfalls in using the tests are also examined. 相似文献
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利用离子束增强沉积技术, 在 Si (111) 和 G Cr15 轴承钢基体上沉积 Cr N 镀层研究氮分压、 N+ + N+2 离子轰击能量和 Nions Cr atoms 到达比对镀层组织结构的影响结果表明, Cr- N 镀层组织对氮分压敏感, 随着氮分压的增加, 镀层中 Cr N 组份增加, 金属 Cr 及 Cr2 N 组份减少; 随着氮离子轰击能量的增加, Cr- N 镀层中 Cr N (200) 择优生长; 但当 N ions/Cr atoms 比从145 ×10 - 2 增至5.87 ×10 - 2 时, 镀层中 Cr N 组份非但没有增多, 反而使镀层中的 Cr 以 Cr2 O3 形态存在. 相似文献