A new technique for on-chip error estimation and reconfiguration of current-steering digital-to-analog converters

In this paper, we propose a reconfigurable current-steering digital-to-analog converter (DAC). The differential nonlinearity error (DNL) of the DAC is estimated on-chip. This is used to reconfigure the switching sequence to get a lower integral nonlinearity error (INL). We propose a novel technique for estimation of DNL based on a step-size measurement. This greatly reduces the linearity and dynamic range requirements of the measuring circuits. A 10-b segmented DAC, along with the associated circuits for DNL estimation and reconfiguration, was designed using 0.35-/spl mu/m CMOS technology and fabricated through Europractice. The paper includes theoretical analysis, simulation, and experimental results for the proposed technique.     

BIST scheme for DAC testing

A low-cost, built-in self-test (BIST) scheme for a digital-to-analogue converter (DAC) is presented. The basic idea is to convert the DAC output voltages corresponding to different input codes into different oscillation frequencies through a voltage controlled oscillator (VCO), and further transfer these frequencies to different digital codes using a counter. According to the input and output codes, performances of a DAC, such as offset error, gain error, differential nonlinearity (DNL), integral nonlinearity (INL), could be effectively detected by simply using digital circuits rather than complex analogue ones. In addition, the annoying DAC output noise could be naturally filtered out by this BIST method     

A low-Voltage 10-bit CMOS DAC in 0.01-mm/sup 2/ die area

A low-voltage 10-bit digital-to-analog converter (DAC) for static/dc operation is fabricated in a standard 0.18-/spl mu/m CMOS process. The DAC is optimized for large integrated circuit systems where possibly dozens of such DAC would be employed for the purpose of digitally controlled analog circuit calibration. The DAC occupies 110 /spl mu/m/spl times/94 /spl mu/m die area. A segmented R-2R architecture is used for the DAC core in order to maximize matching accuracy for a minimal use of die area. A pseudocommon centroid layout is introduced to overcome the layout restrictions of conventional common centroid techniques. A linear current mirror is proposed in order to achieve linear output current with reduced voltage headroom. The measured differential nonlinearity by integral nonlinearity (DNL/INL) is better than 0.7/0.75 LSB and 0.8/2 LSB for 1.8-V and 1.4-V power supplies, respectively. The DAC remains monotonic (|DNL|<1 LSB) as INL reaches 4 LSB down to 1.3-V operation. The DAC consumes 2.2 mA of current at all supply voltage settings.     

基于QN旋转布局的10位500 MS/s分段电流舵DAC

针对分段电流舵数/模转换器（Digital-to-Analog Converter，DAC），通过理论分析和推导，研究电流源阵列系统失配误差和寄生效应对非线性的影响，采用电流源阵列Q^N旋转游走版图布局方案，能够减小电流源系统失配的一次误差，而且版图布线简单，由寄生效应引起的电流源失配较小，利于DAC非线性的优化.基于0.18μm CMOS，采用"6+4"的分段结构，设计了一种10位500MS/s分段电流舵DAC，流片测试结果表明，在输入频率为1.465MHz，采样速率为500MS/s的条件下，无杂散动态范围（Spurious Free Dynamic Range，SFDR）为64.9dB，有效位数（Effective Number of Bits，ENOB）为8.8 bit，微分非线性误差（Differential Non-linearity，DNL）和积分非线性误差（Integral Non-linearity，INL）分别为0.77LSB和1.12LSB.     

A Design of Linearity Built-in Self-Test for Current-Steering DAC

In this paper, a current-mode Built-In Self-Test (BIST) scheme is proposed for on-chip estimating static non-linearity errors in current-steering digital-to-analog converters (DACs). The proposed DAC BIST scheme is designed to verify a 10-bit segmented current-steering DAC, consist of a 5-bit coarse DAC and a 5-bit fine one. This proposed BIST scheme includes a current-mode sample-and-difference circuit to increase the sampling current accuracy and control a current-controlled oscillator (ICO). In addition, only 36 measurements are required by using the selected-code method rather than 1024 measurements for the conventionally-utilized all-code method. Compared to the conventionally-utilized all-code method, about 85-% reduction of test time can be achieved.     

BIST structure for DAC testing

A built-in self-test (BIST) structure for digital-to-analogue converter (DAC) testing is presented. The basic idea is to divide the input codes (0, 1, ..., 2ⁿ-1) of the DAC under test into a number of segments. The DAC output voltages corresponding to different codes in the same segment are amplified to the same voltage value. Such that one single reference voltage can be used to test all codes in the same segment. By this method, the number of reference voltages required for DAC testing can be greatly reduced. We show that offset error, gain error, integral nonlinearity (INL) and differential nonlinearity (DNL) are effectively detected in the proposed BIST structure     

High-level modeling of resistor string based digital-to-analog converters

To obtain a high performance CMOS resistor string digital-to-analog converter (DAC), one of the key design issues is the mismatch in the resistor ratio. This mismatch causes nonlinearity errors such as integral nonlinearity (INL) and differential nonlinearity (DNL), degrading the performances of the converter. Usually these matching properties are taken into account during the design phase by using time consuming and computational intensive transistor-level Monte Carlo simulations for the process technology corner. Recent research aims at reducing the design time by exploiting high-level modeling of converters as a trade-off between simulation time and modelling accuracy. In this work an analytical model for resistor mismatch in DACs is presented and implemented in MATLAB^TM environment. The model utilizes geometrical size of resistors and statistical data of the technology process. Starting from random process variations on geometries it was possible to estimate DNL and INL with very short time simulations. The proposed model is valid both for single stage resistor string DACs or segmented ones. The model can be used to speed up the design of resistor-string based DACs, or as a starting point to develop more accurate models by taking into account high-order effects. The model was successfully used to design a 10bit resistor string DAC in a 0.18 μm BCD technology with DNL and INL lower than 1 LSB (in absolute value). Since the complexity of the DAC is dominated by the resistor string, its optimization since the early design steps, enabled by the proposed high-level model, allowed to minimize area versus state of the art.     

一种用于14 bit SAR ADC的DAC设计

本文设计了用于14bit逐次逼近型模数转换器（SAR ADC）的DAC电路。针对该DAC,介绍一种全差分分段电容阵列结构以缩小DAC的版图面积;高二位权电容采用热码控制,用以改善高位电容在转换时跳变的尖峰以及DAC的单调性;对电容阵列采用数字校准技术,减小电容阵列存在的失配,以提高SAR ADC精度。校准前,SAR ADC的INL达到10LSB,DNL达到4LSB;与校准前相比,校准后,INL〈0.5LSB,DNL〈0.6LSB。仿真结果表明,本DAC设计极大改善SAR ADC的性能,已达到设计要求。     

高速ADC及由其构成的并行/交替式数据采集系统的非线性研究

本文研究了高速ADC及由其构成的并行/交替式数据采集系统的DNL(微分非线性)与INL(积分非线性)及有关测试理论与方法.根据统计学方法由单片ADC的DNL和INL导出了并行/交替式数据采集系统的DNL和INL的数学表达式;并且采用统计直方图方法分别对单片ADC和由双片ADC组成的并行/交替式数据采集系统进行了计算机仿真.结果表明,并行/交替式数据采集系统的DNL与INL小于每一通道单片ADC的DNL和INL.     

On chip testing data converters using static parameters

In this paper, built-in self-test (BIST) approach has been applied to test digital-to-analog (D/A) and analog-to-digital (A/D) converters. Offset, gain, integral nonlinearity (INL), and differential nonlinearity (DNL) errors and monotonicity are tested without using mixed-mode or logic test equipment. An off-line calibrating technique has been used to insure the accuracy of BIST circuitry and to reduce area overhead by avoiding the use of high quality analog blocks. The proposed BIST structure presents a compromise between test cost, area overhead, and test time. By a minor modification the test structure would be able to localize the fail situation. The same approach may be used to construct a fast low cost off-chip D/A converter tester. The BIST circuitry has been designed and evaluated using complementary metal-oxide-semiconductor (CMOS) 1.2 μm technology     

A new on-chip digital BIST for analog-to-digital converters

A fully digital built-in self-test (BIST) for analog-to-digital converters is presented in this paper. This test circuit is capable of measuring the DNL, INL, offset error and gain error, and mainly consists of several registers and some digital subtracters. The main advantage of this BIST is the ability to test DNL and INL for all codes in the digital domain, which in turn eliminates the necessity of calibration. On the other hand, some parts of the analog-to-digital converter with minor modifications are used in the BIST simultaneously. This also reduces the area overhead and the cost of the test. The proposed BIST structure presents a compromise between test accuracy, area overhead and test cost. The BIST circuitry has been designed using Mitel CMOS 1.5 μm technology. The simulation results of the test show that it can be applied to medium resolution analog-to-digital converters or high resolution pipelined analog-to-digital converters. The presented BIST shows satisfactory results for a nine-bit pipe-lined analog-to-digital converter.     

一种有效的ADC内建自测试方案

内建自测试是降低ADC电路测试成本的有效方法。通过最小二乘法和斜坡柱状图。我们得出了测试ADC电路的增益误差、失调误差、微分非线性和积分非线性的算法。根据这些测试算法。介绍了一种易于片上集成的内建自测试结构。实验结果表明，该内建自测试方案具有较高的测试精度。     

2Gbps GaAs单片4bit数模转换器的设计与实现

详述了单片超高速2G bps G aA s 4b it数模转换器(DAC)的设计、制造及测试。在南京电子器件研究所标准76 mm G aA s工艺线采用0.5μm全离子注入M ESFET工艺完成流片。芯入输入输出阻抗实现在片50Ω匹配。4 b it DAC的微分非线性(DN L)为±0.22最低有效位(LSB),积分非线性(IN L)为±0.45LSB,达到5.2 b it的转换精度。该单片电路提供差分互补输出,长周期输出特性无漂移。其最高转换速率可达2 G bps,建立时间小于250 ps,电路核心部分功耗为110 mW。     

一种带有插值滤波器的8位650MHz采样速率数字模拟转换器

针对OFDM-UWB标准超宽带收发系统中数模转换器(DAC)的要求,设计了一款8位650MHz采样速率电流驱动型数模转换器(Current-steering DAC)。为了提高静态性能,本设计通过蒙特卡洛分析确定电流源最佳尺寸并采用双中心版图技术;为了提高动态性能,文中采用共源共栅电流源结构,对开关电压降摆幅处理并在数字输入端前加入插值滤波器。测试结果表明,DAC的积分非线性(INL)和差分非线性(DNL)分别为0.3LSB和0.41LSB,650MHz转换速率下带内奈奎斯特无杂散动态范围(SFDR)为41dB。整体面积为1.8cm×1.3cm,其中DAC面积为0.8cm×0.8cm。     

A 14-b 32 MS/s pipelined ADC with fast convergence comprehensive background calibration

This paper presents the first aggressively calibrated 14-b 32 MS/s pipelined ADC. The design uses a comprehensive digital background calibration engine that compensates for linear and nonlinear errors as well as capacitor mismatch in multi-bit DAC. Background calibration techniques that estimate the errors by correlating the output of ADC with the calibration signal have a very slow convergence rate. This paper also presents a fully digital technique to speed up the convergence in the error estimation procedure. By digitally filtering the input signal during the error estimation, the convergence rate of the calibration has been improved significantly. Implemented in TSMC 0.25 μm technology, the pipelined ADC consumes 75 mA from 2.5 V and occupies 2.8 mm² of active area. Measurement results show that calibration significantly improved dynamic (SNDR, SFDR) as well as static (DNL, INL) performance of the ADC.     

一种1.5 V 8位100 MS/s电流舵D/A转换器

基于新型的低压与温度成正比(PTAT)基准源和PMOS衬底驱动低压运算放大器技术,采用分段温度计译码结构设计了一种1.5V8位100MS/s电流舵D/A转换器,工艺为TSMC0.25μm2P5MCMOS。当采样频率为100MHz,输出频率为20MHz时,SFDR为69.5dB,D/A转换器的微分非线性误差(DNL)和积分非线性误差(INL)的典型值分别为0.32LSB和0.52LSB。整个D/A转换器的版图面积为0.75mm×0.85mm,非常适合SOC的嵌入式应用。     

A 10-bit 100 MSamples/s BiCMOS D/A Converter

This paper presents a 10-bit Digital-to-Analogue Converter (DAC) based on the current steering principle. The DAC is processed in a 0.8µm BiCMOS process and is designed to operate at a sampling rate of 100MSamples/s. The DAC is intended for applications using direct digital synthesis, and focus has been set on reducing dynamic nonlinearities to achieve a high spurious free dynamic range (SFDR) at high generated frequencies. The main part of the DAC consists of a matrix of current cells. Each current cell contains an emitter-coupled logic (ECL) flip-flop, clocked by a global ECL clock to ensure accurate clocking. A bipolar differential pair, with a cascode CMOS current sink, steered by the differential output of the ECL flip-flop, is used in each current cell to steer the current. The DAC operates at 5V, and has a power consumption of approximately 650mW. The area of the chip-core is 2.2mm × 2.2mm. The measured integral nonlinearity (INL) and differential nonlinearity (DNL) are both approximately 2 LSB. At a generated frequency of f _g0.1 f _s(f _s = 100MSamples/s) the measured SFDR is 50dB, and at f _g0.3 f _s the measured SFDR is as high as 43dB. The DAC is operating up to a sampling frequency of approximately 140MSamples/s. The DAC uses the hierarchical switching scheme and therefore the dynamic performance is not described well using the conventional glitch energy. A new energy measure that replaces the conventional glitch energy is therefore proposed. This energy measure is especially useful during the design phase.     

14 bit 50 ms/s 0.18 μm CMOS pipeline ADC based on digital error calibration

Described is a 14 bit 50 MS/s CMOS four-stage pipeline A/D converter (ADC)-based on a digital code-error calibration. The proposed calibration technique measures the capacitor mismatch errors of the front-end multiplying DAC (MDAC) with the back-end pipeline stages while the measured code errors are stored in memory and corrected in the digital domain during normal conversion. The calibration needs the increased power dissipation and chip area of 1.4 and 10.7 , respectively, compared to a 14 bit uncalibrated conventional pipeline ADC. The prototype ADC fabricated in a 0.18 um CMOS process occupies an active die area of 4.2 mm² and consumes 140 mW at 1.8 V and 50 MS/s. After calibration, the measured DNL and INL of the ADC are improved from 0.69 to 0.39 LSB and from 33.60 to 2.76 LSB, respectively.     

A 10-bit 200-MHz CMOS video DAC for HDTV applications

This paper describes a 10-bit 200-MHz CMOS current steering digital-to-analog converter (DAC) for HDTV applications. The proposed 10-bit DAC is composed of a unit decoded matrix for 6 MSBs and a binary weighted array for 4 LSB’s, considering linearity, power consumption, routing area, and glitch energy. A new switching scheme for the unit decoded matrix is developed to improve linearity further. Cascade current sources and differential switches with deglitch latch improve dynamic performance. The measured differential nonlinearity (DNL) and integral nonlinearity (INL) are 0.3 LSB and 0.2 LSB, respectively. The converter achieves a spurious-free dynamic range (SFDR) of above 55 dB over a100-MHz bandwidth and low glitch energy of 1.5 pVs. The circuit is fabricated in a 0.25 μm CMOS process and occupies 0.91 mm². When operating at 200 M Sample/s, it dissipates 82 mW from a 3.3 V power supply.