共查询到20条相似文献,搜索用时 0 毫秒
1.
海马神经元的原子力显微成像 总被引:3,自引:0,他引:3
原子力显微镜(AFM)对完整的细胞成像并同时进行微细结构观察尚有一定困难。本实验改进了标本制备的过程.用原子力显微镜对戊二醛固定的海马神经元进行扫描,建立了方便、实用的完整海马神经元自完整胞体至超微结构的原子力显微镜成像技术,并用改进的方法获得了完整海马神经元及其超微结构的清晰的三维成像,并发现了一些其它显微技术所不能发现的微细结构。这些结构包括:①海马神经元胞体的亚细胞部分及这些亚细胞部分所具有的不同功能;②神经突触的完整形态;③损伤细胞膜表面出现的孔洞;④通过神经突触所形成的神经网络结构。 相似文献
2.
3.
4.
5.
Sensitivity of V-shaped atomic force microscope cantilevers based on a modified couple stress theory
Haw-Long LeeWin-Jin Chang 《Microelectronic Engineering》2011,88(11):3214-3218
A relationship based on a modified couple stress theory is developed to investigate the flexural sensitivity of a V-shaped cantilever of an atomic force microscope (AFM) taking into account the normal interaction force between the cantilever tip and the sample surface. An approximate solution to the flexural vibration problem is obtained using the Rayleigh-Ritz method. The results show that the sensitivity of the V-shaped AFM cantilever using the modified couple stress theory is smaller than that using the classical beam theory for the lower contact stiffness. However, when the contact stiffness becomes higher, the situation is reversed. Furthermore, as the ratio of cantilever thickness to internal material length scale parameter decreases, the sensitivity of the cantilever decreases. 相似文献
6.
7.
传统的以PC机为控制核心的AFM(atomic force microscope)越来越无法满足快速成像的要求,具有先进控制系统的高速AFM正成为国内外的一个研究热点.本文介绍了一种以DSP(digital signal processor)为控制核心的AFM系统.在该系统中,自动进针/退针、扫描电压的产生、A/D采样、D/A输出以及数字闭环反馈控制等任务均在DSP控制下完成;在分辨率为512×512时,可以获得行频55 Hz的扫描速度.实验表明,即便在这样高速扫描的情况下,该系统仍具有良好的成像性能. 相似文献
8.
9.
10.
提出和发展了一种激光光路跟踪型原子力显微镜(AFM)技术及系统。研制了新型AFM探头,设 计了与XY扫描器联动的跟踪透镜及扫描跟踪光路,实现激光束对微探针(微悬 臂)的XY扫描的实时跟踪;研 究设计了独特的反馈跟踪光路,既可实现微悬臂偏转量的精确检测,又可巧妙地消除因微探 针的Z向反馈运动 造成的干扰噪声。利用研发的AFM系统对多孔氧化铝纳米孔等具有不同横向与 纵向结构尺寸的微纳米样品进行了扫 描成像,得到了理想的实验结果,表明研发的系统具有优良的XY扫描跟踪特性 和Z向反馈跟踪性能。本文研发的 AFM系统原理新颖、方法巧妙、扫描成像性能好和分辨率高,克服了常规样品 扫描型AFM的局限性,能够以 微探针扫描的方式实现不同大小、不同重量的样品的AFM扫描成像,可望在微纳米技术领 域获得广泛应用。 相似文献
11.
12.
基于隧道电流检测方式的原子力显微镜纳米检测系统设计 总被引:2,自引:0,他引:2
原子力显微镜(AFM)是当前进行材料表面微观形貌观察及分析的强有力工具之一。本文主要介绍一种隧道显微镜(STM)检测方式的原子力显微镜纳米检测系统(AFM.IPC-208B),该AFM系统设计是在STM.IPC-205B系统设计的基础上,采用隧道电流工作方式,将STM与AFM功能组合兼容。文章详细阐述了AFM.IPC-208B系统的设计原理、镜体、扫描控制以及数据采集。新设计的AFM.IPC-208B系统仍具有0.1nm的分辨率,检测范围为0~2mm×2mm,系统操作简易,工作效率高,与原STM.IPC-205B系统兼容,工作性能稳定可靠。 相似文献
13.
《Mechatronics》2015
A macro-scale atomic force microscope (macro-AFM) has been designed and used for teaching precision mechatronics. The macro-AFM uses a novel electromagnetic self-sensing self-actuating probe. It operates in frequency-modulation AFM (FM-AFM) mode with intermittent contact. The AFM has an imaging volume of 250 mm × 40 mm × 1 mm with a resolution of about 1 μm at 1 Hz measurement bandwidth. The macro-AFM is simple and relatively inexpensive to build. It is scaled to make motion visible to the eye and is robust for a lab environment, all of which make it an affordable and effective educational tool. The macro-AFM is used in Mechatronics (2.737), a graduate level course at MIT, where in a series of 11 laboratory exercises, the students assembled and programmed the AFM system. This article provides the design and theory used for making and controlling the macro-AFM, as well as experimental results. 相似文献
14.
15.
16.
17.
18.
C. Bresolin M. Pesaturo P. Paruzzi V. Soncini D. Erbetta M. Bigi 《Microelectronic Engineering》2003,70(2-4):196-200
An atomic force microscope (AFM) was used to study anomalies in the titanium disilicide formation of narrow (0.26 μm) poly lines at the edge of n+ and p+ implant masks; a special test structure was designed both for morphological and electrical evaluations. On poly lines along the borders of the n+ mask, before titanium deposition, the AFM was able to detect some material build-up exactly on the locations where the silicide is severely reduced in thickness or interrupted, as inferred by electrical data and SEM analysis on finished samples. A carbon (or nitrogen) atom knock-on during the arsenic implant was invoked to explain the observed local hindering of the silicide formation. 相似文献
19.
在电场力显微镜(EFM)下利用不同金属镀层微探针,在微纳米尺度下对聚酰亚胺薄膜的表面电荷生成特性进行研究。采用电场力显微镜导电探针在聚酰亚胺薄膜表面注入电荷,并对微纳米区域产生的电荷进行表征,结果表明不同金属镀层的微探针对聚酰亚胺薄膜上电荷注入效果不同。铂铱合金镀层具有比钴铬合金镀层更高的功函数fm,因此前者在金属-电介质接触中产生更大肖特基势垒,进而降低了电荷的注入程度。该研究为微纳米尺度下探索聚合物绝缘材料表面电荷生成、发展机理提供了一个新的研究方法和途径。 相似文献