Effect of 8 MeV electron irradiation on electrical properties of CuInSe2 thin films

Radiation damages due to 8 MeV electron irradiation in electrical properties of CuInSe₂ thin films have been investigated. The n-type CuInSe₂ films in which the carrier concentration was about 3×10¹⁶ cm⁻³, were epitaxially grown on a GaAs(0 0 1) substrate by RF diode sputtering. No significant change in the electrical properties was observed under the electron fluence <3×10¹⁶ e cm⁻². As the electron fluence exceeded 10¹⁷ e cm⁻², both the carrier concentration and Hall mobility slightly decreased. The carrier removal rate was estimated to be about 0.8 cm⁻¹, which is slightly lower than that of III–V compound materials.     

Electron irradiation and thermal annealing effect on GaAs solar cells

This paper describes the effect of electron irradiation and thermal annealing on LPE AlGaAs/GaAs heterojunction solar cells with various p/n junction depths. The electron irradiation experiments were performed with energy of 3 MeV, fluences ranging from 1×10¹⁴ to 5×10¹⁵ e/cm². The results obtained demonstrate that the irradiation-induced degradation of performances of the cells is mainly in the short circuit current and could be mostly recovered by annealing at 260°C for 30 min. Four electron traps, E_c−0.24 eV, E_c−0.41 eV, E_c−0.51 eV, E_c−0.59 eV, were found by DLTS analysis, only two shallow levels of which could be removed by the annealing.     

Effect of proton irradiation on electrical properties of CuInSe2 thin films

High-energy proton irradiation (380 keV and 1 MeV) on the electrical properties of CuInSe₂ (CIS) thin films has been investigated. The samples were epitaxially grown on GaAs (0 0 1) substrates by Radio Frequency sputtering. As the proton fluence exceeded 1×10¹³ cm⁻², the carrier concentration and mobility of the CIS thin films were decreased. The carrier removal rate with proton fluence was estimated to be about 1000 cm⁻¹. The electrical properties of CIS thin films before and after irradiation were studied between 80 and 300 K. From the temperature dependence of the carrier concentration in CIS thin films, we found N_D=9.5×10¹⁶ cm⁻³, N_A=3.7×10¹⁶ cm⁻³ and E_D=21 meV from the fitting to the experimental data on the basis of the charge balance equation. After irradiation, a defect level was created, and N_T=1×10¹⁷ cm⁻³ for a fluence of 3×10¹³ cm⁻², N_T=5.7×10¹⁷ cm⁻³ for a fluence of 1×10¹⁴ cm⁻² and E_T=95 meV were also obtained from the same fitting. The new defect, which acted as an electron trap, was due to proton irradiation, and the defect density was increased with proton fluence.     

5–20 MeV proton irradiation effects on GaAs/Ge solar cells for space use

This paper reports the high-energy proton irradiation effects on GaAs/Ge space solar cells. The solar cells were irradiated by protons with energy of 5–20 MeV at a fluence ranging from 1×10⁹ to 7×10¹³ cm⁻², and then their electric parameters were measured at AM0. It was shown that the I_sc, V_oc and P_max degrade as the fluence increases, respectively, but the degradation rates of I_sc, V_oc and P_max decrease as the proton energy increases, and the degradation is relative to proton irradiation-induced defect Ec−0.41 eV in irradiated GaAs/Ge cells.     

Radiation resistance of MBE-grown GaInP/GaAs cascade solar cells flown onboard Equator-S satellite

The radiation resistance of GaInP/GaAs cascade solar cells grown by molecular beam epitaxy (MBE) was tested onboard Equator-S satellite. The short-circuit current, open-circuit voltage, and power data were obtained for a period of about half a year. The remaining factors of these parameters were determined at the standard end-of-life (EOL) condition of an equivalent dose of 1×10¹⁵ cm⁻² 1 MeV electrons. Electron irradiation tests were also performed in the laboratory. Consistent results were obtained with flight and laboratory data. The remaining power at the EOL condition was 0.89–0.90 for these cells.     

Radiation resistance of high-efficiency InGaP/GaAs tandem solar cells

Radiation resistance of high-efficiency InGaP/GaAs tandem solar cells with a world-record efficiency of 26.9% (AM0, 28°C) has been evaluated by 1 MeV electron irradiation. Degradation in tandem cell performance has been confirmed to be mainly attributed to large degradation in the GaAs bottom cell. Similar radiation resistance with GaAs-on-Ge cells has been observed for the InGaP/GaAs tandem cell. Moreover, recovery of the tandem cell performance has been found due to minority-carrier injection under light illumination or forward bias, which causes defect annealing in InGaP top cells. The optimal design of the InGaP base layer thickness for current matching at end of life (EOL) (after irradiation with 10¹⁵ electrons cm⁻²) has been examined.     

Analysis of thin silicon solar cells for high efficiency

A comprehensive theoretical analysis taking into account the contribution from both the emitter and base regions having finite surface recombination velocity has been developed for computing short-circuit current, open-circuit voltage, and efficiency of thin AR coated thin silicon solar cells with textured front surface. The dependence of efficiency on the front surface and back surface recombination velocities and on the cell parameters have been investigated in details for varying cell thickness considering the effects of bandgap narrowing and Auger recombination in the material. It is shown that efficiency exceeding 24% can be attained with silicon solar cells having thickness as low as 25 μm provided both front and back surfaces are well passivated (S < 10³cm/s) and the doping concentration in the base and emitter are in the range of 5 × 10¹⁶ to 10¹⁷cm⁻³ and 10¹⁸ to 5 × 10¹⁸cm⁻³, respectively. It is also shown that an efficiency of about 23% can be obtained for thin cells of 25 μm thickness with a much inferior quality materials having diffusion length of about 40 μm.     

Solar cells using iodine-doped polythiophene–porphyrin polymer films

Wet-type organic solar cells containing 5,10,15,20-3-tetrathienylporphyrin (TThP) and polythiophene (PTh) films were fabricated. The TThP/PTh film was prepared on indium-tin-oxide (ITO) glass using an electrochemical polymerization method in an n-Bu₄NPF₆/CH₂Cl₂ solution. It was found that a small amount of iodine doping of the film improved the incident photon-to-electron conversion efficiency (IPCE) of a solar cell consisting of a TThP/PTh film and an aqueous electrolyte. A HOMO level measurement suggested that a modified HOMO level of the low iodine-doped TThP/PTh film allowed a fast electron transfer from PTh to a porphyrin moiety. To obtain further improvement, a sandwich-type solar cell using a 5% (w/w) aqueous solution of acetonitrile containing 0.05 M iodine and 0.5 M lithium iodide as an electrolyte was then fabricated. The solar cell absorbed light in the 300–800 nm wavelength range, converting this to a cathodic photocurrent with a maximum IPCE of 32% at 430 nm under irradiation of 5.0×10¹⁴ photon cm⁻² s⁻¹. This value is about 10 times higher than that of the solar cells using an aqueous electrolyte. The total energy conversion efficiency (η) of the solar cell under simulated sunlight reached 0.12% for 2.59 mW cm⁻² at AM1.5 and 0.05% for 100 mW cm⁻² at air mass 1.5.     

Epi-n-IZO thin films/1 0 0 Si, GaAs and InP by L-MBE––a novel feasibility study for SIS type solar cells

High quality epitaxial indium zinc oxide (heavily indium oxide doped) (epi-n-IZO) thin films were optimized by laser-molecular beam epitaxy (L-MBE) i.e., pulsed laser deposition (PLD) technique for fabricating novel iso- and hetero-semiconductor–insulator–semiconductor (SIS) type solar cells using Johnson Matthey “specpure”- grade 90% In₂O₃ mixed 10% ZnO (as commercial indium tin oxide (ITO) composition) pellets. The effects of substrate temperatures, substrates and heavy indium oxide incorporation on IZO thin film growth, opto-electronic properties with 1 0 0 silicon (Si), gallium arsenide (GaAs) and indium phosphide (InP) wafers were studied. As well as the feasibility of developing some novel models of iso- and hetero-SIS type solar cells using epi-IZO thin films as transparent conducting oxides (TCOs) and 1 0 0 oriented Si, GaAs and InP wafers as base substrates was also studied simultaneously. The optimized films were highly oriented, uniform, single crystalline approachment, nano-crystalline, anti-reflective (AR) and epitaxially lattice matched with 1 0 0 Si, GaAs and InP wafers without any buffer layers. The optical transmission T (max) 95% is broader and absolute rivals that of other TCOs such as ITO. The highest conductivity observed is σ=0.47×10³ Ω⁻¹ cm⁻¹ (n-type), carrier density n=0.168×10²⁰ cm⁻³ and mobility μ=123 cm²/V s. From opto-electronic characterizations, the solar cell characteristics and feasibilities of fabricating respective epi-n-TCO/1 0 0 wafer SIS type solar cells were confirmed. Also, the essential parameters of these cells were calculated and tabulated. We hope that these data be helpful either as a scientific or technical basis in semiconductor processing.     

The study on high efficient AlxGa1−xAs/GaAs solar cells

The investigation of Al_xGa_1−xAs/GaAs solar cells is carried out by means of both metalorganic chemical vapor deposition (MOCVD) and liquid-phase epitaxial (LPE) technique. The measurements of illuminated I–V characteristics, dark I–V characteristics and quantum efficiencies were performed for the GaAs solar cells made in author's laboratory. The measuring results revealed that the quality of materials in GaAs solar cell's structures is the key factor for getting high-efficient GaAs solar cells, but the effect of post-growth technology on the performances of GaAs solar cells is also very strong. The 21.95% (AM0, 2×27 cm², 25°C) high conversion efficiency in a typical GaAs solar cell has been achieved owing to improving the quality of materials as well as optimizing the post-growth technology of devices.     

High efficiency AlxGa1−xAs/GaAs solar cells: Fabrication, irradiation and annealing effect

High efficiency Al_xGa_1−xAs/GaAs heteroface solar cells have been fabricated by an improved multi-wafer squeezing graphite boat liquid phase epitaxy (LPE) technique, which enables simultaneous growth of twenty 2.3 × 2.3cm² epilayers in one run. A total area conversion efficiency of 17.33% is exhibited (1sun, AMO, 2.0 × 2.0cm²). The shallow junction cell shows more resistance to 1 MeV electron radiation than the deep one. After isochronal or isothermal annealing the density and the number of deep level traps induced by irradiation are reduced effectively for the solar cells with deep junction and bombardment under high electron fluences.     

Investigation of non-aqueous electrodeposited CdS/Cd1−xZnxTe heterojunction solar cells

Polycrystalline Cd_1−xZn_xTe solar cells with efficiency of 8.3% were grown by cathodic electrodeposition on glass/ITO/CdS substrates using non-aqueous ethylene glycol bath. The deposit is characterised versus the process conditions by XRD and found to possess a preferred (1 1 1) orientation on Sb doping in the electroplating bath. The surface morphology of the deposit is studied using atomic force microscope. The average RMS roughness for the ternary film was higher than that for the binary CdTe. Optical properties of the films were carried out to study the band gap and calculation of molar concentration ‘x’. The effects of Sb doping in CdS/Cd_1−xZn_xTe heterojunctions have been studied. The short circuit current density (c) was found to improve and series resistance (R_s) reduced drastically upon Sb doping. This improvement in J_sc is attributed to an increase in quantum efficiency. The evaluation of solar cell parameters was also carried out using the current–voltage characteristics in dark and illumination. The best results were obtained when 2×10⁻³ M ZnCl₂ along with antimony were present in the deposition bath. Under AM 1.5 conditions the open circuit voltage, short circuit current density, and fill factor of our best cell were V_oc=600 mV, J_sc=26.66 mA/cm², FF=0.42 and efficiency, η=8.3%. The carrier concentration and built-in potential of Cd_1−xZn_xTe calculated from Mott–Schottky plot was 2.72×10¹⁷ cm⁻³ and 1.02 eV.     

Preparation and characterisation of electrodeposited n-CdS/p-CdTe thin film solar cells

Cadmium sulphide and cadmium telluride films have been electrodeposited for n-CdS/p-CdTe solar cells. Cell efficiency varied considerably from 9.5% to 11.5% for each deposition set. The reverse saturation currents of 9.5% and 11.5% cells at 298 K were 25 and 6.7 nA cm⁻², respectively. The cells with higher efficiency has a lower number of interface states than the less efficient cells. The 11.5% cell had interface states (N_IS) of 3× 10¹⁰ cm⁻² eV⁻¹ at zero volt bias in dark and when it was illuminated with 35 mW cm⁻² light at zero volt bias N_IS increased by two orders to 1.2×10¹² cm⁻² eV⁻¹. At higher frequency the large voltage intercept of the Mott-Schottky plot indicates the existence of the near intrinsic layer of the polycrystalline heterojunction.     

Dye sensitization of antimony-doped CdS photoelectrochemical solar cell

Sb-doped CdS single crystal was used as a photoanode to fabricate a photoelectrochemical solar (PECS) cell. The three organic dyes; eosin, thymol blue and rhodamin 6G were used as sensitizers in (PECS) cell. In the absence of the dye, the results showed that with Sb-doped CdS single crystal electrode, a higher power conversion efficiency 9.27% has been achieved compared to 5.7–7.4% for pure crystal. Application of the dye in PECS cell increases the efficiency to about 13%. The efficiency reaches its maximum value when the dye concentration is (2.5×10⁻⁵)M, sufficient to cover the surface of the semiconductor electrode with a continuous monolayer of the dye. Exceeding this value resulted in a gradual decrease of the efficiency from its maximum value. Mott–Schottky plots gave a doping density of 3.14×10¹⁷ cm⁻³ and a space charge width of 4.95×10⁻⁶ cm for the sample used. A flat-band potential equal to −0.84 V, independent of both frequency and pH, was also predicted. Cyclic voltammetry (c.v.) measurements showed an anodic current peak at 0.4 V vs. SCE. The disappearance of this peak after excess addition of the reducing agent Na₂S, indicates that this peak is due to the PEC corrosion of the semiconductor electrode.     

Photo atomic layer deposition of transparent conductive ZnO films

Low-resistivity ZnO films were grown by photo atomic layer deposition (photo-ALD) technique using diethylzinc (DEZ) and H₂O as reactant gases. Self-limiting growth was achieved for the temperature range from 105°C to 235°C. It was found that UV light irradiation was very effective to increase the electron concentration of the films and the electron concentration of 5 × 10²⁰ cm⁻³ was achieved even in undoped ZnO. Thus, the resistivity of the films grown with UV irradiation was one order of magnitude less than that grown without UV irradiation. The minimum resistivity of 6.9 × 10⁻⁴Ω cm was obtained by photo- ALD method without any intentional doping.     

Effect of copper diffusion on photovoltaic characteristics of CuGaSe2–GaAs cells

CuGaSe₂–GaAs heterojunctions were fabricated by fast evaporation of polycrystalline CuGaSe₂ from a single source on n-type GaAs substrates. The best CuGaSe₂–GaAs photocell (without an antireflective coating) exhibited an efficiency of 11.5%, J_sc=32 mA/cm², V_oc=610 mV and FF=0.60. The spectral distribution of photosensitivity of CuGaSe₂–GaAs junctions extends from 400 to 900 nm. The CuGaSe₂ films were characterized by X-ray diffraction (XRD) and scanning electron microscope (SEM) techniques. XRD analysis indicated that the thin films were strongly oriented along the (1 1 2) plane. SEM studies of CuGaSe₂ films showed nearly stoichiometric composition with grain size about 1–2 μm. The energy dispersive X-ray spectroscopy (EDX) analysis of Cu concentration distribution in n-type GaAs showed that Cu diffused from the film into n-type GaAs during the growth process resulting in formation of the latent p–n homojunction in substrate. The diffusion coefficient of Cu in GaAs at growth temperature (520°C) estimated from EDX measurements was 6×10⁻⁸ cm²/s.     

Low-energy proton irradiation effects on GaAs/Ge solar cells

This paper reports the low-energy proton irradiation effects on GaAs/Ge solar cells for space use. The proton irradiation experiments were performed with a fluence of 1.2×10¹³ cm⁻², energies ranging from 0.1 to 3.0 MeV. The results obtained demonstrate that the irradiation with a proton energy of 0.3 MeV gives rise to the most degradation rates of I_sc, V_oc and P_max of the solar cells with no coverglass, which is related to the proton irradiation-induced vacancies near the pn junction in GaAs/Ge cells. The degradation rates of I_sc, V_oc and P_max of the solar cells with coverglass increase as the proton energy increases due to the cascade ions induced by collision processes. It is found that the coverglass has an obvious protection effect against the irradiation with the proton energy below 0.5 MeV.     

Fabrication of stable hydrogenated amorphous silicon from SiH2Cl2 by ECR-hydrogen-plasma

Relatively stable high bandgap hydrogenated amorphous silicon (a-Si:H) films were prepared by the microwave electron cyclotron resonance (ECR) hydrogen plasma CVD method using SiH₂Cl₂ source gas. The substrate position relative to the position of the generation of reactive species affects the structure of these films. The films prepared under optimized condition showed rather high bandgap, 1.83 eV. However, the defect density was low, 3 × 10¹⁵ cm⁻³, and the photosensitivity was greater than 7 orders of magnitudes. The defect density was found to saturate at relatively low values ( 3 × 10¹⁶ cm⁻³) independent of the illumination intensity.     

Physical properties of Bi doped CdTe thin films grown by the CSVT method

A study of the physical properties of CdTe thin films doped with Bi is presented. CdTe:Bi thin films were deposited by the close space vapor transport (CSVT) technique using powdered CdTe:Bi crystals grown by the vertical Bridgman method. CdTe:Bi crystals were obtained with nominal Bi doping concentrations varying in the 1×10¹⁷–8×10¹⁸ cm⁻³ range. The physical properties of CdTe:Bi thin films were studied performing photoluminescence, X-ray, SEM, photoacoustic spectroscopy and resistivity measurements. We observed a decrease of the resistivity values of CdTe:Bi films with the Bi content as low as 6×10⁵ Ω-cm for Bi concentrations of 8×10¹⁸ cm⁻³. These are meaningful results for CdTe-based solar cells.     

Preparation and properties of CdS/CdTe thin film solar cell produced by periodic pulse electrodeposition technique

CdS/CdTe solar cells have been prepared by periodic pulse electrodepositionmethod. 10.8% efficient cell was made with open circuit voltage (V_oc)≈753mV, short-circuit current (J_sc)≈23.6 mA/cm² and fill factor (FF)≈0.61. Current-voltage-temperature measurments showed the variation of ideality factor (A) from 1.88 at 344 K to 4.49 at 202 K whereas voltage factor (α) was almost constant above 276 K. The junction transport is possibly dominated by a tunneling mechanism. Capacitance measurements gave the value of diffusion potential as 1.2 eV, ionized charged density as 5.9 × 10¹⁵ cm⁻³ and number of interface states (N_IS) as 2.8 × 10¹¹ cm⁻² eV⁻¹ at zero volt bias. Measurements of open circuit voltage (V_oc) with temperature gave the value of barrier height as 1.42 eV.