一种高速片内电流监控器实现

静态电流(IDDQ)测试的实现方法研究是IDDQ测试领域的重要内容之一,高速、高精度是共同追求的目标。通过分析测试向量改变时流过被测电路的电源电流变化情况,得出制约IDDQ测试速度的主要因素。基于此,采用CMOS0.5μm工艺参数、SPICE仿真工具和模拟集成电路设计规则,提出一种快速、高精度的BICS(片内电流监控器)的设计方案。设计中利用辅助的PMOS开关管和延迟电路,有效地解决测试速度问题。设计出的电路达到了100MHz的测试速率、1A测量精度、500mV的最大电源电压降、50μA以上的故障电流检测能力,可以满足一定的实际应用需要。     

Current monitoring circuit for fault detection in CMOS integrated circuit

This article presents a built-in current sensor (BICS), which detects faults using the current testing technique in CMOS integrated circuits. This circuit employs cross-coupled PMOS transistors, which are used as current comparators. The proposed circuit has a negligible impact on the performance of the circuit under test (CUT). In addition, no extra power dissipation and high-speed fault detection are achieved. It can be applied to deep sub-micron processes. The validity and effectiveness are verified through the HSPICE simulation on circuits with faults. The entire area of the test chip is 116×65 μm². The BICS occupies only 41×17 μm² of the area of the test chip. The area overhead of a BICS versus the entire chip is about 9.2%. The chip was fabricated with Hynix 0.35 μm 2-poly-4-metal N-well CMOS process.     

一种带补偿的电流采样电路

采用0.35 μm CMOS工艺,设计了一种电流采样电路。分析了传统senseFET电流采样电路中采样速度与采样范围之间的制约关系。提出了一种带有采样电流补偿的电流采样电路,通过注入补偿电流,加快了采样电路环路响应速度,同时拓展了电流采样下限。该电流采样电路被用于10 MHz开关频率的电流模Buck变换器中。仿真结果显示,所提出的电流采样电路在全负载范围内实现了精确快速的电感电流采样功能。     

Dynamic characterization of Built-In Current Sensors based on PN junctions: Analysis and experiments

The goal of this work is to analyze the performance of PN junction-based Built-in Current Sensors (BICS) for I _DDQ testing. Two types of BIC Sensors are analyzed: one based on a simple PN junction as the sensing element (DBICS), and the other based on a lateral BJT (PBICS). The sensitivity, speed and performance of the BICS are studied by showing their dependence on circuit parameters. Design constraints of such sensors in order to achieve performance criteria on CUT and BICS are analyzed. The dynamic analysis of the BICS is compared with experimental results when the PN junction BICS are used on a CMOS circuit.     

Design and Realization of a Built-In Current Sensor for IDDQ Testing and Power Dissipation Measurement

Built-in current sensor (BICS) is known to enhance test accuracy, defect coverage of quiescent current (I_DDQ) testing method in CMOS VLSI circuits. For new deep-submicron technologies, BICSs become essential for accurate and practical I_DDQ testing. This paper presents a new BICS suitable for power dissipation measurement and I_DDQ testing. Although the BICS presented in this paper is dedicated to submicron technologies that require reduced supply voltage, it can also be used for applications and technologies requiring normal supply voltage. The proposed BICS has been extended for on-line measurement of the power dissipation using only an additional capacitor. Power dissipation measurement is important for safety-critical applications and battery-powered systems. A simple self-test approach to verify the functionality and accuracy of BICSs has also been introduced. The proposed BICS has been implemented and tested using an N-well CMOS 1.2 m technology. Practical results demonstrate that a very good measurement accuracy can be achieved.     

Fault tolerant system based on IDDQ testing

Offline test is essential to ensure good manufacturing quality. However, for permanent or transient faults that occur during the use of the integrated circuit in an application, an online integrated test is needed as well. This procedure should ensure the detection and possibly the correction or the masking of these faults. This requirement of self-correction is sometimes necessary, especially in critical applications that require high security such as automotive, space or biomedical applications. We propose a fault-tolerant design for analogue and mixed-signal design complementary metal oxide (CMOS) circuits based on the quiescent current supply (IDDQ) testing. A defect can cause an increase in current consumption. IDDQ testing technique is based on the measurement of power supply current to distinguish between functional and failed circuits. The technique has been an effective testing method for detecting physical defects such as gate-oxide shorts, floating gates (open) and bridging defects in CMOS integrated circuits. An architecture called BICS (Built In Current Sensor) is used for monitoring the supply current (IDDQ) of the connected integrated circuit. If the measured current is not within the normal range, a defect is signalled and the system switches connection from the defective to a functional integrated circuit. The fault-tolerant technique is composed essentially by a double mirror built-in current sensor, allowing the detection of abnormal current consumption and blocks allowing the connection to redundant circuits, if a defect occurs. Spices simulations are performed to valid the proposed design.     

有限流保护功能的霍尔电流传感器

简单介绍了闭环式霍尔电流传感器的工作原理,在其基础上提出了一种限流保护电路,使得霍尔电流传感器原边电流过载时输出电流钳位,保障其满足3倍甚至更高倍过载要求,并通过了试验验证.     

光学电流传感器的实现方案及其现状

介绍了光学电流传感器的实现原理,各种光学电流传感器的实现方案及其各自的优缺点,同时提 出目前影响光学电流传感器商用化的几个问题及其相应的解决措施。     

一种基于电涡流传感器的数据采集系统

论述并分析了电涡流传感器的基本原理，设计了同被测件相应的电涡流传感器，并完成了测量电路、接口电路的设计和调试，从而完成了基于电涡流传感器的数据采集系统设计。该类系统可用于自动售货机币值的判别和生产线扁平金属工件的多信息采集及自动控制，由于是多信息采集，系统具有更高的准确性。     

A Passive Optical Fiber Current Sensor Based on YIG

A research on passive optical fiber current sensor based on magneto-optical crystal and a new design of light path of the sensor head are presented. Both methods of dual-channel optical detection of the polarization state of the output light and signal processing are proposed. Signal processing can obtain the linear output of the current measurement of the wire more conveniently. Theoretical analysis on the magnetooptical fiber current sensor is given, followed by experiments. After that, further analysis is made according to the results, which leads to clarifying the exiting problems and their placements.     

Current Testing Procedure for Deep Submicron Devices

This paper presents a test technique that employs two different supply voltages for the same IDDQ pattern. The results of the two measurements are subtracted in order to eliminate the inherent sub-threshold leakage. Summary of the experiment carried out on System on a Chip (SOC) device build in 0.35 technology is also shown. These experiments proved that the method is effective in detecting failures not detectable with the single limit IDDQ.     

Design of ICs applying built-in current testing

Built-in Current (BIC) sensors have proven to be very useful in testing static CMOS ICs. In a number of experimental ICs BIC sensors were able to detect small abnormal I _DDQ currents. This paper discusses the design of the circuit under test and Built-in Current (BIC) sensors, which provide: maximum level of defect detectability, minimum impact of BIC sensor on the performance of the circuit under test and minimum area overhead needed for BIC sensors implementation.This research was supported by NSF Grant MIP8822805.     

新型全CMOS片上温度传感器设计

利用阈值电压随温度的线性变化关系,设计并改进了一种基于弛张振荡器的全CMOS片上数字温度传感器,提出了一种新型的基于施密特触发器的全CMOS片上数字温度传感器,用于集成电路的热测试和温度保护.仿真结果表明,文中实现的两种数字温度传感器精度均在1℃以内,而且基于施密特触发器的温度传感器仅使用了19个晶体管,与多数文献的结果相比,晶体管数目至少节省了26.9%.     

高灵敏度的光磁式电流传感器

介绍了结构上带气隙的园环铁芯,采用新型传感元件设计的法拉第效应光磁式电流传感器.该传感器元件是一块经过精细研磨的玻璃棱镜,棱镜的两端面有高反射能力的镀层,经棱镜传播的光束在玻璃/空气界面上会进行20次的临界反射.新设计的电流传感器,其灵敏度比基于类似原理的原设计产品几乎高3倍.     

一种基于微处理器的SOC自测试方案

提出了一种基于片上微处理器和透明路径测试访问的SOC自测试方案。以片上微处理器为测试加载和响应收集比较的主体,构造透明路径并行传输测试数据,以嵌入程序控制测试过程。可以在提高测试速度的同时,降低对测试设备性能的依赖,并可以进行全速测试,所需额外面积开销较小。实验表明,该测试方案是有效的。     

一种光纤电流传感器的设计

针对交流电的特点和传统测试仪器的缺点,以法拉第效应为理论基础,设计了一种光纤电流传感器,介绍了该传感器的工作原理、结构和测试结果.实验结果表明,该电流传感器能准确测量30kA电流,为生活中的大电流测试提供了一种切实有效和更便利的方法.     

全光纤电流传感器目前及今后的发展

本文介绍了全光纤电流传感器的基本原理及目前存在的主要问题,并叙述了提高其稳定性的技术方案和今后的发展。     

光纤电流传感器及其研究现状

本文介绍了光纤电流传感器的分类及其测量原理，光纤电流传感器的研究和实用化过程中的核心问题，同时介绍了在这些研究方面取得的新进展。     

有精准偏置电压输出的霍尔电流传感器

通过介绍开环式霍尔电流传感器的工作原理,在此基础上提出了一种可以输出精准直流偏置电压的直流霍尔电流传感器电路,并通过试验进行了验证.