共查询到20条相似文献,搜索用时 15 毫秒
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静态电流(IDDQ)测试的实现方法研究是IDDQ测试领域的重要内容之一,高速、高精度是共同追求的目标。通过分析测试向量改变时流过被测电路的电源电流变化情况,得出制约IDDQ测试速度的主要因素。基于此,采用CMOS0.5μm工艺参数、SPICE仿真工具和模拟集成电路设计规则,提出一种快速、高精度的BICS(片内电流监控器)的设计方案。设计中利用辅助的PMOS开关管和延迟电路,有效地解决测试速度问题。设计出的电路达到了100MHz的测试速率、1A测量精度、500mV的最大电源电压降、50μA以上的故障电流检测能力,可以满足一定的实际应用需要。 相似文献
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Dynamic characterization of Built-In Current Sensors based on PN junctions: Analysis and experiments
The goal of this work is to analyze the performance of PN junction-based Built-in Current Sensors (BICS) for I
DDQ testing. Two types of BIC Sensors are analyzed: one based on a simple PN junction as the sensing element (DBICS), and the other based on a lateral BJT (PBICS). The sensitivity, speed and performance of the BICS are studied by showing their dependence on circuit parameters. Design constraints of such sensors in order to achieve performance criteria on CUT and BICS are analyzed. The dynamic analysis of the BICS is compared with experimental results when the PN junction BICS are used on a CMOS circuit. 相似文献
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Built-in current sensor (BICS) is known to enhance test accuracy, defect coverage of quiescent current (IDDQ) testing method in CMOS VLSI circuits. For new deep-submicron technologies, BICSs become essential for accurate and practical IDDQ testing. This paper presents a new BICS suitable for power dissipation measurement and IDDQ testing. Although the BICS presented in this paper is dedicated to submicron technologies that require reduced supply voltage, it can also be used for applications and technologies requiring normal supply voltage. The proposed BICS has been extended for on-line measurement of the power dissipation using only an additional capacitor. Power dissipation measurement is important for safety-critical applications and battery-powered systems. A simple self-test approach to verify the functionality and accuracy of BICSs has also been introduced. The proposed BICS has been implemented and tested using an N-well CMOS 1.2 m technology. Practical results demonstrate that a very good measurement accuracy can be achieved. 相似文献
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Badi Guibane Belgacem Hamdi Abdellatif Mtibaa Brahim Bensalem 《International Journal of Electronics》2018,105(6):1025-1035
Offline test is essential to ensure good manufacturing quality. However, for permanent or transient faults that occur during the use of the integrated circuit in an application, an online integrated test is needed as well. This procedure should ensure the detection and possibly the correction or the masking of these faults. This requirement of self-correction is sometimes necessary, especially in critical applications that require high security such as automotive, space or biomedical applications. We propose a fault-tolerant design for analogue and mixed-signal design complementary metal oxide (CMOS) circuits based on the quiescent current supply (IDDQ) testing. A defect can cause an increase in current consumption. IDDQ testing technique is based on the measurement of power supply current to distinguish between functional and failed circuits. The technique has been an effective testing method for detecting physical defects such as gate-oxide shorts, floating gates (open) and bridging defects in CMOS integrated circuits. An architecture called BICS (Built In Current Sensor) is used for monitoring the supply current (IDDQ) of the connected integrated circuit. If the measured current is not within the normal range, a defect is signalled and the system switches connection from the defective to a functional integrated circuit. The fault-tolerant technique is composed essentially by a double mirror built-in current sensor, allowing the detection of abnormal current consumption and blocks allowing the connection to redundant circuits, if a defect occurs. Spices simulations are performed to valid the proposed design. 相似文献
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介绍了光学电流传感器的实现原理,各种光学电流传感器的实现方案及其各自的优缺点,同时提 出目前影响光学电流传感器商用化的几个问题及其相应的解决措施。 相似文献
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Jeong Beom Kim 《International Journal of Electronics》2013,100(10):999-1007
This article presents a built-in current sensor (BICS), which detects faults using the current testing technique in CMOS integrated circuits. This circuit employs cross-coupled PMOS transistors, which are used as current comparators. The proposed circuit has a negligible impact on the performance of the circuit under test (CUT). In addition, no extra power dissipation and high-speed fault detection are achieved. It can be applied to deep sub-micron processes. The validity and effectiveness are verified through the HSPICE simulation on circuits with faults. The entire area of the test chip is 116×65 μm2. The BICS occupies only 41×17 μm2 of the area of the test chip. The area overhead of a BICS versus the entire chip is about 9.2%. The chip was fabricated with Hynix 0.35 μm 2-poly-4-metal N-well CMOS process. 相似文献
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A research on passive optical fiber current sensor based on magneto-optical crystal and a new design of light path of the sensor head are presented. Both methods of dual-channel optical detection of the polarization state of the output light and signal processing are proposed. Signal processing can obtain the linear output of the current measurement of the wire more conveniently. Theoretical analysis on the magnetooptical fiber current sensor is given, followed by experiments. After that, further analysis is made according to the results, which leads to clarifying the exiting problems and their placements. 相似文献
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Built-in Current (BIC) sensors have proven to be very useful in testing static CMOS ICs. In a number of experimental ICs BIC sensors were able to detect small abnormal I
DDQ
currents. This paper discusses the design of the circuit under test and Built-in Current (BIC) sensors, which provide: maximum level of defect detectability, minimum impact of BIC sensor on the performance of the circuit under test and minimum area overhead needed for BIC sensors implementation.This research was supported by NSF Grant MIP8822805. 相似文献
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This paper presents a test technique that employs two different supply voltages for the same IDDQ pattern. The results of the two measurements are subtracted in order to eliminate the inherent sub-threshold leakage. Summary of the experiment carried out on System on a Chip (SOC) device build in 0.35 technology is also shown. These experiments proved that the method is effective in detecting failures not detectable with the single limit IDDQ. 相似文献
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介绍了结构上带气隙的园环铁芯,采用新型传感元件设计的法拉第效应光磁式电流传感器.该传感器元件是一块经过精细研磨的玻璃棱镜,棱镜的两端面有高反射能力的镀层,经棱镜传播的光束在玻璃/空气界面上会进行20次的临界反射.新设计的电流传感器,其灵敏度比基于类似原理的原设计产品几乎高3倍. 相似文献
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本文介绍了光纤电流传感器的分类及其测量原理,光纤电流传感器的研究和实用化过程中的核心问题,同时介绍了在这些研究方面取得的新进展。 相似文献
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本文报道了我们对于全光纤型光纤电流传感器试验样机在户外进行长期稳定性实验的结果。主要是环境温度的起伏对系统各部分的影响。实验结果表明:全光纤型光纤电流传感器其长期稳定性不能满足0.5%测量精度的要求,其主要原因是光纤质量不稳定,长期使用后其性能有较大变化。 相似文献
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霍尔电流传感器在家用电器电气参数测试中的应用 总被引:2,自引:0,他引:2
首先介绍了霍尔器件及两种工作模式的霍尔电流传感器的基本工作原理,然后说明了已研制成功的两种智能化测试仪器——热态电气强度测试仪和接地电阻测试仪的结构组成与应用情况。 相似文献
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《Microelectronics Journal》2003,34(10):919-926
In this paper, we present a built-in current sensor to test operational amplifiers that takes advantage of previous results where the negative supply current has been taken as the test observable using the Oscillation-test technique. The sensor is applied to a variable-length chain of OTAs considering an exhaustive analysis of catastrophic defects (opens, shorts), Gate Oxide Short and Floating Gate defects. We analyse the sensitivity of both frequency and amplitude of the current consumption. Results show that the proposed sensor provides 97% fault coverage, as the previous results suggested. 相似文献
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一种检测冗余故障的瞬态电流测试方法 总被引:1,自引:0,他引:1
数字电路中的冗余故障是不能被传统的电压测试方法(VoltageTesting)和稳态电流测试方法(IDDQTest-ing)检测出来的。根据瞬态电流测试(IDDQTesting)的思想,提出一种检测冗余故障的方法,该方法利用扇出重汇聚结构当中从扇出点到重汇聚点的不同路径的延迟差,在重汇聚点形成冒险,以激活故障并进行传播。实验表明,此方法能够有效地检测冗余故障。 相似文献