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装配式配电站的建设与发展,为电力行业的发展带来了全新的力量,极大地供应了整个社会的用电需求,提高了供电系统的运转水平,也为配电站建设节省了空间,削减了施工程序和周期,减少了环境污染,为整个社会创造了良好的经济效益和环境效益。本文分析了装配式配电站建设的方案、优势、技术以及效益。 相似文献
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提出了一种适合VoWLAN技术DEDCA接入机制,引入了信道状态CS因子,提出了基于信道状态的动态的退避窗口机制和一种新的退避方式.确立了退避窗户最大值和最小值的与信道关系的公式,确立了退避方式阀值的公式,最后通过进行了仿真,DEDCA不但对视频和音频有QoS保证,整个信道的性能都提高了,验证了DEDCA的正确性和适合在VoWLAN技术中的应用. 相似文献
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文中研究了基于分形稳定运动有效带宽的计算方法,利用迭代过程推导出了聚合流有效带宽的计算公式,提出了一种基于有效带宽的公平性的自相似业务接纳控制算法,在接纳判断过程中引入了公平性机制,保证了业务接纳的公平性,通过MATLAB和OPNET相结合的仿真方法证明了该算法的有效性.结果证明了文中提出的算法保障了网络的服务质量,保证了各业务接纳的公平性,同时保持了网络高的利用率. 相似文献
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阐述了该光学系统研究的意义,确定了基本设计原则。然后进行了平行光管和望远镜的高斯光学结构模型及设计,建立了具体的数学模型并进行求解。最后根据目标耦合光路结构,利用ZEMAX软件对该光学系统进行了优化设计,对优化结果进行了像质评价,得出了结论。该系统解决了红外光学精确制导系统动态跟踪特性的内场测试的一系列问题,促进了红外黑体跟踪目标地面等效测试的发展,对提升仿真试验技术能力提供了重要的硬件支撑。 相似文献
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介绍了Struts的框架模式以及流程,XML和XSLT的特点,分析了目前Struts的框架的优缺点,提出了新的改进方法,给出并分析了改进方法的流程图,还讲解了新方案的核心类的实现。重点讲解了如何用XSLT和XML改进Struts,最后阐述了改进后的优势。 相似文献
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给出了测试转台电控系统的组成,着重讨论了伺服控制单元的设计,详细介绍了伺服主控模块的设计和对外接口,分析计算了转台负载力矩,并由此给出了伺服电机的选型,简要介绍了系统的电源设计。最后研制出了测试转台样机,给出了测量误差,对类似工程设计具有一定的参考意义。 相似文献
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“我有一个梦想:某一天三大运营商员工不摆摊了,不打架了,员工年收入差距缩小了,前端营业员待遇提高了,后端装维与资源矛盾化解了,服务质量提高了,恶性竞争消除了,重复建设停止了,不再破坏对手广告了,不互挖墙角搞策反了,不再零元购机了,不打价格战了,都能活的有尊严了”. 相似文献
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空间用元器件热真空试验是空间环境模拟试验中非常重要的一项试验,文章通过对空间用元器件热真空环境应力的分析,给出了不同轨道的温度范围以及不同真空度下空间用元器件的物理效应;对空间用元器件热真空试验评价方法进行了研究和探讨,在参照组件、分系统、整星热真空试验方法的基础上,提出了器件级热真空试验程序。介绍了已开展的DC/DC混合集成电路和双向收发器单片集成电路的热真空试验情况和试验结果。试验结果表明,通过热真空试验,可以对空间用元器件热真空环境下的性能和可靠性进行试验评价,为航天用户单位合理选用空间用元器件提供科学依据。 相似文献
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刘鸿雁 《固体电子学研究与进展》1983,(3)
本文提出了处理步进应力加速寿命试验的“时间等效”数学模型,并用它把寿命分布服从对数正态分布(或威布尔分布)、有m步的一次步进应力加速寿命试验变为有m级应力的恒定应力加速寿命试验来分析处理.并且推导出了它们之间的变换计算公式.用本法处理质子轰击隔离WC56型砷化镓场效应管步进应力加速寿命试验,获得了满意的结果. 相似文献
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Electromagnetic shielding tests in the 1- to 1O-GHz frequency range have been characterized by lack of repeatability and reliability. New test methods have been developed which correct most of the causes of erratic behavior and have been found to provide reasonably smooth curves when results are plotted against frequency. Study of the results obtained under various conditions of test indicates that the test procedures approach the desired goal of providing a measure of shielding effectiveness that is related only to the test item itself. The cable test procedures are usable with any type of shielded cable including multiple conductor cables with connectors not intended for RF usage. Cables may be tested in their final configuration without need for modification or removal of insulation, etc. Results are given for tests made under various conditions and are compared with results obtained previously with the triaxial test method. Evaluation of the test procedure for testing small shielded enclosures was performed by testing suitable boxes equipped with leakage openings that could be moved to various points on the surface of the box. The results indiate that the general effect on shielding of a particular type of opening remains much the same regardless of its location or orientation. Results are given for a number of opening designs under various conditions of test. 相似文献
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A novel low-cost platform for prototyping and characterizing the performance of digital circuit intellectual properties (IPs) has been developed. Compromised of several HW/SW components, it allows developers of circuit IPs to verify the functionality of any number of IPs on the same prototype chip and characterize their speeds without the need for any expensive test equipment special/custom IP-wrappers, or high-speed test board design. A complete prototype of the proposed platform has been realized and successfully used to test a prototype IC fabricated in a 150 nm technology with frequencies up to 2.1 GHz. Design conditions/constraints for portability to any fabrication process have been developed and verified using measurements from the fabricated IC. 相似文献
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Accelerated life testing provides a necessary tool for reliability validation but is generally very time-consuming as standard test take up to 2000 hours to proceed. In this article, results on the early stages of the ageing of pHEMT transistors are presented and it is shown that the necessary test time can be decreased from 2000 hours to 144 hours without loss of data confidence. This has been enabled by the application of an insitu measurement method where the ageing of the device under test is characterized during the stress phase. Two main degradation factors can be identified in good agreement with findings reported in literature. The data have been successfully correlated with standard test results performed on a 2000 hours time scale. 相似文献
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利用MATLAB的S-函数与Simulink模块,编制高低温环境试验设备中的单部件仿真模块并链接为仿真系统,以此来对高低温环境试验进行数字仿真,并给出实例与对比分析. 相似文献