MBE法生长ZnO纳米线阵列的结构和光学性能

在氧等离子体辅助的MBE系统中, 以1 nm厚的Au薄膜为催化剂, 基于气?液?固(VLS)机制实现了低温ZnO纳米线阵列在Si(111)衬底表面的生长. 通过场发射扫描电子显微镜(FE-SEM)可以观察到, ZnO纳米线阵列垂直生长在衬底上, 直径为20~30 nm. X射线衍射(XRD)和高分辨透射电镜(HRTEM)结果表明: ZnO纳米线为六方纤锌矿结构, 具有沿c轴方向的择优取向. 光致发光(PL)谱显示在380 nm附近有强烈ZnO本征发射峰, 475~650 nm可见光区域有较强的缺陷导致的发射峰.     

氮掺杂ZnO纳米阵列的制备和电学特性

采用化学气相沉积 （CVD） 法,以高纯ZnO和活性C混合粉末为原料,以NH3为掺杂气体,在Si （111）衬底上制备了N掺杂的ZnO纳米线阵列,用X射线衍射仪 （XRD）、扫描电镜 （SEM）、拉曼光谱对样品进行分析,结果表明, 氮气的掺杂过程对生长N掺杂的ZnO纳米线阵列有一定的影响。除此之外,N掺杂的ZnO纳微米p-n结被合成,表现出很明显的整流特性。     

ZnO缓冲层上低温生长Al掺杂的ZnO薄膜

采用射频磁控溅射法在ZnO缓冲层上制备了不同Al掺杂量的ZnO（AZO）薄膜。利用X射线衍射（XRD）、扫描电子显微镜（SEM）和光致发光（PL）等表征技术,研究了AZO薄膜的微观结构、表面形貌和发光特性。结果表明,随着Al掺杂量的增加,ZnO薄膜的择优取向性发生了改变,且当Al的掺杂量为0.81%（原子分数）时,（002）衍射峰与其它衍射峰强度的比值达到最大,表明适合的Al掺杂使ZnO薄膜的择优取向性得到了改善。在可见光范围内薄膜的平均透过率超过70%。通过对样品光致发光（PL）谱的研究,发现所有样品出现了3个发光峰,分别对应于以444nm（2.80eV）、483nm（2.57eV）为中心的蓝光发光峰和以521nm（2.38eV）为中心较弱的绿光峰。并对样品的发光机理进行了详细的探讨。     

反应源温度对ZnO纳米线阵列定向性及发光性能的影响

以Au薄膜为催化剂、ZnO与碳混合粉末为反应源,采用碳热还原法在单晶Si衬底上制备了ZnO纳米线阵列.通过扫描电子显微镜( SEM)、X射线衍射仪(XRD)、荧光分光光度计对样品的表征,研究了反应源温度对ZnO纳米线阵列的定向性和光致发光性能的影响.样品在源温度920℃条件下沿(002)方向择优生长,定向性最好,温度过低不利于ZnO纳米线阵列密集生长,而温度过高导致Zn原子二次蒸发,因而也不利于纳米线阵列的定向和择优生长;样品在源温度880℃有最强的近紫外带边发射,表明温度过高和过低都不利于ZnO晶体结构的优化;由于ZnO纳米线在缺氧氛围下生长,氧空位是缺陷存在的主要形式,因此所有样品都有较强的绿光发射.温度升高导致纳米线生长速度提高而增加了氧空位缺陷数量,从而使样品绿峰强度增强并在源温度920℃时达最大值,但温度的进一步升高可导致ZnO纳米线表面Zn元素的蒸发而降低氧空位缺陷的数量,从而抑制绿峰强度.     

ZnO同质p-n结的研究

调节反应气体中O2的比例和RF电源的功率可以增加本征施主V0的形成焓,降低本征受主VZn和Oi的形成焓,制备出p型ZnO薄膜;采用掺杂金属Al制备出低电阻n型ZnO薄膜,在此基础上得到性能可观的ZnO同质p-n结.     

纳米氧化锌掺铝薄膜的微观结构研究

采用溶胶-凝胶(sol-gel)法在玻璃衬底上制备了纳米ZnO掺铝薄膜,利用X射线衍射仪(XRD)和透射电镜(TEM)对薄膜的微观结构进行了系统的研究。结果表明,所有在玻璃衬底上生长的ZnO薄膜均具有c轴择优取向。掺杂量为2%(原子分数)时,Al在ZnO薄膜中达到最高水平。过量Al掺杂明显减弱薄膜的c轴择优取向。随着Al掺杂量的增加,ZnO晶粒进一步细化。其原因是未进入ZnO晶格的Al以非晶Al2O3的形式在ZnO晶界上形成了对晶界运动的钉扎,从而阻碍了ZnO晶粒进一步长大。     

ZnO纳米线阵列的图形化生长

采用光刻和射频磁控溅射技术在Si衬底上制备了图形化的ZnO种子层薄膜。分别采用气相榆运和水热合成法，制备了最小单元为30μm的图形化的ZnO纳米线阵列。X射线衍射（XRD）分析显示单晶纳米线阵列具有高度的c轴[001]择优取向生长性质，从扫描电子显微镜（SEM）照片看出，阵列图形完整清晰，边缘整齐，纳米线阵列在室温下光致发光（PL）谱线中在380hm左右具有强烈的紫外发射峰，可见光区域发射峰得到了抑制，证明ZnO纳米线阵列氧空位缺陷少，晶体质量高。     

氧化锌薄膜的拉曼光谱研究

利用拉曼光谱结合X射线衍射分析对未掺杂和掺杂的ZnO薄膜，陶瓷薄膜进行了研究，ZnO薄膜及ZnO陶瓷薄膜均由sol-gel法制备，掺杂组份有Bi2O3,Sb2O3,MnO和Cr2O3等。结果表明，未掺杂的薄膜的ZnO主晶相均表现出显著的定向生长特征，其拉曼光谱特征谱峰为437cm^-1，谱峰强度随薄膜退火温度的提高略有增强，掺杂后ZnO的拉曼谱峰发生了红移，掺Bi2O3后ZnO的拉曼谱峰由347cm^-1移质移至434cm^-1，掺Sb2O3后ZnO的拉曼谱峰移至435cm^-1，而掺杂Bi2O3,Sb2O3,MnO和Cr2O3等组份的ZnO陶瓷薄膜的ZnO拉曼谱峰则移至434cm^-1，说明掺杂元素进入了ZnO晶格，引起了晶格的变化，ZnO薄膜性能不仅受次晶相组成的影响，而且受因掺杂元素进入而引起的ZnO晶格畸变的影响。     

Sn掺杂ZnO半导体纳米线的制备、表征及光学性能

采用化学气相沉积法获得了Sn掺杂含量约为2.4%(原子分数)的Sn掺杂ZnO半导体纳米线。X射线衍射结果表明,Sn的掺杂并没有改变ZnO的纤锌矿结构。掺杂纳米线的室温光致发光光谱在409.2nm和498.0nm处出现了蓝绿光发光峰。探讨了其发光机制,认为前者可能来源于从导带到Zn空位形成的浅受主能级的跃迁以及从氧空位形成的浅施主能级到价带的跃迁;而后者来源于从氧空位形成的浅施主能级到锌空位浅受主能级的跃迁。     

Al掺杂ZnO薄膜的微结构及光学特性研究

采用射频磁控溅射方法在玻璃衬底上制备出不同Al掺杂量的ZnO(AZO)薄膜。利用X射线衍射(XRD)、扫描电子显微镜(SEM)和光致荧光发光(PL)等系统研究了不同Al掺杂量对ZnO薄膜的结晶性能、表面形貌和光学特性等的影响。结果显示,随着Al掺杂量的增加,薄膜的(002)衍射峰先增强后减弱,同时出现了(100)、(101)和(110)衍射峰,表明我们制备的AZO薄膜为多晶纤锌矿结构,适量的Al掺杂可提高ZnO薄膜的结晶质量,然而AZO薄膜的表面平整、晶粒致密均匀。薄膜在紫外-可见光范围的透过率超过90%,同时随着Al掺杂量的增加,薄膜的光学带隙值先增大,后减小。这与采用量子限域模型对薄膜的光学带隙作出相应的理论计算所得结果的变化趋势完全一致。     

Formation of novel homojunction device using p-type ZnO:Co shell coating on n-type ZnO nanowires

P-type ZnO:Co thin film was spin coated onto n-type ZnO nanowire arrays to form a novel ZnO homojunction device using a fully solution-based process. The optoelectronic and structural properties of the homojunction device were extensively characterized by using scanning electron microscopy, X-ray diffraction, energy dispersive spectroscopy and photoluminescence emission measurement and current voltage measurement. It was found that the applied ZnO:Co coating bundles the nanowires together and suppress surface defects on the nanowire. Dark and illuminated device confirms the pn junction formation and its light sensitivity properties.     

Growth of high quality ZnO nanowires on graphene

We report growth of the ZnO nanowires on graphene/SiO2/Si substrates using a chemical vapor deposition method. The length of nanowires varies from 1 microm to 10 microm with increasing the growth time from 30 min to 90 min. X-ray diffraction and high-resolution transmission electron microscopy investigations predict the high structural quality of the c-axis grown single crystalline ZnO nanowires. Temperature dependent photoluminescence spectra from the nanowires reveal excellent optical quality and excitonic behavior in the single crystalline ZnO nanowires. A well-resolved free exciton emission at 3.375 eV, indicates high crystalline quality nanowires and a strong PL peak at 3.370 eV is assigned to neutral-donor bound excitons (D0X).     

Structure, photoluminescence and wettability properties of well arrayed ZnO nanowires grown by hydrothermal method

Well aligned ZnO nanowire arrays with high crystal quality were grown on Si substrates at a low temperature (50 degrees C) by hydrothermal method using a pre-formed ZnO seed layer. ZnO seeds were prepared via radio-frequency magnetron sputtering onto Si substrates. The morphologies of the ZnO nanowire arrays were shown by field emission scanning electron microscopy. X-ray diffraction spectra showed that the full width at the half maximum of the (0002) peak of the nanowire arrays without any heat treatment was only 0.07 degrees, indicating very high crystal quality. Furthermore, the room-temperature photoluminescence spectra of the ZnO nanowire arrays exhibited excellent UV emission. The special micro/nano surface structure of the ZnO nanowire arrays can enhance the dewettability for surfaces modified via low surface energy materials such as long chain fluorinated organic compounds. The surface of the ZnO nanowire arrays is also found to be superhydrophobic with a contact angle of 165 degrees +/- 1 degrees, while the sliding angle is 3 degrees.     

Synthesis of ZnO nanowires by the hydrothermal method,using sol–gel prepared ZnO seed films

Zinc oxide (ZnO) nanowires with various morphologies are synthesized by the hydrothermal method on silicon substrates coated with ZnO thin films. The ZnO films are used as the seed layer and are prepared using the sol–gel technique. Experimental results demonstrate that the synthesis of ZnO nanowires is dependent on the crystalline properties of the ZnO seed-layer films. Sol concentration is the controlled parameter for the preparation of ZnO seed-layer films in this study. The ZnO films are found to have the hexagonal wurtzite structure with highly preferred growth along the c-axis at suitable sol concentrations. The vertically aligned ZnO nanowire arrays on the substrates are believed to be the result of the epitaxial growth of the ZnO seed layer. Scanning electron microscopy shows that nanowires with uniform distribution in length, diameter, and density are obtained. X-ray diffraction patterns clearly reveal that the ZnO nanowires are primarily grown along the c-axis direction. Transmission electron microscopy and selected-area electron diffraction measurements show that the nanowires have good crystalline properties. The well-aligned and high surface areas of the ZnO nanowires make them a potential candidate for applications in solar cells, field emission devices, and ultra-sensitive gas sensors.     

Characterization of ZnO nanowires grown on Si (100) with and without Au catalyst

ZnO nanowires were grown on Si (100) substrates with and without Au catalyst by chemical vapor deposition employing the vapor-liquid-solid (VLS) and vapor-solid (VS) mechanisms, respectively. The diameters of the resulting nanowires were in the range 80-150 nm with typical length about 10 μm. The near-band-edge (NBE) emission of ZnO nanowires grown with and without catalyst was observed at 382 nm and 386 nm, respectively. The intensity of the NBE emission of ZnO nanowires grown without the catalyst was higher than that of the green luminescence. By sharp contrast, the intensity of the NBE emission of ZnO nanowires grown with catalyst was lower than that of green luminescence. The X-ray diffraction (XRD) spectrum of the ZnO nanowires grown without catalyst exhibited a peak intensity of c-plane 5 times higher than that of m-plane and 10 times higher than that of a-plane. However, the XRD spectrum of the ZnO nanowires grown with catalyst exhibited a peak intensity of the c-plane about 1.5 times higher than that of the m-plane and 4 times higher than that of a-plane intensity. Thus, the ZnO nanowires grown without catalyst have a preferential orientation along the c-axis direction. Our results show that the catalyst strongly effects optical and structural properties of the ZnO nanowires.     

ZnO纳米线的制备及场发射特性的研究进展

从ZnO纳米线的生长机制出发,重点讨论了催化剂在制备过程中的作用,比较了采用VLS和VS不同机制生长ZnO纳米线的优缺点,并结合二者特点发现采用金属自催化将是制备高质量ZnO纳米线阵列的一种有效方法.分析了几种有利于提高其场发射性能的后处理方法,经过适当的后处理ZnO纳米线晶体的结构将更加完善,场发射开启场、阈值场将进一步降低,电流密度和场增强因子也将随之大大提高.     

Field emission performance of SiC nanowires directly grown on graphite substrate

Lawn-like SiC nanowire arrays were successfully synthesized on graphite substrates by thermal evaporation of silicon powders at high temperature. The morphology, microstructure and composition of the nanowires were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD) and transmission electron microscopy (TEM) measurements. The product grown on graphite substrates was hexagonal prism-shaped single-crystal 3C-SiC nanowires with high aspect ratio. Planar defects, such as microtwins and stacking faults were observed in SiC nanowires. Field emission measurements of the SiC nanowires grown on graphite substrate showed a very low threshold field of 2.1 V μm⁻¹, high brightness and stable field emission performance.     

Growth of Zn(1_x)Mg(x)O and Zn(1_x)Cd(x)O nanowires and the application in light emitting devices

Magnesium and Cadmium doped ZnO nanowires were successfully grown by Chemical Vapor deposition method in a tube furnance. Photoluminescence spectra show that the band gap of ZnO nanowire has been tuned from 4.00 eV to 2.08 eV by Magnesium and Cadmium doping. Transmission Electron Microscopy and X-ray diffraction characterization analysis indicate that most of the formed nanowires are single crystalline with good quality. Zn(1-x)Cd(x)O nanowire sample was used for heterojunctional light emitting diode fabrication. Electroluminescence measurement yields a strong emission peak at 553 nm from the Zn(1-x)Cd(x)O nanowire.