共查询到13条相似文献,搜索用时 62 毫秒
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张建华 《机械工人(热加工)》2007,(3):43-45
波形弹簧是安装在高压柱塞主轴上的一个较为重要的零件,它与主轴端面密封结构相连,上端是V形密封圈和V形密封环,下端是石墨环和钢套,在主轴运转时处于受压状态。零件尺寸如图1所示。 相似文献
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硅对原位反应自生Mg_2Si/ZM5复合材料热处理态的组织和性能的影响 总被引:2,自引:0,他引:2
在真空感应炉中氩气保护下制备材料,用OM,SEM,EDAX及拉伸试验,探讨硅对原位反应自生Mg2Si /ZM5复合材料T6热处理后显微组织和性能的影响规律。结果表明,反应添加物Si在ZM5合金中形成了高熔点、高硬度的Mg2Si强化相,时效处理可促进(Mg17Al12)相沿晶内连续析出,明显地提高了材料的室温与高温强度,如含1.5%Si的复合材料经T6处理后室温屈服强度提高幅度为28.7%,高温抗拉强度与屈服强度提高幅度分别为9.3%、14.0%;此外Mg2Si相的形貌随着硅含量的不同而变化,如含Si 0.5%为时,主要形成细小短棒状或片状共晶Mg2Si相,Si>1%时,则出现了粗大块状或汉字状初生Mg2Si相和片状或短棒状的共晶Mg2Si相;Mg2Si相是一种脆性相,使得该材料呈现出解理断裂,降低了材料的塑性。 相似文献
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采用往复挤压工艺细化Mg-4Al-2Si(AS42)镁合金组织,研究了挤压过程中Mg_2Si颗粒的细化效果、破碎特征、分布规律及破碎机制。结果表明:从铸态到挤压8道次态,随挤压道次的增加,颗粒不断细化,均匀度和弥散度逐渐提高;挤压11道次时,颗粒发生粗化;合金在400℃、应变速率0.01s~(-1)条件下的压缩峰值应力约为75MPa,大于Mg_2Si颗粒的断裂应力(48MPa),挤压使颗粒发生开裂;随挤压道次的增加,位错密度逐渐增大,位错在Mg_2Si颗粒处的数量增多,应力集中急剧增大,从而导致颗粒发生破碎。 相似文献
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朱正德 《机械工业标准化与质量》2008,(11):33-35
本文通过分析和实例指出,在完善了SPC过程能力评估的基础上,如何进行有针对性的质量改进,以有效地提高生产过程的运行质量。文章阐述了这样一个观点:贯彻SPC时所采集样本的实际分布情况和样本的单值进程图。在实施过程实时监控中有着极为重要的作用。 相似文献
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采用化学分析、断口扫描和金相检验方法,对60Si2Mn圆钢在试用过程中出现的频繁疲劳、断裂进行了分析。60Si2Mn圆钢脆断的原因是由于热处理不当,使淬火组织过烧,造成弹簧圆钢综合性能差而引起的。 相似文献
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HAO Xuhong LIU Changming PAN Dengliang College of Material Science Engineering Chongqing University Chongqing China 《机械工程学报(英文版)》2011,(4):656-660
Al-Si pistons are frequently damaged by burning piston top surface due to elevated combustion temperature, and by rubbing the first ring groove against the engine cylinder liner. To prevent piston from these damages, some technologies were invented, such as mounting high Ni cast iron ring around the first ring groove in Al alloy piston body and thermal resistant steel on piston top surface, and fabricating Al composite pistons by squeeze casting for enhancing the whole or local piston performance. In this paper, composite pistons locally reinforced with in situ primary Si and primary Mg2Si particles are fabricated by centrifugal casting. The microstructure characteristics, hardness and wear resistance of the composite piston are investigated and the motion characteristic of the in situ particles in centrifugal field is analyzed. The results of the experiments show that primary Si and Mg2Si particles mix up with each other in melt and segregate at the regions of piston top and piston ring grooves under the effect of centrifugal force. Particulate reinforced regions have a higher hardness and better wear resistance compared with the unreinforced regions and this performance increases after heat treatment. The analysis result of particle movement shows that, primary Si and primary Mg2Si particles move at approximately the same velocity in the centrifugal field, because of the growth of primary Si and fusion after colliding between primary Si particles, which compromised the velocity difference of primary Si and primary Mg2Si particles caused by the difference of their densities. Research results have some theory significance and applicative value of project in development of new aluminum matrix composites piston products. 相似文献
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利用XPS能很好地分辨出硅基纳米硅-氧化硅膜层中的n-Si和n-SiO2。对Si2P峰进行的拟合处理,可计算出n-Si和n-SiO2的含量,其结果与RF-磁控溅射沉积薄膜中所用的复合靶Si和SiO2的面积比基本一致。 相似文献
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We apply scanning tunnelling microscopy and tunnelling spectroscopy to study the initial stages of CaF2 epitaxy on Si(111)-(7×7) for a range of deposition temperatures. We find that deposition at surface temperatures <700°C leads to CaF2 clustering. At temperatures between 750 and 800°C two new structures, a 2×3 and a (√3 X √3***)R30°, are observed. Tunnelling spectra and topographs obtained at different energies allow us to measure interface band gaps, and determine the valence state of Ca bonded directly to silicon and the valence state of Ca in the second layer. More importantly, we demonstrate that STM can be used to image thick insulating layers of CaF2 by tunnelling into the conduction band of the films. One of our goals in this study has been to test the ability of STM to image insulating multilayers. It is generally believed that STM cannot be applied to insulators. We find, however, that despite the large band gap of ~12 eV, the CaF2 conduction band is accessible, and that insulating films can be imaged by STM. 相似文献