基于25 nm FinFET结构的SRAM单粒子效应研究

对基于25 nm FinFET结构的SRAM单粒子效应进行研究。使用Synopsys Sentaurus TCAD仿真软件进行器件工艺校准,并对独立3D FinFET器件以及包含FinFET器件和HSpice模型的混合电路(如6管SRAM单元)进行单粒子瞬态仿真。通过改变重粒子入射条件,分析影响瞬态电流峰值、脉宽、漏极翻转阈值等参数的因素。研究发现,混合模型中,FinFET结构器件的漏极翻转阈值为0.023 MeV·cm²/mg,对未来基于FinFET结构的器件及电路结构的加固提出了更高的要求。     

基于遗传算法的开关电流存储电路的设计

针对开关电流存储电路存在固有误差和电路器件参数需要大量手工迭代计算等难题,提出基于遗传算法的开关电流存储电路设计方法.其主要思想是以Class AB栅极接地存储电路为基础,对其进行小信号模型分析,借助遗传算法对电路的电荷注入误差和时间响应性能进行多目标优化,获取电路中器件参数的最优Pareto解.采用0.5μm CMOS工艺参数,对电路进行PSPICE仿真测试.结果表明,优化设计的电路具有存储精度高、响应速度快等优点.     

FET宽带小信号等效电路的研究

介绍了一种确定宽带FET小信号等效电路参数的一种方法。该方法基于FET内部器件的Y参数(Z参数)进行分析,从中得到与频率无关的等效电路参数(电容、电感、电阻值),根据模型可以得到任意指定频率下的电路等效模型或某频带内的参数均值。通过仿真测试,该等效模型在高达25 GHz频带范围频率变化,器件参数保持恒定,并与实际器件工作状况非常吻合。     

用于柔性显示的有机薄膜晶体管像素驱动电路

文中建立一种基于有机半导体TFT器件的模型,并将其应用于基于有机TFT的AMOLED显示背板驱动电路设计,以实现阈值电压补偿功能。首先制备低压有机TFT器件,并利用PSPICE工具对有机TFT器件进行建模;然后详细分析选取模型参数,建立能够准确反映器件电学特性的模型;最后基于模型指导,设计采用有机TFT的7T1C结构的AMOLED像素驱动电路。此外,分析有机TFT器件具有的温度依赖迁移率特性对屏幕亮度均匀性产生的影响。仿真结果表明：AMOLED像素驱动电路可有效实现对TFT器件阈值电压的补偿;且屏幕亮度不一致率低于5%,远低于传统的2T1C像素驱动电路,可大幅降低屏幕亮度的不均匀性。文中建立的有机TFT模型也可为其他基于有机器件的电路设计提供指导。     

一种面向SOC的衬底噪声宏模型

针对SOC中常见的衬底噪声耦合问题,通过将器件模拟与拟合法相结合,基于0.25 μ m CMOS工艺提取衬底结构参数建立了电阻宏模型.该模型被应用于CMOS放大器电路,利用Hspice进行仿真,仿真结果表明,该模型从时、频域角度都能较好地表征出衬底噪声对模拟电路性能的影响,对深亚微米混合信号电路设计具有重要的指导意义.     

阻变型非易失性存储器单元电路结构设计与Spice仿真

为进一步确定阻变型非易失性存储器的擦写速度、器件功耗和集成度等实用化的性能指标,设计RRAM存储器单元电路结构,并使用HSpice软件分别对RRAM存储器单元结构电路的延时和功耗性能进行仿真.同时,通过仿真对双极型和单极型两种电阻转变类型及器件工艺进行比较和分析,确定1T1R结构电路单元适用于双极型阻变型非易失性存储器件,并且电路仿真的结果为阻变型非易失性存储器的进一步实用化提供了参考.     

基于BSIM3模型的毫米波MOS变容管建模

提出了应用于毫米波段的MOS变容管的建模方法。针对标准0.18μm CMOS工艺,采用2D器件仿真软件MINIMOS,设计实现了积累型MOS变容管;并提出和分析了基于标准BSIM3模型的MOS变容管的等效电路模型;通过MINIMOS仿真,直接提取电路模型各寄生参数。该模型能方便地在电路设计软件中实现,并能预测最高达40 GHz频率范围内的变容管特性。     

一种简单可靠离散量信号电路的设计和实现

基于目前航空电子设备离散量输入/输出电路实现复杂,分立器件多,高低温下参数不一致等现象,通过对比分析典型离散量电路,提出了一种简单、高可靠性的离散量信号电路设计,同时由于典型离散量输出电路故障率较高,提、出了一种离散量输出信号的过流保护电路设计思路,采用电路仿真软件Multisim进行了功能仿真、容差分析,在实际工程应用中各项实验结果证明,该电路满足实际使用要求,具有很高的稳定性和可靠性.     

射频宽带低噪声放大器的设计与仿真

介绍了一种射频宽带低噪声放大器的设计过程,包括稳定性分析、偏置电路设计和匹配电路设计等内容.设计采用E-PHEMT晶体管(ATF-55143)器件模型和其他元件模型.通过采用ADS技术进行电路和电磁仿真,结果表明设计的放大器完全满足性能指标要求.     

BUCK DC/DC变换器最优化设计

为了设计出高性能的开关电源,选择性能更为优越的功率半导体器件,改进电路拓扑结构,选择和改进控制电路的控制方式,优化器件的排列布局等成为必然途径.从BUCK DC/DC变换器的基本工作原理着手,设计了主电路参数,运用非线性规划技术对该电路进行优化设计,得到最优化模型,然后运用ORCAD PSPICE软件对电路进行仿真,仿真结果表明:运用最优化设计所体现的优越性明显,提高电路设计质量.     

A Modified Simulation-Based Multi-Signal Modeling for Electronic System

Multi-signal model is an effective modeling method applicable to large scale complex system. In this paper, an improved simulation-based modeling method for parametric fault is put forward. Two times of Monte-Carlo simulation are done in normal tolerance. Based on the estimated sample variance obtained from the first Monte-Carlo simulation, the analysis runs of the second Monte-Carlo is determined empirically to reduce the simulation cost. Then the statistical distribution of data from the second Monte-Carlo simulation is judged qualitatively by normality test. After that, an adaptive method is adopted to estimate the threshold range for signal feature in normal state, which can improve modeling precision. At last, the effectiveness of the proposed method is verified and the performances are compared to manifest the advantage of the proposed method. The work in this paper is valuable for future further research of complex system test and diagnosis based on multi-signal.     

基于BiCMOS宽动态可变增益放大器的设计

基于栅压控制MOS管等效电阻实现放大器输出电阻和射极电阻同时改变的原理,构造一种新型可变增益放大器,通过控制电路和稳压电路提高了增益动态范围和电路稳定性。采用UMC0.5μm BiCMOS工艺,使用HSpice软件仿真,结果表明该放大器可在0－70μA的较小控制电流下实现增益在0－66dB宽范围内连续变化,带宽超过73MHz,具有良好的线性度。     

基于PSpice的电路优化设计方法的研究与应用

提出了一种将PSpice的参数扫描分析和优化分析结合起来对电路进行最优化设计的新方法．即先用参数扫描分析实现电路的次优化设计．再用优化分析实现电路的最优化设计。给出了应用该方法实现带通滤波器电路最优化设计的流程和仿真结果，实验结果表明滤波器电路的最优化设计不仅能完全满足性能指标的要求，而且还可以降低优化迭代运算和仿真执行的次数，提高优化设计的效率和准确性，同时也验证了该方法对电路进行最优化设计是有效和可行的。     

Mass characterisation of organic transistors and Monte-Carlo circuit simulation

We present a method for designing organic circuits using Monte-Carlo based circuit simulation. The organic devices suffer from mismatch and variations that are due to systematic and random fluctuations in the process and material characteristics. In this work, we have used the variable range hopping model to extract the model parameters using a mass characterisation technique. The parameter fluctuations of organic transistors are taken into account and process corners determined based on static (noise margin) and transient (delay) characteristics. Thus a methodology is developed to find the parameter range of individual devices, within which the circuits are having good performance, for instance inverters working with desired noise margin. We also found out the critical parameters of the transistor, that predominantly affects the static and transient performance of an inverter. These critical parameters can be provided as input to the process engineers to fine tune the process. This information can also be used in developing robust circuit design techniques, which can overcome the variation effects of these critical parameters. Thus, a mass characterisation of transistors combined with the proposed method, allows robust circuit design in the presence of huge process variations.     

Finite-Point-Based Transistor Model: A New Approach to Fast Circuit Simulation

In this paper, a new approach of transistor modeling is developed for fast statistical circuit simulation in the presence of variations. For both the I-V and C-V characteristics of a transistor, finite data points are identified based on their physical meanings and their importance in circuit operation. The impact of process and design variations is embedded into these key points using analytical expressions. During the simulation, the entire I -V and C -V curves are interpolated from these points with simple polynomial formulas. This novel approach significantly enhances the simulation speed with sufficient accuracy. The model is implemented in Verilog-A to support generic circuit simulators. The accuracy and convergence of the proposed model are comprehensively evaluated through a set of benchmark circuits, including nand, a pass-gate, latches, AOI, ring oscillators, and an adder. Compared to SPICE simulations with the BSIM models, the simulation time can be reduced by 7 times in transient analysis and more than 9 times in Monte-Carlo simulations.     

GaAs IC虚拟实验室

本文介绍一个用来设计及研究GaAs器件及其IC,且具有良好的图形交互界面的IC-CAD软件,它可以完成诸如示波、扫频、频谱、阻抗与电平测量、信号源发生等传统实验室中的各种硬件功能,对GaAs器件及其各类微波集成电路的分析、设计与开发有着重要意义.     

Hierarchical statistical analysis of complex analog and mixed-signal systems

With increasing process parameter variations in nanometre regime, circuits and systems encounter significant performance variations and therefore statistical analysis has become increasingly important. For complex analog and mixed-signal circuits and systems, efficient yet accurate statistical analysis has been a challenge mainly due to significant simulation and modelling time. In the past years, there have been various approaches proposed for statistical analysis of analog and mixed-signal circuits. A recent work is reported to address statistical analysis for continuous-time Delta-Sigma modulators. In this article, we generalise that method and present a hierarchical method for efficient statistical analysis of complex analog and mixed-signal circuits while maintaining reasonable accuracy. At circuit level, we use the response surface modelling method to extract quadratic models of circuit-level performance parameters in terms of process parameters. Then at system level, we use behavioural models and apply the Monte-Carlo method for statistical evaluation of system performance parameters. We illustrate and validate the method on a continuous-time Delta–Sigma modulator and an analog filter.     

Optimization-based multifrequency test generation for analog circuits

A robust test set for analog circuits has to detect faults under maximal masking effects due to variations of circuit parameters in their tolerance box. In this paper we propose an optimization based multifrequency test generation method for detecting parametric faults in linear analog circuits. Given a set of performances and a frequency range, our approach selects the test frequencies that maximize the observability on a circuit performance of a parameter deviation under the worst masking effects of normal variations of the other parameters. Experimental results are provided and validated by HSpice simulations to illustrate the proposed approach.     

Symbolic Macromodeling for Statistical Simulation of Operational Amplifiers

Symbolic circuit simulator is traditionally applied to the small-signal analysis of analog circuits. This paper establishes a symbolic behavioral macro-modeling method applicable to both small-signal and large-signal analysis of general two-stage operational amplifiers (op-amps). The proposed method creates a two-pole parametric macromodel whose parameters are analytical functions of the circuit element parameters generated by a symbolic circuit simulator. A moment matching technique is used in deriving the analytical model parameter. The created parametric behavioral model can be used for op-amps performance simulation in both frequency and time domains. In particular, the parametric models are highly suited for fast statistical simulation of op-amps in the time-domain. Experiment results show that the statistical distributions of the op-amp slew and settling time characterized by the proposed model agree well with the transistor-level results in addition to achieving significant speedup.     

CCⅡ低通滤波器的PSpice仿真分析

用子电路模块代替电路中的关键元件,采用理论分析与PSpice的参数扫描分析和优化分析相结合的方法对电路进行最优化设计,结合一个CCⅡ低通滤波电路的设计实例,阐述了仿真分析方法的具体步骤,给出了滤波电路最优化设计的仿真分析结果,该结果符合设计理论分析值的要求。对优化后的电路进行了温度扫描分析、蒙托卡诺分析和最坏情况分析。仿真结果表明,该方法在电路设计中是可行的。