Sn-3.0Ag-0.5Cu/Ni/Cu微焊点剪切强度与断口的研究

用直径为200~500μm的Sn-3.0Ag-0.5Cu无铅焊球分别在Ni和Cu焊盘上制作焊点,并对焊后和时效200h后的焊点进行剪切测试,并采用SEM观察剪切断口形貌。结果表明,焊后和时效200 h后焊点接头的剪切强度都随焊球尺寸增大而减小。焊后断口处韧窝形状为抛物线型,断裂方式为韧性断裂;随着焊球尺寸的增大,剪切断口处的韧窝数量增多,韧窝的变小变浅。时效200 h后,韧窝变浅,趋于平坦,韧窝数量也明显减少,材料的韧性下降,脆性增加,断裂方式由韧性向脆性发生转变。     

再流焊工艺技术的研究

随着表面贴装技术的发展，再流焊越来越受到人们的重视。本文介绍了再流焊接的一般技术要求，并给出了典型温度曲线以及温度曲线上主要控制点的工艺参数。同时还介绍了再流焊中常见的质量缺陷，并粗浅地讨论了其产生的原因及其相应对策。     

再流焊工艺技术研究

随着表面贴装技术的发展,再流焊越来越受到人们的重视。本文介绍了再流焊接的一般技术要求,并给出了典型温度曲线以及温度曲线上主要控制点的工艺参数。同时还介绍了再流焊中常见的质量缺陷,并粗浅地讨论了其产生的原因及其相应对策。     

再流焊工艺技术的研究

随着表面贴装技术的发展,再流焊越来越受到人们的重视。文中介绍了再流焊的一般技术要求,并给出了典型温度曲线以及温度曲线上主要控制点的工艺参数。同时还介绍了再流焊中常见的质量缺陷,并粗浅地讨论了其产生的原因及其相应对策。     

Sn-3.0Ag-0.5Cu/Cu焊点可靠性研究

采用铺展面积法研究了Sn-3.0Ag-0.5Cu无铅钎料在不同温度下的润湿性能,同时探讨了150℃等温时效对Sn-3.0Ag-0.5Cu/Cu焊点界面组织及力学性能的影响。结果表明,随着钎焊温度的升高,Sn-3.0Ag-0.5Cu钎料的润湿性能明显增加。焊后钎料/Cu界面处对应的金属间化合物为Cu6Sn5相,经150℃时效,界面层的形貌由原来的齿状逐渐转化为层状,且厚度随着时效时间的增加而增加。发现界面层金属间化合物厚度与时效时间的二次方根成线性关系。对焊点在时效过程中的力学性能进行分析,发现Sn3.0Ag0.5Cu/Cu焊点的力学性能随着时效时间的增加逐渐降低,时效初期,焊点的力学性能下降较快,后期趋于平缓。     

再流焊焊点可靠性自动管理系统

加热因子Q是描述SMT再流焊过程的一个量化参数,决定了再流焊工艺以及焊点的可靠性,其大小直接反映了焊点的吸热量以及焊接界面形成的金属间化合物的形态.通过自动再流焊管理系统(ARM)对温度曲线进行监控和优化,调整加热因子,实现可靠的产品焊接.     

微量Ni对Sn-3.0Ag-0.5Cu钎料及焊点界面的影响

研究了Ni的含量对无铅钎料Sn-3.0Ag-0.5Cu润湿性、熔点、重熔及老化条件下界面化合物(IMC)的影响。结果表明:微量Ni的加入使SnAgCu润湿力增加6%;使合金熔点略升高约3℃;重熔时在界面形成了(Cu,Ni)6Sn5IMC层,且IMC厚度远高于SnAgCu/Cu的Cu6Sn5IMC厚度。在150℃老化过程中,SnAgCuNi/Cu重熔焊点IMC随着时间的增加,其增幅小于SnAgCu/Cu的增幅,此时Ni对IMC的增长有一定抑制作用。     

再流焊工艺技术及其发展

随着表面贴装技术的发展,再流焊越来越受到人们的重视,本文从多个方面对再流焊工艺进行了较详细的介绍。     

Nanoparticles of the Lead-free Solder Alloy Sn-3.0Ag-0.5Cu with Large Melting Temperature Depression

Due to the toxicity of lead (Pb), Pb-containing solder alloys are being phased out from the electronics industry. This has lead to the development and implementation of lead-free solders. Being an environmentally compatible material, the lead-free Sn-3.0Ag-0.5Cu (wt.%) solder alloy is considered to be one of the most promising alternatives to replace the traditionally used Sn-Pb solders. This alloy composition possesses, however, some weaknesses, mainly as a result of its higher melting temperature compared with the Sn-Pb solders. A possible way to decrease the melting temperature of a solder alloy is to decrease the alloy particle size down to the nanometer range. The melting temperature of Sn-3.0Ag-0.5Cu lead-free solder alloy, both as bulk and nanoparticles, was investigated. The nanoparticles were manufactured using the self-developed consumable-electrode direct current arc (CDCA) technique. The melting temperature of the nanoparticles, with an average size of 30 nm, was found to be 213.9°C, which is approximately 10°C lower than that of the bulk alloy. The developed CDCA technique is therefore a promising method to manufacture nanometer-sized solder alloy particles with lower melting temperature compared with the bulk alloy.     

Demonstration and Characterization of Sn-3.0Ag-0.5Cu/Sn-57Bi-1Ag Combination Solder for 3-D Multistack Packaging

A combination solder of Sn-3.0Ag-0.5Cu (numbers are all in weight percent unless specified otherwise) wrapped by Sn-57Bi-1Ag was tested for application to three-dimensional (3-D) multistack packaging. The experimental variables controlled were the reflow peak temperatures (170, 185, 200, and 230°C), the reflow cycles (up to four times), and the mask which controls the amount of Sn-57Bi-1Ag solder paste (two sizes). We demonstrate and evaluate the combination solder structure, focusing on microstructural changes and the shear strength. The degree of mixing in the combination solder, which is enhanced by an increase in the reflow peak temperature, is independent of the number of reflow cycles. The ball shear strength and the lab shear strength both increased with increases in the reflow peak temperatures. This behavior is explained by the amount of the brittle Bi phase that constitutes the eutectic Sn-Bi phase.     

Intermetallic compounds formed during the reflow and aging of Sn-3.8Ag-0.7Cu and Sn-20In-2Ag-0.5Cu solder ball grid array packages

After reflow of Sn-3.8Ag-0.7Cu and Sn-20In-2Ag-0.5Cu solder balls on Au/Ni surface finishes in ball grid array (BGA) packages, scallop-shaped intermetallic compounds (Cu_0.70Ni_0.28Au_0.02)₆Sn₅ (IM1a) and (Cu_0.76Ni_0.24)₆(Sn_0.86In_0.14)₅ (IM1b), respectively, appear at the interfaces. Aging at 100°C and 150°C for Sn-3.8Ag-0.7Cu results in the formation of a new intermetallic phase (Cu_0.70Ni_0.14Au_0.16)₆Sn₅ (IM2a) ahead of the former IM1a intermetallics. The growth of the newly appeared intermetallic compound, IM2a, is governed by a parabolic relation with an increase in aging time, with a slight diminution of the former IM1a intermetallics. After prolonged aging at 150°C, the IM2a intermetallics partially spall off and float into the solder matrix. Throughout the aging of Sn-20In-2Ag-.5Cu solder joints at 75°C and 115°C, partial spalling of the IM1b interfacial intermetallics induces a very slow increase in thickness. During aging at 115°C for 700 h through 1,000 h, the spalled IM1b intermetallics in the solder matrix migrate back to the interfaces and join with the IM1b interfacial intermetallics to react with the Ni layers of the Au/Ni surface finishes, resulting in the formation and rapid growth of a new (Ni_0.85Cu_0.15)(Sn_0.71In_0.29)₂ intermetallic layer (IM2b). From ball shear tests, the strengths of the Sn-3.8Ag-0.7Cu and Sn-20In-2Ag-0.5Cu solder joints after reflow are ascertained to be 10.4 N and 5.4 N, respectively, which drop to lower values after aging. An erratum to this article is available at .     

Effects of strain ratio and tensile hold time on low-cycle fatigue of lead-free Sn-3.5Ag-0.5Cu solder

Low-cycle fatigue (LCF) behavior of a lead-free Sn-3.5Ag-0.5Cu solder alloy was investigated at various combinations of strain ratio (R = −1, 0, and 0.5) and tensile hold time (0, 10, and 100 sec). Results showed that the LCF life of the given solder, at each given combination of testing conditions, could be individually described by a Coffin-Manson relationship. An increase of strain ratio from R=−1 to 0 and to 0.5 would cause a significant reduction of LCF life due to a mean strain effect instead of mean stress effect. LCF life was also markedly reduced when the hold time at tensile peak strain was increased from 0 to 100 sec, as a result of additional creep damage generated during LCF loading. With consideration of the effects of strain ratio and tensile hold time, a unified LCF lifetime model was proposed and did an excellent job in describing the LCF lives for all given testing conditions.     

Inhibition of Whisker Growth on the Surface of Sn-3Ag-0.5Cu-0.5Ce Solder Alloyed with Zn

Solder alloys doped with rare-earth elements have been reported to show many beneficial effects. However, tin whiskers have been observed to appear on the surface of Sn-3Ag-0.5Cu-0.5Ce solder joints after air exposure for short periods. Such a phenomenon of abnormal whisker growth may significantly degrade the reliability of electronic packaging. The present study shows that the tin whiskers can be prevented by the addition of 0.5 wt.% Zn into a Sn-3Ag-0.5Cu-0.5Ce solder. The inhibition effect on the whisker growth is correlated to the refining of (Ce_0.9Zn_0.1)Sn₃ intermetallics in this Sn-3Ag-0.5Cu-0.5Ce-0.5Zn alloy.     

Effect of Ionization Characteristics on Electrochemical Migration Lifetimes of Sn-3.0Ag-0.5Cu Solder in NaCl and Na<Subscript>2</Subscript>SO<Subscript>4</Subscript> Solutions

Anodic dissolution characteristics and electrochemical migration (ECM) behavior of Sn-3.0Ag-0.5Cu solder in NaCl and Na₂SO₄ solutions were investigated using anodic polarization tests and water drop tests (WDT). The ECM lifetime of Sn-3.0Ag-0.5Cu solder in NaCl solution (42.4 s) was longer than that in Na₂SO₄ solution (34.8 s). The pitting potential of Sn-3.0Ag-0.5Cu solder in NaCl solution (135 mV, SCE) was higher than that in Na₂SO₄ solution (−367 mV, SCE). The passivity film (SnO₂) formed on Sn-3.0Ag-0.5Cu solder during WDTs in NaCl solution was thicker than that formed in Na₂SO₄ solution. Therefore, the longer ECM lifetime of Sn-3.0Ag-0.5Cu solder in NaCl solution than in Na₂SO₄ solution can be attributed to the higher pitting potential in the NaCl solution, which is ascribed to the formation of a thicker passivity film (SnO₂) in the former. It was confirmed that microelements such as Ag and Cu do not take part in ECM because they form chemically stable intermetallic compounds with Sn. We believe that Sn is the only element that contributes to ECM, and dissolution of Sn at the anode is possibly the rate-determining step of ECM of Sn-3.0Ag-0.5Cu solder.     

Cyclic softening of the Sn-3.8Ag-0.7Cu lead-free solder alloy with equiaxed grain structure

Low-cycle fatigue behavior of the Sn-Ag-Cu ternary-eutectic alloy was investigated under a fully reversed loading condition. The solder alloy exhibited cyclic softening early in the fatigue life and continued to soften as the number of fatigue cycles increased. Following cyclic loading, numerous microcracks were found in the microstructure. Most of the microcracks were located along the grain boundaries in the areas with finer grains. The areal density of the microcracks increased with both strain amplitude and cycle number. By combining percolation theory with microcracking analysis, the cycle-dependent softening behavior was shown to result from accumulation of microcrack density with fatigue cycles.     

Kinetics of intermetallic formation at Sn-37Pb/Cu interface during reflow soldering

The kinetics of the intermetallic layer formation at Sn-37wt.%Pb solder/Cu pad interface during reflow soldering were studied. The growth kinetics were analyzed theoretically by assuming that the mass flux of Cu through channels between scalloplike grains primarily contributes to the growth. Rate-controlling steps considered for the mass flux were the Cu dissolution from the bottom of the channels, diffusion through the channel, and the formation reaction of the intermetallic layer. These results indicated that a transition in the growth rate observed around 120–150 sec of reflow time may be associated with transition of the rate-controlling step from the Cu dissolution to the Cu diffusion through the channel.