共查询到18条相似文献,搜索用时 467 毫秒
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微量Co对低银无铅焊料润湿及界面反应的影响 总被引:2,自引:1,他引:1
利用润湿测量仪研究了加入微量Co对低银无铅焊料Sn1.00Ag0.70Cu和Sn0.50Ag0.70Cu润湿性能的影响,并与共晶无铅焊料Sn3.00Ag0.50Cu的润湿性能进行对比。结果发现,焊料Sn3.00Ag0.50Cu、Sn1.00Ag0.70Cu0.07Co和Sn0.50Ag0.70Cu0.03Co的润湿平衡力F分别为3.0850,3.0600和3.0275mN,润湿时间分别为0.64,0.88和1.01s。低银微钴无铅焊料显示了与共晶无铅焊料类似的润湿力,只是润湿时间略有增加。 相似文献
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Sn—Ag—Cu无铅焊料性能研究 总被引:2,自引:0,他引:2
环保和微电子器件高度集成化的发展驱动了高性能无铅焊料的研究和开发,Sn—Ag-Cu系无铅焊料由于具有良好的焊接性能和使用性能,已逐渐成为一种通用电子无铅焊料。文章通过实验的方法,研究了8种不同配比的Sn—Ag—Cu焊料中银、铜含量对合金性能(包括熔点、润湿性和剪切强度)的影响,并对焊料的显微组织进行对比与分析,得出低银焊料的可靠性比高银焊料好,同时Sn-2.9Ag—1.2Cu的合金具有较低的熔点且铺展性好,为确定综合性能最佳的该系焊料合金提供了依据。 相似文献
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传统含银无铅焊料已经被证明是最有潜力替代Sn-Pb合金的焊料并被广泛应用.可观的Ag含量也意味着焊料成本增加.因此,低银合金的研发开始受到科研机构和工业界广泛关注.但是低银产品的服役性能都低于主流的SAC系合金.采用引入微量元素Ce的方法提高接头可靠性.结果表明,Ce元素的添加提高了钎料的可焊性、抗拉强度以及热循环下的服役性能.此外,稀土元素的添加并未引发Sn晶须的生长. 相似文献
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概要地评述了无铅焊料中低银含量的锡-银-铜(SnAgCu)体系的发展方向。由于高银含量的锡-银-铜(SnAgCu)体系存在着成本高和耐跌落(摔)性差的问题,它将被低银含量的锡-银-铜(SnAgCu)体系所取代。在低银含量的锡-银-铜(SnAgCu)体系中加入某些微量添加剂可以达到锡-铅焊料的性能水平。 相似文献
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通过实验测定Sn—Ag—Sb及Sn—Zn—In系列合金的润湿角,进行了润湿性研究,发现Sn—Ag—Sb及Sn—Zn—In系焊料存在润湿性差的缺点,通过添加低表面张力的金属或稀土元素可在一定程度上降低润湿角,能提高润湿性。 相似文献
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Sn-Ag和Sn-Zn及Sn-Bi系无铅焊料 总被引:24,自引:5,他引:19
随着微电子组装技术的发展,研制新型的和实用的无铅焊料替代传统的Sn-Pb焊料已成为近年的研究热点。介绍了目前最常见的Sn-Ag、Sn-Zn和Sn-Bi为基体的无铅焊料并与传统的Sn-Pb焊料的性能进行了比较。 相似文献
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As the electronics industry is moving towards lead-free manufacturing processes, more effort has been put into the reliability study of lead-free solder materials. Various tin–silver–copper-based solders have become widely accepted alternatives for tin–lead solders. In this study, we have tested three different SnAgCu solder compositions. The first consisted of a hypoeutectic 96.5Sn/3.0Ag/0.5Cu solder, the second of a eutectic 95.5Sn/3.8Ag/0.7Cu solder, and the third of a hypereutectic 95.5Sn/4.0Ag/0.5Cu solder. A eutectic SnPb solder was used as a reference. The test boards were temperature-cycled (−40 to +125 °C) until all samples failed. The results of the temperature cycling test were analyzed, and cross-section samples were made of the failed joints. Scanning electron and optical microscopy were employed to analyze the fracture behavior and microstructures of the solder joints. The reliability of lead-free solders and the effect of microstructures on joint reliability are discussed. 相似文献
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Ever since RoHS was implemented in 2006, Sn3.0Ag0.5Cu (SAC305) has been the primary lead-free solder for attaching electronic devices to printed circuit boards (PCBs). However, due to the 3.0 wt% Silver (Ag) in SAC305, companies have been looking at less expensive solder alternatives, especially for use in inexpensive products that have short operating lives and are used in mild application conditions. This paper reviews new lead-free solder alternatives and the trends in the industry, including SnCu-based solders, SnAgCu solders with Ag content < 1.0 wt%, SnAg solders, and no-Ag low-temperature solders (e.g., SnBi-based solders). The analysis is conducted for reflow, wave, and rework conditions and for packaged and flip-chip devices. 相似文献
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Co, Ni, Pt, Al, P, Cu, Zn, Ge, Ag, In, Sb or Au inclusions in Sn–Ag based lead free solders were evaluated to study if these nanoparticles can reduce the growth of intermetallic compounds after four time reflow processes and thermal aging. Also, these nanoparticles were studied if they can reduce the frequency of occurrence of intermetallic compound fractures in high impact pull tests. In addition to intermetallic compound analyses, these nanoparticle effects on solder ball hardness were studied if nanoparticles affects solder hardness and displacement in drop tests. Finally, these nanoparticle effects on drop test performance were studied. This study found that Co, Ni and Pt were very effective for the growth of intermetallic compounds and drop test performance compared to Cu, Ag, Au, Zn, Al, In, P, Ge and Sb. 相似文献