Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor

We present here a method to calibrate the lateral force in the atomic force microscope. This method makes use of an accurately calibrated force sensor composed of a tipless piezoresistive cantilever and corresponding signal amplifying and processing electronics. Two ways of force loading with different loading points were compared by scanning the top and side edges of the piezoresistive cantilever. Conversion factors between the lateral force and photodiode signal using three types of atomic force microscope cantilevers with rectangular geometries (normal spring constants from 0.092 to 1.24 N/m and lateral stiffness from 10.34 to 101.06 N/m) were measured in experiments using the proposed method. When used properly, this method calibrates the conversion factors that are accurate to +/-12.4% or better. This standard has less error than the commonly used method based on the cantilever's beam mechanics. Methods such of this allow accurate and direct conversion between lateral forces and photodiode signals without any knowledge of the cantilevers and the laser measuring system.     

A new calibration method of the lateral contact stiffness and lateral force using modulated lateral force microscopy

We describe a new calibration method for lateral contact stiffness using modulated lateral force microscopy, a technique that offers some advantages with respect to the more classical friction force microscopy currently used for characterizing the friction properties of materials. The calibration method is based on the study of the lateral contact stiffness versus applied load and on the use of elasticity contact theories to determine by fit the calibration coefficient, allowing the scaling of experimental data. The method is tested by measuring the friction coefficient and shear strength of silicon and mica samples, respectively, and compared with results from the literature. This revised version was published online in August 2006 with corrections to the Cover Date.     

Investigation of human hair fibers using lateral force microscopy

Atomic force microscopy (AFM) and lateral force microscopy (LFM) were used to investigate the morphologic and surface changes associated with various surface modifications to human hair. These included extraction with a series of solvents, bleaching, and treatment with a cationic copolymer. The study assessed the ability of these techniques to distinguish the changes in surface properties, including morphology and friction coefficient, as manifested in changes brought about by the indicated surface modifications. While topographic morphology can easily be investigated with contact AFM. LFM offers an additional tool for probing the surface distribution of oils and waxes. The removal of surface lipids from the fiber surface was accomplished using soxhlet extraction with t-butanol and n-hexane, while the free internal lipids (within the fiber structure) were removed by extraction with a mixture of chloroform and methanol (70:30, v/v). In addition, the surface of hair was modified with the cationic polymer, co(vinyl pyrrolidone-methacrylamidopropyl trimethylammonium chloride [PVP/MAPTAC]), and its distribution on the surface was monitored. Ambient AFM and LFM studies of surface modified and native fibers clearly indicate that when investigated as a function of tip loading force, the different modifications result in changes of the friction coefficient, which increase in this order: native, bleached, solvent extracted, and polymer-treated hair. Friction images show surface variations that are interpreted as areas of varying lipid film coverage. In addition, topographic images of the fibers show the presence of small pores, which become increasingly prevalent upon solvent extraction.     

Measuring the activation energy of thiol desorption using lateral force microscopy

Thermal stability of self-assembled monolayers (SAMs) is important for applications in various surface science applications. As a model material, 16-mercaptohexadecanoic acid (MHA) on template stripped gold surfaces was investigated to determine the effect of temperature on the change of lateral force signal using atomic force microscopy (AFM). Friction force signals were obtained at various temperatures in order to determine whether it was possible to correlate the friction signal with desorption of the thiol molecule from the surface. Samples were heated for up to 10 h ranging from 40 to 80 °C in air and scanned every hour. A kinetic model was introduced to correlate the lateral force signal to the activation energy of desorption of the SAM from gold surface with heating. The activation energy of the detachment using this technique is 25.4 kcal/mol, which is consistent with other more complex techniques.     

Fabrication of robot head module using contact-resistance force sensor for human-robot interaction and its evaluation

This paper presents a design of a robot head module with touch sensing algorithms that can simultaneously detect contact force and location. The module is constructed with a hemisphere and three sensor-units that are fabricated using contact-resistance force sensors. The surface-part is designed with the hemisphere that measures 300 mm in diameter and 150 mm in height. Placed at the bottom of the robot head module are three sensor-units fabricated using a simple screen printing technique. The contact force and the location of the model are evaluated through the calibration setup. The experiment showed that the calculated contact positions almost coincided with the applied load points as the contact location changed with a location error of about ±8.67 mm. The force responses of the module were evaluated at two points under loading and unloading conditions from 0 N to 5 N. The robot head module showed almost the same force responses at the two points.     

Tribological interaction between multi-walled carbon nanotubes and silica surface using lateral force microscopy

This work presents the tribological interaction between multi-walled carbon nanotubes (MWCNTs) and silica surface using lateral manipulation in the atomic force microscope (AFM). The MWCNT is mechanically manipulated by a pyramidal silicon probe of an AFM using the same scan mechanism as in the imaging mode. With a controlled normal force of the AFM probe, it was found that lateral force applied to the MWCNT could overcome the tribological adhesion between MWCNT and silica surface, causing individual MWCNT to rotate on the silica. According to the results, the shear stresses due to tribological interacting with the MWCNTs and the silica are 59.6 MPa and 64.8 MPa for the MWCNT 1 (100 nm diameter) and the MWCNT 2 (60 nm diameter), respectively. Experimental results show that the shear stress increases with the increasing rotation angle for each manipulation, from which we determine the linear fitting function. In addition, we determine the relationship between push point and pivot point to realize the rotation behavior. The implications of tribological interaction between the MWCNTs and silica surface are discussed in detail.     

Prototype cantilevers for quantitative lateral force microscopy

Prototype cantilevers are presented that enable quantitative surface force measurements using contact-mode atomic force microscopy (AFM). The "hammerhead" cantilevers facilitate precise optical lever system calibrations for cantilever flexure and torsion, enabling quantifiable adhesion measurements and friction measurements by lateral force microscopy (LFM). Critically, a single hammerhead cantilever of known flexural stiffness and probe length dimension can be used to perform both a system calibration as well as surface force measurements in situ, which greatly increases force measurement precision and accuracy. During LFM calibration mode, a hammerhead cantilever allows an optical lever "torque sensitivity" to be generated for the quantification of LFM friction forces. Precise calibrations were performed on two different AFM instruments, in which torque sensitivity values were specified with sub-percent relative uncertainty. To examine the potential for accurate lateral force measurements using the prototype cantilevers, finite element analysis predicted measurement errors of a few percent or less, which could be reduced via refinement of calibration methodology or cantilever design. The cantilevers are compatible with commercial AFM instrumentation and can be used for other AFM techniques such as contact imaging and dynamic mode measurements.     

Investigation of nanoparticles by atomic and lateral force microscopy

Metallic nanoparticles have been produced on vitreous carbon substrates by means of thermal evaporation. From pictures of the particles, made by a high-resolution scanning electron microscope (HRSEM), a semispherical shape is suggested due to the total mass of deposited material. Atomic force microscopy (AFM) has been applied to this sample in order to get direct topographic information. The AFM has been operated with normal and super tips, the latter having a smaller cone angle and radius, thus following more precisely the contours of an object. Simultaneously lateral-force microscopic (LFM) images have been recorded. Major differences between the contents of HRSEM- and AFM-images are considered, emphasizing the important influence of the tips' geometry. Both the AFM and LFM line scans have been compared with and have qualitatively agreed with those calculated under simplifying assumptions.     

Development and evaluation of a two-axial shearing force sensor consisting of an optical sensor chip and elastic gum frame

We developed a promising shearing force sensor that is small in size and can measure shearing force along two axes independently. This sensor consists of an elastic gum frame and an optical sensor chip (6 mm × 6 mm × 8 mm). From the experimental results, the resolutions of the sensor along the x- and y-axes are found to be 0.070 N and 0.063 N. We also experimentally demonstrated that the sensor can separately measure shearing force along two axes. Finally, we demonstrated that the scale factor which correspond to resolution and linear portion which correspond to measuring range of the signals can be changed easily by using three types of elastic gum frame. This sensor can be embedded in the finger of a robot hand and use it to not only measure shearing force but also detect the slip phenomenon.     

Easy and direct method for calibrating atomic force microscopy lateral force measurements

We have designed and tested a new, inexpensive, easy-to-make and easy-to-use calibration standard for atomic force microscopy (AFM) lateral force measurements. This new standard simply consists of a small glass fiber of known dimensions and Young's modulus, which is fixed at one end to a substrate and which can be bent laterally with the AFM tip at the other end. This standard has equal or less error than the commonly used method of using beam mechanics to determine a cantilever's lateral force constant. It is transferable, thus providing a universal tool for comparing the calibrations of different instruments. It does not require knowledge of the cantilever dimensions and composition or its tip height. This standard also allows direct conversion of the photodiode signal to force and, thus, circumvents the requirement for a sensor response (sensitivity) measurement.     

Development of eddy current microscopy for high resolution electrical conductivity imaging using atomic force microscopy

We present a high resolution electrical conductivity imaging technique based on the principles of eddy current and atomic force microscopy (AFM). An electromagnetic coil is used to generate eddy currents in an electrically conducting material. The eddy currents generated in the conducting sample are detected and measured with a magnetic tip attached to a flexible cantilever of an AFM. The eddy current generation and its interaction with the magnetic tip cantilever are theoretically modeled using monopole approximation. The model is used to estimate the eddy current force between the magnetic tip and the electrically conducting sample. The theoretical model is also used to choose a magnetic tip-cantilever system with appropriate magnetic field and spring constant to facilitate the design of a high resolution electrical conductivity imaging system. The force between the tip and the sample due to eddy currents is measured as a function of the separation distance and compared to the model in a single crystal copper. Images of electrical conductivity variations in a polycrystalline dual phase titanium alloy (Ti-6Al-4V) sample are obtained by scanning the magnetic tip-cantilever held at a standoff distance from the sample surface. The contrast in the image is explained based on the electrical conductivity and eddy current force between the magnetic tip and the sample. The spatial resolution of the eddy current imaging system is determined by imaging carbon nanofibers in a polymer matrix. The advantages, limitations, and applications of the technique are discussed.     

压电薄膜力传感器及其牙咬力的测量应用研究

本文介绍一种用于测量牙咬力的传感器-压电簿膜力传感器.它应用压电薄膜受到机械应力产生电极化,从而产生电荷的原理来测量牙咬力.这种压电薄膜厚度仅25μm,用它来作为传感器测量牙咬力时无咬合间隙,测量的值能反映出牙齿真实的咬力.     

Atomistic study of lateral contact stiffness in friction force microscopy

The effective stiffness of a friction force microscope tip–substrate system is an important parameter that describes the relationship between lateral force and elastic deformation. In this study, we use a multi-spring model to simplify the system, where two contributions, the tip apex stiffness and the lateral contact stiffness, are discussed in detail. Molecular dynamics simulations are used to characterize stiffness by simulating a tip apex subject to shear or sliding over a substrate surface. The results show that, although the height of the tip apex and tip–substrate orientation affect the various stiffness contributions, the contact itself dominates the overall compliance.     

Effect of contact stiffness on wedge calibration of lateral force in atomic force microscopy

Quantitative friction measurement of nanomaterials in atomic force microscope requires accurate calibration method for lateral force. The effect of contact stiffness on lateral force calibration of atomic force microscope is discussed in detail and an improved calibration method is presented. The calibration factor derived from the original method increased with the applied normal load, which indicates that separate calibration should be required for every given applied normal load to keep the accuracy of friction measurement. We improve the original method by introducing the contact factor, which is derived from the contact stiffness between the tip and the sample, to the calculation of calibration factors. The improved method makes the calculation of calibration factors under different applied normal loads possible without repeating the calibration procedure. Comparative experiments on a silicon wafer have been done by both the two methods to validate the method in this article.     

Fabrication of four-point biped robot foot module based on contact-resistance force sensor and its evaluation

This paper presents the design of robot foot module of four-point biped walking robot and its fabrication. The foot module has four sensor units based on contact-resistance force sensor. The thin-film-type force sensor is fabricated by coating resistive ink on thin polyimide film using silk screening technique. The simple structure is devised and fabricated to assemble the thin force sensor rigidly. The unit force sensor module is evaluated by the calibration setup to obtain the characteristics of repeatability and hysteresis. The sensor module presents hysteresis error of about 5% and repeatability error of about 0.37%. The calculated zero moment point (ZMP) of the foot module is also compared with the measured position using static load of 50 N. The maximum location error of ZMP is less than 10%. The robot foot module shows the possibility of applying it to humanoid walking.     

Improved lateral force calibration based on the angle conversion factor in atomic force microscopy

A novel calibration method is proposed for determining lateral forces in atomic force microscopy (AFM), by introducing an angle conversion factor, which is defined as the ratio of the twist angle of a cantilever to the corresponding lateral signal. This factor greatly simplifies the calibration procedures. Once the angle conversion factor is determined in AFM, the lateral force calibration factors of any rectangular cantilever can be obtained by simple computation without further experiments. To determine the angle conversion factor, this study focuses on the determination of the twist angle of a cantilever during lateral force calibration in AFM. Since the twist angle of a cantilever cannot be directly measured in AFM, the angles are obtained by means of the moment balance equations between a rectangular AFM cantilever and a simple commercially available step grating. To eliminate the effect of the adhesive force, the gradients of the lateral signals and the twist angles as a function of normal force are used in calculating the angle conversion factor. To verify reliability and reproducibility of the method, two step gratings with different heights and two different rectangular cantilevers were used in lateral force calibration in AFM. The results showed good agreement, to within 10%. This method was validated by comparing the coefficient of friction of mica so determined with values in the literature.     

原子力显微镜原理与应用技术

本文简述原子力显微镜的工作原理,对比说明敲击模式的优越性,指出针尖-样品卷积效应和假象产生的原因,并例证其应用领域及其测试效果。     

A compact sensor head for simultaneous scanning force and near-field optical microscopy

A compact sensor head based on scanning force microscopy (SFM) using cantilever probes has been developed. The idea is to replace the microscope objective of a conventional optical microscope by this compact module and turn the optical microscope into a scanning force and near-field optical microscope with subwavelength resolution. We describe our concept and present initial results showing images of the object’s optical properties and surface topography recorded simultaneously.     

Atomic force microscopy of histological sections using a chemical etching method

Physiology and pathology have a big deal on tissue morphology, and the intrinsic spatial resolution of an atomic force microscope (AFM) is able to observe ultrastructural details. In order to investigate cellular and subcellular structures in histological sections with the AFM, we used a new simple method for sample preparation, i.e. chemical etching of semithin sections from epoxy resin-embedded specimens: such treatment appears to melt the upper layers of the embedding resin; thus, removing the superficial roughness caused by the edge of the microtome knife and bringing into high relief the biological structures hidden in the bulk. Consecutive ultrathin sections embedded in epoxy resin were observed with a transmission electron microscope (TEM) to compare the different imaging properties on the same specimen sample. In this paper we report, as an example, our AFM and TEM images of two different tissue specimens, rat pancreas and skeletal muscle fibres, showing that most of the inner details are visible with the AFM. These results suggest that chemical etching of histological sections may be a simple, fast and cost-effective method for AFM imaging with ultrastructural resolution.