溅射工艺条件对TbFeCo/Pt薄膜磁性能的影响

采用射频磁控溅射法在玻璃基片上成功制得了TbFeCo/Pt非晶垂直磁化膜,系统研究了溅射工艺参数对TbFeCo薄膜磁性能的影响.振动样品磁强计测量结果表明:Tb含量在补偿成分点附近,采用较低的溅射氩气压与Pt底层,有利于提高TbFeCo薄膜的磁性能;当Tb含量为0.24,溅射功率为300W,溅射气压为0.53Pa,薄膜厚度为140nm时,TbFeCo/Pt薄膜矫顽力达到476kA/m,饱和磁化强度为151kA/m,剩磁矩形比超过0.8,该薄膜有望用作高密度光磁混合记录介质.     

电介质保护膜对磁光记录膜的磁和磁光特性的影响

采用射频磁控溅射法制备了非晶TbFeCo薄膜及其保护层AlN薄膜，并研究保护层对薄膜的磁和磁光特性的影响。结果表明，AlN薄膜可以增强薄膜磁光效应，同时，AlN薄膜对TbFeCo磁光薄膜的矫顽力、垂直磁各向异性以及本征克尔角都有一定的影响。其原因来自于溅射过程中N和Al原子对TbFeCo薄膜表面的轰击而导致的界面特性的改变。     

电介质保护膜对磁光记录膜的磁和磁光特性的影响

采用射频磁控溅射法制备了非晶TbFeCo薄膜及其保护层AlN薄膜 ,并研究保护层对薄膜的磁和磁光特性的影响。结果表明 ,AlN薄膜可以增强薄膜磁光效应 ,同时 ,AlN薄膜对TbFeCo磁光薄膜的矫顽力、垂直磁各向异性以及本征克尔角都有一定的影响。其原因来自于溅射过程中N和Al原子对TbFeCo薄膜表面的轰击而导致的界面特性的改变     

共溅射沉积的TbFeCo薄膜

本文介绍了利用射频共溅射技术制备垂直膜面单轴各向异性TbFeCo磁光薄膜,并研究了该薄膜的磁、磁光和读写性能。测试结果表明,这种TbFeCo薄膜的磁光盘其载噪比和擦写循环分别达到48dB和1×10~6次以上。该磁光盘可适用于数据存储。     

Ce掺杂对TbFeCo材料磁光性能影响的研究

采用射频磁控溅射方法制备了TbFeCo非晶磁光薄膜，并在TbFeCo中引入轻稀土元素Ce，测试了薄膜的磁光性能。研究了薄膜成分对其磁光性能的影响。结果表明；在TbFeCo薄膜中掺入少量Ce时，薄膜的磁光克尔角及矫顽力都有所提高，矩形度也增加了。但随Ce掺入量的增加，薄膜的磁光性能发生恶化，较好的掺杂在10.31?左右。     

磁控溅射制备TbFeCo薄膜及其光学和磁光性质研究

采用放电等离子烧结(SPS)TbFeCo合金靶,分别在Si衬底和K9玻璃衬底上磁控溅射制备了磁光薄膜TbFeCo/Si和TbFeCo/K9;利用扫描型可变入射角全自动椭偏仪,室温下测量了复介电常数谱,测量结果表明两样品介电函数值有较大差异,说明衬底对薄膜的光学性质有重要影响.用磁光Kerr谱仪,在室温下分别测量了TbFeCo薄膜的极向Kerr回线和横向Kerr回线,发现所制备TbFeCo薄膜不具有垂直磁化性质,而呈现出面内磁化性质.     

稀土-过渡金属磁光介质膜的理论与特性

本文讨论了稀土-过渡金属(以下简写为 RE-TM)非晶合金膜用作磁光记录介质的理论和 TbFeCo 膜的特性。采用射频溅射技术制备出 TbFeCo 非晶垂直磁化膜。膜的垂直各向异性常数K_u 为2.94×10~(5J)/m~3,克尔旋转角θ_k 为0.24-0.29°。得到了θ_k 随过渡金属 Co 含量而变化的曲线。当 Co 在 TM 次网络中含量达50%时,θ_k 有最大值0.29°。在膜被复盖一层 SiO_2或 AlN 之后,θ_k 从0.29°提高到0.55°或1.48°。(TbFeCo+AlN)膜的θ_k 达到1.48°这样高的值,尚未见文献报导。这种膜可以直接用作磁光记录介质。     

SmDyFeCo磁光薄膜的磁特性研究

采用射频磁控溅射方法制备了ＳｍＤｙＦｅＣｏ非晶磁光薄膜，研究了氩气压，溅射功率对ＳｍＤｙＦｅＣｏ薄膜磁特性的影响。实验表明，和ＤｙＦｅＣｏ非晶薄膜相比，ＳｍＤｙＦｅＣｏ非晶薄膜的矫顽力Ｈｃ随温度变化更为缓慢，并且具有更大的垂直磁各向异性常数，因而具有更好的记录特性，本征磁光克尔角可达０．３１，可以作为一种实用化的磁光记录介质。     

溅射气压对TbFeCo磁光薄膜的光学常数的影响

利用直流磁控溅射制备了TbFeCo/Si薄膜，采用可变入射角全自动椭圆偏振光谱仪，测量了用磁控溅射法制备的TbFeCo/Si薄膜的光学常数，测量能量范围为1．5～4．5eV。分析了不同氩气压强对磁控溅射制备的TbFeCo/Si磁光薄膜的光学常数的影响。实验结果表明，在低能区域，样品的所有光学常数均随压强增加而增加，受制备工艺影响较大。但在高能区域，光学常数随压强的变化相对说来不再明显．     

超高密度磁存储的展望

磁性存储是最常用的海量存储技术,其记录密度越来越高,发展也越来越快。本文通过对信息记录、读出和存储三个过程的分析,对比了硬磁盘记录、垂直磁记录和磁光记录的优缺点,指出了采用垂直记录模式、非晶结构合金薄膜或铁氧体薄膜介质是实现超高密记录的方向,光辅助磁记录是很有希望的记录技术。同时,还指出量子磁盘技术是未来高密记录的方向。     

Thickness dependence of microstructures and magnetic properties for CoPt/Ag nanocomposite thin films

Ag underlayer (30 nm) has improved the degree of ordering and perpendicular magnetic anisotropy of CoPt films (7.5-10 nm). After annealing at 600 °C and 700 °C, the perpendicular coercivity of CoPt/Ag films has been raised as the thicknesses of CoPt layers are increased. The magnetic easy axis of CoPt/Ag films would change from a random orientation to an out-of-plane orientation. It is found that Ag underlayer with thickness of 30 nm can improve the perpendicular magnetic properties of CoPt layers with thicknesses in the range of 7.5-10 nm. The CoPt/Ag films would be a candidate for perpendicular magnetic recording media.     

Effect of Ag underlayer on microstructures and perpendicular magnetic properties of CoPt nanocomposite thin films

CoPt/Ag films were prepared by magnetron sputtering on glass substrates and subsequent annealing. The dependence of degree of ordering and magnetic properties on Ag film thickness and annealing conditions were investigated. It was found that the Ag underlayer played a dominant role in inducing the (001) texture of the CoPt film after annealing. CoPt films with a thickness about 20 nm and Ag underlayers with a thickness about 70 nm are easy to obtain a large degree of ordering and a perpendicular magnetic anisotropy after annealing at 700 degrees C for 30 min. CoPt/Ag films with out-of-plane coercivity (Hc (perpendicular)) in the range of 13.5-14.0 kOe and a out-of-plane squareness (S(perpendicular)) of 0.97 were obtained after annealing at 700 degrees C for 30 min. Ag underlayer is beneficial to enhance the Hc(perpendicular)and S(perpendicular) of CoPt film significantly. The degree of ordering and perpendicular magnetic properties of the CoPt films which deposited on Ag underlayer are larger than those of the single layer CoPt films.     

Study on Micro-magnetic Simulation of Magnetic State of TbFeCo/Anodized Aluminum Oxide Film

Based on the experimental study of the AAO underlayer??s effect on the magnetic properties and structure, combining micro-magnetic theory as well, TbFeCo/AAO film magnetic properties and magnetic reversal characteristics were analyzed by finite-element micro-magnetic calculation software Magpar. With limited hardware conditions for the computer, a TbFeCo perpendicular magnetization films model with 9×9 matrix particles was simulated. It was found that for the pinning effect of non-magnetic porous AAO barrier film on TbFeCo particle film, the coercivity of isolated TbFeCo/AAO film (2100 kA/m) was larger than the coercivity of continuous TbFeCo film (2000 kA/m). The exchange coupling among the film particles, which was affected by AAO barrier film, led to a longer magnetization reversal time of isolated TbFeCo films than that of continuous ones.     

Finding stabilized coercivity in a study of thickness and temperature dependent Co/Ag/Ge(001) ultrathin films

Epitaxial magneto-optical Co/Ag/Ge(001) ultrathin films were investigated at both room temperature and low temperature. Interesting variations in coercivity as a function of thickness and temperature suggest the existance of interfacial exchange interactions. The operative Ag layers required to inhibit intermixing of Co-Ge alloys from the oscillation of coercivity with Ag film thickness were determined. When the Ag film thickness was reduced to the submonolayer range, perpendicular anisotropy was unexpectedly found. Thus unusual phenomenon can be qualitatively discussed in terms of effective magnetic anisotropy by the contribution of reduced Co layers and by surface magnetic anisotropy.     

Recording characteristics of electroless-plated perpendicularrecording flexible disks with a perpendicular head

Perpendicular magnetic recording using a main-pole-driven perpendicular head was tested using electroless-plated flexible disks. Soft magnetic NiFeP films, also produced by electroless plating, were used as an underlayer of a perpendicular recording medium in this test. Two types of flexible double-layer media, composed of an electrodeless-plated CoNiReP film with two types of NiFeP underlayers with a coercivity of 2 and 5.5 Oe, were fabricated, and their recording characteristics were measured. A recording density value of 75 kFRPI was obtained for the medium with the softer magnetic 2-Oe underlayer, about twice as high a value as that for the medium with the 5.5-Oe underlayer     

The effect of thickness on the texture and magnetic properties of single-layered FePt films by rapid thermal annealing

The single-layered FePt films with thickness in the range of 5 to 50 nm are deposited directly on Si(100) substrate without underlayer, then post annealed at 700 degrees C by rapid thermal annealing (RTA) technique. As the film thickness of FePt is over 20 nm, the L1(0) FePt(111) preferred orientation is presented and tended to in-plane magnetic anisotropy. However, the L1(0) FePt(001) texture is obtained and exhibited perpendicular magnetic anisotropy as the film thickness is decreased to 10 nm. Its perpendicular coercivity (Hc(perpendicular)), saturation magnetization (Ms) and perpendicular squareness (S(perpendicular)) are 14.8 kOe, 795 emu/cm3 and 0.79, respectively. On the other hand, both the grain size and domain size of FePt film decrease with decreasing the film thickness of FePt. The grain size for 10-nm FePt film is as small as 9.7 nm with domain size of 123 nm, which reveal its significant potential as perpendicular magnetic recording media for ultra high-density recording.     

Microstructure and magnetic properties of (0 0 1)-oriented L10 FePt films: Role of Ag underlayer and Fe/Pt ratio

FePt multilayer films were deposited on Si(1 0 0) substrate with thermally grown SiO₂ film and sputtered Ag underlayer at room temperature by dc magnetron sputtering and subsequently annealing in vacuum. Experimental results suggest that proper thickness of Ag underlayer and slightly rich of Fe content can effectively induce the (0 0 1) texture of FePt films. A Fe_57.4Pt_42.6 thin film on the 8 nm Ag underlayer exhibits a large perpendicular coercivity of 7.6 kOe with magnetic remanence close to 1.     

Fabrication of SmCo5 Double-Layered Perpendicular Magnetic Recording Media

We fabricated SmCo₅ double-layered perpendicular magnetic recording media with high perpendicular magnetic anisotropy for realizing ultra high density recording. A double-layered medium with a Ru buffer layer introduced between a Cu/Ti intermediate layer and a Co-Zr-Nb soft magnetic underlayer exhibited high perpendicular magnetic anisotropy, whereas that without the Ru buffer layer did not. Auger electron spectroscopy revealed that the Ru buffer layer inhibited interdiffusion between the Cu/Ti intermediate layer and the Co-Zr-Nb soft magnetic underlayer. We report here for the first time the read-write characteristics of SmCo₅ double-layered perpendicular magnetic recording media. The medium noise was small in the medium with a Sm-Co layer deposited under high Ar gas pressure owing to small magnetic clusters