An 8/10 bit 200/100MS/s configurable asynchronous SAR ADC

This paper presents an asynchronous 8/10 bit configurable successive approximation register analog-to-digital converter (ADC). The proposed ADC has two resolution modes and can work at a maximal sampling rate of 200 and 100MS/s for 8 bit mode and 10 bit mode respectively. The ADC uses a custom-designed 1 fF unit capacitor to reduce the power consumption and settling time of capacitive DAC, a dynamic comparator with tail current to minimize kickback noise and improve linearity. Moreover, asynchronous control technique is utilized to implement the ADC in a flexible and energy-efficient way. The proposed ADC is designed in 90 nm CMOS technology. At 100MS/s and 1.0 V supply, the ADC consumes 1.06 mW and offers an ENOB of 9.56 bit for 10 bit mode. When the ADC operates at 8 bit mode, the sampling rate is 200MS/s with 1.56 mW power consumption from 1.0 supply. The resulted ENOB is 7.84 bit. The FOMs for 10 bit mode at 100MS/s and 8 bit mode at 200MS/s are 14 and 34 fJ/conversion-step respectively.     

An 8 bit, 100 kS/s,switch-capacitor DAC SAR ADC for RFID applications

An 8 bit switch-capacitor DAC successive approximation analog to digital converter (SAR-ADC) for sensor-RFID application is presented in this paper. To achieve minimum chip area, maximum simplicity is imposed on capacitive DAC; replacing capacitor bank with only a one switch-capacitor circuit. The regulated dynamic current mirror (RDCM) design is introduced to provide stabilized current. This invariable current from RDCM, charging or discharging the only capacitor in circuit is controlled by pulse width modulated signal to realize switch capacitor DAC. The switch control scheme is built using basic AND gates to generate the control signals for RDCM. Only one capacitor and reduced transistor count in digital part reduces the silicon area occupied by the ADC to only 0.0098 mm². The converter, designed in GPDK 90 nm CMOS, exhibits maximum sampling frequency of 100 kHz & consumes 6.75 µW at 1 V supply. Calculated signal to noise and distortion ratio (SNDR) at 1 V supply and 100 kS/s is 48.68 dB which relates to ENOB of 7.79 bits. The peak values of differential and integral nonlinearity are found to be +0.70/−0.89 LSB and +1.40/−0.10 LSB respectively. Evaluated figure of merit (FOM) is 3.87×10²⁰, which show that the proposed ADC acquires minimal silicon area and has sufficiently low power consumption compared to its counterparts in RFID applications.     

抗辐射低功耗流水线型8位100 MS/s ADC

设计并实现了一种抗辐射低功耗流水线型8位ADC。对流水线型结构的分辨率影响进行分析,确定了最优的级间分辨率和流水线结构。采用多种电路的结构设计,降低了电路功耗。为达到抗辐射指标,对电路进行了抗辐射加固设计。测试结果表明,在3 V电源电压、100 MHz时钟输入频率、70.1 MHz模拟输入频率的条件下,该ADC的SFDR为59.6 dBc,稳态总剂量能力为 2 500 Gy(Si),单粒子闩锁阈值为75 MeV·cm²/mg,功耗为69 mW。该ADC采用0.35 μm CMOS工艺制作,面积为0.75 mm²。该ADC适用于空间环境的通信系统。     

一种14位100 MS/s的流水线模数转换器

设计了一种14位100 MS/s的流水线模数转换器(ADC)。采样保持电路与第1级2.5位乘法数模转换器(MDAC1)共享运放,降低了功耗。提出了一种改进的跨导可变双输入开关运放,以满足采样保持和MDAC1对运放的不同要求,并消除记忆效应和级间串扰。ADC后级采用5级1.5位运放共享结构。基于0.18 μm CMOS工艺,ADC核心面积为1.4 mm²。后仿真结果表明,在1.8 V电源电压下,当采样速率为100 MS/s、输入信号频率为46 MHz时,ADC的信噪比(SNR)为82.6 dB,信噪失真比(SNDR)为78.7 dB,无杂散动态范围(SFDR)为84.1 dB,总谐波失真(THD)为-81.0 dB,有效位数(ENOB)达12.78位。ADC整体功耗为116 mW。     

An 8 bit 1 MS/s SAR ADC with 7.72-ENOB

This paper presents a low power 8-bit 1 MS/s SAR ADC with 7.72-bit ENOB. Without an op-amp, an improved segmented capacitor DAC is proposed to reduce the capacitance and the chip area. A dynamic latch comparator with output offset voltage storage technology is used to improve the precision. Adding an extra positive feedback in the latch is to increase the speed. What is more, two pairs of CMOS switches are utilized to eliminate the kickback noise introduced by the latch. The proposed SAR ADC was fabricated in SMIC 0.18 μm CMOS technology. The measured results show that this design achieves an SFDR of 61.8 dB and an ENOB of 7.72 bits, and it consumes 67.5 μ W with the FOM of 312 fJ/conversion-step at 1 MS/s sample under 1.8 V power supply.     

一种8位100 MS/s的低功耗流水线型ADC

基于0.35 μm CMOS工艺,设计并制作了一种低功耗流水线型ADC。分析了ADC结构对功耗的影响,采用1.5位/级的流水线结构来最小化功耗,并提升速度。为进一步降低功耗,设计了一种不带补偿并可调节相位裕度的共源共栅跨导放大器(OTA)和改进的比较器。测试结果显示,该ADC在3 V电源电压、100 MS/s采样速率下,功耗为65 mW,面积为0.73 mm²,在模拟输入频率为70.1 MHz和141 MHz下的无杂散动态范围(SFDR)分别为59.8 dBc和56.5 dBc。该ADC可应用于需要欠采样的通信系统中。     

An 8-b 100-MSample/s CMOS pipelined folding ADC

Although cascading reduces the number of folders used in folding analog-to-digital converters (ADCs), it demands wider bandwidth. The pipelining scheme proposed in this work greatly alleviates the wide bandwidth requirement of the folding amplifier. The pipelining is implemented with simple differential-pair folders. The key idea is to use odd multiples of folders with distributed interstage track/holds cooperatively with an algorithm for coding and digital error correction for the nonbinary system. The pipelined folding ADC prototyped using 0.5-μm CMOS exhibits a differential nonlinearity (DNL) of ±0.4 LSB and an integral nonlinearity (INL) of ±1.3 LSB at 100 MSample/s. The chip occupies 1.4 mm×1.2 mm in active area and consumes 165 mW at 5 V     

基于比较器亚稳态抑制技术的8位320 MS/sSAR ADC

提出一种比较器亚稳态抑制技术,并将其应用于一个8位320 MS/s 的逐次逼近型模数转换器(SAR ADC)。该技术抑制了比较器在高速工作情况下可能出现的亚稳态现象,从而降低了比较器出现错误结果的概率。同时,提出一种转换时间复用技术,使ADC能在转换与采样模式之间快速切换。与传统技术相比,随着工艺角、电源电压和温度(PVT)的变化,ADC的采样时间会被最大化。基于65 nm CMOS工艺,设计了一种8位320 MS/s SAR ADC。芯片测试结果表明,在1 V电源电压下,功耗为1 mW,信号噪声失真比(SNDR)>43 dB,无杂散动态范围(SFDR)>53.3 dB。SAR ADC核的芯片面积为0.021 mm²,在Nyquist采样率下,优值为29 fJ/step。     

8 bit 400 MS/s CMOS折叠插值结构ADC的设计

折叠插值结构是高速ADC设计中的常用结构。提出了一种新的在折叠插值结构ADC中只对THA进行时间交织的技术,可以在基本不增加芯片功耗和面积的情况下,使ADC的系统速度提高近1倍。位同步技术可以保证粗分和细分通路之间的同步,在位同步的基础上设计了新的编码方式。基于上述技术设计了8 bit 400 MS/s CMOS折叠插值结构ADC,核心电路电流为110mA,面积仅1mm×0.8mm,Nyquist采样频率下SNDR为47.2dB,SFDR为57.1dB。     

一种全集成8位2.16 GS/s SAR ADC

设计了一种8位2.16 GS/s四通道、时间交织逐次逼近型模数转换器(TI-SAR ADC).单通道SAR ADC采用数据环、异步时钟环的双环结构实现高速工作.采用带复位开关的动态比较器缩短量化时间,提高比较精度.结合反向单调切换时序,逐步增大共模电压,提升量化速度.基于55 nm CMOS工艺设计,后仿真结果表明,在...     

采用改进型1.5位/级结构的10位100MHz流水线模数转换器

介绍了一个采用改进型1.5位/级结构的10位100MHz流水线结构模数转换器. 测试结果表明,模数转换器的信噪失真比最高可以达到57dB,在100MHz输入时钟下,输入信号为57MHz的奈奎斯特频率时,信噪失真比仍然可以达到51dB. 模数转换器的差分非线性和积分非线性分别为0.3LSB和1.0LSB. 电路采用0.18μm 混合信号CMOS工艺实现,芯片面积为0.76mm2.     

采用改进型1.5位/级结构的10位100MHz流水线模数转换器

介绍了一个采用改进型1.5位/级结构的10位100MHz流水线结构模数转换器.测试结果表明,模数转换器的信噪失真比最高可以达到57dB,在100MHz输入时钟下,输入信号为57MHz的奈奎斯特频率时,信噪失真比仍然可以达到51dB.模数转换器的差分非线性和积分非线性分别为0.3LSB和1.0LSB.电路采用0.18μm混合信号CMOS工艺实现,芯片面积为0.76mm2.     

一个不含有传统采样保持放大器的8位100兆采样率流水线模数转换器

本文实现了一个省去传统的采样保持模块的8位100兆采样率流水线模数转换器(ADC)。与包含传统采样保持模块的相同指标的流水线ADC相比,品质因子(FoM)和面积分别降低了21%和12%。提出了一种余量增益放大器(MDAC)中运放的闭环带宽(BWclose)的模型,并通过晶体管级仿真验证了该模型。本设计采用0.18µm 1P6M CMOS混合信号工艺实现,测试结果显示,当采样率为100兆时,输入信号1MHz和80MHz对应的分辨率分别为7.43bit和6.94位,包括内置参考电压/电流源的静态功耗为23.4mW,品质因子为0.85pJ/step,面积为0.53mm2,积分非线性(INL)和差分非线性(DNL)分别为-0.99~0.76LSB,-0.49~0.56LSB。     

An 8-bit 100-MS/s pipelined ADC without dedicated sample-and-hold amplifier

An 8-b 100-MS/s pipelined analog-to-digital converter(ADC) is presented.Without the dedicated sample-and -hold amplifier(SHA),it achieves figure-of-merit and area 21%and 12%less than the conventional ADC with the dedicated SHA,respectively.The closed-loop bandwidth of op amps in multiplying DAC is modeled,providing guidelines for power optimization.The theory is well supported by transistor level simulations.A 0.18-μm 1P6M CMOS process was used to integrate the ADCs,and the measured results show that the...     

8位12MS/s带片上参考电压的异步逐次逼近模数转换器

This paper proposes an 8 bit asynchronous successive approximation register ADC for wireless transceivers.A split capacitor DAC is used to reduce power and area consumption and the value of the split capacitor is calculated theoretically to ensure linearity.Asynchronous control logic is proposed to eliminate the high internal clocks and significantly speeds up the successive approximation algorithm.An on-chip reference with a fully integrated buffer and decoupling capacitor is adopted for avoiding an extra pin for the off-chip reference. The prototype,fabricated in UMC 0.18μm CMOS technology,achieves an effective number of bits of 7.64 bits at a sampling frequency of 12 MS/s.The total power consumption is 0.918 mW for a 1.8 V supply,while the onchip reference consumes 53%of the total power.It achieves a figure of merit of 180 fJ/conv-step,excluding the reference’s power consumption.     

单通道8bit1.4GS/s折叠内插ADC

基于0.18 μm CMOS工艺设计并实现了一种8 bit 1.4 GS/s ADC.芯片采用多级级联折叠内插结构降低集成度,片内实现了电阻失调平均和数字辅助失调校准.测试结果表明,ADC在1.4GHz采样率下,有效位达6.4bit,功耗小于480 mW.文章所提的综合校准方法能够有效提高ADC的静态和动态性能,显示出...     

5 V, 8 bit, 100 MS/s fully differential CMOS sample-and-holdamplifier

A 5 V, 100 MS/s fully differential CMOS sample-and-hold amplifier (SHA) with 8 bit accuracy is proposed. Based on the stability limitations of closed-loop SHAs studied in a previous paper (see Int. J. Electron., vol. 78, no. 5, p. 907-910, 1995), the proposed SHA is implemented by an open-loop structure using the `gain-enhanced unity-gain amplifier' to avoid the stability problem and achieve higher operation speed. Simulation results which agree well with experimental results have been obtained to demonstrate the accuracy of the proposed circuit     

采用SAR结构的8通道12位ADC设计

本文设计实现了一个8通道12位逐次逼近型ADC。转换器内部集成了多路复用器、并/串转换寄存器和复合型DAC,实现了数字位的串行输出。整体电路采用HSPICE进行仿真,转换速率为133KSPS,转换时间为7.5μs。通过低功耗设计,工作电流降低为2.8mA。芯片基于0.6μmBiCMOS工艺完成版图设计,版图面积为2.5×2.2mm2。     

一种1.5 V 8位100 MS/s电流舵D/A转换器

基于新型的低压与温度成正比(PTAT)基准源和PMOS衬底驱动低压运算放大器技术,采用分段温度计译码结构设计了一种1.5V8位100MS/s电流舵D/A转换器,工艺为TSMC0.25μm2P5MCMOS。当采样频率为100MHz,输出频率为20MHz时,SFDR为69.5dB,D/A转换器的微分非线性误差(DNL)和积分非线性误差(INL)的典型值分别为0.32LSB和0.52LSB。整个D/A转换器的版图面积为0.75mm×0.85mm,非常适合SOC的嵌入式应用。     

一个电容阵列定制的100MS/s，9bit，0.43mW逐次逼近型模数转换器

本论文介绍了一个带定制电容阵列的低功耗9bit,100MS/s逐次比较型模数转换器。其电容阵列的基本电容单元是一个新型3D,电容值为1fF的MOM电容。除此之外,改进后的电容阵列结构和开关转换方式也降低了不少功耗。为了验证设计的有效性,该比较器在TSMC IP9M 65nm LP CMOS工艺下流片。测试结果如下：采样频率100MS/s,输入频率1MS/s时,有效位数（ENOB）为7.4,bit,信噪失真比（SNDR）为46.40dB,无杂散动态范围（SFDR）为62.31dB。整个芯片核面积为0.030mm2,在1.2V电源电压下功耗为0.43mW。该设计的品质因数（FOM）为23.75fJ/conv。