SAC0307-xNi/Ni焊点的IMC及镍镀层的消耗

利用扫描电镜(SEM)对焊点SAC0307/Ni(Sn-O.3Ag-0.7Cu/Ni)和SAC0307-0.05Ni/Nj(Sn-O.3Ag-0.7Cu-0.05 Ni/Ni)经过180℃老化后的界面金属问化合物(IMC)的微观结构及镍镀层的消耗进行了研究.结果表明,回流焊后,SAC0307/Ni和SAC0307-O.05Ni/Ni焊点的IMC层均为(Cu_(1-x)Ni_x)_6Sn_5,且随着老化时间的延长,IMC层的厚度均逐渐增加,化合物类型没有变化,但IMC的化学组成有所改变.SAC0307-0.05Ni/Ni焊点中IMC层形貌为蠕虫状,厚度比不加镍时有所降低.回流焊后两种钎料焊盘的镍层消耗几乎相同,但老化384h后SAC0307/Ni的焊盘镍层的剩余厚度明显比SAC0307-0.05Ni/Ni的小.因此,钎料中添加适量的镍可以有效地降低焊盘镍层在时效过程中的消耗速率,即显著提高镍焊盘的抗老化能力.

Abstract：

The micrestmcture of interfacial IMC and the consumption of Ni layer for SAC0307/Ni ( Sn-0.3Ag-0.7Cu/Ni ) soldered joint and SAOY307-0.05Ni/Ni (Sn-O. 3Ag-0.7Cu-0.05Ni/Ni) soldered joint after aging at 180℃ were studied by scanning electron microscope( SEM ). The results indicated that the IMC layer of SAC0307/Ni and SAC0307-0.05Ni/Ni are both (Cu_(1-x),Ni_x)_6Sn_5 after reflow soldering. With the increasing of aging time, the thickness of IMC layer increases gradually, the type of IMC is not changed, but the chemical composition changes. The morphology of IMC is stormshaped and the thickness of IMC is much thinner when SAC0307 solder added 0. 05 % Ni is used. The consumption of Ni layer is nearly the same using both solders "after the first time reflow soldering, but the residual thickness of the Ni layer in SACO307/Ni solder is thinner than that in SAC0307-0.05Ni/Ni after aging for 384 h. So solders with a little Ni element can decrease the consumption rate of Ni layer effectively during aging, that is, the aging-resistant abihty of Ni pad is improved obviously.     

不同Ag元素含量Sn-Ag-Cu无铅钎料性能分析

分别研究了Ag元素含量(质量分数,%)为0.3,1.0,2.0,3.0,3.8的Sn-Ag-Cu(SAC)无铅钎料合金的显微结构、熔化行为、力学性能、润湿性和界面金属间化合物(IMC)形貌.结果表明,随着Ag元素含量的增加,钎料内部金属间化合物晶粒越小,晶粒在钎料中的密度越高,晶粒间距越小,金属间化合物产生的弥散强化越明显,钎料的抗拉强度越高,但韧性越低.随Ag元素含量的提高,钎料越接近共晶成分,熔化温度范围越小.Ag元素含量对润湿性影响不明显,SAC0307/Cu焊点界面IMC晶粒比其它钎料细小.     

Ni和Bi元素对SnAgCu钎焊界面金属化合物生长速率的影响

通过加速温度时效方法研究Ni和Bi元素对低银(含银量小于1%,质量分数)Sn-Ag-Cu(LASAC)钎料界面IMC生长速率的影响。通过与高银钎料SAC305和低银钎料LASAC对比,分析添加Ni和Bi元素后LASAC钎料在高温时效过程中热疲劳抗性的变化情况。结果表明:LASAC/Cu、LASAC-Bi/Cu和SAC305/Cu界面IMC时效后均形成较厚的Cu3Sn层,LASAC-Ni/Cu界面经IMC时效后则形成较薄的(Cu,Ni)3Sn;高银钎料SAC305在180℃时效下IMC生长速率为2.17×10-5μm2/s,与之相比,低Ag钎料LASAC IMC在时效过程中生长速率较高,为3.8×10-5μm2/s;Ni和Bi元素的添加均可降低钎料LASAC/Cu界面IMC的生长速率,其中Bi的改善效果最显著,LASAC-Bi钎料的IMC生长速率为1.92×10-5μm2/s,低于SAC305钎料的IMC生长速率。     

冷热冲击对无铅钎料可靠性的影响

文中对比了一种新型低银钎料Sn-Ag-Cu-Bi-Ni（SACBN07）与市场上的SAC305,SAC0307两种无铅钎料的抗冷热冲击性能.利用纳米压痕试验等微观测试方法研究时效后界面组织及力学性能的变化.结果表明,SACBN07的抗冷热冲击性能最好,焊点失效后三种材料中裂纹的扩展路径不同,SAC305失效裂纹位于体钎料中,SACBN07钎料断裂位置逐渐由钎料基体转移到金属间化合物（IMC）层中,而SAC0307断裂位于界面IMC中;钎料中Bi,Ni元素的加入有效地抑制了IMC的生长,相同冷热冲击时间,SACBN07钎料中界面IMC厚度最薄;SACBN07体钎料的硬度受冷热冲击影响最小,时效后仅降低了8.6%,而SAC305与SAC0307分别降低了12.5%和28.3%.     

Cu基板粗糙度对SnAgCu无铅钎料润湿性的影响

在微电子封装软钎焊领域,钎料的润湿性直接决定焊接接头的性能.文中以不加入外来元素为前提,以SAC305/Cu钎焊体系为研究对象,完成了SAC305钎料在不同粗糙度Cu基板上的润湿铺展试验,研究了Cu基板粗糙度对SnAgCu钎料润湿性及SnAgCu/Cu界面化合物形貌与分布的影响.结果表明,?SnAgCu钎料在Cu基板上...     

倒装LED回流焊接头组织的抗高温时效性能

以SAC305锡膏为钎料,通过回流焊实现了倒装LED与Cu/Ag、Cu/Ni/Au基板的互连.研究了两种接头界面微观组织在高温时效条件下的演变行为.结果表明,接头两侧界面组织间存在相互影响. Cu/Ni/Au基板中的Au在回流焊过程中溶解至体钎料内,对芯片侧Au-Sn金属间化合物的生长起到抑制效果.芯片侧Au-Sn金属间化合物的快速生长降低了体钎料中Sn的相对浓度,从而使体钎料中有利于基板侧IMC生长组元的相对浓度得到提升,促进基板侧IMC生长.相比较而言,在Cu/Ag基板上的回流焊试样抗高温时效性能较差.     

纳米颗粒增强SAC0307锡膏焊点的分析

研究了纳米颗粒添加对低银SAC0307锡膏焊点显微组织和力学性能的影响.结果表明,添加纳米铜颗粒的焊点钎料共晶区中岛状Cu₆Sn₅相尺寸大、且难于弥散分布,添加量超过0.3%时,Cu₆Sn₅相极易在液/气界面聚集、合并和长大,导致钎料流动性变差、锡膏中助焊剂气体难于逸出而形成气孔.而添加0.1~5.0%纳米银颗粒的焊点均无气孔产生,其焊点钎料中的Ag₃Sn相尺寸小易于弥散分布,且β-Sn初晶相细化明显.随纳米银添加量的增加,焊点抗剪强度先增加后降低,0.5%添加量时抗剪强度最大、较相同条件下的SAC0307焊点提高了30.8%.     

Plastic characterization and performance of SnAgCuBiNi/Cu lead-free BGA solder joints

Nanoindentation test is performed on study the plastic and creep properties of the Sn-Ag-Cu (SAC) lead-free ball grid array (BGA) solder joints. The dynamic hardness of two kinds of solder joints decreases with indentation depth increase. SAC0705BiNi/Cu exhibits a higher ultimate dynamic hardness and a smaller indentation depth than SAC305/Cu. Then the strain hardening phenomenon of SAC305/Cu is more obvious compared to that of SAC0705BiNi/Cu. The indentation creep of SAC0705BiNi/Cu solder joint is lower than that of SAC305/Cu solder joint before and after thermal shock. The creep rate sensitive index of SACBiNi/Cu solder joint is lower than that of solder joint. SAC0705BiNi/Cu solder joint is superior to SAC305/Cu solder joint in the anti-creep property. The plasticity of SAC0705BiNi/Cu and SAC305/Cu solder joints are similar. Compared with SAC305 solder, the SAC0705BiNi solder performs higher hardness and solder creep resistance and still maintains a good plasticity.     

Comparative Study on Solid-State and Metastable Liquid-State Aging for SAC305/Cu Joints

In order to study the in?uence of the physical state of solder on the interfacial reaction of dip-soldered Sn-3.0 Ag-0.5 Cu/Cu system, two kinds of experiments were designed, including:(1) solid-state aging between the solder and Cu substrate;(2)liquid-state aging between the metastable supercooled liquid-state solder and Cu substrate. The aging times were 30, 60,120 and 180 min, respectively, and the aging temperature was 8 ℃ lower than the melting point of the Sn-3.0 Ag-0.5 Cu(SAC305) alloy(217 ℃). The experimental data revealed that the physical state of the solder obviously affected the formation of the intermetallic compound(IMC), and resulted in the difference in the diffusion of atoms on the interface between the SAC305 solder and Cu substrate. The IMC interface after aging for 30 min presents unique characteristics compared with that of the sample after dip soldering. The IMC interface of solid-state aged SAC305/Cu couple is relatively planar, while the IMC interface under metastable supercooled liquid-state aging conditions presents scallop-like shape.     

磁控溅射Cu-Cr合金薄膜与Sn-Ag-Cu焊料在时效处理时的界面反应

采用磁控溅射的方式沉积不同Cr含量的Cu-Cr合金薄膜,通过与Sn-Ag-Cu(SAC)焊料在240 ℃下回焊形成焊点结构,然后将试样置于180 ℃下进行真空时效处理。研究Cu-Cr合金作为凸点下金属化(UBM)层时与SAC形成焊点的焊接可靠性。使用配备能量色散X射线光谱仪的场发射扫描电镜和多功能推力测试仪等分析界面金属间化合物(IMC)的形貌及焊点的剪切强度。结果表明,SAC/Cu-Cr焊点结构在回焊后形成了不同于传统的SAC/Cu焊点扇贝状IMC的针状IMC。在时效处理后,Cr在晶界处的偏析形成了富铬层,其作为扩散阻挡层阻碍Cu扩散到IMC中,使得Cu₃Sn和柯肯达尔空洞的生长受到抑制。剪切强度测试结果表明,回焊后SAC/Cu-Cr试样比SAC/Cu试样具有更高的剪切强度。Cr靶电流为1.5 A的Cu-Cr合金UBM层形成的焊点结构具有较小的IMC厚度,且拥有最高的焊点剪切强度。证实了Cu-Cr 合金UBM层有利于提高焊接可靠性。     

铋对SAC305−xBi/Cu焊接接头显微组织、热性能、力学性能和界面行为的影响

通过添加1％ 和2％(质量分数)的Bi提高SAC305焊接接头的性能,并研究Bi掺杂对SAC305?xBi/Cu焊接接头显微组织、热性能和力学性能的影响.Bi掺杂通过细化初始β-Sn和共晶相改善焊接接头的显微组织.当Bi含量低于2％ 时,Bi溶解到β-Sn基体中形成固溶体;而当Bi含量等于或高于2％时,β-Sn基体中形...     

热老化与热循环条件下Bi对Sn-1.0Ag-0.5Cu无铅焊点界面组织与性能的影响

研究了在热老化和热循环过程中Bi的添加对低银无铅钎料Sn-1.0Ag-0.5Cu (SAC105)的BGA焊点界面微观组织演变的影响,分析了Bi的添加对SAC105微焊点热老化与热循环剪切性能的影响. 结果表明,Bi元素添加量为2%(质量分数)时,对热循环过程中微焊点界面处金属间化合物(IMC)层整体厚度的增加起到抑制作用,同时阻碍了热循环过程中因焊点热失配导致的IMC层破碎. 但是Bi的添加促进了界面IMC层中Cu₃Sn层的生长,因此在经过20天以上热老化处理后SAC105-2Bi微焊点界面IMC层厚度与SAC105微焊点接近. 此外,Bi的添加可以显著提升热循环处理后SAC105微焊点的抗剪切能力. SAC105-2Bi微焊点的剪切力学性能受到热循环处理的影响较小. 与SAC105微焊点相比,SAC105-2Bi微焊点的断裂模式更早地从韧性断裂向脆性断裂转变,因此Bi的添加降低了SAC105微焊点的热循环可靠性.     

Ti90及其优化合金的组织与力学性能研究

研究了钎焊与时效过程中,在Sn0.7Ag0.5Cu(SAC0705)钎料与Cu基板和石墨烯Cu基板界面处金属间化合物(IMC)的形成与演变。采用加热平台制备焊接试样并在120℃时效600h。结果表明,界面金属间化合物在时效过程中增厚。SAC0705/Cu和SAC0705/G-Cu 2种焊接界面金属间化合物均为Cu6Sn5。当钎料中添加Ni元素后,Cu6Sn5化合物转变为(Cu,Ni)6Sn5。随着钎料中Ni元素含量的增大,2种基板上的界面金属间化合物厚度先增加后减小。此外,随着Ni含量增大,化合物生长速率降低。石墨烯Cu基板表面的石墨烯层起到扩散阻挡层效果,因此,石墨烯Cu板上的化合物厚度小于常规Cu基板,同时其界面化合物生长速率较低。     

Fe粉对Sn-3Ag-0.5Cu复合钎料组织及性能的影响

通过在钎料中添加Fe粉颗粒,研究其对Sn-3Ag-0.5Cu复合无铅钎料的黏度、熔点、钎焊接头界面微观组织、与Cu基板之间的润湿性及焊点力学性能的影响。结果表明:微米级Fe粉的添加增加了复合钎料焊膏单位体积内焊粉的接触面积,使得焊膏内摩擦力增大,导致复合钎料焊膏的黏度增加;微米级Fe粉的添加对Sn-3Ag-0.5Cu钎料的熔化特性没有显著影响;钎焊时,由于重力偏聚及界面吸附作用,Fe粉颗粒集中沉积于Sn-3Ag-0.5Cu-Fe/Cu钎焊接头界面处靠近钎料一侧,由于增大液态钎料黏度而导致钎料与Cu板间的润湿性降低;与Sn-3Ag-0.5Cu/Cu相比,Sn-3Ag-0.5Cu-Fe/Cu界面处钎料一侧粗大的β-Sn枝晶区消失,取而代之的是细小的等轴晶。Sn-3Ag-0.5Cu-1%Fe/Cu的剪切强度为46 MPa,比Sn-3Ag-0.5Cu/Cu剪切强度提高39%;靠近界面金属间化合物处钎料基体的显微硬度提高约25%。     

Property alterations of Sn-0.6Cu-0.05Ni-Ge lead-free solder by Ag,Bi, In and Sb addition

The Sn-Cu-Ni-Ge solder is a strong challenger to the Sn-Ag-Cu (SAC) solders as a replacement for the Sn-Pb eutectic solder. This research investigated the effects of addition of Ag, Bi, In, and Sb on the physical properties of the Sn-0.6Cu-0.05Ni-Ge (SCNG) lead-free solder and the interfacial reaction with the Cu substrate. The melting behavior, microstructure, tensile strength, and wettability of the SCNG–x (x=Ag, Bi, In, Sb) solders were examined. The findings revealed that the introduction of Ag, Bi, In, and Sb minimally altered the solidus temperature, liquidus temperature, and tensile strength of the solder. However, the cooling behavior and solidified microstructure of the solder were affected by the concentration of the alloying elements. The wettability of the SCNG solder was improved with the doping of the alloying elements except Sb. The thickness of intermetallic layer was increased by the addition of the alloying elements and was related to the cooling behavior of the solder. The morphology of intermetallic layer between the SCNG–x solders and the Cu substrate was different from that of the typical SAC solders. In conclusion, alloying the SCNG solder with Ag, Bi, In or Sb is able to improve particular properties of the solder.     

Suppressing effect of 0.5 wt.% nano-TiO2 addition into Sn-3.5Ag-0.5Cu solder alloy on the intermetallic growth with Cu substrate during isothermal aging

This study investigated the effects of adding 0.5 wt.% nano-TiO₂ particles into Sn3.5Ag0.5Cu (SAC) lead-free solder alloys on the growth of intermetallic compounds (IMC) with Cu substrates during solid-state isothermal aging at temperatures of 100, 125, 150, and 175 °C for up to 7 days. The results indicate that the morphology of the Cu₆Sn₅ phase transformed from scallop-type to layer-type in both SAC solder/Cu joints and Sn3.5Ag0.5Cu-0.5 wt.% TiO₂ (SAC) composite solder/Cu joints. In the SAC solder/Cu joints, a few coarse Ag₃Sn particles were embedded in the Cu₆Sn₅ surface and grew with prolonged aging time. However, in the SAC composite solder/Cu aging, a great number of nano-Ag₃Sn particles were absorbed in the Cu₆Sn₅ surface. The morphology of adsorption of nano-Ag₃Sn particles changed dramatically from adsorption-type to moss-type, and the size of the particles increased.The apparent activation energies for the growth of overall IMC layers were calculated as 42.48 kJ/mol for SAC solder and 60.31 kJ/mol for SAC composite solder. The reduced diffusion coefficient was confirmed for the SAC composite solder/Cu joints.     

时效时间对Cu/In-Sn-2.5Ag/Cu焊点组织形貌及剪切性能的影响

研究了Cu/In-Sn-2.5Ag/Cu复合钎料焊点在125 ℃时效不同时间后的微观组织和剪切性能。结果表明:随着时效时间的延长,Cu/In-Sn-2.5Ag/Cu焊点界面金属间化合物(IMCs)层厚度呈现增加的趋势,焊点界面IMCs层组织先生成Cu₆(In, Sn)₅相,同时焊点中生成少量的Ag₉In₄相,随着时效时间的延长,钎料与Cu原子进一步反应生成Cu₃(In, Sn),部分Ag₉In₄转变为Ag₃In。当时效时间为168 h,形成全IMCs焊点。焊点剪切强度随时效时间延长呈现先增大后减小的趋势,时效时间为120 h时剪切强度最大,达到15.38 MPa。     

不同剪切速率下锡银铜系/镍金焊点的断裂行为研究

对锡银铜系高可靠性焊料合金的研究虽然已经较为广泛,但是缺乏对其焊点在不同应变速率下的剪切强度和断裂模式的研究。本文将牌号为SAC305和Innolot不同成分的锡银铜系焊料合金锡膏印刷在镍金镀层(Ni(P)/Au)上回流成BGA焊点,采用DAGE 4000 HS焊接强度测试仪进行不同剪切速率下的剪切性能测试,并对其剪切曲线、剪切强度及断裂能进行计算和分析,再采用金相显微镜和扫描电子显微镜(SEM)对焊点界面微观结构及断口进行表征分析。结果表明：合金本身成分的差异导致焊点界面金属间化合物层(IMC层)厚度和分布存在差异,随着剪切速率的增加,SAC305和Innolot合金焊点的强度总体上都随之增加,且焊点的断裂模式由焊点基体内部的韧性断裂向界面金属间化合物脆性断裂发生转变,Innolot合金由于其他金属元素添加导致的强化作用使得其剪切强度得到较大提升而塑性损伤。     

Ni-CNTs增强颗粒对Sn58Bi-0.1Er焊点组织与力学性能的影响

采用真空熔炼方法制备了不同Ni-CNTs含量的Sn58Bi-0.1Er钎料合金,研究不同Ni-CNTs含量对Sn58Bi-0.1Er复合钎料在Cu基板上的润湿性能的影响,并对不同Ni-CNTs含量下接头界面处金属间化合物的组织形貌及接头的剪切性能进行了分析.结果表明,当Ni-CNTs增强颗粒的添加为0.01％～0.05...     

β-Sn晶粒取向及温度对Cu/SAC305/Cu微焊点时效界面反应的影响

为了探究不同等温时效温度下β-Sn晶粒取向及晶界特征对界面反应的影响,采用准原位观测手段对不同Sn取向的Cu/Sn3.0Ag0.5Cu/Cu(Cu/SAC305/Cu)微焊点进行研究. 结果表明,在不同温度下时效时,微焊点两侧界面IMC(Cu₆Sn₅ + Cu₃Sn两相)自始至终呈现对称性生长,表明时效过程中β-Sn晶粒取向及晶界的存在不会影响界面反应. 但是随着时效温度的升高,界面IMC的形貌和厚度发生明显变化. 在100 ℃时效后,界面处生成扇贝状的Cu₆Sn₅和较薄的不连续的Cu₃Sn层;在125 ℃时效后,界面处生成扇贝状的Cu₆Sn₅和较薄的连续的Cu₃Sn层;而在150 ℃时效后,界面IMC由层状Cu₆Sn₅和层状Cu₃Sn双层结构组成. 时效温度的升高促使Cu和Sn原子扩散加快,促进了扇贝状Cu₆Sn₅向层状转变并造成Cu₃Sn的快速生长. 同时,基于界面IMC厚度随时效时间的演变规律,获得了不同时效温度下微焊点界面IMC生长曲线,可为Sn基微焊点的可靠性评价提供依据.