Polarizing properties of embedded symmetric trilayer stacks under conditions of frustrated total internal reflection

An all-transparent symmetric trilayer structure, which consists of a high-index center layer coated on both sides by a low-index film and embedded in a high-index prism, can function as an efficient polarizer or polarizing beam splitter under conditions of frustrated total internal reflection over a wide range of incidence angles. For a given set of refractive indices, all possible solutions for the thicknesses of the layers that suppress the reflection of either the p or s polarization at a specified angle, as well as the reflectance of the system for the orthogonal polarization, are determined. A 633 nm design that uses a MgF2-ZnS-MgF2 trilayer embedded in a ZnS prism achieves an extinction ratio (ER) > 40 dB from 50 degrees to 80 degrees in reflection and an ER > 20 dB from 58 degrees to 80 degrees in transmission. IR polarizers that use CaF2-Ge-CaF2 trilayers embedded in a ZnS prism are also considered.     

Wide-angle, high-extinction-ratio, infrared polarizing beam splitters using frustrated total internal reflection by an embedded centrosymmetric multilayer

A centrosymmetric multilayer stack of two transparent thin-film materials, which is embedded in a high-index prism, is designed to function as an efficient polarizer or polarizing beam splitter (PBS) under conditions of frustrated total internal reflection over an extended range of incidence angles. The S(LH)(k)LHL(HL)(k)S multilayer structure consists of a high-index center layer H sandwiched between two identical low-index films L and high-index-low-index bilayers repeated (k times) on both sides of the central trilayer maintaining the symmetry of the entire stack. For a given set of refractive indices, all possible solutions for the thicknesses of the layers that suppress the reflection of p-polarized light at a specified angle, and the associated reflectance of the system for the orthogonal s polarization, are determined. The angular and spectral sensitivities of polarizing multilayer stacks employing 3, 7, 11, 15, and 19 layers of BaF(2) and PbTe thin films embedded in a ZnS prism, operating at lambda=10.6 microm, are presented. The 15- and 19-layer stack designs achieve extinction ratios (ER) >30 dB in both reflection and transmission over a 46 degrees -56 degrees field of view inside the prism. Spectral analysis reveals additional discrete polarizing wavelengths other than the design wavelength (lambda=10.6 microm). The 11-, 15-, and 19-layer designs function as effective s-reflection polarizers (|R(s)|(2)>99%) over a 2-3 microm bandwidth. The effect of decreasing the refractive index contrast between the H and L layers on the resulting ER is also considered.     

Analytical relations for thin-film total internal reflection phase retarders

Single-layer coatings on total internal reflection boundaries that produce any specific phase retardation are analyzed. One- and two-reflection phase-retarding systems are considered. Simple quadratic equations are obtained for an unknown layer phase thickness at a given angle of incidence and phase retardation. Equations for specific multilayer coatings that are equivalent to single-layer designs are also deduced. Diagrams of solution zones for refractive indices are given comparatively for one- and two-reflection systems.     

Integrated photonic coupler based on frustrated total internal reflection

An optical coupler for integrated photonic circuits is presented and analyzed. The coupler is based on frustrated total internal reflection (FTIR) and offers high efficiency in a compact footprint. Analytic expressions for the transmission and reflection coefficients of the coupler are obtained using a plane-wave theory and experimentally verified. Finite-difference time-domain modeling of FTIR is discussed and modeling results of the coupler are presented. A parametric discussion of the FTIR coupler provides design tools for making 3 dB couplers.     

Application of frustrated total internal reflection devices to analytical laser spectroscopy

Novel implementations of single-fiber laser-induced breakdown spectroscopy and laser-induced fluorescence spectroscopy systems that gated light switches based on frustrated total internal reflection are described. The switching devices are largely wavelength independent, with full temporal and spatial separation of laser and fluorescence light. Wavelength-independent beam separation or beam combination schemes can be implemented for coaxial optical setups, e.g., in single-fiber or telescopic experimental arrangements. Selected practical examples of schemes for qualitative and quantitative analytical spectroscopy are discussed.     

Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si-SiO2 interface

An achromatic infrared (lambda = 1.2-4 microm), Si-prism quarter-wave retarder (QWR) is described that uses total internal reflection at a buried Si-SiO2 interface at an angle of incidence phi near 33 degrees, where deltaDelta/deltaphi = 0. The retardance delta deviates from 90 degrees by < +/- 2 degrees within a field of view of +/- 10 degrees (in air) over the entire bandwidth. Because the SiO2 layer at the base of the prism is optically thick, this QWR is unaffected by environmental contamination.     

Attenuated total internal reflection infrared microscopy of multilayer plastic packaging foils

Multilayer plastic foils are important packaging materials that are used to extend the shelf life of food products and drinks. Fourier transform infrared (FT-IR) spectroscopic imaging using attenuated total internal reflection (ATR) can be used for the identification and localization of different layers in multilayer foils. A new type of ATR crystal was used in combination with a linear array detector through which large sample areas (400 x 400 microm(2)) could be imaged with a pixel size of 1.6 microm. The method was tested on laminated plastic packing materials containing 5 to 12 layers. The results of the identification of the different materials using ATR-FT-IR were compared with differential scanning calorimetry (DSC) and the layer thickness of the individual layers measured by ATR-FT-IR was compared with polarized light microscopy (LM) and scanning electron microscopy (SEM). It has been demonstrated that individual layers with a thickness of about 3 microm could be identified in multilayer foils with a total thickness ranging from 100 to 150 microm. The results show a spatial resolution of about 4 microm (measured at wavenumbers ranging from 1000 to 1730 cm(-1)), which is about a factor of two better than can be obtained using transmission FT-IR imaging. An additional advantage of ATR is the ease of sample preparation. A good correspondence was found between visible and FT-IR images. The results of ATR-FT-IR imaging were in agreement with those obtained by LM, SEM, and DSC. ATR-FT-IR is superior to the combination of these techniques because it delivers both spatial and chemical information.     

Nonpolarizing beam splitter designed by frustrated total internal reflection inside a glass cube

A method for the design of an all-dielectric nonpolarizing prism beam splitter utilizing the principle of frustrated total internal reflection is reported. The nonpolarizing condition for a prism beam splitter is discussed, and some single layer design examples are elaborated. The concept can be applied to a wide range of wavelengths and arbitrary transmittance values, and with the help of a computer design program examples of 400-700 nm, T(p)=T(s)=0.5+/-0.01, with incident angles of 45 degrees and 62 degrees are given. In addition, the sensitivity and application of the design are also discussed.     

Phase shifts in frustrated total internal reflection and optical tunneling by an embedded low-index thin film

Simple and explicit expressions for the phase shifts that p- and s-polarized light experience in frustrated total internal reflection (FTIR) and optical tunneling by an embedded low-index thin film are obtained. The differential phase shifts in reflection and transmission deltar, deltat are found to be identical, and the associated ellipsometric parameters psir, psit are governed by a simple relation, independent of film thickness. When the Fresnel interface reflection phase shifts for the p and s polarizations or their average are quarter-wave, the corresponding overall reflection phase shifts introduced by the embedded layer are also quarter-wave for all values of film thickness. In the limit of zero film thickness (i.e., for an ultrathin embedded layer), the reflection phase shifts are also quarter-wave independent of polarization (p or s) or angle of incidence (except at grazing incidence). Finally, variable-angle FTIR ellipsometry is shown to be a sensitive technique for measuring the thickness of thin uniform air gaps between transparent bulk media.     

Principal angles and principal azimuths of frustrated total internal reflection and optical tunneling by an embedded low-index thin film

The condition for obtaining a differential (or ellipsometric) quarter-wave retardation when p- and s-polarized light of wavelength λ experience frustrated total internal reflection (FTIR) and optical tunneling at angles of incidence ? ≥ the critical angle by a transparent thin film (medium 1) of low refractive index n1 and uniform thickness d, which is embedded in a transparent bulk medium 0 of high refractive index n0 takes the simple form: -tanh2 x = tan δp tan δs, in which x = 2πn1(d/λ)(N2sin2? - 1)(1/2), N = n0/n1, and δp, δs are 01 interface Fresnel reflection phase shifts for the p and s polarizations. From this condition, the ranges of the principal angle and normalized film thickness d/λ are obtained explicitly. At a given principal angle, the associated principal azimuths ψr, ψt in reflection and transmission are determined by tan2ψr = -sin 2δs/sin 2δp and tan2ψt = -tan δp/tan δs, respectively. At a unique principal angle ?e given by sin2?e = 2/(N2 + 1), ψr = ψt = 45° and linear-to-circular polarization conversion is achieved upon FTIR and optical tunneling simultaneously. The intensity transmittances of p- and s-polarized light at any principal angle are given by τp = tan δp/tan (δp - δs) and τs = -tan δs/tan (δp - δs), respectively. The efficiency of linear-to-circular polarization conversion in optical tunneling is maximum at ?e.     

Measurements of complex refractive indices of metals at several wavelengths by frustrated total internal reflection due to surface plasmon resonance

By employing a modified Otto's configuration for measuring surface plasmon resonance that has been proposed by Bliokh and his coworkers [Appl. Phys. Lett.89, 021908 (2006)APPLAB0003-695110.1063/1.2220540] we have obtained complex refractive indices of metals at several wavelengths. We demonstrate that the configuration has high potential for obtaining dispersion relations of metal conductors in bulk samples as well as in thin films from the visible to the near-infrared wavelength region. Furthermore, we show that the configuration enables us to obtain the complex refractive indices of metals or a thickness or refractive index of a dielectric layer on the metal at different points simultaneously. We have constructed a measurement system and carried out basic experiments. The experimental results agreed well with numerically simulated values or published ones.     

Comparison of quarter-wave retarders over finite spectral and angular bandwidths for infrared polarimetric-imaging applications

We compare three technological approaches for quarter-wave retarders within the context of polarimetric-imaging applications in the long-wave infrared (LWIR) spectrum. Performance of a commercial cadmium sulfide (CdS) crystalline waveplate, a multilayer meanderline structure, and a silicon (Si) form-birefringent retarder are evaluated under conditions of 8-12 μm broadband radiation emerging from an F/1 focusing objective. Metrics used for this comparison are the spectrally dependent axial ratio, retardance, and polarization-averaged power transmittance, which are averaged over the angular range of interest. These parameters correspond to the characteristics that would be observed at the focal-plane array (FPA) detector of an LWIR imaging polarimeter.     

Scanning total internal reflection fluorescence microscopy under one-photon and two-photon excitation: image formation

We propose a new type of total internal reflection fluorescence microscopy (TIRFM) called scanning TIRFM (STIRFM) that uses a focused ring-beam illumination and a high-numerical-aperture objective (NA = 1.65). The evanescent field produced by the STIRFM is focused laterally, producing a small excitation volume that can induce a nonlinear effect such as two-photon absorption. Experimental images of CdSe quantum dot nanocrystals and Rhodamine 6G-doped microbeads show that good lateral and axial resolutions are achieved with the current setup. The theoretical simulation of the focal spot produced in STIRFM geometry shows that the focused evanescent field is split into two peaks because of the depolarization effect of a high numerical-aperture objective lens. However, the point-spread function analysis of both one-photon and two-photon excitation cases shows that the detection of the focus-splitting effect is dependent on the detection pinhole size. The effect of pinhole size on image formation is theoretically investigated and confirmed experimentally with the nanocrystal images.     

Metrological and technical characteristics of total internal reflection refractometers

Metrological and technical characteristics and diagrams of automatic total internal reflection refractometers are considered. Measurement of the refractive index of a substance from the affected total internal reflection spectrum is also considered.Translated from Izmeritelnaya Tekhnika, No. 11, pp. 50–54, November, 2004.     

Behavior of total internal reflection in optical crystals

It is shown that a crystal can be cut so that one incident beam undergoing reflected from an inclined face inside the crystal excites four beams, two ordinary and two extraordinary, propagating in different directions. Pis’ma Zh. Tekh. Fiz. 25, 46–51 (January 12, 1999)     

Novel attenuated total reflection Fourier transform infrared microscopy using a gem quality diamond as an internal reflection element

A novel technique for attenuated total reflection Fourier transform infrared (ATR FT-IR) spectral acquisition by an infrared microscope with a gem-quality faceted diamond as an internal reflection element (IRE) is introduced. Unlike conventional IREs, the novel diamond IRE has a sharp tip configuration instead of a flat tip configuration. Light at normal incidence was coupled into the diamond while the transflected radiation from the diamond was collected through the table facet by the built-in 15x Cassegrainian objective. The number of reflections in the novel diamond IRE equals two. The evanescent field generated under total internal reflection at the pavilion facet was exploited for ATR spectral acquisition of materials attached to the IRE. The observed ATR spectra were compared to those obtained via a traditional zinc selenide IRE.     

Attenuated total internal reflection infrared microspectroscopic imaging using a large-radius germanium internal reflection element and a linear array detector

The number of techniques and instruments available for Fourier transform infrared (FT-IR) microspectroscopic imaging has grown significantly over the past few years. Attenuated total internal reflectance (ATR) FT-IR microspectroscopy reduces sample preparation time and has simplified the analysis of many difficult samples. FT-IR imaging has become a powerful analytical tool using either a focal plane array or a linear array detector, especially when coupled with a chemometric analysis package. The field of view of the ATR-IR microspectroscopic imaging area can be greatly increased from 300 x 300 microm to 2500 x 2500 microm using a larger internal reflection element of 12.5 mm radius instead of the typical 1.5 mm radius. This gives an area increase of 70x before aberrant effects become too great. Parameters evaluated include the change in penetration depth as a function of beam displacement, measurements of the active area, magnification factor, and change in spatial resolution over the imaging area. Drawbacks such as large file size will also be discussed. This technique has been successfully applied to the FT-IR imaging of polydimethylsiloxane foam cross-sections, latent human fingerprints, and a model inorganic mixture, which demonstrates the usefulness of the method for pharmaceuticals.     

Silica colloidal crystals as porous substrates for total internal reflection fluorescence microscopy of live cells

Total internal reflection fluorescence (TIRF) microscopy is a powerful means of probing biological cells because it reduces autofluorescence, but the need for direct contact between the cell surface and the microscope slide hinders chemical access to the cell surface. In this work, a submicrometer crystalline layer of colloidal silica on the microscope coverslip is shown to allow TIRF microscopy while also allowing chemical access to the cell surface. A 750 nm layer of 165 nm silica colloidal crystals was sintered onto a fused silica coverslip, and Chinese hamster ovary cells were successfully grown on this surface. This cell line over-expresses the human delta-opioid receptor, which enabled probing of the binding of a labeled ligand to the receptors on the cell surface. Total internal reflection and chemical access to the cell surface are demonstrated. The range of angles for total internal reflection is reduced only by 1/3 due to the lower index of refraction of the colloidal multilayer relative to fused silica.     

Modulation of retroreflection by controlled frustration of total internal reflection

Retroreflective images are useful in outdoor application for which high legibility is required both during the day and in response to vehicular illumination. To date, all variable message retroreflective images have employed mechanical shutters as the switching mechanism. As an alternative, we propose a method for switching the total internal reflection effect used in retroreflectors by means of pneumatic actuation of surface treated polydimethylsiloxane gel. This approach is both effective and compatible with current large-scale manufacturing methods.     

Optical characterization of multilayer stacks used as phase-change media of optical disk data storage

We report results of measurements of the optical constants of the dielectric layer (ZnS-SiO2), reflecting layer (aluminum-chromium alloy), and phase-change layer (GeSbTe, AgInSbTe) used as the media of phase-change optical recording. The refractive index n and the absorption coefficient k of these materials vary to some extent with the film thickness and with the film deposition environment. We report the observed variations of optical constants among samples of differing structure and among samples fabricated in different laboratories.