X-ray scattering in X-ray fluorescence spectra with X-ray monochromatic, polarised excitation - Modelling, experiment, and Monte-Carlo simulation

A systematic series of measurements has been carried out with monochromatic X-ray excitation with synchrotron radiation in order to check a physical model on X-ray scattering. The model has recently been successfully tested for the case of polychromatic, unpolarised excitation emitted by an X-ray tube. Our main purpose is the modelling of a physical background in X-ray fluorescence spectra, so that improved quantitative results can be achieved especially for strongly scattering specimens. The model includes single Rayleigh and Compton scattering in the specimen, the effect of bound electrons, the challenging Compton broadening and the polarisation degree. Representative specimens, measurement geometries and excitation energies have been selected with synchrotron monochromatic light at BAMline/BESSY II. Monte-Carlo simulations have been also carried out in order to evaluate the quality of the results achieved with the model.     

Calculation of depth-dependent elemental concentration with X-ray fluorescence using a layered calibration method

Depth-dependent elemental concentration can be assessed using either multiple-angle or confocal X-ray fluorescence (XRF) measurements. This work presents a different approach based on a layered calibration method. The depth-dependent elemental concentration was modeled as multiple layers of uniform elemental concentrations. The unknown elemental concentration in each layer can be calculated using a single-angle XRF measurement, layered calibration data, and a priori knowledge of the concentration behavior as a function of depth. The method was verified using a commercial portable X-ray spectrometer and four-layer stacks of polyester resin discs doped with various concentrations of arsenic. This approach is particularly suitable for quantitative in vivo measurements of arsenic and selenium concentrations in the human skin since minimal ionizing radiation exposure constrains the number of XRF measurements.     

X射线吸收光谱技术中的滤光片研制

在同步辐射X射线吸收光谱(XAS)实验中,X射线滤光片用于吸收样品的康普顿散射和弹性散射,改善荧光信号的质量。我们将ZnO颗粒分散在聚氨酯溶液里,通过恰当的喷涂工艺,获得ZnO滤片。X射线衍射(XRD),X射线荧光(XRF)及X射线吸收光谱(XAS)实验结果表明：在滤片制备过程中,ZnO结构保持不变。进一步地,ZnO滤片用于测量Ga2O3的GaK边XAS谱,显示出好的信噪比。采用同样的方法还制备了其它X射线滤光片,表明这种X射线滤光片制备技术的可行性和实用性。     

基于傅里叶变换的本底扣除法在X荧光分析中的应用

X荧光分析(XRF)法具有原位、快速和多元素同时测量等优点,广泛应用于野外测量和实验室分析。由XRF谱全能峰获得元素含量,须作本底扣除。本文采用基于傅里叶变换的本底扣除法,其特点为分析准确度高、不易受本底变化影响。结果显示,采用FFT本底扣除,野外测量得到的Sr含量与实验室分析结果的平均误差为11.0%;而用线性本底扣除,该平均误差为25.9%。     

Iterative and accurate determination of small angle X-ray scattering background

X-ray scattering is widely used in material structural characterizations.The weak scattering nature,however,makes it susceptible to background noise and can consequently render the final results unreliable.In this paper,we report an iterative method to determine X-ray scattering background and demonstrate its feasibility by small angle X-ray scattering on gold nanoparticles.This method solely relies on the correct structural modeling of the sample to separate scattering signal from background in data fitting processes,which allows them to be immune from experimental uncertainties.The importance of accurate determination of the scaling factor for background subtraction is also illustrated.     

不同黑腔的X光辐射和散射光特性实验研究

在神光Ⅱ三倍频实验中，设计了多种半腔靶构型，研究不同黑腔构型的X光辐射和散射光特性。采用多种探测设备对多角度辐射温度、软X光谱、M带角分布、X光总量、超热电子、散射光、漏激光和受激拉曼散射（SRS）等物理量进行了综合测量，并比较了不同靶型的相关物理量。     

Identification of origin of single aerosol particles using polycapillary X-ray lens

A micro X-ray fluorescence (Micro-XRF) spectrometer based on a polycapillary focusing X-ray lens (PFXRL) and a laboratory X-ray source was designed to carry out the XRF analysis of single aerosol particles. The minimum detection limit (MDL) of this Micro-XRF spectrometer was 9 ppm for the Fe-Kα. The percentage of the particles of vehicle exhaust among aerosol particles was studied in Beijing, Chinese capital, during the test of odd-even driving restrictions for Beijing 2008 Olympics Games. This Micro-XRF spectrometer had potential applications in the analysis of single aerosol particles.     

Multiple scattering approach to X-ray absorption spectroscopy

In this paper we present the state of the art of the theoretical background needed for analyzing X-ray absorption spectra in the whole energy range. The multiple-scattering (MS) theory is presented in detail with some applications on real systems. We also describe recent progress in performing geometrical fitting of the XANES (X-ray absorption near-edge structure) energy region and beyond using a full multiple-scattering approach.     

Application of the MTSVD unfolding method for reconstruction of primary X-ray spectra using semiconductor detectors

A thorough knowledge of the primary spectrum is very important to perform a quality control (QC) of X-ray tubes. In previous works, a methodology to assess primary spectrum using a Compton spectrometer and applying the Monte Carlo (MC) method has been analyzed. By means of a Monte Carlo model, a response matrix can be built, relating the Pulse Height Distribution (PHD) recorded in the detector to the primary X-ray spectrum. Subsequently, an unfolding method based on the application of a Modified Truncated Singular Value Decomposition (MTSVD) is applied to the response matrix to assess the primary spectrum. Germanium (Ge), Silicon (Si) and Cadmium-Telluride (CdTe) detectors are considered in this work. The main goal of the paper is to determine whether the MTSVD unfolding method is adequate to provide an acceptable reproduction of spectra for these detectors.     

Measurement of tungsten impurity spectra with a two-crystal X-ray crystal spectrometer on EAST

Spectral measurement of tungsten (W) impurity is essential to study impurity transport. Therefore, an X-ray crystal spectrometer (XCS) on EAST was used to measure the line spectra from highly ionized W ions. On EAST, both poloidal XCS and tangential XCS have been developed to measure the plasma temperature as well as the rotation velocity. Recently, He-like and H-like argon spectra have also been obtained using a two-crystal setup. W lines are identified in this study. Through a careful analysis, the W lines of 3.9336, 3.9321, and 3.664 Å are found to be diffracted by He-like or H-like crystals. The lines are confirmed with the NIST database. We also calculated the ion temperature with Doppler broadening of these lines. The ion temperature from the W lines is entirely consistent with that from Ar line spectra. The measurement of these W line spectra could be used to study W impurity transport in future work.     

源激发X射线荧光测定头发中Ca、Fe、Cu、Zn、Pb的方法优化

同位素源激发X射线荧光（XRF）已广泛应用于头发中的微量元素测定。中国原子能科学研究院曾经建立了源激发X射线荧光分析技术分析头发样品,Pb的检测限（LLD）约10μg/g。本工作在原来工作的基础上优化仪器参数,降低背景信号强度,提高了灵敏度,尤其是对Pb的灵敏度,使Ca、Fe、Cu、Zn、Pb的检测限分别达到19、1.2、1.1、0.62、1.1μg。首次采用V做内标元素,取样量为0.5g,仪器的短期稳定性相对标准偏差（RSD）为0.38%,长期稳定性相对标准偏差为0.98%。     

Chemical effects in the Kβ X-ray emission spectra of sulfur

In this work our previous study about chemical effects in the K spectra of S compounds employing high-resolution X-ray spectroscopy has been extended to the Kβ emission spectra. The measurements were performed with a wavelength dispersive single crystal spectrometer operated in the von Hamos geometry having an energy resolution comparable to the natural linewidth of the measured Kβ X-ray lines. The target fluorescence was produced by irradiating the samples with the bremsstrahlung from an X-ray tube. The energies and widths of the main components in the Kβ emission spectrum are given for different sulfur compounds (sulfide, sulfite, sulfate). The measured energy shifts between the Kβ lines of the compounds and elemental sulfur are presented as a function of the sulfur oxidation state and compared with the results obtained from the former K measurements.     

Inelastic neutron scattering and prompt fission neutron spectra for Np

The secondary neutron spectra (inelastic, elastic, fission) for ²³⁷Np were measured by the neutron time of flight spectrometer of the IPPE at the incident energy range 1–2.5 MeV. The solid tritium target was used as a neutron source. The neptunium oxide (189 g) packed in the low mass stainless steel container was used as a scattering sample. The neutron background due to scattering on the target environment and tritium into the target backing was measured and was calculated with the appropriate model of the neutron source. The data were corrected for neutron background, the scattering on the oxygen and iron nuclei, and the effect of the finite sample size. The fission neutron spectra were measured, evaluated and subtracted from the emission neutron spectra to estimate inelastic neutron spectra and cross-sections. The experimental results were compared with ENDF/B-VI, BROND-2, JENDL-3 neutron data libraries.     

吸收法在强激光与固体靶所致脉冲X射线能谱测量中的研究进展北大核心CSCD

脉冲X射线能谱测量,对于强激光装置中的物理诊断以及辐射防护具有重要意义。脉冲X射线具有脉冲时间短、注量大、能谱范围宽等特点,常规脉冲测量技术往往受到探测器死时间、堆积效应的限制而无法适用。目前多个国家都建立了强激光装置的研究平台,并开展X射线能谱测量相关研究。本文首先介绍了基于吸收法原理且适用于中低能脉冲X射线的测量方法:Ross Pair法和衰减法。然后针对这两种方法从5个方面(探测器结构、滤片材料、探测介质选择、散射控制以及解谱方法)综述了脉冲X射线吸收谱仪的研究进展,并分析了各自的适用性。目前激光装置中脉冲X射线能谱的测量还面临着能量分辨率不理想、结果不确定度无法量化和被动式能谱测量操作不便等问题。随着激光装置的不断升级,脉冲X射线注量以及打靶频次将不断增加,对探测器的耐辐照性能以及响应速度提出了更高的要求。     

Total reflection X-ray fluorescence analysis using polycapillaries. A comparison with conventional setups

The possibility of producing parallel X-ray beams with low divergence by means of half monolithic polycapillaries gives the impression to be useful in total reflection X-ray fluorescence (TXRF) experiments. On one hand, the use of polycapillaries facilitates the alignment and the setup of the experiment. As expected, the spectra registered in the experiment shown low background and good signal-noise ratio. On the other hand, the intensity of photons on the samples when polycapillaries are employed is lower than in other configurations, which produces a loss of efficiency for the excitation of the sample mainly for light elements. In this work, different TXRF experiments were carried out and the minimum detection limits attained were compared with the ones obtained from TXRF using polycapillaries. The results indicate that the decrease of intensity produced by polycapillaries is imposing when detection limits are analyzed. Nevertheless, detection limits are better than conventional XRF. The possibility of employing non-symmetrical polycapillaries could eventually improve the detection limits so as to be equivalent to the conventional TXRF setups.     

X－射线谱数据处理软件SPAN／XRF的开发和应用

文章介绍了ｘ－射线谱数据处理软件ＳＰＡＮ／ＸＲＦ的算法原理、主要特点和用途。设计的软件中有多种实用的功能和较理想的用户界面。此软件在微机上运行，支持ＶＧＡ彩色图形显示、多种打印机和鼠标等外设。     

A Simulation Study on the Flash X-Ray Spectra Spatial Distribution

Accurate measurement of flash X-ray energy spectra plays an important role in highenergy flash radiography. In this paper, by virtue of Geant4 toolkit, we simulated the generation and transport of X-ray photons resulting from the interaction of a high-energy electron beam with a solid thin target. We obtained the flash X-ray energy spectral distribution in the plane perpendicular to the electron beam incident direction. Our results indicate that the flash X- ray spectrum is almost uniform in the azimuthal direction but is quite different in the radius direction. Specifically, as the radius increases, the incident X-ray dose decreases significantly. Our work paves a theoretical basis for selecting appropriate structures and layout of the spectrometer and facilitates the measurements of flash X-ray energy spectra.     

Scanning X-ray microfluorescence in a SEM for the analysis of very thin overlayers

In this paper, we used back-foil scanning X-ray microfluorescence (SXRF) and we examined the sensitivity of the technique for the analysis of very thin overlayers, where electron probe X-ray microanalysis (EPMA) reaches its detection limits. The lateral resolution of back-foil SXRF is also calculated for all the systems used. Both experimental results and Monte-Carlo calculations are used in this respect. Back-foil SXRF used in optimized experimental conditions, is found to be more sensitive than EPMA, especially in the case of very thin overlayers. The lateral resolution of back-foil SXRF is of the order of some micrometers. This is much better than the lateral resolution in conventional XRF and of the same order of magnitude as in EPMA.     

X射线荧光分析中原级谱分布的计算

X射线荧光分析中,X射线管产生的原级谱的分布对荧光分析的影响很大。尤其是在元素间吸收增强效应的校正过程中,基本参数法要求准确获得X射线原级谱的强度分布。使用MCNP程序模拟不同加速电压、不同靶材料、不同铍窗厚度等条件下电子打靶后的X射线能谱分布,为X射线荧光分析仪研制过程优化X光管靶材、管压等提供依据,实现高精度的X射线荧光分析。