A 0.6V 44.6 ppm/ºC subthreshold CMOS voltage reference with wide temperature range and inherent leakage compensation

In this paper, a 0.6 V subthsheshold CMOS voltage reference (CVR) achieving wide temperature range and high power supply ripple rejection (PSRR) is presented. The proposed CVR structure can compensate the high temperature leakage and current mirror induced mismatches so as to increase the operating temperature range. The generated reference voltage of the proposed CVR circuit is the threshold voltage difference of two NMOS transistors, leading to relatively small variations. Moreover, the enhanced current source helps achieve high PSRR. The proposed CVR circuit is implemented in a standard 0.18-μm CMOS technology. Measurement results show that, with one single trimming, a mean output of 344 mV with standard deviation of only 2.89 mV and average TC of 44.6 ppm/°C over a wide temperature range from −40 °C to 125 °C is achieved. The measured PSRR is −68 dB, −52 dB and −52 dB at 10 Hz, 100 kHz and 10 MHz, respectively. The measured line sensitivity (LS) is 0.06%/V with a power supply from 0.6 V to 2 V while consuming 19.8  nW at 0.6 V supply. The active area is 0.019 mm².     

A sub-1-V, high precision, ultra low-power, process trimmable, resistorless voltage reference with low cost 90-nm standard CMOS technology

A low power voltage reference generator operating with a supply voltage ranging from 1.6 to 3.6?V has been implemented in a 90-nm standard CMOS technology. The reference is based on MOSFETs that are biased in the weak inversion region to consume nanowatts of power and uses no resistors. The maximum supply current at 3.6?V and at 125°C is 173?nA. It provides a 771?mV voltage reference. A temperature coefficient of 7.5?ppm/°C is achieved at best and 39.5?ppm/°C on average, in a range from ?40 to 125°C, as the combined effect of a suppression of the temperature dependence of mobility and the compensation of the threshold voltage temperature variation. Several process parameters affect the performance of the proposed voltage reference circuit, so a process adjustment aimed at correcting errors in the reference voltage caused by these variations is dealt with. The total block area is 0.03?mm².     

CMOS voltage reference based on threshold voltage and thermal voltage

A fully CMOS based voltage reference circuit is presented in this paper. The voltage reference circuit uses the difference between gate-to-source voltages of two MOSFETs operating in the weak-inversion region to generate the voltage with positive temperature coefficient. The reference voltage can be obtained by combining this voltage difference and the extracted threshold voltage of a saturated MOSFET which has a negative temperature coefficient. This circuit, implemented in a standard 0.35-μm CMOS process, provides a nominal reference voltage of 1.361 V at 2-V supply voltage. Experimental results show that the temperature coefficient is 36.7 ppm/°C in the range from −20 to 100°C. It occupies 0.039 mm² of active area and dissipates 82 μW at room temperature. With a 0.5-μF load capacitor, the measured noise density at 100 Hz and 100 kHz is 3.6 and 2 5 \textnV/?{\textHz} , 2 5\,{\text{nV}}/\sqrt {\text{Hz}} , respectively.     

一种新型的CMOS亚阈值低功耗基准电压源

利用工作于亚阈值的NMOS器件,产生两个负温度系数的电压源,然后将两个电压源作差,产生稳定的基准电压输出.整体电路采用HJTCl80 nrn标准CM（）S工艺实现.仿真结果表明,基准源输出电压为220 mV,在一25℃到100℃的温度范围内的温度系数为68×10^-6/ C.电路的最小供电电压可低至O.7 V,在供电电压O.7～4V范围内的线性调整率为1.5 mV/V.无滤波电容时,1 kHz的电源抑制比为-56 dB室温下,1.O V电压供电时,电路总体功耗为3.7μW.版图设计后的芯片核心面积为O.02 mm².本文设计的电压源适用于低电压低功耗的条件.     

A CMOS threshold voltage reference source for very-low-voltage applications

This paper describes a CMOS voltage reference that makes use of weak inversion CMOS transistors and linear resistors, without the need for bipolar transistors. Its operation is analogous to the bandgap reference voltage, but the reference voltage is based on the threshold voltage of an nMOS transistor. The circuit implemented using 0.35 μm n-well CMOS TSMC process generates a reference of 741 mV under just 390 nW for a power supply of only 950 mV. The circuit presented a variation of 39 ppm/°C (after individual resistor trimming) for the −20 to +80 °C temperature range, and produced a line regulation of 25 mV/V for a power supply of up to 3 V.     

A high speed low jitter LVDS output driver for serial links

A high speed, low jitter low voltage differential signaling (LVDS) output driver for high speed serial transmission is presented. Based on the comparison among four typical output driver architectures and the analysis of the output signal swing, an additional differential termination is addressed at the source of the driver to improve the signal integrity (SI). The stipulated common mode voltage is achieved over process, voltage, temperature (PVT) variations without trimming methodology, by means of a common mode feedback (CMFB) circuit and a novel high order temperature compensation bandgap reference. The simulation results show the temperature coefficient (TC) of the bandgap is only 1.77 ppm/°C. The whole driver circuit is implemented in SMIC 0.18 μm CMOS technology. It provides an output differential mode voltage of 567 mV and a common mode voltage of 1.201 V at 2 Gbps, and consumes 15.41 mA total current with a 2.5 V power supply. The output root mean square (RMS) jitter of the driver is only 7.65 ps.     

A low power CMOS voltage reference generator with temperature and process compensation

A low power CMOS voltage reference with process compensation is presented in TSMC 0.18-μm standard CMOS technology. Detailed analysis of the process compensation technique is discussed. The circuit is simulated with Spectre. Simulation results show that, without any trimming procedure, the output voltage achieves a maximum deviation of 0.35 % across different process corners. The temperature coefficient of the proposed circuit is 12.7 ppm/°C in a temperature range from ?40 to 85 °C and the line sensitivity is 0.036 mV/V with a supply voltage range from 1.2 to 2.5 V under typical condition. The maximum supply current is 390.4 nA at maximum supply voltage and ?40 °C. The power supply rejection ratio is ?68.3 dB at 100 Hz and 2.5 V without any filtering capacitor.     

Sub-1 V,pico-watt subthreshold CMOS voltage reference circuit with dual temperature compensation

A pico-watt CMOS voltage reference is developed using an SK Hynix 0.18 µm CMOS process. The proposed architecture is resistorless and consists of MOSFET circuits operated in the subthreshold region. A dual temperature compensation technique is utilized to produce a near-zero temperature coefficient reference output voltage. Experimental results demonstrate an average reference voltage of 250.7 mV, with a temperature coefficient as low as 3.2 ppm/°C for 0 to 125 °C range, while the power consumption is 545 pW under a 420 mV power supply at 27 °C. The power supply rejection ratio and output noise without any filtering capacitor at 100 Hz are −54.5 dB and 2.88 µV/Hz^1/2, respectively. The active area of the fabricated chip is 0.00332 mm².     

A Sub-1 V nanopower subthreshold current and voltage reference using current subtraction technique and cascoded active load

A sub-1 V, subthreshold current and voltage references are presented using Cascaded Current Mirrors (CCM) as temperature compensator and cascoded transistors as active load. The CCM uses current subtraction concept for temperature compensation of supply independent current generated from Current Generator Circuit (CGC) giving rise to reference current which is fed to active load circuit (ALC). The ALC consists of cascoded PTAT and CTAT voltages to generate supply and temperature independent output reference voltage. The proposed references are implemented and simulated in Cadence Virtuoso using 180 nm CMOS technology model for 0.95–1.8 V supply voltage range. The average output reference voltage of 609.7 mV is obtained with the line regulation of 1.99 mV/V. The supply current of 60.7 nA is found at 0.95 V supply along with Temperature Coefficient (TC) of 44.5 ppm/°C for a temperature range of −20 to 108 °C. A high-value PSRR of −42 dB at 100 Hz and −17 dB at 1 MHz is achieved. It has an area of 0.0082 mm². The obtained average reference current is 6 nA having a slope of 5.5pA/°C.     

0.75 V supply nanowatt resistorless sub-bandgap curvature-compensated CMOS voltage reference

This work presents a resistorless self-biased and small area sub-bandgap voltage reference that works in the nano-ampere consumption range with 0.75 V of power supply. The circuit applies a curvature compensation technique that allows an extended temperature range without compromising the temperature stability. The behavior of the circuit is analytically described, and a design methodology is proposed which allows the separate adjustment of the bipolar junction transistor bias current and its curvature compensation. Simulation results are presented for a 180 nm CMOS process, where a reference voltage of 469 mV is designed, with a temperature coefficient of 5 ppm/°C for the ?40 to 125 °C extended temperature range. The power consumption of the whole circuit is 16.3 nW under a 0.75 V power supply at 27 °C. The estimated silicon area is 0.0053 mm².     

A High-Order Temperature-Compensated Subthreshold Voltage Reference Using Channel Length Modulation Compensation Technique

The paper presents a novel high-order temperature-compensated subthreshold voltage reference that utilizes temperature characteristics of the gate-to-source voltage of subthreshold MOS transistor. The proposed high-order temperature-compensated voltage reference has been designed using two CMOS voltage references and a current subtraction circuit to achieve a low temperature coefficient over a wide temperature range. The proposed circuit offers an output reference voltage of 250.8 mV, line sensitivity of 0.0674%/V and temperature coefficient of 37.4 ppm/°C for the temperature range varying from???20 \(\mathrm{^\circ{\rm C} }\) to 140 °C at nominal conditions. The power supply rejection ratio is obtained as???46.02 dB at a frequency of 100 Hz and???41.91 dB at a frequency of 1 MHz. The proposed circuit shows an output noise of 1.86 \(\mathrm{\mu V}/\surd \mathrm{Hz}\) at 100 Hz and 259.72 \(\mathrm{nV}/\surd \mathrm{Hz}\) at 1 MHz. The proposed circuit has been designed in BSIM3V3 180 nm CMOS technology using Cadence tool. The corner analysis of the proposed circuit has also been performed to show its performance in extreme conditions. The proposed circuit occupies a small chip area of 51 \(\upmu\)m?×?75.3 \(\upmu\)m.

     

A 1.58 nW power consumption and 34.45 ppm/°C temperature coefficient bandgap reference (BGR) for subblocks of RFID tag

In this paper a bandgap reference (BGR) circuit irrespective of the temperature and the supply voltage variation with very low power consumption is proposed. The proportional to absolute temperature (PTAT) and complementary to absolute temperature (CTAT) generators of the proposed BGR, which has four cores cascaded with each other, are used in order to increase not only the output voltage, but also the output control ability for the temperature and the voltage insensitivity. To combine produced voltage from PTAT and CTAT generator, a weight combination circuit, which uses internal capacitors of transistors, is applied. Due to the fact that all of the transistors in such a topology are worked in sub-threshold region, the power consumption is significantly diminished to 1.58 nW. Also the variation of the temperature from −25 °C to 150 °C, leads to the temperature coefficient about 34.45 ppm/°C. The design simulation is done at 960 MHz frequency in TSMC 0.18 µm CMOS technology with the help of Cadence software. Also the post layout simulation result and the layout of the proposed circuit are presented. The output and the chip area of this BGR are 141.5 mV and 1387 µm² respectively.     

一种基于斩波调制的低压高精度CMOS带隙基准源

实现了一种适用于SOC的低压高精度带隙基准电压源设计。利用斩波调制技术有效地减小了带隙基准源中运放的失调电压所引起的误差,从而提高了基准源的精度。考虑负载电流镜和差分输入对各2%的失配时,该基准源的输出电压波动峰峰值为0.31 mV。与传统带隙基准源相比,相对精度提高了86倍。在室温下,斩波频率为100 kH z时,基准源提供0.768 V的输出电压。当电源电压在0.8 V到1.6 V变化时,该基准源输出电压波动小于0.05 mV;当温度在0°C到80°C变化时,其温度系数小于12 ppm/°C。该基准源的最大功耗小于7.2μW,采用0.25μm 2P 5M CM O S工艺实现的版图面积为0.3 mm×0.4 mm。     

A Temperature Compensated CMOS Ring Oscillator for Wireless Sensing Applications

This paper presents a CMOS voltage controlled ring oscillator (VCO) with temperature compensation circuit suitable for low-cost and low-power MEMS gas sensor. This compensated ring oscillator is dedicated to Chopper Stabilized CMOS Amplifier (CHS-A). To operate at low frequency, a control voltage generated by a CMOS bandgap reference (BGR) is described and the measurement results of the fabricated chips are presented. The output voltage of the reference is set by resistive subdivision. In order to achieve small area and low power consumption, n-well resistors are used. This design features a reference voltage of 1 V. The chip is fabricated in AMS 0.35 μm CMOS process with an area of 0.032 mm². Operating at 1.25 V, the output frequency is within 200?±?l0 kHz over the temperature range of ?25 °C to 80 °C with power consumption of 810 μW.     

Low-power low-voltage reference using peaking current mirror circuit

A low-power low-voltage bandgap reference using the peaking current mirror circuit with MOSFETs operated in the subthreshold region is presented. A demonstrative chip was fabricated in 0.35 /spl mu/m CMOS technology, achieving the minimum supply voltage 1.4 V, the reference voltage around 580 mV, the temperature coefficient 62 ppm//spl deg/C, the supplied current 2.3 /spl mu/A, and the power supply noise rejection ratio of -84 dB at 1 kHz.     

A high-order curvature compensation technique for bandgap voltage reference using subthreshold MOSFETs

A bandgap voltage reference with high-order curvature compensation is presented in this study. It exploits subtraction and derivative equalisation of currents generated from two complementary NMOS and PMOS bandgap references (BGRs) using subthreshold MOSFETs. By equating the derivative with respect to temperature of the two currents, generated by the complementary bandgaps, and subtracting these currents, an accurate high-order curvature compensation is achieved. To overcome problems due to the limited input common-mode range of opamps used in BGRs, a transimpedance amplifier with new accurate current compensation that tracks the temperature variation is proposed. This bandgap is implemented using the 0.18 μm CMOS process with a supply voltage as low as 0.7 V. At 0.8 V power supply and an output reference voltage of 386 mV, the proposed circuit achieves a temperature coefficient of 19 ppm/°C from 0 to 130°C. The power consumption is 119 μW and the power supply reduction ratio is 24 dB at 1 kHz.     

一种高电源抑制比曲率补偿带隙基准电压源

在对传统典型CMOS带隙电压基准源电路分析基础上提出了一种高精度、高电源抑制带隙电压基准源。采用二阶曲率补偿技术,电路采用预电压调整电路,为基准电路提供稳定的电源,提高了电源抑制比,在提高精度的同时兼顾了电源抑制比,整个电路采用了CSMC0.5μm标准CMOS工艺实现,采用spectre进行进行仿真,仿真结果显示当温度为-40℃~80℃,输出基准电压变化小于1mV,温度系数为3.29×10-6℃,低频时(1kHz)的电源抑制比达到75dB,基准电路在高于3.3V电源电压下可以稳定工作,具有较好的性能。     

Sub-1 V band-gap based and MOS threshold-voltage based voltage references in 0.13 µm CMOS

Portable and implantable device applications require low supply voltage reference circuits due to increasing trend for lower power requirements. Voltage references have been proposed for operation below 1 V for CMOS and a comprehensive analysis of the behavior of the different topologies is needed for ultra-low power designs, in order to select the right circuit topology for a given requirement. This work compares two major classes of voltage reference topologies: threshold voltage (V_T0)-based and (V_G0) bandgap voltage-based reference circuits. Four different topologies of voltage-reference designs with 1-V supply were designed and fabricated in 130 nm CMOS process. Monte Carlo analysis shows the variability of the references and of their temperature coefficients (TC), and the results are compared to measured samples. Simulations and measurements show that the threshold voltage-based references are more susceptible to the variations in the CMOS fabrication process.     

Ultra low power PVT independent sub-threshold gm-C filters for low frequency biomedical applications

An ultra low power gm-C filter for low cut-off frequency bio-medical implantable applications is presented in this paper. The design is based on a novel trans-conductance stage operating in the sub-threshold region with a PVT independent fixed replica gm biasing circuit. The significant variation in gm with respect to temperature due to channel length modulation is corrected using a parallel combination of two gm blocks of different value. The circuit performance remains nearly constant for a supply voltage range of 1.1–1.7 V. A general biquad filter has been implemented and simulations show about 1% variation in the 3-dB bandwidth (in the range of few hertz) for a temperature range of −30 to 110°C. The circuit has been implemented using 0.5 μm CMOS technology with a nominal supply voltage of 1.2 V and power consumption for each gm block is 55.3 nW.     

Low-power broadband quadrature signal generator based on phase-tunable dividers

This paper presents the design and experimental results of a low-power 300–960 MHz I/Q signal generator for low-IF receivers. The circuit is based on phase-tunable dividers and uses delay-locked loops, which provide phase accuracy for the quadrature signals as well as low-sensitivity of the phase error against temperature and power supply variations. Thanks to the adopted technique, the phase error can be further reduced by trimming the reference voltage of the delay-locked loops through a calibration digital word, which can be stored in a non-volatile memory during manufacturing. The I/Q generator exhibits an absolute phase error before calibration that is lower than 1.5°. The I/Q phase drift due to temperature variations from ?40 to 85 °C and power supply variations from 1.1 to 1.3 V is 0.3° and 0.2°, respectively. By dividing the overall frequency range into four 165-MHz wide sub-bands and using only four 5-bit calibration words, the I/Q phase variation with respect to frequency, temperature, and power supply is lower than 1° in the 300–960 MHz operating band. The I/Q generator is implemented in a 90-nm CMOS technology and exhibits a current consumption as low as 0.5 mA.