Modified processes capability assessment with dynamic mean shift

Rapid advancements in manufacturing technology have seen electronic products becoming lighter and thinner. This has led to production yield requirements of sawing processes in the semiconductor industry becoming increasingly strict. For sawing processes requiring a very low fraction of defective, the process capability index C_pk is widely applied for production yield measurement under the assumption of process stability. However, in practice, even when the typical control charts are implemented, dynamic and unobserved natures of the actual process mean shift may occur. Since the trial control limits are established with reference to random samples, the associated performances are also with uncertainty because of sampling error. In this paper, we investigate the effects of parameter estimation error on the development of the phase I control chart and further compare three methods with various estimators for the process standard deviation. Then, we tabulate the modified adjustment magnitudes for the dynamic C_pk under various subgroup sizes and sample sizes. On the basis of the simulation results, the proposed method can avoid overestimating the true process capability and make more trustworthy decisions. Finally, for demonstration purposes, an application of process capability measures for a sawing process is presented.     

Integrating grey sequencing with the genetic algorithm–immune algorithm to optimise touch panel cover glass polishing process parameter design

The touch panel cover glass is one of the important parts and components that determine touch panel quality. The quality requirement of touch panel cover glass emphasises the stability of glass thickness. As this factor directly influences the induction effect and touch of the touch panel, the parameter conditions for the cover glass polishing process have significant impact. This study integrated grey sequencing with the Genetic algorithm–Immune algorithm to optimise the parameter design for the touch panel cover glass polishing process. The experimental measurement value was the thickness value of the processed glass, and the uniformity of glass thickness after processing was discussed. The optimum processing combination influencing the process conditions is as follows: the ambient temperature is 22 (°C), the processing pressure is 0.04 (Mpa), the processing time is 30 (min), the machine speed is 70 (rpm), the polishing solution concentration is 1.4 (g/cm³), the central particle size of polishing powder is 1.4 (um) and the process capability C_pk is 1.75, which is better than the process capability of C_pk 1.41 of the response surface methodology and the process capability of C_pk 1.37 of the Taguchi experimental design.     

Re-evaluating the process capability indices for non-normal distributions

Classical process capability indices (PCIs) C _p , C _pu , C _pl and C _pk can indicate the potential process capability accurately when the quality characteristic of the product is normally distributed. When the process has a non-normal distribution, classical PCIs will be inappropriate and can misled the assessment of process capability. Zwick (1995), Schneider and Pruett (1995-96) and Tong and Chen (1998) proposed various PCIs for non-normal distributions. This paper compares the accuracy of these indices for several selected non-normal distributions based on the proportion of non-conformity of manufactured product. The results indicate that these PCIs lead to a larger number of errors in various combinations of shape parameters and specification limits. Therefore, this paper proposes three indices, S _pu , S _pl and S _pk , which can reflect accurately the proportion of nonconformity in either normal or non-normal distributions.     

A Bayesian Approach to Capability Testing Based on Cpk with Multiple Samples

Process capability indices provide numerical measures to compare the output of a process to client's expectations. However, most of the existing researches have used traditional distribution frequency method by using a single sample due to assess process capability. An alternative to this approach is to use the Bayesian method. In this paper, we utilize a Bayesian approach based on subsamples to check process capability via capability index C_pk. As a new suggestion, we used the informative normal prior distribution and the characteristics of sufficient statistic of the parameter to drive the posterior distribution. The capability test is done, and the posterior probability p, for which the process under investigation is capable, is derived both based on the most popular index C_pk. Finally, a numerical example is given to clarify the method. Copyright © 2013 John Wiley & Sons, Ltd.     

Process capability analysis chart with the application of Cpm

Process capability analysis (PCA) is a highly effective means of assessing the process ability of product that meets specifications. The process capability analysis chart (PCAC/C_pk ) evaluates the capabilities of multiprocess products together with nominal-the-best specifications, larger-the-better and smaller-the-better specifications. This study proposes process capability analysis chart (PCAC/C_pm ) to consider process yield and expected process loss. A new generated estimator for C_pm is proposed and the properties of statistical estimator and hypothesis test are discussed. A practical example was given for application.     

Economic design of X̄ and R charts under Weibull shock models

This paper considers the problem of a continuous production process where both the mean and variance are simultaneously monitored by an X̄ and R chart respectively, and generalizes the model of Costa (IIE Transactions 1993; 25 (6):27–33). The product variable quality characteristic is assumed to be normally distributed and the process is subject to two independent assignable causes (such as tool wear‐out, overheating or vibration). One cause changes the process mean and the other changes the process variance. However, the occurrence of one kind of assignable cause does not preclude the occurrence of the other. It is also assumed that the occurrence times of the assignable causes are described by Weibull distributions with increasing failure rates. A cost model is developed and a non‐uniform sampling interval scheme is adopted. A two‐step search procedure is employed to determine the optimal design parameters. The relative contribution of the paper over the results obtained by Costa is addressed. A sensitivity analysis of the model is conducted and the cost savings associated with the use of non‐uniform sampling intervals instead of constant sampling intervals are evaluated. The economic design model is then extended to an economic–statistical design model for achieving desired levels of statistical performance while minimizing the expected cost. Performances of purely economic design and economic–statistical design are compared. Copyright © 2000 John Wiley & Sons, Ltd.     

Measuring PPM Non‐conformities for Processes with Asymmetric Tolerances

Process yield has been the most basic and common criterion used in the manufacturing industry for evaluating process capability. The C_pk index has been used widely in the manufacturing industry. In this note, we considered a generalization of C_pk index which handles processes involving a target T with asymmetric tolerances. Particularly, we established a formula for measuring the PPM non‐conformities for given ratios of the two‐side tolerances. We proved the validity of the established formula and tabulated the upper bounds on PPM non‐conformities for various given C_pk index values and ratios of the two‐side tolerances. Copyright © 2012 John Wiley & Sons, Ltd.     

Assessing the actual Gamma process quality – a curve-fitting approach for modifying the non-normal flexible index

Process capability indices (PCIs) have been widely adopted for quality assurance activities. By analysing PCIs, a production department can trace and improve a poor process to enhance product quality level and satisfy customer requirements. Among these indices, C_pk remains the most prevalent for facilitating managerial decisions because it can provide bounds on the process yield for normally distributed processes. However, processes are often non-normal in practice, and C_pk may quite likely misrepresent the actual product quality. Hence, the flexible index C_jkp, which considers possible differences in the variability above and below the target value, has been developed for practical use. However, C_jkp continues to suffer from serious bias in assessing actual capability, especially when the process distribution is highly skewed. In this paper, we modify C_jkp for assessing the actual process quality of a Gamma process. A correction factor is obtained by the curve-fitting method. The results show that our proposed method can significantly reduce the bias for calculation of actual nonconformities. Moreover, we introduce a sample estimator for our modified index. The ratio of this estimator’s average value and the modified index is approximately 1. This implies that our proposed estimator can provide an appropriate estimation for assessing the actual Gamma process quality.     

Non‐normal Capability Indices for the Weibull and Lognormal Distributions

Because the normal process capability indices (PCIs) C_p, C_pu, C_pl, and C_pk represent the times that the process standard deviation is within the specification limits; then, based on and by using the direct relations among the parameters of the Weibull, Gumbel (minimum extreme value type I) and lognormal distributions, the Weibull and lognormal PCIs are derived in this paper. On the other hand, because the proposed PCIs P_p, P_pu, P_pl, and P_pk were derived as a function of the mean and standard deviation of the analyzed process, they have the same practical meaning with those of the normal distribution. Results show that the proposed PCIs could be used as the standard C_p, C_pu, C_pl, and C_pk if a short‐term variance is analyzed. An application to a set of simulated data is presented. Copyright © 2015 John Wiley & Sons, Ltd.     

Combining process capability indices from a sequence of independent samples

Process capability indices such as C_p, C_pk and C_pm have been widely used in manufacturing for process assessment and for evaluation of purchasing decisions. Quality engineers and process operators are often asked to summarize the quality of a process by combining a sequence of C_pk or C_pm. This paper compares three different methods for combining the estimates of the process capability indices C_pk, C_pm and C_pmk from a sequence of independent samples. The criterion of minimum mean-squared-error (MSE) is applied. We find that, in general, methods for the combination of sample process capability indices based on the overall sample mean and pooled sample variance give smaller MSE than those based on weighted averages of the estimates of process capability indices.     

A graphical approach to obtaining confidence limits of Cpk

The process capability index C_pk has been widely used as a process performance measure. In practice this index is estimated using sample data. Hence it is of great interest to obtain confidence limits for the actual index given a sample estimate. In this paper we depict graphically the relationship between process potential index (C_p), process shift index (k) and percentage non-conforming (p). Based on the monotone properties of the relationship, we derive two-sided confidence limits for k and C_pk under two different scenarios. These two limits are combined using the Bonferroni inequality to generate a third type of confidence limit. The performance of these limits of C_pk in terms of their coverage probability and average width is evaluated by simulation. The most suitable type of confidence limit for each specific range of k is then determined. The usage of these confidence limits is illustrated via examples. Finally a performance comparison is done between the proposed confidence limits and three non-parametric bootstrap confidence limits. The results show that the proposed method consistently gives the smallest width and yet provides the intended coverage probability. © 1997 John Wiley & Sons, Ltd.     

Comparing Two Process Capability Indices under Balanced One‐Way Random Effect Model

Process capability indices such as C_p, C_pk, C_pmk and C_pm are widely used in manufacturing industries to provide a quantitative measurement of the performance of the products. In this article, we derived generalized confidence intervals for the difference between process capability indices for two processes under one‐way random effect model. Our study provides coverage probability close to the nominal value in almost all cases as shown via simulation. An example from industrial contexts is given to illustrate the results. Copyright © 2012 John Wiley & Sons, Ltd.     

Bootstrap approach for supplier selection based on production yield

Current manufacturing industries have increased their level of out-sourcing and relied more heavily on their supply chain as a source of competitive advantage. Supplier selection decisions have become an important component of production management. Those decisions have a significant impact on a firm's marketing competition, and suppliers may account for a large portion of the production cost. Production quality is one of the key factors in supplier evaluation. The manual of supplier certification includes a discussion of process capability analysis, which recommends a procedure for evaluating the most prevalent process capability index C _pk. However, the recommended procedure is applicable only when evaluating an individual supplier's performance. In this paper, we apply the bootstrap method to the supplier selection problem. We construct lower confidence intervals for the capability difference and ratio between two given suppliers. Performance comparisons are made among various bootstrap methods in terms of error probability and selection power. For convenience of applications, the sample sizes required for various designated selection power are also tabulated.     

Measuring the Process Yield for Circular Profiles

Two indices C_p(circular) and C_pk(circular) based on the functional method have been proposed to measure the process capability of circular profiles. However, these two indices only provide potential capability and a lower bound on the process yield, respectively. In this paper, we develop a new yield index S_pk(circular) for circular profiles. This index provides an exact measure of process yield. The asymptotic normal distribution of the estimated index is derived. The statistical inferences such as hypothesis testing, confidence interval, and lower confidence interval can be easily constructed. A simulation study is conducted to assess the performance of the proposed method. The simulation results confirm that the estimates are close to the true value and the coverage rates of the confidence intervals are greater than the 95% lower limit of the stated nominal in most cases. One real data set is used to illustrate the applicability of the proposed method. Copyright © 2013 John Wiley & Sons, Ltd.     

Optimal process capability analysis for process design

Conventional process capability analysis is used to measure and control the quality level of a production process in real exercises for on-line quality management. There has been a deficiency in this type of management; namely, the defects which occur in the production process are only passively detected and modified afterwards. Additionally, conventional process capability expression has difficulty distinguishing between alternatives for process selection among possible candidates before process realisation. There is, therefore, considerable motivation for developing a process capability expression which can be used to evaluate alternatives at the beginning of the process design, i.e., off-line application. The conventional C_pm expression is built up by measuring mean deviation and process variances for on-line application. However, if C_pm is used for the process capability analysis for process design, an erroneous C_pm value is found and an inappropriate process design is ended. Thus, the proposed process capability expression revised from the conventional C_pm in consideration of the balance between tolerance cost and quality loss has been developed. This development is the main contribution of this research and, with this development, the appropriate mean and tolerance values can be determined simultaneously prior to the real production process so as to maximise the proposed process capability value. The production is then processed with the pre-determined mean and tolerance values in a real production process. The expectation after process realisation is that the produced responses will be the best of all the alternatives in terms of quality and cost, and that the process capability value obtained after the real production process will be close to the proposed process capability value maximised prior to the real production process.     

An application of non-normal process capability indices

Numerous process capability indices, including C_p, C_pk, C_pm, and C_pmk, have been proposed to provide measures of process potential and performance. In this paper, we consider some generalizations of these four basic indices to cover non-normal distributions. The proposed generalizations are compared with the four basic indices. The results show that the proposed generalizations are more accurate than those basic indices and other generalizations in measuring process capability. We also consider an estimation method based on sample percentiles to calculate the proposed generalizations, and give an example to illustrate how we apply the proposed generalizations to actual data collected from the factory. © 1997 John Wiley & Sons, Ltd.     

Yield‐Based Capability Index for Evaluating the Performance of Multivariate Manufacturing Process

Process capability indices (PCIs) have been widely used in the manufacturing industry providing numerical measures on process precision, accuracy and performance. Capability indices measures for processes with a single characteristic have been investigated extensively. However, an industrial product may have more than one quality characteristic. In order to establish performance measures for evaluating the capability of a multivariate manufacturing process, multivariate PCIs should be introduced. In this paper, we analyze the relationship between PCI and process yield. The PCI EC_pk is proposed based on the idea of six sigma strategy, and there is a one‐to‐one relationship between EC_pk index and process yield. Following the same, idea we propose a PCI MEC_pk to measure processes with multiple characteristics. MEC_pk index can evaluate the overall process yield of both one‐sided and two‐sided processes. We also analyze the effect of covariance matrix on overall process yield and suggest a solution for improving overall process yield. Copyright © 2013 John Wiley & Sons, Ltd.     

Joint economic design of x and R charts under Weibull shock models

This paper deals with the joint economic design of x and R charts when the occurrence times of assignable causes follow Weibull distributions with increasing failure rates. The variable quality characteristic is assumed to be normally distributed and the process is subject to two independent assignable causes (such as tool wear-out, overheating, or vibration). One cause changes the process mean and the other changes the process variance. However, the occurrence of one kind of assignable cause does not preclude the occurrence of the other. A cost model is developed and a non-uniform sampling interval scheme is adopted. A two-step search procedure is employed to determine the optimum design parameters. Finally, a sensitivity analysis of the model is conducted, and the cost savings associated with the use of non-uniform sampling intervals instead of constant sampling intervals are evaluated.     

Yield‐Related Process Capability Indices for Processes of Multiple Quality Characteristics

Process capability indices (PCIs) have been widely used in industries for assessing the capability of manufacturing processes. Castagliola and Castellanos (Quality Technology and Quantitative Management 2005, 2(2):201–220), viewing that there were no clear links between the definition of the existing multivariate PCIs and theoretical proportion of nonconforming product items, defined a bivariate C_pk and C_p (denoted by BC_pk and BC_p, respectively) based on the proportions of nonconforming product items over four convex polygons for bivariate normal processes with a rectangular specification region. In this paper, we extend their definitions to MC_pk and MC_p for multivariate normal processes with flexible specification regions. To link the index to the yield, we establish a ‘reachable’ lower bound for the process yield as a function of MC_pk. An algorithm suitable for such processes is developed to compute the natural estimate of MC_pk from process data. Furthermore, we construct via the bootstrap approach the lower confidence bound of MC_pk, a measure often used by producers for quality assurance to consumers. As for BC_p, we first modify the original definition with a simple preprocessing step to make BC_p scale‐invariant. A very efficient algorithm is developed for computing a natural estimator of BC_p. This new approach of BC_p can be easily extended to MC_p for multivariate processes. For BC_p, we further derive an approximate normal distribution for , which enables us to construct procedures for making statistical inferences about process capability based on data, including the hypothesis testing, confidence interval, and lower confidence bound. Finally, the proposed procedures are demonstrated with three real data sets. Copyright © 2012 John Wiley & Sons, Ltd.     

A Bayesian procedure for process capability assessment

The usual practice of judging process capability by evaluating point estimates of some process capability indices has a flaw that there is no assessment on the error distributions of these estimates. However, the distributions of these estimates are usually so complicated that it is very difficult to obtain good interval estimates. In this paper we adopt a Bayesian approach to obtain an interval estimation, particularly for the index C_pm. The posterior probability p that the process under investigation is capable is derived; then the credible interval, a Bayesian analogue of the classical confidence interval, can be obtained. We claim that the process is capable if all the points in the credible interval are greater than the pre‐specified capability level ω, say 1.33. To make this Bayesian procedure very easy for practitioners to implement on manufacturing floors, we tabulate the minimum values of Ĉ_pm/ω, for which the posterior probability p reaches the desirable level, say 95%. For the special cases where the process mean equals the target value for C_pm and equals the midpoint of the two specification limits for C_pk, the procedure is even simpler; only chi‐square tables are needed. Copyright © 1999 John Wiley & Sons, Ltd.