共查询到20条相似文献,搜索用时 15 毫秒
1.
Satyanarayan K. N. Prabhu 《Journal of Materials Science: Materials in Electronics》2013,24(5):1714-1719
In the present work, wetting characteristics and morphology of intermetallic compounds (IMCs) formed between Sn–2.5Ag–0.5Cu lead-free solder on copper (Cu) and silver (Ag) coated copper substrates were compared. It was found that, Ag coated Cu substrate improved the wettability of solder alloy. The average values of contact angles of solder alloy solidified on Ag coated Cu substrate were reduced to about 50 % as compared to contact angles obtained on Cu substrates. Flow restrictivity for spreading of solder on Ag coated Cu was found to be lower as compared to Cu substrate. The spreading of solder alloy on Ag coated Cu exhibited halo zone. Coarse needle shaped Cu6Sn5 IMCs were observed at the solder/Cu substrate interface whereas at the solder/Ag coated Cu interface Cu6Sn5 IMCs showed scallop morphology. The formation of Cu3Sn IMC was observed for the spreading of solder alloy on both substrates. The solder/Ag coated Cu substrate interface exhibited more particulates of Ag3Sn precipitates as compared to solder/Cu substrate interface. The improved wettability of solder alloy on Ag coated Cu substrate is due to the formation of scallop IMCs at the interface. 相似文献
2.
Liang Zhang Song-bai Xue Li-li Gao Yan Chen Sheng-lin Yu Zhong Sheng Guang Zeng 《Journal of Materials Science: Materials in Electronics》2009,20(12):1193-1199
Ternary lead free solder alloys Sn–Ag–Cu were considered as the promising alternatives to conventional SnPb alloys comparing with other solders. In the present work, effects of trace amounts of rare earth Ce on the wettability, mechanical properties and microstructure of Sn–Ag–Cu solder have been investigated by means of scanning electron microscopy and energy dispersive X-ray analysis systematically. The results indicate that adding trace amount of rare earth Ce can remarkably improve the wettability, mechanical strength of Sn–Ag–Cu solder joint at different temperature, especially when the content of rare earth Ce is at about 0.03%, the tensile strength will be 110% times or more than that of the lead free solder joint without rare earth Ce addition. Moreover, it was observed that the trace amount of rare earth Ce in Sn–Ag–Cu solder may refine the joint matrix microstructure, modify the Cu6Sn5 intermetallic phase at the copper substrate/solder interface, and the intermetallic compound layer thickness was reduced significantly. In addition, since rare earth Ce possesses a higher affinity to Sn in the alloy, adding of rare earth Ce can also lead to the delayed formation and growth of the intermetallic compounds of Ag3Sn and Cu6Sn5 in the alloy. 相似文献
3.
《Materials Science & Technology》2013,29(12):1430-1440
AbstractThe bond shear test was used to assess the integrity of Sn–0·7Cu and Sn–0·3Ag–0·7Cu lead-free solder alloy drops solidified on copper substrates with smooth and rough surface finishes. Solder alloys solidified on smooth substrates required higher shear force compared to that on rough substrates. Sn–0·3Ag–0·7Cu alloy required higher shear energy than Sn–0·7Cu alloy. Solder alloys solidified on smooth substrate surfaces exhibited complete ductile failure. On rough copper surfaces, solder alloys showed a transition ridge characterized by sheared intermetallic compounds (IMCs) and the presence of dimples. The peak shear strength decreased with increase in contact area of the solder bond on the substrate. Smooth surface and the presence of minor amount of Ag in the solder alloy enhance the integrity of the solder joint. 相似文献
4.
Satyanarayan K. N. Prabhu 《Journal of Materials Science: Materials in Electronics》2012,23(9):1664-1672
In the present work, the effect of soldering temperature (270 and 298?°C) and substrate surface texture (0.02 and 1.12?μm) on wetting characteristics and morphology of intermetallic compounds (IMCs) between Sn–0.7Cu lead-free solder on copper substrates was investigated. It was found that increase in temperature and substrate surface roughness improved the wettability of solder alloy. However, the effect of surface roughness on wettability was significant as compared to that of temperature. The spreading of solder alloy was uniform on smooth substrate, whereas spreading of the alloy on rough substrate resulted in an oval shape. The morphology of IMCs transformed from long needle shaped to short and thick protrusions of IMCs with increase in surface roughness of the substrate. Needle shaped and thick protruded intermetallics formed at the solder/Cu interface were identified as Cu6Sn5 compounds. The formation of Cu3Sn IMC was observed only for the spreading of solder alloy at 298?°C which contributed to improvement in the wettability of solder alloy on both smooth and rough substrate surfaces. 相似文献
5.
Kiran N. Bhat K. N. Prabhu Satyanarayan 《Journal of Materials Science: Materials in Electronics》2014,25(2):864-872
The effect of reflow temperature and substrate surface roughness on wettability, intermetallics and shear strength of Sn–3.8Ag–0.7Cu solder alloy on copper (Cu) substrate was studied. It was found that increase in reflow temperature and substrate surface roughness improved the wettability of solder alloy. The size of needle shaped Cu6Sn5 IMCs (intermetallic compounds) increased with increase in temperature. The morphology of IMCs transformed from long to short needles with increase in substrate roughness. Shear strength and shear energy of the solder bond on rough Cu surfaces were found to be higher than that on smooth Cu surfaces. However, the sheared surfaces of the solder bond on rough Cu surface exhibited a transition ridge characterised by sheared IMCs whereas solder bond on smooth Cu surfaces exhibited completely ductile failure. Although, rough surface exhibited higher shear strength and shear energy, smoother surface is preferable due to its predominant bond failure in the solder matrix. 相似文献
6.
Yang Liu Hao Zhang Fenglian Sun 《Journal of Materials Science: Materials in Electronics》2016,27(3):2235-2241
The solderability of the Sn58Bi (SnBi)-nano Cu solder pastes and the microstructure of the solder joints were investigated. Experimental results indicated that the addition of the nano Cu particles in the SnBi solder paste shows limited effect on the solidus. The liquidus of the SnBi-3nano Cu solder paste was 1 °C higher than the SnBi solder paste. Solid Cu6Sn5 intermetallic particles formed in the SnBi-3nano Cu solder paste during the heating process. The Cu6Sn5 intermetallic particles decreased the mobility and wettability of the molten solder. Meanwhile, the Cu6Sn5 nano particles worked as nucleation sites for the formation of Bi grains and Sn–Bi eutectic phase during the cooling process and led to the grain refinement of the solder bulk. The SnBi-1nano Cu solder paste showed the smallest grain size in this research. Additionally, the SnBi-3nano Cu/Cu solder joint showed a eutectic microstructure of Sn–Bi system at the center of the solder bulk but a hypereutectic microstructure with polygon Bi grains near the margin in the solder bulk. 相似文献
7.
Ramani Mayappan Iziana Yahya Noor Asikin Ab Ghani Hamidi Abd Hamid 《Journal of Materials Science: Materials in Electronics》2014,25(7):2913-2922
Due to toxicity of lead in the commercial solder, lead-free solders were proposed. Among the potential lead-free solders, the Sn–Ag–Cu solders were considered as a potential replacement. To further improve the solder properties, a fourth element was added into the Sn–Ag–Cu solder. The present study investigates the effect of different weight percentage of Zn (up to 0.7 wt%) into the Sn-3.5Ag-1.0Cu solder on intermetallic and growth rate (k) after long time thermal aging. The solders were prepared using powder metallurgy method and X-ray diffraction analysis shows that there were Cu6Sn5, Cu3Sn, CuZn and Ag3Sn phases present after solder preparation. The solders were reacted with Cu substrate at 250 °C for 1 min and aged at 150 °C until 1,000 h. The morphology of the intermetallic was observed under scanning electron microscope and the elemental distribution was confirmed by energy dispersive X-ray. Intermetallic thickness and growth kinetic result show that the additions of 0.4 % zinc is sufficient in retarding the Cu6Sn5 and Cu3Sn intermetallic growth. 相似文献
8.
9.
The intermetallic compound (IMC) growth kinetics in pure Sn/Cu and Sn10 wt%Bi/Cu solder joints was studied, respectively, after they were aged at 160-210°C for different time. It was found that the total IMC in Sn10 wt%Bi/Cu joint developed faster than it did in pure Sn/Cu solder joint, when they were aged at the same temperature. And the activation energy Qa for total IMC in Sn10 wt%Bi/Cu joint was lower than that for pure Sn/Cu interconnect. The IMC growth process was discussed. The IMC Cu6Sn5 was enhanced in compensation of reduced IMC Cu3Sn growth. The work reveals that Bi element containing in lead free solder alloys with 10 wt% can enhance IMC growth in lead free solder/Cu joint during service. 相似文献
10.
Tama Fouzder Qingqian Li Y. C. Chan Daniel K. Chan 《Journal of Materials Science: Materials in Electronics》2014,25(6):2529-2539
In order to identify the effect on the properties and behavior of tin–zinc–bismuth (Sn-8 wt% Zn-3 wt% Bi or Sn-13.6 at.% Zn-1.6 at.% Bi) based solders produced by adding nickel (Ni) nano-particles, the interfacial microstructure between plain and composite solders with newly developed immersion silver (Ag) plated copper (Cu) substrates has been investigated as a function of reaction time, at various temperatures. For plain Sn–8Zn–3Bi solder joints, a scallop-shaped Cu–Zn–Ag intermetallic compound layer was found to adhere to the surface of the immersion Ag-plated Cu substrate. However, after addition of Ni nano-particles into the Sn–8Zn–3Bi solder, Cu–Zn–Ag (at the bottom) and (Cu, Ni)–Zn (at the top) intermetallic compound layers were observed at the interfaces. In addition, these intermetallic compound layer thicknesses increased substantially with increases in the temperature and reaction time. In the solder ball region, needle-shaped α-Zn rich phase and spherically-shaped Bi-particles appeared to be homogeneously distributed throughout a beta-tin (β-Sn) matrix. However, after the addition of Ni nano-particles, needle-shaped α-Zn rich phase appeared that exhibited a fine microstructure, due to the heterogeneous nucleation of the Ni nano-particles. The calculated activation energy for the Cu–Zn–Ag intermetallic compound layer for the plain Sn–8Zn–3Bi solder/immersion Ag-plated Cu system was 29.95 kJ/mol—while the activation energy for the total [Cu–Zn–Ag + (Cu, Ni)–Zn] intermetallic compound layers formed in the Sn–8Zn–3Bi–0.5Ni (Sn-13.6 at.% Zn-1.6 at.% Bi ~1 at.% Ni) composite solder/immersion Ag-plated Cu system was 27.95 kJ/mol. Addition of Ni nano-particles reduces the activation energy which enhanced the reaction rate as we know that lower the activation energy indicates faster the reaction rate. 相似文献
11.
《Materials Science & Technology》2013,29(12):1478-1484
AbstractIn this study, the interfacial reaction and joint reliability of immersion Ag-plated Cu substrate with the Sn–0·7Cu (wt-%) ball–grid array (BGA) solder was investigated. During reflow, the Ag plating layer was dissolved completely into the molten Sn–Cu solder and some of the Cu layer was also dissolved into the molten solder. The dissolved Ag and Cu were precipitated as Ag3Sn and Cu6Sn5 intermetallic compounds (IMCs) in the solder matrix. Upon reflow, the Sn–Cu solder exhibits an off-eutectic reaction to produce the eutectic phase and precipitate (Cu6Sn5 and Ag3Sn). The Cu–Sn IMC layer was formed at the solder/Cu interface after reflow, and the IMC layer grew during aging treatment. During the shear tests, the failure mode switched from a bulk-related failure to an interface-related failure. After aging for 250 h, the joint failed partially at the solder/Cu6Sn5 interface. The brittle fracture was linked to the formation of thick Cu–Sn IMC layer. 相似文献
12.
Solder size effect on early stage interfacial intermetallic compound(IMC) evolution in wetting reaction between Sne3.0Age0.5Cu solder balls and electroless nickel electroless palladium immersion gold(ENEPIG) pads at 250 C was investigated. The interfacial IMCs transformed from initial needle- and rodtype(Cu,Ni)6Sn5to dodecahedron-type(Cu,Ni)6Sn5and then to needle-type(Ni,Cu)3Sn4at the early interfacial reaction stage. Moreover, these IMC transformations occurred earlier in the smaller solder joints, where the decreasing rate of Cu concentration was faster due to the Cu consumption by the formation of interfacial(Cu,Ni)6Sn5. On thermodynamics, the decrease of Cu concentration in liquid solder changed the phase equilibrium at the interface and thus resulted in the evolution of interfacial IMCs; on kinetics, larger solder joints had sufficient Cu flux toward the interface to feed the(Cu,Ni)6Sn5growth in contrast to smaller solder joints, thus resulted in the delayed IMC transformation and the formation of larger dodecahedron-type(Cu,Ni)6Sn5grains. In smaller solders, no spalling but the consumption of(Cu,Ni)6Sn5grains by the formation of(Ni,Cu)3Sn4grains occurred where smaller discrete(Cu,Ni)6Sn5grains formed at the interface. 相似文献
13.
《Materials Science & Technology》2013,29(8):1101-1106
AbstractThe growth kinetics of intermetallic compound layers formed between Sn–5Bi–3.5Ag solder and Cu substrate were investigated at temperatures between 70°C and 200°C for 0 to 60 days. A quantitative analysis of the intermetallic compound layer thickness as a function of time and temperature was performed. Diffusion couples showed a composite intermetallic layer comprised of Cu6Sn5 and Cu3Sn. The growth of intermetallic compounds followed diffusion controlled kinetics and the layer thickness reached only 10 μm after 60 days of aging at 150°C. The apparent activation energies calculated for the growth of the total intermetallic compound (Cu6Sn5 + Cu3Sn), Cu6Sn5 and Cu3Sn intermetallic are 88.6, 84.3 and 70.28 kJ mol-1, respectively. 相似文献
14.
Tama Fouzder Qingqian Li Y. C. Chan Daniel K. Chan 《Journal of Materials Science: Materials in Electronics》2014,25(9):4012-4023
Sn–Ag–Cu composite solder has been prepared by adding Ni nanoparticles. Interfacial reactions, the morphology of the intermetallic compounds (IMC) that were formed, the hardness between the solder joints and the plain Cu/immersion Ag-plated Cu pads depending on the number of the reflow cycles and the aging time have all been investigated. A scallop-shaped Cu6Sn5 IMC layer that adhered to the substrate surface was formed at the interfaces of the plain Sn–Ag–Cu solder joints during the early reflow cycles. A very thin Cu3Sn IMC layer was found between the Cu6Sn5 IMC layer and the substrates after a lengthy reflow cycle and solid-state aging process. However, after adding Ni nanoparticles, a scallop-shaped (Cu, Ni)–Sn IMC layer was clearly observed at both of the substrate surfaces, without any Cu3Sn IMC layer formation. Needle-shaped Ag3Sn and sphere-shaped Cu6Sn5 IMC particles were clearly observed in the β-Sn matrix in the solder-ball region of the plain Sn–Ag–Cu solder joints. Additional fine (Cu, Ni)-Sn IMC particles were found to be homogeneously distributed in the β-Sn matrix of the solder joints containing the Ni nanoparticles. The Sn–Ag–Cu–0.5Ni composite solder joints consistently displayed higher hardness values than the plain Sn–Ag–Cu solder joints for any specific number of reflow cycles–on both substrates–due to their well-controlled, fine network-type microstructures and the homogeneous distribution of fine (Cu, Ni)–Sn IMC particles, which acted as second-phase strengthening mechanisms. The hardness values of Sn–Ag–Cu and Sn–Ag–Cu–0.5Ni on the Cu substrates after one reflow cycle were about 15.1 and 16.6 Hv, respectively–and about 12.2 and 14.4 Hv after sixteen reflow cycles, respectively. However, the hardness values of the plain Sn–Ag–Cu solder joint and solder joint containing 0.5 wt% Ni nanoparticles after one reflow cycle on the immersion Ag plated Cu substrates were about 17.7 and 18.7 Hv, respectively, and about 13.2 and 15.3 Hv after sixteen reflow cycles, respectively. 相似文献
15.
The intermetallic compounds (IMCs) formed at the interface between Cu substrate and an Sn-9Zn-0.5Ag lead-free solder alloy have been investigated by X-ray diffraction (XRD), transmission electron microscopy (TEM) and electron diffraction (ED). The XRD patterns show that the main IMCs formed at the interface of Sn-9Zn-0.5Ag/Cu are γ-Cu5Zn8 and η′-Cu6Sn5. The Ag3Sn IMC with orthorhombic structure was also observed at the Sn-9Zn-0.5Ag/Cu interface by TEM and ED analyses. The interfacial adhesion strength between the Cu substrate and Sn-9Zn-0.5Ag lead-free solder alloy is higher than that of the Sn-9Zn alloy due to the formation of Ag3Sn IMC at the interface. 相似文献
16.
The wetting behavior of a new Sn-Bi-Cu Pb-free solder on Cu substrate was investigated by sessile drop method under an Ar-H2 flow in the temperature range from 493 K to 623 K. The contact angle curves tested at 548 K and 623 K are found to fit exponential rule very well. However, the contact angle curve tested under 493 K is not well consistent with exponential rule, for which the spreading course may be classified into three stages. Equilibrium contact angles between Sn-Bi-Cu solder and Cu substrate decrease monotonously with the increase in temperature, which are 28°, 24° and 18° at 493 K, 548 K and 623 K, respectively. The results show that 69.5Sn-30Bi-0.5Cu exhibits good wettability on Cu substrate. Intermetallics formed at the 69.5Sn-30Bi-0.5Cu/Cu interface are identified as Cu6Sn5 adjacent to the solder and Cu3Sn adjacent to the Cu substrate, respectively. Formation of intermetallic seems to improve strong wetting of the substrate by the solder. 相似文献
17.
Interface analysis of embedded chip resistor device package and its effect on drop shock reliability
In this study, the drop reliability of an embedded passive package is investigated under JESD22-B111 condition. Chip resistors were buried in a PCB board, and it was electrically interconnected by electroless and electrolytic copper plating on a tin pad of a chip resistor without intermetallic phase. However tin, nickel, and copper formed a complex intermetallic phase, such as (Cu, Ni)6Sn5, (Cu, Ni)3Sn, and (Ni, Cu)3Sn2, at the via interface and via wall after reflow and aging. Since the amount of the tin layer was small compared with the solder joint, excessive intermetallic layer growth was not observed during thermal aging. Drop failures are always initiated at the IMC interface, and as aging time increases Cu-Sn-Ni IMC phases are transformed continuously due to Cu diffusion. We studied the intermetallic formation of the Cu via interface and simulated the stress distribution of drop shock by using material properties and board structure of embedded passive boards. The drop simulation was conducted according to the JEDEC standard. It was revealed that the crack starting point related to failure fracture changed due to intermetallic phase transformation along the via interface, and the position where failure occurs experimentally agrees well with our simulation results. 相似文献
18.
J.K.Shang 《材料科学技术学报》2010,26(3):200-205
The thermodynamic conditions for dewetting of a liquid solder drop on copper thin films were examined under a hot-stage optical microscope in a flowing protective atmosphere.Dewetting of liquid solder was found to depend strongly on the copper film thickness and preceded by spalling of Cu 6 Sn 5 intermetallic compounds.However,the loss of interfacial bonding by spalling was not sufficient to cause immediate dewetting of solder drops if the wetting tip was still strongly bonded to the copper film.By introducing a pinning force on the wetting front,a sufficient condition was found from a force balance analysis for dewetting of the liquid solder drop,in general agreement with the experimental results. 相似文献
19.
Mrunali Sona K. Narayan Prabhu 《Journal of Materials Science: Materials in Electronics》2014,25(3):1446-1455
In the present work, the effect of reflow time on wetting behaviour, microstructure and shear strength of the eutectic Sn–0.7Cu lead-free solder on Cu substrate were studied. The reflow time was varied from 10 to 10,000 s. The contact angle decreased with the increase in reflow time. The growth of intermetallic compounds (IMCs) increased with the reflow time. The thickness of the Cu6Sn5 IMC layer formed during a reflow time of 10 s was about 3.76 μm and its thickness increased to 3.89, 6.2, 6.68, 7.6 and 19.83 μm during 100, 300, 500, 1,000 and 10,000 s reflow time respectively. The joint shear test was performed to assess the integrity of Sn–0.7Cu solder solidified on copper substrate surfaces. The shear strength decreased with increase in reflow time after an optimum value. 相似文献
20.
Xiaowu Hu Yulong Li Zhixian Min 《Journal of Materials Science: Materials in Electronics》2013,24(6):2027-2034
This paper reports on the interfacial reaction and growth behavior of intermetallic compounds (IMCs) layer (η-Cu6Sn5 + ε-Cu3Sn) between molten Sn–58Bi solder and Cu substrate for various liquid–solid soldering temperatures and times. In addition, the Bi segregation at the Cu3Sn/Cu interface was also discussed, too. It was found that the Cu6Sn5 IMC could be observed as long as the molten solder contacted with the Cu substrate, while the Cu3Sn IMC was formed at the interface between Cu6Sn5 and Cu substrate as the higher soldering temperature and/or longer soldering time were applied. Both thickness of total IMCs layer and Cu6Sn5 grains size increased with increased soldering temperature or time. The growth of the Cu-Sn IMCs layer during soldering exhibited a linear function of the soldering temperature and 0.27 power of soldering time. With soldering temperature increasing (above 280 °C in this present study), Bi was accumulated at the Cu3Sn/Cu interface and resulted in some isolated Bi particles were formed. 相似文献