间歇模原子力显微镜非线性振动的数值模

1 引言 原子力显微镜(简记为AFM)是利用其微悬臂梁的机械振动响应于力敏探针和实验样品表面之间的相互作用力来成像的,由于具有原子和分子级的分辨率,已成为表面成像及材料微结构研究的新工具,在科学技术的各种领域获得了广泛的应用[1-2].有几种不同模式的AFM相继被开发使用.     

Ultrasharp and high aspect ratio carbon nanotube atomic force microscopy probes for enhanced surface potential imaging

The resolution of scanning surface potential microscopy (SSPM) is mainly limited by non-local electrostatic interactions due to the finite probe size. Here we present high resolution surface potential imaging with ultrasharp and high aspect ratio carbon nanotube (CNT) atomic force microscopy (AFM) probes fabricated via dielectrophoresis. Enhancement of surface potential contrast by several factors is reported for integrated circuit structures and purple membrane fragments for these CNT AFM probes as compared to conventional probes. In particular, ultrahigh lateral resolution (～2?nm) surface potential images of self-assembled bacteriorhodopsin proteins are reported at ambient conditions, with the implication of label-free protein detection by SSPM techniques.     

随机噪声激励下轻敲式原子力显微镜动力学特性研究

针对有界随机噪声激励下轻敲式原子力显微镜 (AFM：Atomic force microscope)系统的非线性动力学问题,建立Lennard-Jones力场作用下针尖-样品的集总参数模型,应用现代微分方程和分岔理论,分析了随机扰动强度和弯月面接触角对AFM针尖-样品耦合系统动力学特性的影响。结果表明,轻敲式AFM耦合动力学系统中存在丰富的周期运动和混沌运动,表现出复杂的非线性行为,混沌特性随着随机扰动强度增大而增强,弯月面接触角越大混沌特性越明显,因此在轻敲式AFM优化设计中,随机噪声对AFM系统的影响不可忽视。     

In situ atomic force microscopy tip-induced deformations and Raman spectroscopy characterization of single-wall carbon nanotubes

In this work, an atomic force microscope (AFM) is combined with a confocal Raman spectroscopy setup to follow in situ the evolution of the G-band feature of isolated single-wall carbon nanotubes (SWNTs) under transverse deformation. The SWNTs are pressed by a gold AFM tip against the substrate where they are sitting. From eight deformed SWNTs, five exhibit an overall decrease in the Raman signal intensity, while three exhibit vibrational changes related to the circumferential symmetry breaking. Our results reveal chirality dependent effects, which are averaged out in SWNT bundle measurements, including a previously elusive mode symmetry breaking that is here explored using molecular dynamics calculations.     

Inverting amplitude and phase to reconstruct tip-sample interaction forces in tapping mode atomic force microscopy

Quantifying the tip-sample interaction forces in amplitude-modulated atomic force microscopy (AM-AFM) has been an elusive yet important goal in nanoscale imaging, manipulation and spectroscopy using the AFM. In this paper we present a general theory for the reconstruction of tip-sample interaction forces using integral equations for AM-AFM and Chebyshev polynomial expansions. This allows us to reconstruct the tip-sample interactions using standard amplitude and phase versus distance curves acquired in AM-AFM regardless of tip oscillation amplitude and in both the net attractive and repulsive regimes of oscillation. Systematic experiments are performed to reconstruct interaction forces on polymer samples to demonstrate the power of the theoretical approach.     

恒撞击力轻敲模式AFM的设计及研究

在轻敲模式AFM中,利用DMT模型与光探针点衍射理论结合来检测微探针的振动,并对振动信号进行频率域分析,通过检测和控制信号中高次谐波分量使针尖-样品间撞击力保持恒定。测试实验表明,该系统具有结构简单、可测不同材料的样品和对软质材料样品损伤小的优点,其测量重复性可达1%,分辩力可达1~5nm。     

Mapping of thermoplastic elastomeric nitrile rubber/poly(styrene-co-acrylonitrile) blends using tapping mode atomic force microscopy and transmission electron microscopy

Dynamically vulcanized thermoplastic elastomeric blends of nitrile rubber (NBR)/poly(styrene-co-acrylonitrile) (SAN) were mapped by tapping mode atomic force microscopy (TMAFM) and transmission electron microscopy (TEM). The morphology changes with the blend ratio and dynamic vulcanization. Roughness and surface analysis were used to study the effect of dynamic vulcanization and mixing sequence on the surface texture of the thermoplastic elastomeric blends. Surface geometry was quantified by power spectral density (PSD) and fractal analysis.     

Nano-scale simulative measuring model for tapping mode atomic force microscopy and analysis for measuring a nano-scale ladder-shape standard sample

This study proposes to construct a nano-scale simulative measuring model of Tapping Mode Atomic Force Microscopy (TM-AFM), compare with the edge effect of simulative and measurement results. It combines with the Morse potential and vibration theory to calculate the tip-sample atomic interaction force between probe and sample. Used Silicon atoms (Si) arrange the shape of the rectangular cantilever probe and the nano-scale ladder-shape standard sample atomic model. The simulative measurements are compared with the results for the simulative measurements and experimental measurement. It is found that the scan rate and the probe tip's bevel angle are the two reasons to cause the surface error and edge effect of measuring the nano-scale ladder-shape standard sample by TM-AFM. And the bevel angle is about equal to the probe tip's bevel angle from the results of simulated and experimented on the vertical section of the sample edge. To compare with the edge effect between the simulation and experimental measurement, its error is small. It could be verified that the constructed simulative measuring model for TM-AFM in this article is reasonable.     

Modeling of the anodic arc discharge and conditions for single-wall carbon nanotube growth

A model of the arc discharge used for a single wall carbon nanotube (SWNT) synthesis is developed. Coupling solution of the non-equilibrium, Knudsen layer, with hydrodynamic layer and discharge column provides self-consistent solution for the ablation rate and plasma parameter distribution. It is predicted that the interelectrode gap decreases with the background pressure increase. Conditions for single wall carbon nanotube formation in the arc discharge method of nanotube synthesis are described. Carbon nanotube seed formation and charging in the interelectrode gap are found to be very important effects that may alter carbon nanotube formation in the cathode region. This model predicts that the long carbon nanotubes in the high pressure Helium environment can be deposited on the cathode surface. Model predictions are found to be in agreement with experiment.     

An in situ study of metal complexation by an immobilized synthetic biopolymer using tapping mode liquid cell atomic force microscopy

Near-field scanning optical microscopy and tapping mode, liquid cell atomic force microscopy were used to study the conformational changes in simple short-chain silica-immobilized biopolymer, poly(L-cysteine) (PLCys), as the polymer was exposed to reducing, metal-rich, and acidic environments, respectively, to simulate on-line metal preconcentration. In a reducing environment (0.01 M dithiothreitol in pH 7.0 ammonium acetate buffer), the PLCys features resembled islands on the surface of the glass, 36 +/- 7 nm in height and 251 +/- 60 nm in diameter. Upon exposure to metal (Cd2+ buffered at pH 7.0), the PLCys islands broke up into smaller metal binding clusters whose features were lower in height, 22 +/- 5 nm, and diameter, 213 +/- 53 nm. Exposure to 0.01 M HCl used for metal stripping resulted in protonation of the polymer chains and further reduction in the polymer height to 12 +/- 5 nm. These changes in molecular structure have given new insight into the mechanisms involved to achieve strong binding as well as rapid, quantitative release of bound metals to flexible short-chain synthetic biopolymers.     

Nanometrology of delignified Populus using mode synthesizing atomic force microscopy

The study of the spatially resolved physical and compositional properties of materials at the nanoscale is increasingly challenging due to the level of complexity of biological specimens such as those of interest in bioenergy production. Mode synthesizing atomic force microscopy (MSAFM) has emerged as a promising metrology tool for such studies. It is shown that, by tuning the mechanical excitation of the probe-sample system, MSAFM can be used to dynamically investigate the multifaceted complexity of plant cells. The results are argued to be of importance both for the characteristics of the invoked synthesized modes and for accessing new features of the samples. As a specific system to investigate, we present images of Populus, before and after a holopulping treatment, a crucial step in the biomass delignification process.     

Characterization of microfabricated probes for combined atomic force and high-resolution scanning electrochemical microscopy

A combined atomic force and scanning electrochemical microscope probe is presented. The probe is electrically insulated except at the very apex of the tip, which has a radius of curvature in the range of 10-15 nm. Steady-state cyclic voltammetry measurements for the reduction of Ru(NH3)6Cl3 and feedback experiments showed a distinct and reproducible response of the electrode. These experimental results agreed with finite element simulations for the corresponding diffusion process. Sequentially topographical and electrochemical studies of Pt lines deposited onto Si3N4 and spaced 100 nm apart (edge to edge) showed a lateral electrochemical resolution of 10 nm.     

Determination of nano-roughness of carbon fibers by atomic force microscopy

We present a novel approach to determine the surface roughness on varying scales using atomic force microscopy data. The key factor is to find a suitable background correction for the desired scale. Using the example of the surface of sized and unsized high-tenacity carbon fibers, we present an easy method to find backgrounds for widely varying scales and to evaluate respective topography and surface roughness with the same lateral resolution as the microscope itself. The analysis is done by subtracting a tunable background from the respective height data. By choosing an appropriate background to investigate the surface topography of a carbon fiber on a nm-scale, only small nano-structures with a width of around 20 nm remain after the background subtraction. Evaluating the mean roughness R _a of these nano-structures, sized carbon fibers show an overall value of around 0.1 nm while unsized carbon fibers a value of around 0.4 nm. Total background corrected height analysis shows an even distribution of these nano-structures along the fibrils of the unsized fibers, whereas for the sized fibers the nano-structures are not present. The presented method allows analysis and visualization of the distribution of nano-structures on a carbon fiber surface for the first time. This feature is used to visualize the distribution of the sizing and can further be used to investigate the influence of different production parameters on the fiber topography or to evaluate the contribution of mechanical interlocking to the interfacial strength.     

Structure of semidilute single-wall carbon nanotube suspensions and gels

The microscopic network structure of surfactant-stabilized single-wall carbon nanotubes (SWNTs) in water was investigated as a function of SWNT concentration in the semidilute (overlapping) regime using small-angle neutron scattering (SANS). Most of the samples exhibit rigid rod behavior (i.e., Q(-1) intensity variation) at large scattering wavevector, Q, and a crossover to network behavior (i.e., approximately Q(-2) intensity variation) at low Q. The mesh size, xi, of the network was determined from the crossover of rigid rod to network behavior in the SANS intensity profile and was found to decrease with increasing SWNT concentration. When the dispersion quality of these associating rigid rods was degraded, only approximately Q(-2) intensity variation was observed at both high and low Q. Small-angle X-ray scattering measurements of the same stable dispersions were relatively insensitive to network structure because of poor contrast between SWNTs and surfactant.     

Effects of nonlinear forces on dynamic mode atomic force microscopy and spectroscopy

In this paper, we describe the effects of nonlinear tip-sample forces on dynamic mode atomic force microscopy and spectroscopy. The jumps and hysteresis observed in the vibration amplitude (A) versus tip-sample distance (h) curves have been traced to bistability in the resonance curve. A numerical analysis of the basic dynamic equation was used to explain the hysteresis in the experimental curve. It has been found that the location of the hysteresis in the A-h curve depends on the frequency of the forced oscillation relative to the natural frequency of the cantilever.     

Electronic properties of a single-walled carbon nanotube/150mer-porphyrin system measured by point-contact current imaging atomic force microscopy

The electronic properties of a single-walled carbon nanotube/150mer of porphyrin polymer wire system were investigated. Current-voltage (I-V) curves were measured simultaneously along with topographic observations using point-contact current imaging atomic force microscopy. Symmetric I-V curves were obtained at bare single-walled carbon nanotubes but characteristic asymmetrical rectifying behavior was found at the single-walled carbon nanotube/150mer-porphyrin junctions. This finding is of key importance for the development of new nanoscale molecular electronic devices.     

Identifying individual single-walled and double-walled carbon nanotubes by atomic force microscopy

We show that the number of concentric graphene cylinders forming a carbon nanotube can be found by squeezing the tube between an atomic force microscope tip and a silicon substrate. The compressed height of a single-walled nanotube (double-walled nanotube) is approximately two (four) times the interlayer spacing of graphite. Measured compression forces are consistent with the predicted bending modulus of graphene and provide a mechanical signature for identifying individual single-walled and double-walled nanotubes.     

Plasma-deposited fluorocarbon films: insulation material for microelectrodes and combined atomic force microscopy-scanning electrochemical microscopy probes

Pinhole-free insulation of micro- and nanoelectrodes is the key to successful microelectrochemical experiments performed in vivo or in combination with scanning probe experiments. A novel insulation technique based on fluorocarbon insulation layers deposited from pentafluoroethane (PFE, CF3CHF2) plasmas is presented as a promising electrical insulation approach for microelectrodes and combined atomic force microscopy-scanning electrochemical microscopy (AFM-SECM) probes. The deposition allows reproducible and uniform coating, which is essential for many analytical applications of micro- and nanoelectrodes such as, e.g., in vivo experiments and SECM experiments. Disk-shaped microelectrodes and frame-shaped AFM tip-integrated electrodes have been fabricated by postinsulation focused ion beam (FIB) milling. The thin insulation layer for combined AFM-SECM probes renders this fabrication technique particularly useful for submicro insulation providing radius ratios of the outer insulation versus the disk electrode (RG values) suitable for SECM experiments. Characterization of PFE-insulated AFM-SECM probes will be presented along with combined AFM-SECM approach curves and imaging.     

Thermal conductance and thermopower of an individual single-wall carbon nanotube

We have observed experimentally that the thermal conductance of a 2.76-microm-long individual suspended single-wall carbon nanotube (SWCNT) was very close to the calculated ballistic thermal conductance of a 1-nm-diameter SWCNT without showing signatures of phonon-phonon Umklapp scattering for temperatures between 110 and 300 K. Although the observed thermopower of the SWCNT can be attributed to a linear diffusion contribution and a constant phonon drag effect, there could be an additional contact effect.     

Effects of tip-nanotube interactions on atomic force microscopy imaging of carbon nanotubes

We examine the effect of van der Waals (vdW) interactions between atomic force microscope tips and individual carbon nanotubes (CNTs) supported on SiO₂. Molecular dynamics (MD) simulations reveal how CNTs deform during atomic force microscopy (AFM) measurement, irrespective of the AFM tip material. The apparent height of a single- (double-) walled CNT can be used to estimate its diameter up to ～2 nm (～3 nm), but for larger diameters the CNT cross-section is no longer circular. Our simulations were compared against CNT dimensions obtained from AFM measurements and resonant Raman spectroscopy, with good agreement for the smaller CNT diameters. In general, AFM measurements of large-diameter CNTs must be interpreted with care, but the reliability of the approach is improved if knowledge of the number of CNT walls is available, or if additional verification (e.g., by optical techniques) can be obtained.

Open image in new window