碳纳米管原子力显微镜针尖的制作研究

研究在光学显微镜下，运用两个独立的三维工作台分别控制针尖和碳纳米管的位置，将碳纳米管吸附在传统的原子力显微镜针尖上。首先将碳纳米管粘附在导电的胶带上，然后用涂胶的针尖与其接触将碳纳米管粘附到针尖上，最后运用电蚀的方法优化碳纳米管针尖的长度，以达到高分辨率的要求。运用制作的碳纳米管针尖对硅表面的深槽进行成像，获得了传统针尖无法得到的信息。     

运用碳纳米管原子力显微镜针尖减小长程力作用的研究

减小探针和样品表面之间的长程宏观力是原子力显微镜获得高分辨率成像的关键。首先通过理论分析得出影响长程力的主要因素是探针的几何形状和尺寸。然后分别运用几何形状和尺寸不同的原子力显微镜的传统Si针尖和碳纳米管针尖对样品进行扫描试验研究,结果显示碳纳米管针尖较传统针尖获得了高分辨率的图像。这一结果表明,碳纳米管针尖减小了成像中宏观长程作用力的影响,是理想的原子力显微镜针尖。     

应用聚焦离子束/电子束技术的碳纳米管探针制备工艺研究

提出利用电子束诱导铂沉积和聚焦离子束铣削技术,实现碳纳米管原子力显微镜探针针尖的制备和结构优化研究。结合高分辨率扫描电子显微镜观测和纳米操纵仪,利用电子束诱导铂沉积实现碳纳米管固定到普通原子力显微镜探针末端,可实现直径小于10nm的纳米管探针制备。提出基于聚焦离子束铣削和照射技术实现对纳米管针尖的长度、角度的精确调控优化,纳米管探针的角度调控精度优于1°。     

基于碳纳米管的尖端电极对汤生放电型气体传感器特性的影响

研制出不锈钢针尖，特制钨尖，以及在尖端上生长有碳纳米管(CNT)阵列的针尖与钨尖4种尖端电极，分别测试了4种尖端电极的负离子产生量，及其在空气中汤生放电的不同的I—V特性曲线。影响气体放电的因素很多，其中电极形状和材料是极为关键的因素。笔者通过大量的研究，对这4种尖端电极进行了分析和讨论，发现特制钨尖比不锈钢针尖的表面电场强，而在这两种尖端上生长了碳纳米管后，负离子产生量分别提高到原来的3倍，表明其表面电场加强且表面逸出功降低。汤生放电研究发现，选择生长有碳纳米管的特制钨尖作为电极，不仅可以降低气体的放电电压，而且还可以增大极间距，有利于气流的通畅和传感器的恢复。     

碳纳米管表面镀覆对碳纳米管-银复合材料性能的影响

研究了碳纳米管的表面镀覆处理对复合材料性能的影响，结果表明，碳纳米管经过化学镀银处理后用于制造复合材料，可以改善碳纳米管在金属基体中的分散性，提高复合材料的界面结合力，提高复合材料的硬度、导电性、抗弯强度。断口分析表明，碳纳米管未进行化学镀时，由于碳纳米管-银的弱界面结合，使碳纳米管拔出长度较长，在碳纳米管经化学镀后，由于改善了碳纳米管-银的界面结合状态，使碳纳米管拔出长度较短。     

基于分子动力学的原子力显微镜表面成像

基于非接触式原子力显微镜针尖扫描成像机理,应用分子动力学方法采用非刚性针尖-表面原子团簇相互作用模型,模拟超低温环境下,非接触式原子力显微镜单晶硅针尖扫描单晶硅(111)-(7×7)表面成像过程.仿真计算采用两种原子间经验势函数描述针尖-表面原子间相互作用,两种晶向针尖末端模型都实现了对单晶硅(111)-(7×7)表面原子级分辨率仿真成像,在某些超原子级分辨率仿真图像中在单晶硅(111)-(7×7)表面Adatom原子位置出现了的双月牙峰形结构,模拟计算与成像试验文献中得到的图像基本一致.同时对采用确定的势函数及确定的晶向针尖末端,实现稳定成像的扫描针尖-表面距离进行讨论.扫描过程中针尖和被测表面形貌轻微改变,对扫描成像结果影响不大.     

纳米管探针机械性能在纳米表征中的优势研究

碳纳米管探针是原子力显微镜新一代探针,在纳米表征领域有重要的应用价值.本文系统的研究了碳纳米管原子力显微镜探针和普通硅探针的机械性能对探针表征能力的影响.通过对比两种探针的耐磨损实验及对小鼠IgG蛋白成像研究发现,碳纳米管探针具有良好的弹性弯曲能力,耐磨损,而且能显著减小成像时对柔软的生物样品的损伤.发现纳米管探针具有很好的塑性,利用聚焦离子束的照射可以精确优化纳米管探针的角度,解决了碳纳米管探针角度精确调控的技术瓶颈,充分发挥纳米管探针的高分辨率优势.     

基于原子力显微镜的线宽粗糙度测量

给出采用原子力显微镜(Atomic force microscope,AFM)测量线宽粗糙度(Line width roughness,LWR)的分析步骤。分析线宽和LWR及其偏差随刻线横截面位置的高度变化的关系,线宽及其偏差和LWR及其偏差随刻线横截面位置的高度值增加而减小。分别采用四种边缘提取算子提取了碳纳米管针尖AFM测量的刻线顶部线宽边缘,计算了刻线顶部线宽和LWR,顶部线宽和LWR测量结果对边缘提取算子不敏感。结合被测单晶硅台阶的顶表面和底表面加工方法,提出采用各扫描线轮廓高度相等的方法校正AFM压电驱动器的z向非线性。比较了采用普通氮化硅探针针尖、超尖针尖以及碳纳米管针尖AFM测量名义线宽为1 000 nm刻线LWR的结果,显示采用三种针尖的LWR测量结果存在差异,但考虑到AFM分辨率,可认为测量结果基本相同。因此,为更精确描述刻线边缘,必须提高AFM分辨率。     

长2．5厘米高纯度碳纳米管

日本产业技术综合研究所的研究人员最近采用新方法，制成了长2．5厘米的高纯度单层碳纳米管，如此长度的碳纳米管能被肉眼看到，取得这样的成果可谓一大突破。     

基于精确探针模型的AFM图像重构研究

原子力显微镜技术已在纳米成像中得到了普遍应用.但实验表明,AFM图像在水平方向分辨率较低,其中探针针尖形貌是影响扫描图像分辨率的关键因素之一.为了提高AFM扫描图像的分辨率,改善成像质量,一种可行的方法是通过建立探针模型后,重构扫描图像.在已有的探针建模方法中,普遍采用盲建模算法.针对目前盲建模算法中降噪阈值难以优化问题,提出了一种降噪阈值最优估计新方法.该方法可以使盲建模算法更准确地建立扫描方向上的探针形貌轮廓,进而完成3D探针模型.通过应用AFM探针扫描多空铝和标准栅格实验,介绍了探针针尖形貌精确建模的方法.然后使用数学形态学的腐蚀运算对标准栅格的AFM成像进行了重构,验证了上述方法的有效性.实验结果证明,重构后的图像中降低了探针针尖形貌的失真影响,可以显著改善扫描探针显微镜成像的水平分辨率.     

Arrangement and stability of atoms at the apex of a scanning tip

A field ion microscope was used to examine the stability of the atomic arrangement at tip apexes. Although a single W atom at the top layer of a [111]-orientated tip apex protrudes from the underneath layer by only 0·91 Å, the present study suggests that the (111)-orientated W tip is the most desirable tip for scanning tunnelling microscopes because a large activation energy for surface diffusion on the (111) plane immobilizes the apex atom while the tip scans over a specimen surface and the tip apex can be resharpened by simply heating the tip.     

Long polymeric tips of atomic force microscopy for large biological samples

We show a new atomic force microscopy technique for obtaining high‐resolution topographic images of large bio‐samples. To obtain high‐resolution topographic images for the samples, we fabricated a long polymeric tip with a small protrusion using two‐photon adsorbed photo‐polymerization techniques. The obtained tip length was over 50 µm, and the tip was used directly to visualize COS‐1 and 293 cells. Compared with commercial tips, the long tip made it easier to obtain topographic images of the large cells. In the magnified topographic images, the sub‐100‐nm resolution was confirmed with the long tips. This long probe tip is expected to broaden large sample‐related studies and applications in the future.     

表面开口裂纹高度的超声无损测定

介绍了超声端点衍射法在表面开口裂纹高度中测定原理,自行设计了测量方案,试验运用K=1,1．5,2,2．5的探头分别对高度为2,3,5,7,9,11,13,15,17,20mm的裂纹进行了超声测量,结果表明K=1时,具有最高的测量精确度,且随着K值的增大,测量误差呈增大趋势;对于不同高度的裂纹,运用衍射法测量的平均误差波动较小,说明衍射法具有高度选择性,对于高度越大的裂纹,测量越准确。     

Nano-wear of the diamond AFM probing tip under scratching of silicon, studied by AFM

In order to improve such a widely used microtribological testing procedure as surface scratching by an AFM diamond tip, an experimental study has been carried out using single-crystalline silicon as the tested material. Wear of the AFM diamond tip under scratching was observed by a decrease in the scratch depth with increasing wear cycles and by the direct imaging of the diamond tip shape using a Si₃N₄ AFM tip. It was shown that the current widely used experimental method, which assumes the diamond tip to be non-wearable, introduces uncontrollable error into the obtained values for the tested material's wear rate. The harder the tested material, the larger may be the tip wear, and, therefore, the bigger may be its effect on the obtained wear rate values. The specific wear rates for the diamond tip and a silicon wafer were estimated to be 1.4 × 10^-9 and 4.5 × 10^-4 mm³/(N m), respectively.     

Real-time atomic force microscopy in lubrication condition

We have studied frictional force and wear problem in real-time atomic force microscopy in contact-mode using a resonator type mechanical scanner allegedly reported. The fast scanning may cause wear in the sample surface or the tip, and may deteriorate the image quality. Mineral oil was used to make a lubricious surface on a polycarbonate sample, and it was found that the interfacial frictional force was decreased. A Si tip which was coated with a hydrophobic film by means of chemical modification was confirmed to diminish the frictional force in the fast scanning process. The resultant image quality was improved due to reduced friction and wear.     

轴流压缩机转子叶顶扩稳结构设计

为控制泄漏流提高压缩机的稳定工作裕度,采用了叶顶前缘端削与叶顶篦齿组合的设计。对该结构的数值研究表明:前缘端削通过引入高能来流对间隙泄漏流的抑制作用增强,篦齿在一定程度上阻断泄漏流由压力面向吸力面的流动,二者共同作用使压缩机在不同转速下的稳定工作裕度均获得一定提升。     

In situ metal tip sharpening of scanning probe microscopes

This article demonstrated a new approach for fabrication and sharpening of metal tips of scanning probe microscopes. Experimentally, a metal tip was heated and melted by a focused laser light. The tip was then sharpened by a strong electric field and consolidated as the laser was turned off. With a low‐vacuum and a high‐voltage source, a 25‐µm indium‐coated platinum wire was sharpened to a tip with diameters below 50 nm. The minimal tip radius by this method is estimated to be below 1 nm. With this technique, in situ tip sharpening for SPM would be possible. SCANNING 34: 76–79, 2012. © 2011 Wiley Periodicals, Inc.     

Lateral force microscopy of multiwalled carbon nanotubes

Carbon nanotubes are usually imaged with the atomic force microscope (AFM) in non-contact mode. However, in many applications, such as mechanical manipulation or elasticity measurements, contact mode is used. The forces affecting the nanotube are then considerable and not fully understood. In this work lateral forces were measured during contact mode imaging with an AFM across a carbon nanotube. We found that, qualitatively, both magnitude and sign of the lateral forces to the AFM tip were independent of scan direction and can be concluded to arise from the tip slipping on the round edges of the nanotube. The dependence on the normal force applied to the tip and on the ratio between nanotube diameter and tip radius was studied. We show that for small values of this ratio, the lateral force signal can be explained with a simple geometrical model.