共查询到20条相似文献,搜索用时 15 毫秒
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The dramatic increase in the number of devices and functionality of the latest ultra large scale integration designs have resulted in increasing chip size. Concurrently, to achieve higher circuit board component densities, package dimensions have been shrinking. These two competing trends are leading to ever more rigorous requirements on the mechanical characteristics of the packaging technology. The dominant issue in component level reliability is delamination and cracks initiated at the interface between dissimilar materials. In board level reliability, solder joint reliability is a primary issue. This paper describes the methodology of prediction and the explanation for interfacial delamination, cracks at the top of the interfaces and the edge of corner, and also solder joint reliability. This paper furthermore presents the role of the chip backside contamination affecting interfacial delamination, the surface characterizations and an explanation of the interface chemistry, and the strength of solders with a variety of plating materials for Sn–Ag-based lead free solders. 相似文献
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Photonics packaging is a challenge to electronic packaging for two important reasons. The first and most obvious is that light must have access to the device. There must be a window, port or optical fiber interface. The other and more serious problem is that most devices require a highly controlled atmosphere. And if having to accommodate both electrons and photons were not enough, innovators have added mechanical motion to optical devices. Micro-opto-electro-mechanical systems (MOEMS) bring photonics, electronics, optics, physics and mechanical engineering together on one semiconductor device. This appears to be the ultimate convergence of technology domains and can also include biology and chemistry 相似文献
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本文围绕着工业领域中电子信息工程的应用这一主题展开了讨论,首先分析了工业领域中电子信息工程的应用,随后提出了推动工业领域中电子信息工程应用发展的措施.随着科学技术的发展,社会各行业领域都开始应用电子信息工程,工业领域也不例外. 相似文献
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Electronic packages consist of metallic, polymeric, and sometimes ceramic materials as integral entities. Individual physical
and mechanical properties of these constituents, and their influence on each other's behavior, affect the overall reliability
of the electronic packages. The most common failures in electronic interconnects arise from thermomechanical fatigue of the
solder joints. Mismatches in coefficient of thermal expansion (CTE) that exist between these constituent materials are the
main cause of such failures. Several approaches such as alloying and composite methodology are being explored to improve the
reliability of the solder, which is metallic in nature, by improving its mechanical attributes. Other avenues such as matching
the CTE of the constitutent materials are also being considered. In addition, the metallization of the electrical components
and electrically non-conducting polymeric/ceramic layer to make it solderable has also been a source of concern regarding
the joint reliability. Another concern relates to the high CTE of polymeric boards. This can cause significant CTE mismatch
problems if silicon chips are directly mounted on them. Some of our significant findings in these respects are presented. 相似文献
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C. A. Neugebauer 《Journal of Electronic Materials》1989,18(2):229-239
This paper concentrates on the materials requirements anticipated for future packaging strategies of electronic components
beyond the 1st level package. This includes Wafer Scale Integration (Level 0), hybrid assembly of bare chips in multichip
modules (Level 1.5), printed wiring board (PWB) assembly, including surface mount (Level 2), and higher levels (connectors,
mother boards, and cables). Furthermore, high-performance digital VLSI logic packaging only is addressed, to the exclusion
of memory, analog, and power circuitry (except power supplies). 相似文献
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扼要分析了电子器件封装技术迅速发展的成因,预测了电子封装新技术的发展方向,深入阐述了引脚布置方式的突破,BGA技术的发展,BGA和倒装芯片结合的优势,CSP产业化的关键,在晶圆片上进行CSP封装的新工艺,以及倒装芯片和CSP封装的综合比校。 相似文献
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近年来,随着我国社会主义市场经济飞速发展,人们生活质量和生活水平不断提高,对电子工程自动化控制提出了更高的要求,而智能技术作为其中的重要组成部分,在其中发挥了十分重要的作用。本文针对电子工程自动化控制中的智能技术发展的现状以及存在的问题,提出几点有效的措施和建议,从而实现电力企业又好又快发展。 相似文献
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Anisotropic self-alignment of the noncircular pads is investigated to reduce the misalignment in electronic packaging, and
the effects of the direction and length ratio of the noncircular pads are analyzed. The restoring forces of circular and noncircular
pads are calculated numerically using the surface evolver and are compared with the experimental data. The restoring force
in the minor-axis direction of the noncircular pad becomes largest followed by the circular pad and the major-axis direction
of the noncircular pad. Directionality increases with the length ratio, which implies that more accurate alignment can be
achieved in the specific direction. 相似文献
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伴随着我国全面进入到信息化时代当中,使得自动化技术越发的成熟,并已经十分广泛的应用到了各个领域当中.因此,为了推动社会的现代化进程,就需要各个行业的工作人员,提升自动化技术的掌握程度,并在电子信息工程设计过程中,实现更加深入的研究.本文就基于当下自动化技术,在电子信息工程设计中的应用,进行详细的阐述与分析,以此为相关领... 相似文献
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电子商务是市场发展、时代发展的必然趋势,它是一种新型的交易渠道,与人们的生活节奏相符.所谓电子商务,就是指在互联网技术、计算机技术的支持下,在全球范围内,利用网络手段完成等价交换、产品信息交换的一种贸易方式.随着计算机技术的飞速进步与发展,计算机网络技术在电子商务中发挥了重要作用,为人们网上支付、网上购物提供了有利条件.然而在电子商务的发展过程中,人们还需意识到其中潜在的安全隐患问题,及时发现安全隐患,并采取措施解决问题,有利于提高电子商务发展的安全性. 相似文献
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D. R. Frear 《e & i Elektrotechnik und Informationstechnik》2001,118(2):81-86
A variety of Pb-free solder alloys have been proposed for use as interconnects for electronic packaging including Sn?Ag, Sn?Cu, Sn?Ag?Cu, Sn?Ag?Bi, and Sn?Sb, among others. This paper presents a review of the behavior of promising Pb-free solder alloys as related to their microstructure. Recommendations of optimal alloy composition as a function of performance requirements are given. For surface mount applications, eutectic Sn?Ag?Cu is recommended as the optimal alloy. For flip chip interconnects, the eutectic Sn-Cu alloy has the best performance. The materials and process trends of Pb-free packaging are summarized with optimal conditions identified. 相似文献
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Shengmin Wen 《Components and Packaging Technologies, IEEE Transactions on》2005,28(3):435-440
A fatigue failure criterion based on physical damage mechanism is proposed for solders. A solder structure is defined as fatigued when the portion of its failed grains reaches a critical percolation threshold, since under such state the failed grains may form large cluster of cracks, leading to the structure's mechanical instability as well as electrical degradation. Mechanically the inception of such state corresponds to a turning point of load carry capability in a simple fixed-strain tension-tension test of a solder structure. Experimental data for both lead-rich solders such as 96.5Pb-3.5Sn solders and lead-free solders such as 96.5Sn-3.5Ag showed consistency with the proposed criterion. Experimental data also show that by adoption of this failure criterion a better prediction of mechanical fatigue for a lead rich solder can be achieved. The criterion is derived from a science based fatigue theory, therefore the criterion should be applicable to anisotropic as well as isotropic structures regardless of solder structure sizes, which is useful to the development and design of small-scale (micron scale or smaller) solder joints for current electronic packaging. 相似文献
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For many years Britain's electrical and electronic engineering industry had been perplexed over the ``technician problem': what acceptable title might be found for those senior engineering personnel to whom the generic term Technician was unacceptable, because of their training, experience and functions as engineers. This article surveys the current situation and traces the events leading to the setting up, in 1965, of the Institution of Electrical and Electronics Technician Engineers (IEETE), to meet the professional needs of the technician engineer. His distinct status is now firmly established: a responsible engineer in his own right, he has an identity, qualification and career of his own. 相似文献