InGaAs/AlGaAs应变量子阱激光器的可靠性

利用分子束外延方法研制的ＩｎＧａＡｓ／ＡｌＧａＡｓ应变量子阱激光器外延材料制备了窄条型脊型波导结构量子阱激光器件．通过对其５０℃高温加速老化,检测了器件的可靠性,并对器件中存在的三种典型退化行为,即快速退化、慢退化和端面光学灾变损伤进行了分析与研究．     

应变补偿InGaAs/InAlAs量子级联激光器

利用应变补偿的方法研制出激射波长 λ≈ 3.5— 3.7μm的量子级联激光器 .条宽 2 0 μm,腔长 1 .6mm的 Inx Ga1- x As/Iny Al1- y As量子级联激光器已实现室温准连续激射 .在最大输出功率处的准连续激射可持续 30 min以上 .     

应变补偿InGaAs/InAlAs量子级联激光器

利用应变补偿的方法研制出激射波长λ≈3.5—3.7μm的量子级联激光器.条宽20μm,腔长1.6mm的InxGa1-xAs/InyAl1-yAs量子级联激光器已实现室温准连续激射.在最大输出功率处的准连续激射可持续30min以上.     

GaAs/AlGaAs多量子阱激光器

用国产的分子束外延设备生长出多量子阱激光器结构,在室温下,其宽接触阈电流密度为3000A/cm~2,质子轰击条形器件单管最佳阈值电流为128mA,单面连续输出功率可大于22mw,在一定注入范围内可单纵模工作,最高单面微分量子效率达34％,激射波长在8590～8640埃之间,远场光强分布呈单峰,在室温附近的特征温度T_o为202K.对外延材料和器件的初步研究表明,AlGaAs材料特别是掺杂的AlGaAs材料质量不理想是导致激光器阈电流密度不够低的可能原因.     

低阈值电流密度INGaAs/GaAs/AlGaAs应变量子阱激光器

利用分子束外延技术，生长了极低阈值电流密度、低内损耗、高量子效率的InGaAs／GaAs／AlGaAs应变量子阱激光器．在腔长900μm时，80μm宽接触激光器阈值电流密度是125A／cm2，在腔长为2000μm时是113A／cm2，这样低的阈值电流密度是目前国内报道的最低值．激光器的内损耗和内量子效率分别是2cm－1和84％．     

980nm高功率应变量子阱阵列激光器的研制

利用分子束外延（MBE）方法研制出了高质量的InGaAs/GaAs/AlGaAs应变量子阱阵列激光器。其有源区采用分别限制单量子阱结构，激射波长在980nm左右，阵列器件由48个LD构成，在重复频率300Hz、脉冲宽度200μs的条件下，定温光功率输出达到20W，斜率效率1.1W/A，光电转换效率29％。     

InGaAs/GaAs/AlGaAs应变量子阱激光器

优化设计了既能实现较小垂直方向远场发散角,又能降低腔面光功率密度的ＩｎＧａＡｓ／ＧａＡｓ／ＡｌＧａＡｓ应变层量子阱激光器,并计算了该结构激光器实现基横模工作的脊形波导结构参数。利用分子束外延生长了ＩｎＧａＡｓ／ＧａＡｓ／ＡｌＧａＡｓ应变量子阱激光器材料并研制出基横模输出功率大于１４０ｍＷ,激射波长为９８０ｎｍ的脊形波导应变量子阱激光器,其微分量子效率为０．８Ｗ／Ａ,垂直和平行结平面方向远场发散角分别为２８°和６．８°     

MBE生长高质量GaAs／AlGaAs量子阱激光器

我们利用分子束外延方法研制了ＧａＡｓ／ＡｌＧａＡｓ缓交折射率分别限制（ＧＲＩＮ－ＳＣＨ）单量子阱和双量子阱激光器．对腔长为６００μｍ的端面不镀膜的宽接触条型Ｆ－Ｐ腔激光器，阈值电流密度（平均值）分别为２９０Ａ／ｃｍ２和２４０Ａ／ｃｍ２．腔长在１２００μｍ的双量子阱激光器的阈电流密度低达１９０Ａ／ｃｍ２．对出光面和背面分别镀以增透膜和高反膜的宽接触条型（８０μｍ）．激光器，线性输出功率高达１．８２Ｗ；出光面的斜率效率达到１．０４Ｗ／Ａ；利用湿法化学腐蚀所制备的脊形波导结构单量子阱激光器阈值电流最低可达８ｍＡ     

生长温度对于Ge衬底上分子束外延生长的InGaAs/GaAs量子阱结构质量的影响

本文研究了斜切割（100）Ge衬底上InxGa1-xAs/GaAs量子阱结构的分子束外延生长（In组分为0.17或者0.3）。所生长的样品用原子力显微镜、光致发光光谱和高分辨率透射电子显微镜进行了测量和表征。结果发现,为了生长没有反相畴的GaAs缓冲层,必须对Ge衬底进行高温退火。在GaAs外延层和InxGa1-xAs/GaAs量子阱结构的生长过程中,生长温度是一个至关重要的参数。文中讨论了温度对于外延材料质量的影响机理。通过优化生长温度,Ge衬底上的InxGa1-xAs/GaAs量子阱结构的光致发光谱具有很高的强度、很窄的线宽,样品的表面光滑平整。这些研究表面Ge 衬底上的III-V族化合物半导体材料有很大的器件应用前景。     

Influence of growth temperatures on the quality of InGaAs/GaAs quantum well structure grown on Ge substrate by molecular beam epitaxy

Molecular beam epitaxy growth of an In_xGa_1-xAs/GaAs quantum well（QW） structure（x equals to 0.17 or 0.3） on offcut（100） Ge substrate has been investigated.The samples were characterized by atomic force microscopy,photoluminescence（PL）,and high resolution transmission electron microscopy.High temperature annealing of the Ge substrate is necessary to grow GaAs buffer layer without anti-phase domains.During the subsequent growth of the GaAs buffer layer and an In_xGa_1-xAs/GaAs QW structure,temperature plays a key role. The mechanism by which temperature influences the material quality is discussed.High quality In_xGa_1-x As/GaAs QW structure samples on Ge substrate with high PL intensity,narrow PL linewidth and flat surface morphology have been achieved by optimizing growth temperatures.Our results show promising device applications forⅢ-Ⅴcompound semiconductor materials grown on Ge substrates.     

Growth and characterization of digital alloy quantum wells of CdSe/ZnSe

We report a study of digital alloy quantum wells of CdSe/ZnSe grown by migration enhanced epitaxy. The quantum well regions consist of various numbers of periods of one monolayer of CdSe and three monolayers of ZnSe, and the barriers are ZnSe. It will be shown that the optical properties of such quantum wells are greatly affected by the structural quality of the digital alloy. Both structural and optical properties will be discussed. Such digital alloy quantum wells are shown to have excellent room temperature optical characteristics.     

Effects of distance between wells on band structure and characteristics of InGaAs/InGaAsP strain-compensated multiple quantum well lasers

In terms of the multi-well energy representation technique, the effects of the distance between wells on the valence band structure and characteristics are analyzed for InGaAs/InGaAsP strain-compensated multiple quantum well lasers with zero net strain. The computed result shows that a coupling effect exists between the wells, causes an energy split, and affects the properties of the laser, such as the density of states, optical gain, differential gain, threshold wavelength, threshold carrier density and threshold current density. We find that when the distance between wells equals twice the thickness of the well, the effect of the distance between wells on the characteristics of the laser becomes weak. Therefore, for the practical design of lasers, it is reasonable to take the thickness of the barrier to be twice that of the well.     

（英）利用分子束外延在GaAs基上生长高特征温度的InAs量子点激光器

通过MBE外延系统生长了1.3 μm的GaAs基InAs量子点激光器.为了获得更好的器件性能,InAs量子点的最优生长温度被标定为520 ℃,并且在有源区中引入Be掺杂.制备了脊宽100 μm,腔长2 mm的激光器单管器件,在未镀膜的情况下,达到了峰值功率1.008 W的室温连续工作,阈值电流密度为110 A/cm^-2,在80℃下仍然可以实现连续工作,在50 ℃以下范围内,特征温度达到405 K.     

AlGaInAs/InP应变补偿多量子阱激光器

为了优化在长距离光纤通讯系统中采用的1.31μm波长的量子阱激光器,对AlGaInAs/InP材料的有源区应变补偿的量子阱激光器进行了设计研究。采用应变补偿的方法,根据克龙尼克-潘纳模型理论计算出量子阱的能带结构,设计出有源区由1.12%的压应变AlGaInAs阱层和0.4%的张应变AlGaInAs垒层构成。使用ALDS软件对所设计出的器件进行了建模仿真,对其进行了阈值分析和稳态分析。结果表明,在室温25℃下,该激光器具有9mA的低阈值电流和0.4W/A较高的单面斜率效率;在势垒层采用与势阱层应变相反的适当应变,可以降低生长过程中的平均应变量,保证有源区良好的生长,改善量子阱结构的能带结构,提高对载流子的限制能力,降低阈值电流,提高饱和功率,改善器件的性能。     

分子束外延生长高应变单量子阱激光器

采用分子束外延方法研究了高应变 In Ga As/Ga As量子阱的生长技术 .将 In Ga As/Ga As量子阱的室温光致发光波长拓展至 116 0 nm,其光致发光峰半峰宽只有 2 2 me V.研制出 112 0 nm室温连续工作的 In Ga As/Ga As单量子阱激光器 .对于 10 0 μm条宽和 80 0 μm腔长的激光器 ,最大线性输出功率达到 2 0 0 m W,斜率效率达到 0 .84m W/m A,最低阈值电流密度为 45 0 A/cm2 ,特征温度达到 90 K.     

Investigation into the InAs/GaAs quantum dot material epitaxially grown on silicon for O band lasers

InAs/GaAs quantum dot(QD)lasers were grown on silicon substrates using a thin Ge buffer and three-step growth method in the molecular beam epitaxy(MBE)system.In addition,strained superlattices were used to prevent threading disloca-tions from propagating to the active region of the laser.The as-grown material quality was characterized by the transmission electron microscope,scanning electron microscope,X-ray diffraction,atomic force microscope,and photoluminescence spectro-scopy.The results show that a high-quality GaAs buffer with few dislocations was obtained by the growth scheme we de-veloped.A broad-area edge-emitting laser was also fabricated.The O-band laser exhibited a threshold current density of 540 A/cm² at room temperature under continuous wave conditions.This work demonstrates the potential of large-scale and low-cost manufacturing of the O-band InAs/GaAs quantum dot lasers on silicon substrates.     

Contactless electroreflectance study of a GaAIAs/lnGaAs/ GaAs/GaAIAs step quantum well structure

Using contactless electroreflectance at 300 and 77K, we have studied the inter-subband transitions from a GaAlAs/InGaAs/GaAs/GaALAs step quantum well structure (small well inside a large well) consisting of two layers A (In_xGa_1−xAs) and B (GaAs) with widths L_A and L_B, respectively, bounded by two thick barrier regions of Ga_x Al_yAs. By comparison of the observed spectral features with an envelope function calculation, including the effects of strain, we have been able to characterize the potential profile of the structure, i.e., L_A, L_B, x, and y. There is very good agreement between experiment and the intended materials param-eters. Such configurations are of considerable importance since (a) they form the basis for pseudomorphic high electron mobility transistors, and (b) also have applications in optoelectronics due to their large Stark shifts.