A 0.5-V power-supply scheme for low-power system LSIs using multi-V/sub th/ SOI CMOS technology

This paper proposes a novel power-supply scheme suitable for 0.5-V operating silicon-on-insulator (SOI) CMOS circuits. The system contains an on-chip buck DC-DC converter with over 90% efficiency, 0.5-V operating logic circuits, 100-MHz operating flip-flops at 0.5-V power supply, and level converters for the interface between the 0.5-V operating circuit and on-chip digital-to-analog (D/A) converters or external equipment. Based on the theory, the values of on-resistance and threshold voltage of SOI transistors are clarified for the 0.5-V/10-mW output DC-DC converter, which satisfies both high efficiency and low standby power. The proposed flip-flop can hold the data during the sleep with the use of the external power supply, while maintaining high performance during the active. The level converter comprises dual-rail charge transfer gates and a CMOS buffer with a cross-coupled nMOS amplifier to operate with high speed even in a conversion gain of higher than 6, where the conversion gain is defined as the ratio of the output and input signal swings. The test chip was fabricated for the 0.5-V power supply scheme by using multi-V/sub th/ SOI CMOS technology. The experimental results showed that the buck DC-DC converter achieved a conversion efficiency of 91% at 0.5-V/10-mW output with stable recovery characteristics from the sleep, and that the dual-rail level converter operated with a maximum data rate of 300 Mb/s with the input signal swing of 0.5 V.     

A 30 GHz MMIC receiver for satellite transponders

The development of 30-GHz-band monolithic microwave integrated circuits (MMICs) and multichip MMIC modules (low-noise amplifier and frequency converters) is reported. A 30-GHz-band full-MMIC receiver for satellite transponders was successfully constructed using the MMIC modules and the performance of the full-MMIC receiver is evaluated. Test results verify its successful performance as a satellite receiver system. The design and performance of the MMICs (a two-stage amplifier, an image rejection mixer, and a frequency multiplier), of multichip-type MMIC modules (a 30-GHz-band low-noise amplifier module with 30 dB gain and 8.2 dB noise figure, and an image rejection frequency converter with a 10 dB conversion loss and an 18 dB image rejection ratio) and of the full-MMIC receiver, which weighs 1/6 as much as a conventional hybrid integrated circuit are presented     

10 K NbN ADC for IR sensor applications

The authors report the design, fabrication and test results of a 12-bit NbN SFQ counting A/D converter operating at 9 to 10 K and its insertion into a test IR focal plane array sensor system. The NbN IC is based on a linearized SQUID front-end which generates SFQ pulses at a frequency proportional to the signal. A gated SFQ counter integrates the signal over the sample time and the data is driven off chip through a serializing latching voltage state logic (MVTL) output shift register. The TRW A/D converter chip has been packaged and inserted into an IR focal plane array sensor test facility, or test bed, at the NASA Jet Propulsion Laboratory. The entire system has been successfully demonstrated producing IR images at 100 frames/s with the NbN A/D converter operating at 9 K, dissipating 0.3 mW. Performance of the A/D converter chip, the package including magnetic shielding and medium/high speed signal I/O, and the integrated test bed system are discussed.     

A Multipulse-Structure-Based Bidirectional PWM Converter for High-Power Applications

Multipulse converters are suitable for high-power application with the merits of low switching frequency and perfect harmonic performance. But less controllability and poor regulation lead the restriction on its application. A bidirectional pulsewidth modulation (PWM) converter based on multipulse structure is proposed in this paper, which has the same perfect harmonic performance with very low switching frequency. A special sequential sampling space vector modulation technique, which has the sampling sequence from the lagging module to the leading module, is proposed to make the converter controllable like conventional PWM converters. The harmonic performance and linear regulation capability are analyzed theoretically. The converter is modeled in detail, and an instantaneous feedback control strategy with phase delay compensation and decoupling control is also proposed. The controller parameters are optimized to get high dynamic performance with adequate phase margin and gain margin. A 3-kVA prototype is built, and the simulation and experiment results validate that the proposed converter is quite suitable for high-power conversion.     

A 14-bit monotonic NMOS D/A converter

A new configuration of a 14-bit digital-to-analog (D/A) converter has been fabricated as an experimental monolithic NMOS chip. The concept utilizing two cascaded resistor strings delivers an inherent 14 bit monotonicity and a static voltage output signal. The small chip size of about 8.5 mm/SUP 2/ and the saving of external components make the converter applicable for low-cost high-resolution control loop systems. A modified test chip is also described which has been provided as a step into the field of accurate monolithic converters needed for digital audio systems. A voltage output settling time less than 10 /spl mu/s and a linearity at the 12 bit level have been achieved.     

基于ATE的8位超高速ADC动态参数测试

提出了一种采用Advantest 93000型自动测试设备,配合外挂高性能信号源SMA 100A,对8位1.5 GS/s超高速ADC进行动态参数测试的方案。该方案使用外挂信号源,提供采样时钟和模拟输入信号,解决了93000与外部信号源之间输入信号不同步,以及两者频率差异导致的采样不稳定问题,有效提升了93000测试超高速ADC动态参数的能力,可广泛应用于超高速ADC量产测试。     

Reference refreshing cyclic analog-to-digital and digital-to-analog converters

A method of cyclic analog-to-digital (A/D) and digital-to-analog (D/A) conversion using switched-capacitor techniques is described. By periodically modifying the reference voltage to compensate for the nonideal signal-transfer-loop gain, it is possible in principle to build A/D and D/A converters whose linearity is independent of component ratios and that occupy only a small die area. These converters require two moderate-gain MOS operational amplifiers, one comparator, and a few capacitors. A test chip for A/D conversion was built and evaluated. The test data show that the A/D performs as a monotonic 13-bit converter with maximum 1-LSB differential and 2-LSB integral nonlinearity.     

A high-speed and high-resolution CMOS comparator with three-stage preamplifier

The accuracy of A/D and D/A converters depend largely upon their inner comparators. To guarantee 12-bit high resolution for an A/D converter, a precise CMOS comparator consisting of a three-stage differential preamplifier together with a positive feedback latch is proposed. Circuit structure, gain, the principle of input offset voltage storage and latching time constant for the comparator will be analyzed and optimized in this article. With 0.5 μm HYNIX mixed signal technology, the simulation result shows that the circuit has a precision of 400 μV at 20 MHz. The test result shows that the circuit has a precision of 600 μV at 16 MHz, and dissipates only 78 μW of power dissipation at 5 V. The size of the chip is 210 × 180 μm2. The comparator has been successfully used in a 10 MSPS 12-bit A/D converter. The circuit can be also used in a less than 13-bit A/D converter.     

A 100-Gb/s throughput ATM switch MCM with a 320-channel paralleloptical I/O interface

For an ATM switch system, we have developed a 100-Gb/s input/output (I/O) throughput optical I/O interface ATM switch multichip module (MCM) that has 320-ch optical I/O ports. This MCM is fabricated using ceramic (MCM-C) technology and very-small highly-parallel O/E and E/O optical converters. It uses 0.25-μm complementary metal oxide semiconductors (CMOS) ATM switch large scale integrations (LSIs) and has a total I/O throughput of up to 160 Gb/s. A prototype module with total I/O throughput of 100 Gb/s has been partially assembled using eight optical I/O interface blocks, each composed of a 40-ch O/E converter and a 40-ch E/O converter; the data rate per channel is from dc to 700 Mb/s. Using this module we developed an optical I/O interface ATM switch system and confirmed the operation of the optical interface     

A 14-bit 80-kHz sigma-delta A/D converter: modeling, design andperformance evaluation

The development is described of a sigma-delta A/D (analog-to-digital) converter. Included is a brief overview of sigma-delta conversion. The A/D converter achieves an 88.5-dB dynamic range and a maximum signal-to-noise ratio of 81.5 dB. The harmonic distortion is negligible. This level of performance is about 10 dB higher than previously reported results for oversampled A/D converters in this frequency range. The analog modulator uses a double-integration switched-capacitor architecture with an oversampling rate of 10.24 MHz. Transconductance amplifiers having a 160-MHz f_t were developed for the integrators. The circuit is implemented in a 1.75-μm 5-V CMOS process. The analog circuitry occupies 2 mm² of silicon area and consumes 75 mW of power. Some of the difficult problems associated with evaluating the performance of sigma-delta converters are described. The design of a sigma-delta development and performance evaluation system is presented. This system includes a custom interface board linking the chip to a Sun workstation, and extensive digital signal processing and analysis software     

确好芯片商业化的关键问题

基于老化筛选技术的确好芯片KGD是现行多芯片封装结构中的关键芯片,具有封装成本低、可靠性高、体积小、易封装集成等优点,其应用前景广泛,如多芯片组件、多芯片封装、系统封装、功率系统封装、微系统封装、堆叠封装、混合集成电路等。文章对KGD技术做了分类总结,综述了近几年KGD技术的研发进展,指出KGD进一步发展的商业化关键问题。     

用于多个引伸计数据采集的接口电路设计

针对力学实验或生产加工的实际功能需求,以高性能单片机STC12C5410AD为核心设计开发了一套用于多个电子引伸计数据采集的电路系统。系统硬件电路以24位高精度A/D转换芯片AD7714为模数转换器件,并且运用其放大模块进行信号的放大处理;下位单片机程序采用Keil C51进行编写,系统上位机软件应用VB进行设计和开发。全套系统造价低、体积小、便携性好,能同时检测和显示1～3路形变信号,测试实验表明该系统检测精度高、实时性好,能满足力学性能实验和生产加工现场的实际功能需求,具有较大的应用价值。     

Simultaneous Static Testing of A/D and D/A Converters Using a Built‐in Structure

Static testing of analog‐to‐digital (A/D) and digital‐to‐analog (D/A) converters becomes more difficult when they are embedded in a system on chip. Built‐in self‐test (BIST) reduces the need for external support for testing. This paper proposes a new static BIST structure for testing both A/D and D/A converters. By sharing test circuitry, the proposed BIST reduces the hardware overhead. Furthermore, test time can also be reduced using the simultaneous test strategy of the proposed BIST. The proposed method can be applied in various A/D and D/A converter resolutions and analog signal swing ranges. Simulation results are presented to validate the proposed method by showing how linearity errors are detected in different situations.     

基于DSP的高精度A/D转换器转换特性参数静态测试系统的设计

A/D转换器是许多电子系统中的一个重要器件,其性能好坏直接影响到整个电子系统的性能指标。本文介绍了一种基于DSP和高精度D/A转换器的自动测试系统,可对16位及16位以下的高精度A/D转换器的转换特性参数进行测试。该系统硬件连接简单,软件操作方便,便于携带。     

Time interleaved converter arrays

High-speed monolithic converters normally use a variation of the flash technique, which 2/SUP n/ comparators in parallel to obtain a fast n-bit conversion. Although this method allows for high converter bandwidth, it is not very area efficient, and results in large die sizes for even modest resolution converters. In the technique presented here, a number of small but area efficient converters are operated in a time-interleaved fashion to achieve the bandwidth of a flash circuit, but in a substantially smaller area. This technique is analyzed with respect to noise and distortion resulting from nonideal array characteristics, and is demonstrated by way of a four-way array test-chip. This chip consists of four time-interleaved 7-bit weighted-capacitor A/D converters fabricated in a 10 /spl mu/m metal-gate CMOS process. Full 7-bit linearity is maintained up to a 2.5 MHz conversion rate, with operation at reduced linearity continuing to approximately 4 MHz. The design of this chip, and anticipated characteristics if fabricated in a modern 4-5 /spl mu/m process are described.     

A/D与D/A转换器主流工艺技术现状和发展趋势

随着半导体技术的进步,对A/D、D/A转换器的性能提出了更高的要求,用于制作A/D、D/A转换器的工艺技术也在不断改进.文章介绍了目前用于制作A/D、D/A转换器的主流工艺技术;结合相关产品,对比分析了各种工艺的优缺点,并对A/D、D/A转换器工艺技术的发展趋势进行了展望.     

A High-Performance Operational Amplifier for High-Speed High-Accuracy Switch-Capacitor Cells

A highspeed highaccuracy fully differenttial operational amplifier (opamp) is realized based on noMillercapacitor feedforward (NMCF) compensation scheme. In order to achieve a good phase margin, the NMCF compensation scheme uses the positive phase shift of lefthalfplane (LHP) zero caused by the feedforward path to counteract the negative phase shift of the nondominant pole. Compared to traditional Miller compensation method, the opamp obtains high gain and wide band synchronously without the polesplitting effect while saves significant chip area due to the absence of the Miller capacitor. Simulated by the 0.35 μm CMOS RF technology, the result shows that the openloop gain of the opamp is 118 dB with the unity gainbandwidth (UGBW)of 1 GHz, and the phase margin is 61°while the settling time is 5.8 ns when achieving 0.01% accuracy. The opamp is especially suitable for the frontend sample/hold (S/H)cell and the multiplying D/A converter(MDAC) module of the highspeed highresolution pipelined A/D converters(ADCs).     

A new high-speed periodic-threshold comparator for use in aJosephson A/D converter

A Josephson comparator based on a nonhysteric one-junction superconducting quantum interference device (SQUID) for use in a periodic-threshold A/D (analog-to-digital) converter is discussed. Simulations show that a 4-bit A/D converter using this comparator could have a sampling rate of >20 GHz with an analog signal bandwidth of >10 GHz. This performance represents a factor-of-greater-than-five improvement over that of other periodic-threshold A/D converters, which are based on two- or three-junction SQUIDs     

高速14位A/D转换器的动态测试平台设计

研究了高速A/D转换器动态参数测试方法,设计了基于Quartus Signaltap的测试平台。利用该平台对一款14位80MS/s的A/D转换器芯片进行动态参数测试。测试结果表明,该平台方案可行、操作简便、实时性强,适合于高速高精度A/D转换器的动态参数测试。