Metrological Assurance of Measurements of the Electromagnetic Parameters of Ferromagnetic Film Materials at High Frequencies

A version of the VÉT 122-1-92 working standard, with extended functional and technical capabilities, for providing metrological backup for measurements of the electromagnetic parameters of ferromagnetic film materials at high frequencies is presented.     

System for Metrological Support for Traceability of Measurements of Mass Geometry Characteristics

Measurement Techniques - A system of metrological support is proposed that allows testing for the purpose of type approval, verification and calibration of stands for measuring the mass, center of...     

The Virtual Fields Method for Extracting Constitutive Parameters From Full-Field Measurements: a Review

Abstract:  The virtual fields method has been developed for extracting constitutive parameters from full-field measurements provided by optical non-contact techniques for instance. It is based on the principle of virtual work written with some particular virtual fields. This paper can be regarded as a general review summarising some 15 years of developments of this method. The main aspects of the method are first recalled in the case of both linear and non-linear constitutive equations. They are then illustrated by some recent relevant examples. Some studies underway as well as relevant issues to be addressed in the near future are eventually discussed.     

Support Vector Regression for Measuring Electromagnetic Parameters of Magnetic Thin-Film Materials

We propose a novel method for extracting the electromagnetic parameters (complex permittivity and permeability) of magnetic thin-film materials. The method extracts electromagnetic parameters of the magnetic thin films from effective electromagnetic parameters by using the supported vector machine (SVM). We validated the method in the frequency range of 1-8 GHz. The results show that the errors for both epsiv' and mu' are less than 0.5%, and the errors of both tan delta_epsiv and tan delta_mu are less than 0.001.     

Metrological Support for Measurements of Speed and Bandwidth of Packet Data Networks: Problems and Prospects for Development

Measurement Techniques - We consider the main problems of metrological support for measurements of speed and bandwidth in digital packet data networks. We enumerate the methods for performing data...     

Reversible and Irreversible Modulation of Tubulin Self‐Assembly by Intense Nanosecond Pulsed Electric Fields

Tubulin self‐assembly into microtubules is a fascinating natural phenomenon. Its importance is not just crucial for functional and structural biological processes, but it also serves as an inspiration for synthetic nanomaterial innovations. The modulation of the tubulin self‐assembly process without introducing additional chemical inhibitors/promoters or stabilizers has remained an elusive process. This work reports a versatile and vigorous strategy for controlling tubulin self‐assembly by nanosecond electropulses (nsEPs). The polymerization assessed by turbidimetry is dependent on nsEPs dosage. The kinetics of microtubules formation is tightly linked to the nsEPs effects on structural properties of tubulin, and tubulin‐solvent interface, assessed by autofluorescence, and the zeta potential. Moreover, the overall size of tubulin assessed by dynamic light scattering is affected as well. Additionally, atomic force microscopy imaging reveals the formation of different assemblies reflecting applied nsEPs. It is suggested that changes in C‐terminal modification states alter tubulin polymerization‐competent conformations. Although the assembled tubulin preserve their integral structure, they might exhibit a broad range of new properties important for their functions. Thus, these transient conformation changes of tubulin and their collective properties can result in new applications.     

Test Stand for Measuring the Free-Space Electromagnetic Parameters of Materials over an Ultrawide Range of Microwave Frequencies

Measurement Techniques - A special system has been developed for measurement in free space of the following parameters of flat material samples: reflection and transmission coefficients,...