共查询到18条相似文献,搜索用时 218 毫秒
1.
2.
3.
VSI Q控制图应用研究 总被引:1,自引:0,他引:1
VSI Q控制图可以解决经典休哈特控制图在样本数据缺乏的情况下不能应用的问题,并且可以加快检出速度.具体方法是将样本数据转换成服从标准正态分布的统计数据,再利用可变抽样区间技术确定抽样间隔时间.应用研究证明,VSI Q控制图在缺乏样本数据时也能用于监控生产过程,快速检测出异常. 相似文献
4.
5.
提出三种过程质量指数(PQI)的过程质量指数系统,基于过程质量指数的统计公差提供了一个过程质量要求和控制图设计之间的标准化界面.通过基于过程质量指数的统计公差带增加对x--R或x--s控制图中线的约束,建立一种保证预设质量和过程稳态的统计过程控制新方法.这不仅增强了控制图的功能,也为过程质量规划、统计公差和保证预设质量的SPC相关参数的并行设计提供了指导. 相似文献
6.
针对统计过程控制技术在企业实施过程中难以真正实现质量控制功能的现状,对制造质量控制系统中数据的管理方法进行研究,提出依据产品结构配置的数据管理方法,解决制造质量数据分散、无序和不完整等问题,实现质量数据的合理存储和读取,大大提高了统计过程控制的准确性和可靠性。 相似文献
7.
8.
9.
10.
11.
Kit C. B. Roes Ronald J. M. M. Does Bas S. Jonkers 《Quality and Reliability Engineering International》1999,15(3):175-190
Q charts provide means for statistical process control in low‐volume processes and start‐up phases of production. Concerns on their performance have led to research into different types of enhancements and much discussion on the appropriateness of these. Driven by the aim to implement control charts in the low‐volume production of advanced wafer steppers, we investigate the performance of additional run rules and tightening control limits on the traditional Q chart compared with an exponentially weighted moving average (EWMA). Furthermore, we develop an alternative QR chart based on the mean moving range as estimator of the process standard deviation and consider the economics of low‐volume processes by means of a specific cost model. The comparisons are based on the run length distributions after a permanent shift and trend, both with an onset early in the process. Real life examples are given for various important variables in wafer stepper production. It is concluded that the EWMA based on QR statistics provides the best performance throughout. Competing alternatives with almost equal performance are the EWMA of Q statistics and the combination of four tests of special causes (1‐of‐1, 2‐of‐3, 4‐of‐5 and 8‐of‐8) applied on either the Q or QR chart. Overall, the mean moving range performs better. Copyright © 1999 John Wiley & Sons, Ltd. 相似文献
12.
13.
Marion R. Reynolds Jr Changsoon Park 《Quality and Reliability Engineering International》2010,26(3):199-221
This paper investigates control charts for detecting special causes in an ARIMA(0, 1, 1) process that is being adjusted automatically after each observation using a minimum mean‐squared error adjustment policy. It is assumed that the adjustment mechanism is designed to compensate for the inherent variation due to the ARIMA(0, 1, 1) process, but it is desirable to detect and eliminate special causes that occur occasionally and produce additional process variation. It is assumed that these special causes can change the process mean, the process variance, the moving average parameter, or the effect of the adjustment mechanism. Expressions are derived for the process deviation from target for all of these process parameter changes. Numerical results are presented for sustained shifts, transient shifts, and sustained drifts in the process parameters. The objective is to find control charts or combinations of control charts that will be effective for detecting special causes that result in any of these types of parameter changes in any or all of the parameters. CUSUM charts designed for detecting specific parameter changes are considered. It is shown that combinations of CUSUM charts that include a CUSUM chart designed to detect mean shifts and a CUSUM chart of squared deviations from target give good overall performance in detecting a wide range of process changes. Copyright © 2009 John Wiley & Sons, Ltd. 相似文献
14.
15.
Nan Chen Shiyu Zhou Tzyy‐Shuh Chang Howard Huang 《Quality and Reliability Engineering International》2008,24(7):793-806
This paper presents a control charting technique to monitor attribute data based on a generalized zero‐inflated Poisson (GZIP) distribution, which is an extension of ZIP distribution. GZIP distribution is very flexible in modeling complicated behaviors of the data. Both the technique of fitting the GZIP model and the technique of designing control charts to monitor the attribute data based on the estimated GZIP model are developed. Simulation studies and real industrial applications illustrate that the proposed GZIP control chart is very flexible and advantageous over many existing attribute control charts. Copyright © 2008 John Wiley & Sons, Ltd. 相似文献
16.
S. Bersimis S. Psarakis J. Panaretos 《Quality and Reliability Engineering International》2007,23(5):517-543
In this paper we discuss the basic procedures for the implementation of multivariate statistical process control via control charting. Furthermore, we review multivariate extensions for all kinds of univariate control charts, such as multivariate Shewhart‐type control charts, multivariate CUSUM control charts and multivariate EWMA control charts. In addition, we review unique procedures for the construction of multivariate control charts, based on multivariate statistical techniques such as principal components analysis (PCA) and partial least squares (PLS). Finally, we describe the most significant methods for the interpretation of an out‐of‐control signal. Copyright © 2006 John Wiley & Sons, Ltd. 相似文献
17.
Multivariate exponentially weighted moving average (MEWMA) control chart with five different estimators as population covariance matrix is rarely applied to monitor small fluctuations in the statistical process control. In this article, mathematical models of the five estimators (S1, S2, S3, S4, S5) are established, with which the relevant MEWMA control charts are obtained, respectively. Thereafter, the process monitoring performance of the five control charts is simulated. And the simulation results show that the S4 estimator-based MEWMA control chart is of the best performance both in step offset failure mode and ramp offset failure mode. Since the inline process monitoring of photovoltaic manufacturing is intended to be a problem of multivariate statistics process analysis, the feasibility and effectiveness of the proposed model are elaborated in the case study during the cell testing and sorting process control for the fabrication of multicrystalline silicon solar cells. 相似文献
18.
Yanjing Ou Di Wen Zhang Wu Michael B. C. Khoo 《Quality and Reliability Engineering International》2012,28(1):3-17
This article compares the effectiveness and robustness of nine typical control charts for monitoring both process mean and variance, including the most effective optimal and adaptive sequential probability ratio test (SPRT) charts. The nine charts are categorized into three types (the type, CUSUM type and SPRT type) and three versions (the basic version, optimal version and adaptive version). While the charting parameters of the basic charts are determined by common wisdoms, the parameters of the optimal and adaptive charts are designed optimally in order to minimize an index average extra quadratic loss for the best overall performance. Moreover, the probability distributions of the mean shift δµ and standard deviation shift δσ are studied explicitly as the influential factors in a factorial experiment. The main findings obtained in this study include: (1) From an overall viewpoint, the SPRT‐type chart is more effective than the CUSUM‐type chart and type chart by 15 and 73%, respectively; (2) in general, the adaptive chart outperforms the optimal chart and basic chart by 16 and 97%, respectively; (3) the optimal CUSUM chart is the most effective fixed sample size and sampling interval chart and the optimal SPRT chart is the best choice among the adaptive charts; and (4) the optimal sample sizes of both the charts and the CUSUM charts are always equal to one. Furthermore, this article provides several design tables which contain the optimal parameter values and performance indices of 54 charts under different specifications. Copyright © 2011 John Wiley & Sons, Ltd. 相似文献