共查询到16条相似文献,搜索用时 140 毫秒
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针对进化方法在多态自检电路设计方面存在的扩展性问题,该文提出了一种基于输入分解输出匹配的多态自检电路进化设计方法。该方法将原始电路分解为可进化生成部分和固定部分,由此减少待进化设计电路的输入个数以及适应度评价时真值表输入输出组合数量,从而降低电路进化复杂度;在适应度评价阶段,当电路输出位与理想输出匹配度小于1/2时,通过添加非门的形式提高候选电路适应度和种群多样性,防止最优结构的丢失。进化设计实验将多态门和普通门相结合,进行了两种多态自检加法器的设计。结果表明,与传统多态自检电路进化设计方法相比所提方法进化代数分别减少了47.9%和89.1%,单个测试参量下故障覆盖率分别提高了75.7%和79.7%,具有收敛速度快、扩展性好、故障覆盖率高的优点。 相似文献
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为了能以较小的代价自动高效地构造量子可逆逻辑电路,提出了一种新颖的量子可逆逻辑电路综合方法.该方法通过线拓扑变换和对换演算,利用递归思想,将n量子电路综合问题转换成单量子电路综合问题,从而完成电路综合,经过局部优化生成最终电路.该算法综合出全部的3变量可逆函数,未优化时平均需6.41个EGT门,优化后平均只需5.22个EGT门;理论分析表明,综合n量子电路最多只需要n2n-1个EGT门.与同类算法相比,综合电路所用可逆门的数量大幅减少.同时该算法还避免了时空复杂度太大的问题,便于经典计算机实现. 相似文献
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The quantum of power consumption in wireless sensor nodes plays a vital role in power management since more number of functional elements are integrated in a smaller space and operated at very high frequencies. In addition, the variations in the power consumption pave the way for power analysis attacks in which the attacker gains control of the secret parameters involved in the cryptographic implementation embedded in the wireless sensor nodes. Hence, a strong countermeasure is required to provide adequate security in these systems. Traditional digital logic gates are used to build the circuits in wireless sensor nodes and the primary reason for its power consumption is the absence of reversibility property in those gates. These irreversible logic gates consume power as heat due to the loss of per bit information. In order to minimize the power consumption and in turn to circumvent the issues related to power analysis attacks, reversible logic gates can be used in wireless sensor nodes. This shifts the focus from power-hungry irreversible gates to potentially powerful circuits based on controllable quantum systems. Reversible logic gates theoretically consume zero power and have accurate quantum circuit model for practical realization such as quantum computers and implementations based on quantum dot cellular automata. One of the key components in wireless sensor nodes is the cryptographic algorithm implementation which is used to secure the information collected by the sensor nodes. In this work, a novel reversible gate design of 128-bit Advanced Encryption Standard (AES) cryptographic algorithm is presented. The complete structure of AES algorithm is designed by using combinational logic circuits and further they are mapped to reversible logic circuits. The proposed architectures make use of Toffoli family of reversible gates. The performance metrics such as gate count and quantum cost of the proposed designs are rigorously analyzed with respect to the existing designs and are properly tabulated. Our proposed reversible design of AES algorithm shows considerable improvements in the performance metrics when compared to existing designs. 相似文献
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A. N. Nagamani S. Ashwin B. Abhishek V. K. Agrawal 《Journal of Electronic Testing》2016,32(2):175-196
Reversible logic has gained interest of researchers worldwide for its ultra-low power and high speed computing abilities in the future quantum information processing. Testing of these circuits is important for ensuring high reliability of their operation. In this work, we propose an ATPG algorithm for reversible circuits using an exact approach to generate CTS (Complete Test Set) which can detect single stuck-at faults, multiple stuck-at faults, repeated gate fault, partial and complete missing gate faults which are very useful logical fault models for reversible logic to model any physical defect. Proposed algorithm can be used to test a reversible circuit designed with k-CNOT, Peres and Fredkin gates. Through extensive experiments, we have validated our proposed algorithm for several benchmark circuits and other circuits with family of reversible gates. This algorithm produces a minimal and complete test set while reducing test generation time as compared to existing state-of-the-art algorithms. A testing tool is developed satisfying the purpose of generating all possible CTS’s indicating the simulation time, number of levels and gates in the circuit. This paper also contributes to the detection and removal of redundant faults for optimal test set generation. 相似文献
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The design and optimization of BiCMOS buffer chains and multi level logic circuits are reported. BiCMOS speedup contours are introduced and analytical expressions for the delay are obtained. The speedup contours and the delay expressions were used in the design and optimization of BiCMOS buffer chains. Also, general design guidelines, which can be easily automated, for circuit design in a BiCMOS environment are given. Designing multistage mixed CMOS/BiCMOS buffers, BiCMOS complex logic gates, and multi level CML (current mode logic) gates is also studied 相似文献