单线法测量中径时各种修正值的正确使用

单线法测量中径时各种修正值的正确使用邹先文（江汉石油仪表厂，４３４５６０）用单线法测量螺纹中径与用三线法测量螺纹中径，其值往往存在一定的差异。随着螺纹升角的增大，差异也随之增大，其差异存在于中径值的修正上。各类参考文献都谈到：单线法仅在被测螺纹的一侧...     

修正值与修正因子

阐述对修正值和修正因子及有关术语概念的理解,重点是它们之间的关系并通过两例加以说明。     

出租汽车轮胎修正值的动态测定和简便修正方法

本文提出了出租汽车胎修正值动态测定的原理和具体方法，给出了３０辆３种不同车型轮胎修正值的动态和静态测定方法得出的实验数据；指出动、静态测定方法之间的差异，并提出一种科学，实用，简便的轮胎修正值的修正方法。     

立式金属罐倾斜修正值的研究

本文提出了立式罐倾斜修正值的计算公式和测量方法，并对它的量级进行了分析。     

量块干涉测量位相修正问题

比较了国际上几种量块位相修正量的测量方法，并提出测量量块位相修正量的设想。     

系统误差的修正在测量技术中的应用

介绍了量具的零位调整不正确时系统误差消除的方法并以游标卡尺和外径千分尺为例具体分析其消除方法。     

修正值和修正因子的不确定度

<正>一、定义说明了修正值和修正因子都只是一个估计值修正值定义为:用代数方法与未修正测量结果相加,以补偿其系统误差的值。修正因子定义为:为补偿系统误差而与未修正测量结果相乘的数     

工作用玻璃液体温度计修正值测量值的不确定度评定

本文按照JJG130-2011的规定,对工作用玻璃液体温度计修正值的不确定度进行评定。温度计测试点为0℃、10℃、20℃、30℃、40℃、50℃时,修正值分别为+0.04℃、-0.03℃、-0.04℃、0.00℃、+0.02℃、0.00℃,扩展不确定度U=0.07℃,k=2。     

脉动流量计量检测的探讨

对脉动流的特性予以概括的分析，并从其本质出发，理论分析探讨了脉动流在计量检测中所遵循的准则和所注意的条件，提出增加脉动缓和度的方法和有关的计算公式。解决了脉动流难以计量检测的问题，从而提高了脉动流在计量检测中的准确性。     

如何保证计量工作质量

本文试分析了军队计量工作的特点、计量工作对武器装备建设所起到的重要作用,在此基础上结合工作实际提出了如何保证计量工作质量、提高计量工作水平的做法和建议.     

浅谈计量与产品质量的关系

计量工作是提高产品质量的必要保证手段,质量是目的,计量是手段。企业要在竞争激烈的市场中求生存求发展,产品质量是关键。而质量的优劣,则取决于计量管理水平的高低。     

Talking about Metrology and Energy On World Metrology Day

The theme of this year's World Metrology Day is "Metrology and Energy". The energy problem is an important issue for the whole world and has received great attention in China since China is both a big energy-consuming country and a country severely short of energy.Under the energy and environmental pressure, China will take measures in the following four respects in order to solve the problem of energy shortage:     

磁带记录仪自动计量测试研究

介绍了磁带记录仪自动计量测试的研究设计情况，着重介绍了程控多通道信号选择器及其GPIB接口的设计，简要地介绍了自动测试软件设计情况。     

残余应力测试与校准方法研究现状与展望

简单介绍了残余应力产生的原因及其对材料性能的影响,分析了现阶段残余应力测试方法的基本原理、应用场合和优缺点等,尤其是对目前普遍使用的X射线衍射法、中子衍射法、纳米压痕法、钻孔法等残余应力测试方法进行了详细说明.针对残余应力准确测量需求,分析现阶段基于标样法和仪器性能校准的残余应力校准方法,并说明了校准对残余应力准确测量...     

X-Ray Lithography Mask Metrology: Use of Transmitted Electrons in an SEM for Linewidth Measurement

X-ray masks present a measurement object that is different from most other objects used in semiconductor processing because the support membrane is, by design, x-ray transparent. This characteristic can be used as an advantage in electron beam-based x-ray mask metrology since, depending upon the incident electron beam energies, substrate composition and substrate thickness, the membrane can also be essentially electron transparent. The areas of the mask where the absorber structures are located are essentially x-ray opaque, as well as electron opaque. This paper shows that excellent contrast and signal-to-noise levels can be obtained using the transmitted-electron signal for mask metrology rather than the more commonly collected secondary electron signal. Monte Carlo modeling of the transmitted electron signal was used to support this work in order to determine the optimum detector position and characteristics, as well as in determining the location of the edge in the image profile. The comparison between the data from the theoretically-modeled electron beam interaction and actual experimental data were shown to agree extremely well, particularly with regard to the wall slope characteristics of the structure. Therefore, the theory can be used to identify the location of the edge of the absorber line for linewidth measurement. This work provides one approach to improved x-ray mask linewidth metrology and a more precise edge location algorithm for measurement of feature sizes on x-ray masks in commercial instrumentation. This work also represents an initial step toward the first SEM-based accurate linewidth measurement standard from NIST, as well as providing a viable metrology for linewidth measurement instruments of x-ray masks for the lithography community.     

实验室认可为计量工作注入新的活力

本文结合计量工作实际,就一个单位如何有效建立校准/检测实验室质量体系提出了行之有效的思路及方式.