集成量纲分析的多元测量系统能力评价

多元测量系统分析是多元质量控制的重要内容。现有的研究主要是利用统计学的方法,如多元方差分析法和主成分法等进行分析评价。本文提出了基于量纲分析的多元测量系统能力评价方法,集成物理和统计分析方法,利用物理中量纲分析的方法研究产品各相关变量之间的物理关系,将多元测量系统问题转化为一元测量系统问题。从而可以利用一元测量系统能力评价的统计方法及指标来对测量系统的能力进行评估。同时,本文重复了纸飞机试验,并运用基于量纲分析的多元测量系统能力评价方法对纸飞机的测量系统进行了分析评价,验证了该方法的有效性。     

Improving the Surface Electric Potential Measurement Capability for Textile Materials

The system currently employed for measuring the electric potential of the surface of textile fabrics consists in an electrostatic probe connected to an electrostatic voltmeter. The primary aim of the present work is to improve the capability of this measurement system, as evaluated by gauge repeatability and reproducibility studies. The experiments were conducted on samples of polypropylene non‐woven fabrics, electrostatically charged by exposing them to a negative corona discharge from a custom‐designed electrode system. A first series of fully operator‐controlled measurements pointed out the need to automatically control the relative position between the sample and probe, so that to eliminate the variability due to the non‐uniform structure of the non‐woven fabrics. The following series of partly automated experiments revealed that the repeatability and the reproducibility of the measurements are negatively affected by the decay of the electric potential at the surface of the samples. The best gauge capability is obtained when the measurements are delayed with respect to the moment of corona charging, in order to reduce the variability due to the fact that the samples characteristics change in time. Copyright © 2013 John Wiley & Sons, Ltd.     

光电半导体封装测量系统能力分析方法研究

为了提高半导体封装分箱工序的质量水平,有必要对测量系统进行：分析与研究。在深入分析光电半导体封装过程中的测量系统特征的基础上,建立了基于属性GR＆R的测量系统能力分析模型和方法,并通过实例进行了验证。     

测量系统的R&R分析在企业质量改进中的应用

测量系统是指为了完成对被测对象质量特征的测量所需求的人员、量具、程序、软件、操作等的集合。建立准确有效的测量系统永远是企业实现质量改进的第一步。本文阐述了测量系统分析的基本内容及方法，通过一个案例介绍了测量系统分析在企业应用的过程，并提出了应用时的几点注意事项。     

测量系统分析在曲轴测量机上的应用

本文介绍测量系统分析的一般概念,探讨、研究曲轴测量机这一测量系统所涉及的偏倚、线性、稳定性、重复性等一系列问题,提出在实际生产现场评定曲轴测量机的方法。     

Two‐dimensional guidelines for measurement system indices

In this paper, we review two common measurement system indices and a common process capability index. With some simple plots, it will be shown that the traditional guidelines for these measurement system indices can often misdirect improvement efforts. By taking advantage of the relationship between the measurement system indices and the process capability index, two‐dimensional guidelines that can be used as an alternative to the traditional guidelines are developed. These two‐dimensional guidelines are intended to help address adequacy of the measurement system and better direct improvement efforts to where there will be the most benefit. Copyright © 2010 John Wiley & Sons, Ltd.     

Process True Capability Evaluation with the Consideration of Measurement System Variability and Expected Quality Loss

Process capability indices are widely computed under the assumption that the measurement system is free from errors. However, measurement variability is unavoidable and has a significant impact in process capability evaluation. From an economic point of view, Taguchi loss function is an effective tool to measure the quality loss of a product characteristic deviated from target value that is extensively used without taking into account the effect of the measurement system. This paper investigates the influence of measurement system variability on the process capability analysis through the calculation of process capability indices. A new quality loss function, integrating the measurement system errors, is developed to compute the optimal true process capability regarding to the expected mean value of the Taguchi loss function and the loss resulting from the control of the true process capability. Copyright © 2016 John Wiley & Sons, Ltd.     

A Modified Process Capability Index Using Loss Function Concept

Process capability indices (PCIs) have been frequently employed in manufacturing organizations. In this paper, some existing PCIs are reviewed, and after that, the loss function concept is used as a practical tool for PCI. In this regard, an effective scheme for a revised PCI is presented. The preference of the revised index is presented in theory and illustrated through a numerical example. Copyright © 2015 John Wiley & Sons, Ltd.     

一种特殊测量过程的测量系统能力研究

测量系统分析是质量改进的前提之一。基于现实中的一个特殊的测量过程,构造了一个交叉嵌套型的测量系统模型,利用方差分析和方差分量法,计算出测量系统R＆R分析中的各部分方差分量,并给出了应用实例。     

A model‐based approach for attribute gauge analysis

A new method is proposed for the attribute gauge study. A mathematical model based on the Gauge Performance Curve (GPC) is introduced and the connection between the model parameters and gauge characteristics is discussed. The ability of the whole measurement system (the process and the gauge together) is characterized by two key probabilities: the probability of a rejected part being good and the probability of an accepted part being bad. These probabilities can be calculated either with the proposed mathematical model of GPC (GPC‐method) or by using relative frequencies (AIAG‐type method). The performance of the two approaches has been compared, and the proposed GPC‐method is proven to be statistically favourable. Copyright © 2010 John Wiley & Sons, Ltd.     

基于广义置信区间的测量系统能力比较

研究了测量系统分析中对测量同一产品质量特性的两个测量系统能力的比较方法。基于广义推断法,提出了一种比较两个测量系统能力的方法。通过重复性与再现性（R&R）试验研究,利用广义推断法对两个测量系统能力的比较指数建立相应的广义置信区间,并进行计算机仿真。结果表明,基于广义置信区间的方法,可以有效地比较两个测量系统的能力。     

爆破振动测试的数值分析方法

结合秦山核电工程爆破测试,对爆破振动测试中的干扰信号进行了研究,提出了一种数值分析方法,对有用信号和噪声作了统计特性的估计,对测试记录允许程度也进行了估计,为深入进行爆破振动结果分析提供了有效的手段。     

Improving Process Capability of Manufacturing Process by Application of Statistical Techniques

This article describes the application of statistical techniques in solving a problem of high rejection and rework due to variation in the machining process. The rejections in the shop floor of a company were studied through Pareto analysis for prioritizing the problems due to different sources. The grinding process was found to be the most contributing among all the processes towards rejection and rework. The process capability of this grinding process was evaluated and found to be very low. A step by step method was adopted by the application of several statistical techniques such as design of experiments for solving this problem. As a result of the study, the process capability has improved drastically. This has lead to reduction in the problems due to high rejection and rework in shop floor.     

微波、毫米波相位噪声测试系统的研制

提出了首先对微波、毫米波信号进行下变频,再利用锁相环提取被测试信号相位噪声的相位噪声提取方法,采用现代谱分析技术对提取出的相位噪声信号在频率中进行分析,并利用"反卷积"技术实现测试系统的误差校正,研制实现了微波、毫米波相位噪声测试系统.实验测试结果表明该系统具有测试灵敏度高和被测信号频率范围广的优点,证明了它具有较大的应用价值.     

一种微波源调频噪声测量系统

分析了一种微波源调频噪声测量方法的原理，根据需要研制了一套微波源调频噪声测量系统，详细给出了为保证系统测量结果准确可靠所必需的调试步骤，并结合实际设计出一种独特的定标方法，使用该系统实测了一个２２．６８ＧＨｚ锁相稳频信号的调频噪声，并对测量结果进行了讨论。     

基于DSP的数字化转台伺服系统数字测速的实现

在分析了数字测速方法的原理之后,根据转台伺服系统速度检测方法的现状及DSP更适合数字化测速的特点,用DSP对目前广泛运用于转台伺服系统中的数字测速方法位置差分法(即 M 法)进行了实际应用,并给出了具体的软、硬件实现方法.实践证明,由于DSP自身硬件的特点,使得该方法在不改变原有转台伺服系统硬件设备的基础上,即可完成速度测量,且与原有测速方法相比,测速精度提高了 4 倍.该方法简单、方便,非常适用于那些需要高精度速度检测及位置闭环的场合.     

An Approach to Build Process‐Oriented Basis for Causation‐Based Multivariate SPC and Process Capability Analysis

Although various multivariate process monitoring techniques have been developed, they do not diagnose the process for finding the root causes of irregularities during production. There have been recent studies on a new method that involves process‐oriented basis representation, which links the process variation to its causes, and thus helps in monitoring and diagnosing a process. However, all the studies done so far focused on its application. In this paper, a method is proposed to build the process‐oriented basis for a process irrespective of the number of variables characterizing it. Along with various other statistical techniques, factor analysis and cluster analysis, with customized distance function, are used in developing the method. The built in process‐oriented basis is further used for multivariate statistical process control and process capability analysis. Multivariate solder‐paste problem from electronics industry is used for illustration. Copyright © 2012 John Wiley & Sons, Ltd.     

基于评分法的测量系统能力评价

目前所用的测量系统能力评价方法是建立在正态性假设的基础上,如果测量系统误差不满足正态性,运用原来的评价指标在对测量系统能力进行评价的过程中会发生误判。将连续等级概率评分(CRPS)应用到测量系统分析评价当中,通过研究CRPS的相关特性,建立了基于CRPS评分法的测量系统能力评价指标,从而使测量系统误差非正态分布时,对测量系统能力进行评价的过程中不会发生误判。通过案例分析表明,当测量系统误差为正态分布时,运用CRPS和运用传统评价指标给出的评价结果是一致的,同时,CRPS评价方法能够有效实现非正态测量系统误差情形下的测量系统能力评价。     

亚像元精度摄像测量系统定标方法

在以图像测量技术为核心的检测系统中，摄像机的定标精度是保证测量系统高精度的前提。为此，引入归一化互相关和曲面拟合技术实现高精度定标。该方法利用预先设计的标准图片，对摄像机进行定标。由归一化互相关技术得到像素级的匹配结果，再采用曲面拟合技术实现亚像元级定标．结果表明：此方法可以对行列方向同时进行定标，定标精度可达1／20像元以上。     

求解非线性系统的信赖域方法

本文给出了一个求解非线性系统的信赖域方法。通过引入松驰变量将非线性系统问题转化为带非负约束的非线性最优化问题,新算法借助于KKT条件和F-BNCP函数,在每次迭代时,不必求解二次信赖域子问题,只需求解一个线性方程组。在一定的假设条件下,该算法还是全局收敛和局部超线性收敛的。数值试验结果表明该算法是有效的。