Comparison of dislocation images obtained using the scanning optical microscope and scanning electron microscope

Dislocations in a silicon specimen containing a p-n junction have been imaged with a scanning optical microscope (SOM) and a scanning electron microscope (SEM) using the induced carrier mode. Examination of the same dislocations by the two methods has shown that virtually identical images are obtained and the spatial resolution is 1m.     

Wavelet processing of nanocomposite images obtained by scanning tunnel and electron microscopes

The technique of digital processing of images obtained using a nanotechnological complex on the basis of a Umka-02-E scanning tunnel microscope and Philips XL30 scanning electron microscope is described. It is capable of efficient elimination of factors complicating the analysis, such as weak contrast ratio and background nonuniformity of images. Experimental images of nanocomposite material opal-InSb, which includes nanoparticles of indium antimonide in the porous dielectric matrix of opal, underwent wavelet processing. In addition to enhanced quality of the analyzed images, the technique makes it possible to reduce the aliasing effect (discrete structure of the image being reconstructed) in wavelet processing.     

Numerical analysis of the transmission efficiency of heat-drawn and chemically etched scanning near-field optical microscopes

The scanning near-field optical microscope (SNOM) has been tested experimentally for a wide variety of applications, but, to date, there has been little work done on the numerical or analytical modeling of the optical field as it propagates throughout the SNOM probe. Therefore, the fabrication on the probes relies more on trial and error than on clear design principles. An algorithm has been developed for the study and optimization of the geometry of SNOM probes fabricated by the heat-drawn and the one-step chemically etched methods. The algorithm uses the finite-difference beam propagation method (FD-BPM) to model the field evolution throughout the SNOM structure.     

Dual-optical-mode near-field scanning optical microscopy

The simultaneous operation of near-field scanning optical microscopy (NSOM) in reflection and transmission modes is demonstrated. In the transmission mode, a low-noise, large-area silicon photodetector was mounted between the piezoelectric transducer scanning stage and the sample. In the reflection mode, either a photomultiplier tube or two large-area silicon detectors was used for signal collection. The reflection-mode setup consisting of two silicon detectors provides a large numerical aperture of 0.9 as well as symmetrical detection of emitting photons. The dielectric thin films and the light-emitting polymers were used to demonstrate the capability of these two modes of NSOM. A comparison between these two different setups is also presented.     

Differential near-field scanning optical microscopy

We theoretically and experimentally illustrate a new apertured near-field scanning optical microscopy (NSOM) technique, termed differential NSOM (DNSOM). It involves scanning a relatively large (e.g., 0.3-2 mum wide) rectangular aperture (or a detector) in the near-field of an object and recording detected power as a function of the scanning position. The image reconstruction is achieved by taking a two-dimensional derivative of the recorded power map. Unlike conventional apertured NSOM, the size of the rectangular aperture/detector does not determine the resolution in DNSOM; instead, the resolution is practically determined by the sharpness of the corners of the rectangular aperture/detector. Principles of DNSOM can also be extended to other aperture/detector geometries such as triangles and parallelograms.     

Fluorescence lifetime imaging with near-field scanning optical microscopy

Near-field scanning optical microscopy (NSOM) is a high-resolution scanning probe technique capable of obtaining simultaneous optical and topographic images with spatial resolution of tens of nanometers. We have integrated time-correlated single-photon counting and NSOM to obtain images of fluorescence lifetimes with high spatial resolution. The technique can be used to measure either full fluorescence lifetime decays at individual spots with a spatial resolution of <100 nm or NSOM fluorescence images using fluorescence lifetime as a contrast mechanism. For imaging, a pulsed Ti:sapphire laser was used for sample excitation and fluorescent photons were time correlated and sorted into two time delay bins. The intensity in these bins can be used to estimate the fluorescence lifetime at each pixel in the image. The technique is demonstrated on thin films of poly(9,9'-dioctylfluorene) (PDOF). The fluorescence of PDOF is the results of both inter- and intrapolymer emitting species that can be easily distinguished in the time domain. Fluorescence lifetime imaging with near-field scanning optical microscopy demonstrates how photochemical degradation of the polymer leads to a quenching of short-delay intrachain emission and an increase in the long-delay photons associated with interpolymer emitting species. The images also show how intra- and interpolymer species are uniformly distributed in the films.     

Probe-sample interactions in reflection near-field scanning optical microscopy

Reflection near-field scanning optical microscopy with an asymmetric detector orientation is demonstrated. The effects of the probe-sample interactions are studied for different polarizations, detector orientations, and sample reflectivity. It is shown that the orientation of the detector can introduce shadowing in the images, which is opposite from the naive interpretation and which is dependent on the optical properties of the sample. Near-field optical images of metallic test patterns in reflection are shown that exhibit a lateral resolution of 40 nm.     

Fluorescence resonance energy transfer scanning near-field optical microscopy

The method of fluorescence resonance energy transfer scanning near-field optical microscopy (FRET SNOM) consists in the separation of a FRET pair between an SNOM tip and a sample. The donor (or acceptor) centre is located at the tip apex and scanned in the vicinity of a sample while acceptor fluorescence (or donor-fluorescence quenching) is detected. It is shown that the spatial resolution for such an approach is governed not by the aperture size but by the FRET characteristic radius (F?rster radius), and thus can attain the value of 2-7 nm with the same (or higher) sensitivity as characteristic for the aperture SNOM. The theoretical fundamentals of the method, its experimental realization and connections with other types of near-field optical microscopy are discussed. Coherent FRET SNOM, which can be realized at liquid helium temperatures, and its possible applications for quantum informatics, are briefly outlined.     

Characterization of antiresonant reflecting optical waveguide devices by scanning near-field optical microscopy

Silicon-based antiresonant reflecting optical waveguide (ARROW) devices were studied by means of a scanning near-field optical microscope. Various structures such as a Y junction of a Mach-Zehnder interferometer and a directional optical coupler were characterized, showing the propagation of the light inside the devices simultaneously with the topography. Scattering on the splitting point of the Y junction was shown, as well as a partial coupling of the light between the two branches of the coupler. Measurements on the decay length of the evanescent field were also performed to study the use of the ARROW waveguide for sensor purposes.     

Field enhancement in apertureless near-field scanning optical microscopy.

The near field of an apertureless near-field scanning optical microscopy probe is investigated with a multiple-multipole technique to obtain optical fields in the vicinity of a silicon probe tip and a glass substrate. The results demonstrate that electric field enhancements of >15 relative to the incident fields can be achieved near a silicon tip, implying intensity enhancements of several orders of magnitude. This enhancement arises both from the antenna effect of the elongated probe and from a proximity effect when the probe is near the substrate surface and its image dipoles play a role.     

Phase separation in polyaniline with near-field scanning optical microscopy

We report the studies of conjugated polymers, polyaniline thin films, with a near-field scanning optical microscope. Because of the absorption variation in different oxidation states, transmission-mode near-field scanning optical microscope images were employed to map out the distribution of the oxidation states on a submicrometer scale. When the near-field wavelength is varied (between 632.8 and 543.5 nm), the phase separation between the oxidized and the reduced repeated units, with domain sizes on a nanometer-length scale, is observed.     

Detection of probe dither motion in near-field scanning optical microscopy

The probe-to-sample separation in near-field scanning optical microscopes can be regulated by a noncontact shear-force sensing technique. The technique requires the measurement of a minute dither motion applied to the probe. We have characterized an optical detection method for measuring this motion to determine the optimum detection configuration in terms of sensitivity and stability. A scalar diffraction model of the detection method is developed for calculating sensitivity, and experimental results are found to be in good agreement with the theoretical predictions. We find that maximum sensitivity and stability cannot be achieved simultaneously, and it may be desirable in practice to trade sensitivity for enhanced stability.     

GHz apertureless near-field scanning optical microscopy of ferroelectric nanodomain dynamics

Nanoscale domain dynamics of (Ba,Sr)TiO(3) thin films are investigated at microwave frequencies with a home-developed GHz-frequency apertureless near-field scanning optical microscope (GHz-ANSOM). Using a microwave phase-modulation technique, we decoupled topographic artifacts from the optical signal, providing an enhanced and background-free temporal response. Interleaved acquisition of images taken at sequential time intervals provides amplitude and phase information about the electrooptic response at <50 nm spatial resolution and <10 ps temporal resolution. The local microwave response is highly nonuniform in both the amplitude and the phase.     

反射式近场光学显微镜样品近场光分布特性

建立了一种反射式近场光学显微镜中样品近场光分布特性的模型,应用矢量衍射理论,得到了系统的场方程。在弱波动条件下,采用微扰法对场方程进行了求解,能方便地得到样品表面的各阶近场光反射和透射模复振幅表达式。计算结果表明,一级场分布要比零级场小一个量级,各阶近场信号的强弱完全由面形函数的傅里叶变换决定。通过与零级结果的比较,证明了计算结果的正确性。提供了一种计算样品表面近场分布简便方法,对反射式近场光学显微镜中调制检测技术具有指导意义。     

Vector near-field calculation of scanning near-field optical microscopy probes using Borgnis potentials as auxiliary functions

A new boundary integral equation method for solving the near field in three-dimensional vector form in scanning near-field optical microscopy (SNOM) using Borgnis potentials as auxiliary functions is presented. A boundary integral equation of the electromagnetic fields, expressed by Borgnis potentials, is derived based on Green's theorem. The harmonic expansion in rotationally symmetric SNOM probe--sample systems is studied, and the three-dimensional electromagnetic problem is partly simplified into a two-dimensional one. The boundary conditions of Borgnis potentials both on dielectric boundaries and on perfectly conducting boundaries are derived. Relevant algorithms were studied, and a computer program was written. As an example, a SNOM probe-sample system composed of a round metal-covered probe and a sample with a flat surface has been numerically studied, and the computational results are given. This new method can be used efficiently for other electromagnetic field problems with round subwavelength structures.     

Nanometer scale polarimetry studies using a near-field scanning optical microscope

We describe a new technique that incorporates polarization modulation into near-field scanning optical microscopy (NSOM) for nanometer scale polarimetry studies. By using this technique, we can quantitatively measure the optical anisotropy of materials with both the high sensitivity of dynamic polarimetry and the high spatial resolution of NSOM. The magnitude and relative orientation of linear birefringence or linear dichroism are obtained simultaneously. To demonstrate the sensitivity and resolution of the microscope, we map out stress-induced birefringence associated with submicrometer defects at the fusion boundaries of SrTiO3 bicrystals. Features as small as 150 nm were imaged with a retardance sensitivity of approximately 3 x 10(-3) rad.     

Absorption coefficient imaging by near-field scanning optical microscopy in bacteria

We present a method for obtaining a position-dependent absorption coefficient from near-field scanning optical transmission microscopy. We show that the optical transmission intensity can be combined with the topography, resulting into an absorption coefficient that simplifies the analysis of different materials within a sample. The method is tested with the dye rhodamine 6G, and we show some analysis in biological samples such as bacteria KIebsiella pneumoniae and Pseudomonas aeruginosa. The calculated absorption coefficient images show important details of the bacteria, in particular for P. aeruginosa, in which membrane vesicles are clearly seen.