WC-Co硬质合金上高质量金刚石薄膜的制备

采用微波等离子体化学气相沉积法在硬质合金基体上制备金刚石薄膜.研究了铜过渡层和酸蚀脱钴两种基体前处理工艺以及在施加铜过渡层的情况下,不同的沉积气压和基片温度对金刚石薄膜的质量的影响.结果表明:在施加铜过渡层后,在适中的沉积条件下(沉积气压6.0 kPa,基片温度约为780℃)可得到质量较好的金刚石薄膜.     

硼浓度对沉积在刀具上的金刚石膜表面的影响

在热丝CVD装置中，以氢气、丙酮、硼酸三甲脂为原料，在YG6上制备了含硼金刚石薄膜．研究丙酮中硼含量对薄膜表面晶形及晶粒度的影响．结果表明，薄膜中渗入适量的硼不改变薄膜表面晶形，细化晶粒．有利于薄膜附着力的提高；而过高的硼含量恶化金刚石薄膜质量，降低薄膜附着力．     

燃焰法CVD金刚石薄膜生长过程的实验研究

采用燃焰法在硅基片表面进行了金刚石薄膜沉积实验．介绍了用金刚石微粉研磨基片表面对金刚石成核及生长的影响．根据不同沉积时间基片表面的扫描电子显微照片，分析了金刚石薄膜的生长过程，得出了金刚石薄膜的生长过程是以岛状生长模式形成连续膜的结论．     

Thermal residual stress analysis of diamond coating on graded cemented carbides

Finite element model was developed to analyze thermal residual stress distribution of diamond coating on graded and homogeneous substrates. Graded cemented carbides were formed by carburizing pretreatment to reduce the cobalt content in the surface layer and improve adhesion of diamond coating. The numerical calculation results show that the surface compressive stress of diamond coating is 950 MPa for graded substrate and l 250 MPa for homogenous substrate, the thermal residual stress decreases by around 24% due to diamond coating. Carburizing pretreatment is good for diamond nucleation rate, and can increase the interface strength between diamond coating and substrate.     

YT类硬质合金成形铣刀的金刚石涂层工艺研究

针对YT15硬质合金B212型成形铣刀片,以两种不同的化学方式对硬质合金基体进行预处理,而后采用热丝化学气相沉积的方法在其表面沉积微米级金刚石薄膜.使用扫描电子显微镜观察金刚石薄膜颗粒的大小及均匀度,激光拉曼光谱仪检测金刚石涂层的成分,压痕法检验金刚石涂层刀片的膜-基附着强度,并就不同预处理的基体表面对金刚石薄膜的质量、附着性能的影响进行分析.结果表明,经预处理后的YT类硬质合金表面粗糙度较YG类降低约10%,采用平行布置热丝方式和现有的沉积工艺在YT类硬质合金衬底涂覆的金刚石薄膜均匀性较好,且经酸碱预处理的金刚石薄膜表现出良好的附着力,附着强度介于600~1 000 N,醇碱预处理对衬底表面原有的光洁度损坏较小,有助于细化金刚石晶粒,但膜-基附着强度不高.     

基片预处理对CVD金刚石薄膜形核的影响

微波辅助等离子体化学气相沉积法是目前低压气相合成金刚石薄膜方法中应用最普遍、工艺最成熟的方法,形核是CVD金刚石沉积的第一步．利用微波辅助等离子体化学气相沉积装置,研究了硅基片预处理方式对金刚石薄膜形核密度的影响．在工作气压为5-8kPa,微波功率为2500—5000W,甲烷流量为4-8cm^3／min,氢气流量为200em3／min,沉积温度为500℃-850℃的条件下,在单晶Si基片上沉积金刚石薄膜．通过扫描电子显微镜形貌观察表明,基片预处理能够显著提高金刚石形核密度,同时用拉曼光谱表征了金刚石薄膜的质量,     

MPECVD法在抛光石英玻璃上沉积金刚石薄膜

采用微波等离子体增强化学气相沉积方法(MPECVD),利用氢气和甲烷混合气体,在抛光石英基片上低温沉积出金刚石薄膜。用扫描电子显微镜(SEM)、激光拉曼光谱仪(Raman)和傅立叶红外光谱仪(FTIR)对薄膜的表面形貌、颗粒尺寸、纯度和光学透过性能进行了表征。通过SEM发现,得到的金刚石薄膜的颗粒尺寸为0.2~0.3μm,形核密度超过109cm-2,从薄膜形貌可以发现,较高温度有利于提高薄膜的生长速率和颗粒尺寸的均匀性。通过拉曼光谱和红外透射光谱分析发现,较高温度下沉积的薄膜具有较高的金刚石相含量,薄膜的光学透过性能也相对较好。     

辅助气体对分阶段制备金刚石膜的影响

采用形核 甲烷/氢气生长-辅助气体/甲烷/氢气生长的新工艺,在镜面抛光的单晶硅片上制备了金刚石膜,并用扫描电子显微镜和激光拉曼光谱等测试方法对薄膜的表面形貌和质量性能进行了表征;研究了添加辅助气体对已有金刚石晶型生长的影响.结果表明:以甲烷/氢气为气源时,金刚石膜生长率一般为1.8 μm/h,当分别加入氧气、二氧化碳、氮气时,其生长率都有所提高,其中加入二氧化碳时,其生长率是甲烷/氢气为气源的3倍多,但是加入氩气时,其生长率下降;通过新工艺,在加入氮气或氩气时,第一生长阶段为微米,而第二生长阶段为纳米尺寸,最后制备出具有微/纳米双层复合金刚石膜.     

The effect of working gas pressure and deposition power on the properties of molybdenum films deposited by DC magnetron sputtering

Molybdenum films were deposited on Corning 7059 glass substrates by DC magnetron sputtering with different working gas pressures and sputtering powers.The structure and morphology,residual stress and adhesion,resistivity and optical reflectance of the as-deposited Mo films were investigated.The results show that Mo films deposited with high working gas pressure and low sputtering power have a spherical surface morphology,small grain size,residual compressive stress and a good adhesion,high resistivity and low optical reflectance.With the working gas pressure decreased and the sputtering power increased,Mo films have elongated spindle-shape or diamond flake shape surface morphology,the grain size is increased,with residual stress changed from tensile to compressive,a poor adhesion,resistivity decreased and optical reflectance increased.     

Deposition of crackless freestanding diamond films on Mo substrates with Zr interlayer

The Mo substrate with Zr interlayer,namely composite substrate,was employed to solve the problem of crack formation in the freestanding diamond film deposition.Freestanding diamond films deposited on the composite substrates by the direct current arc plasma jet chemical vapor deposition(CVD) method were investigated with scanning electron microscopy(SEM),X-ray photoelectron spectroscopy (XPS),X-ray diffraction(XRD),and Raman spectroscopy.In addition,the stress distribution during the large area freestand...     

Nanodiamond films deposited at moderate temperature on pure titanium substrate pretreated by ultrasonic scratching in diamond powder suspension

Nanocrystalline diamond （NCD） film deposition on pure titanium and Ti alloys is extraordinarily difficult because of the high diffusion coefficient of carbon in Ti, the large mismatch in their thermal expansion coefficients, the complex nature of the interlayer formed during diamond deposition, and the difficulty to achieve very high nucleation density. In this investigation, NCD films were successfully deposited on pure Ti substrate by using a novel substrate pretreatment of ultrasonic scratching in a diamond powder-ethanol suspension and by a two-step process at moderate temperature. It was shown that by scratching with a 30-μm diamond suspension for 1 h, followed by a 10-h diamond deposition, a continuous NCD film was obtained with an average grain size of about 200 nm. Detailed experimental results on the preparation, characterization, and successful deposition of the NCD films on Ti were discussed.     

Synthesis of boron-doped diamond/porous Ti composite materials — Effect of carbon concentration

Highly boron-doped diamond films were deposited on porous titanium substrates by hot filament chemical vapor deposition technique.The morphology variation of highly boron-doped diamond films grown on porous titanium substrates was investigated,and the effects of carbon concentration on nucleation density and diamond growth were also studied.The continuous change of surface morphology and structure of diamond film were characterized by scanning electron microscopy.The structures of diamond film and interlayer were analyzed by X-ray diffraction.The quality of boron-doped diamond film was confirmed by visible Raman spectroscopy.The experimental results reveal that surface morphology and quality of boron-doped diamond films are various due to the change of carbon concentration.The thickness of intermediate layer decreases with the carbon concentration increasing.     

大面积金刚石膜生长过程中的缺陷和内应力

采用甲烷和氢气作为气源,在直径为50 mm的抛光单晶硅片上,利用新型微波等离子体化学气相沉积(MPCVD)装置制备出金刚石膜.用扫描电子显微镜观测金刚石膜的表面形貌,利用激光Raman光谱表征金刚石膜的质量以及X射线衍射检测金刚石膜的成分和晶界缺陷.结果表明V(CH4)/V(H2)为1%,基片温度为845℃时,生长金刚石膜的质量较好,并且具有完整的晶体形貌,但是扫描电子显微镜图×5 000倍时,观察到金刚石膜中明显的晶体缺陷存在,同时X射线衍射图表明金刚石膜的内应力较大.     

MPCVD法AlN基体上金刚石薄膜的制备

以丙酮和氢气作气源,采用微波等离子体化学气相沉积法（MPCVD）在AlN表面制备金刚石薄膜,并通过拉曼光谱（Raman）,扫描电子显微镜（SEM）对沉积得到的金刚石薄膜进行表征.研究表明：直接在AlN表面沉积因金刚石的形核密度很低而很难得到连续的金刚石薄膜.利用金刚石微粉研磨AlN表面有利于金刚石形核密度的提高,Raman分析和电镜观察发现：所得的金刚石薄膜存在杂质和缺陷,没有明显的刻面特征,而且是由粒径较大的球状颗粒堆积而成.     

采用Cu／Ti过渡层沉积金刚石薄膜刀具的界面结构

研究了硬质合金基底上Cu／Ti作过渡层化学气相沉积(CVD)金刚石薄膜的界面特性。利用激光Ra—man谱分析了过渡层不同生长阶段金刚石薄膜的质量的影响。采用SEM、EDS对金刚石薄膜硬质合金刀具横截面的结构进行了研究。结果表明：基体中的Co被Cu／Ti作过渡层有效的抑制住；Cu向基体内的扩散改善了基体的性能，提高了界面层金刚石薄膜的质量；Ti的引入促进了金刚石的形核，减少了界面处晶粒间的空隙，提高了金刚石薄膜与基体表面的实际接触面积。     

金刚石薄膜的形核研究

本文介绍了当前金刚石薄膜形核的现状及用热丝化学气相沉积法在不同的衬底上沉积金刚石膜，对Si、Ni、Cu三种衬底生长的金刚石膜进行研究如何增大形核密度、提高形核质量。得到了制备高密度和高质量的金刚石膜的方法。     

脉冲多弧离子镀沉积类金刚石薄膜的牢固度研究

利用脉冲多弧离子镀技术在硅基片上沉积类金刚石薄膜．分析了类金刚石薄膜的牢固度与各种工艺条件的关系．实验结果表明：基片的清洗、基片温度、主回路电压、脉冲频率、烘烤处理都强烈影响类金刚石薄膜的牢固度．同时从理论上分析了利用离子束辅助蒸发工艺可以进一步提高类金刚石薄膜的牢固度     

CVD条件对金刚石薄膜／钼基体界面层的影响

用微波等离子体化学气相沉积法（MPCVD）在Mo基片上沉积金刚石薄膜时,界面层钼的碳化程度与初始沉积条件有关,利用XRD,SEM,EDS,对界面层进行的研究表明：在化学气相沉积的开始阶段,较低的甲烷浓度有利于碳向基体内的扩散从而让表面的Mo充分碳化,形成富含Mo2C的界面层,甲烷浓度过高时有利于金刚石的形核而不利于碳向基体内的扩散,在金刚石薄膜的生长过程中,碳向基体内的扩散很少,界面层的组成结构保持不变。     

直流负偏压对金刚石形核的影响

本文研究了微波等离子体化学气相沉积金刚石薄膜中，直流负偏压的大小、施加的时间和施加偏压期间的甲烷浓度对光滑Ｓｉ衬底上金刚石形核的影响．发现适当的衬底负偏压可以极大地促进金刚石的形核，而过高或过低的偏压则都不利于形核。     

铜基底上外延生长金刚石薄膜的密度泛函理论研究

基于密度泛函理论对铜上外延生长的金刚石薄膜的几何结构及其能量特征进行了计算,计算结果表明外延生长金刚石薄膜的几何参数与体金刚石的几何参数相似（特别是（111）面）;在铜多晶基体的〈111〉方向更有利于金刚石薄膜的外延生长.