垒层Si掺杂对多量子阱InGaN绿光LED性能的影响

InGaN系绿光LED的量子阱结构具有较高的In含量,InN与GaN之间较大的晶格失配度使得绿光器件的量子限制Stark效应更显著。对内建电场的屏蔽可以有效提高载流子的辐射复合效率。论文探讨了绿光多量子阱中垒层的Si掺杂对绿光器件性能的影响。研究发现,多量子阱中垒层适度Si掺杂(3.4×1016 cm-3)可以改善多量子阱结构界面质量和In组分波动,在外加正向电流的作用下更大程度地屏蔽极化电场;同时,还能够增强电流的横向扩展性,提高活化区的有效发光面积。然而,多量子阱中垒层的过度Si掺杂对于绿光LED器件的性能带来诸多的负面影响,比如加剧阱垒晶格失配、漏电途径明显增加等,致使器件光效大幅度降低。     

生长温度对InGaN/GaN多量子阱LED光学特性的影响

利用低压MOCVD系统,在蓝宝石衬底上外延生长了InGaN/GaN多量子阱蓝紫光LED结构材料.研究了生长温度对有源层InGaN/GaN多量子阱的合金组分、结晶品质及其发光特性的影响.结果表明当生长温度从730℃升到800℃时,LED的光致发光波长从490nm移到380nm,室温下PL谱发光峰的半高全宽从133meV降到73meV,表明了量子阱结晶性的提高.高温生长时,PL谱中还观察到了GaN的蓝带发光峰,说明量子阱对载流子的限制作用有所减弱.研究表明,通过改变生长温度可以对LED发光波长及有源层InGaN的晶体质量实现良好的控制.     

GaN基绿光LED材料蓝带发光对器件特性的影响

分析比较了在不同外延生长条件下GaN基高In组分绿光LED材料室温和低温10K下光致发光谱中蓝带发光峰,研究了外延结构中p型层蓝带峰发光特性对材料晶体质量和器件电光转换效率的影响.结果表明:通过优化p型层的外延生长条件,可有效降低和消除其蓝带发光峰较之多量子阱主峰的相对强度,有利于提高LED器件特别是高In组分绿光LED器件在同等注入电流条件下的发光功率.     

GaN基绿光LED材料蓝带发光对器件特性的影响

分析比较了在不同外延生长条件下GaN基高In组分绿光LED材料室温和低温10K下光致发光谱中蓝带发光峰,研究了外延结构中p型层蓝带峰发光特性对材料晶体质量和器件电光转换效率的影响.结果表明:通过优化p型层的外延生长条件,可有效降低和消除其蓝带发光峰较之多量子阱主峰的相对强度,有利于提高LED器件特别是高In组分绿光LED器件在同等注入电流条件下的发光功率.     

InGaN/GaN MQW双波长LED的MOCVD生长

利用金属有机物化学气相淀积(MOCVD)系统生长了InGaN/GaN多量子阱双波长发光二极管(LED).发现在20 mA正向注入电流下空穴很难输运过蓝光和绿光量子阱间的垒层,这是混合量子阱有源区获得双波长发光的主要障碍.通过掺入一定量的In来降低蓝光和绿光量子阱之间的垒层的势垒高度,增加注入到离p-GaN层较远的绿光有源区的空穴浓度,从而改变蓝光和绿光发光峰的强度比.研究了蓝光和绿光量子阱间垒层In组分对双波长LED的发光性质的影响.此外,研究了双波长LED发光特性随注入电流的变化.     

408nm InGaN/GaN LED的材料生长及器件光学特性

通过提高InGaN量子阱结构的生长温度,降低量子阱In组分的掺入效率,提高InGaN/GaN量子阱结构生长质量,缩短LED输出波长等手段,实现了紫光LED高效率输出.采用高分辨率X射线双晶衍射、扫描隧道显微镜和光致发光谱技术研究了高温生长InGaN/GaN多量子阱的结构和光学特性.封装后的300μm×300μm LED器件在20mA的注入电流下输出功率为5.2mW,输出波长为408nm.     

408nm InGaN/GaN LED的材料生长及器件光学特性

通过提高InGaN量子阱结构的生长温度,降低量子阱In组分的掺入效率,提高InGaN/GaN量子阱结构生长质量,缩短LED输出波长等手段,实现了紫光LED高效率输出.采用高分辨率X射线双晶衍射、扫描隧道显微镜和光致发光谱技术研究了高温生长InGaN/GaN多量子阱的结构和光学特性.封装后的300μm×300μm LED器件在20mA的注入电流下输出功率为5.2mW,输出波长为408nm.     

InGaN/GaN多量子阱LED电致发光谱中双峰起源的研究

研究了MOCVD生长的具有双发射峰结构的InGaN/GaN多量子阱发光二极管(LED)的结构和发光特性.在透射电子显微镜(TEM)下可以发现量子阱的宽度不一致,电致发光谱(EL)发现了位于2.45eV的绿光发光峰和2.81eV处的蓝光发光峰.随着电流密度增加,双峰的峰位没有移动,直到注入电流密度达到2×104 mA/cm2时,绿光发光峰发生蓝移,而蓝光发光峰没有变化.单色的阴极荧光谱(CL)发现绿光发射对应的发光区包括絮状区域和发光点,而蓝光发射对应的发光区仅包含絮状区域.通过以上的结果,我们认为蓝光发射基本上源于InGaN量子阱发光,而绿光发射则起源于量子阱和量子点的发光.     

InGaN/GaN多量子阱LED电致发光谱中双峰起源的研究

研究了MOCVD生长的具有双发射峰结构的InGaN/GaN多量子阱发光二极管(LED)的结构和发光特性.在透射电子显微镜(TEM)下可以发现量子阱的宽度不一致,电致发光谱(EL)发现了位于2.45eV的绿光发光峰和2.81eV处的蓝光发光峰.随着电流密度增加,双峰的峰位没有移动,直到注入电流密度达到2×104 mA/cm2时,绿光发光峰发生蓝移,而蓝光发光峰没有变化.单色的阴极荧光谱(CL)发现绿光发射对应的发光区包括絮状区域和发光点,而蓝光发射对应的发光区仅包含絮状区域.通过以上的结果,我们认为蓝光发射基本上源于InGaN量子阱发光,而绿光发射则起源于量子阱和量子点的发光.     

InGaN/GaN多量子阱的变温发光特性研究

采用低压金属有机化学沉积方法制备了InGaN/GaN多量子阱.变温PL测量发现,量子阱发光强度具有良好的温度稳定性,随着温度升高(10～300K),发光强度只减小到1/3左右.分析认为,InGaN/GaN多量子阱的多峰发光结构是由多量子阱的组分及阱宽的不均匀引起的.随着温度升高,GaN带边及量子阱的光致发光均向低能方向移动,但与GaN带边不同,量子阱发光峰值变化并不与通过内插法得到的Varshni经验公式相吻合,而是与InN带边红移趋势一致,分析了导致这种现象的可能因素.还分析了量子阱发光寿命随温度升高而减小的原因.     

Optimization of the nanopore depth to improve the electroluminescence for GaN-based nanoporous green LEDs

GaN-based nanoporous green LEDs with different pore depth have been fabricated by using anodic aluminum oxide (AAO) as dry etching mask. The experimental results show that the electrical properties of the nanoporous LEDs with different pore depths are similar, but for the optical properties, the LEDs with nanopores extended to the p-GaN layer exhibits the best performance, if increase the depth to MQWs or decrease to the ITO layer will both decrease the light output power (LOP). By calculating the light extraction efficiency using three-dimensional (3D) finite-difference time-domain method, the decrease of the light output is mainly attributed to the reduced light extraction efficiency when the pore depth stop at ITO transparent layer instead of p-type layer, while if the depth reach the MQWs, the deterioration of the QWs which is caused by dry etching damage will play an important role. This optimization would give a valuable guidance to the surface structure design for nanostructured GaN-based LEDs, such as surface roughening, photonic crystal, or top-down fabricated surface-plasmon enhanced LEDs.     

Mg fluctuation in p-GaN layers and its effects on InGaN/GaN blue light-emitting diodes dependent on p-GaN growth temperature

Correlation between material properties of bulk p-GaN layers grown on undoped GaN and device performance of InGaN/GaN blue light-emitting diodes (LEDs) as a function of p-GaN growth temperature were investigated. The p-GaN layers of both structures grown by metal-organic chemical-vapor deposition were heavily doped with Mg. As the growth temperature of the bulk p-GaN layer increased up to 1,080°C, N_A-N_D increased. However, above 1,110°C, N_A-N_D sharply decreased, while the fluctuation of Mg concentration ([Mg]) increased. At this time, a peculiar surface, which originated from inversion domain boundaries (IDBs), was clearly observed in the bulk p-GaN layer. The IDBs were not found in all LEDs because the p-GaN contact layer was relatively thin. The change in photoluminescence emission from the ultraviolet band to blue band is found to be associated with the fluctuation of [Mg] and IDBs in bulk p-GaN layers. The LED operating voltage and reverse voltage improved gradually up to the p-GaN contact-layer growth temperature of 1,080°C. However, the high growth temperature of 1,110°C, which could favor the formation of IDBs in the bulk p-GaN layer, yielded poorer reverse voltage and saturated output power of the LEDs.     

Organic/inorganic F8T2/GaN light emitting heterojunction

An organic/inorganic white-light emitting F8T2 (9,9-dioctylfluorene-co-bithiophene)/GaN heterojunction is reported. The white-light emission is produced by hybridizing the blue light (464 nm) emitted from the GaN MQWs and the yellow/green light (500–650 nm) emitted at the F8T2/p-GaN interface by electroluminescence (EL). The yellow/green light emission in the F8T2 layer is resulted from the carrier accumulation and Frenkel excitons at the F8T2/p-GaN junction interface. It is concluded that the energy barrier and large mobility discrepancy at the F8T2/p-GaN junction interface cause carriers accumulating in the F8T2 side near the F8T2/p-GaN interface. The accumulated carriers at the F8T2/p-GaN interface form Frenkel excitons by Coulombic interaction. Then, the Frenkel excitons recombine to radiate the yellow/green emission in the F8T2 layer. The International Commission on Illumination (CIE) coordinate of the white-light emitted from the present device is at (0.28, 0.30), which is very close to the standard white light (0.33, 0.33).     

Influence of growth temperature and growth rate of p-GaN layers on the characteristics of green light emitting diodes

We investigated the electrical and structural qualities of Mg-doped p-type GaN layers grown under different growth conditions by metalorganic chemical vapor deposition (MOCVD). Lower 300 K free-hole concentrations and rough surfaces were observed by reducing the growth temperature from 1,040°C to 930°C. The hole concentration, mobility, and electrical resistivity were improved slightly for Mg-doped GaN layers grown at 930°C with a lower growth rate, and also an improved surface morphology was observed. In_0.25Ga_0.75N/GaN multiple-quantum-well light emitting diodes (LEDs) with p-GaN layers grown under different conditions were also studied. It was found from photoluminescence studies that the optical and structural properties of the multiple quantum wells in the LED structure were improved by reducing the growth temperature of the p-layer due to a reduced detrimental thermal annealing effect of the active region during the GaN:Mg p-layer growth. No significant difference in the photoluminescence intensity depending on the growth time of the p-GaN layer was observed. However, it was also found that the electroluminescence (EL) intensity was higher for LEDs having p-GaN layers with a lower growth rate. Further improvement of the p-GaN layer crystalline and structural quality may be required for the optimization of the EL properties of long-wavelength (∼540 nm) green LEDs.     

Influence of growth conditions on the V-defects in InGaN/GaN MQWs

The influence of the growth temperature,TMIn/TEGa andⅤ/Ⅲratio on the V-defects of InGaN/GaN multi-quantum wells（MQWs） has been investigated and discussed.When the TMIn flow increases from 180 to 200 sccm,the density of V-defects increases from 2.72×10¹⁸ to 5.24×10¹⁸ cm^-2,and the V-defect width and depth increase too.The density also increases with the growth temperature.The densities are 2.05×10⁸,2.72×10¹⁸ and 4.23×10⁸ cm^-2,corresponding to a growth temperature of 748,753 and 758℃respectively.When the NH₃ flows are 5000,6600 and 8000 sccm,the densities of the V-defects of these samples are 6.34×10¹⁸,2.72×10¹⁸ and 4.13×10¹⁸ cm^-2,respectively.A properⅤ/Ⅲratio is needed to achieve step flow growth mode.We get the best quality of InGaN/GaN MQWs at a growth temperature of 753℃TMIn flow at 180 sccm,NH₃ flow at 6600 sccm,a flatter surface and less V-defects density.The depths of these V-defects are from 10 to 30 nm,and the widths are from 100 to 200 nm.In order to suppress the influence of V-defects on reverse current and electro-static discharge of LEDs,it is essential to grow thicker p-GaN to fill the V-defects.     

LED用石墨烯复合透明电极厚度组合的仿真与优化

为降低石墨烯(Gr)透明电极与p-GaN之间的肖特基势垒与接触电阻,进行了将银、金、镍和铂四种金属或氧化镍作为中间层引入它们两者之间的尝试。使用有限元方法模拟研究了Gr与金属或氧化镍的不同厚度组合对LED的光、热和电特性的影响。发现:透明导电层的透光率和LED芯片的表面温度均随石墨烯和金属或氧化镍厚度的增加而降低;1.5nm的Ag、Ni、Pt,1nm Au或1nm的NiO_x分别与3层(3L)Gr复合时为优化厚度组合,其中,1.5nm Ni/3L Gr为最佳Gr/金属复合透明电极。     

MgO界面层对n-ZnO纳米棒/p-GaN异质结LED光电性能的影响

为了较好地实现n-ZnO的电致发光(EL),利用水热法在p-GaN外延片上制备了ZnO纳米棒阵列,构造了n-ZnO纳米棒/p-GaN异质结LED原型器件,并研究了MgO界面层对器件光电性能的影响。结果表明,n-ZnO纳米棒/p-GaN异质结器件具有明显的二极管整流效应。室温、正向偏压下,n-ZnO纳米棒/p-GaN异质结LED仅在430nm附近具有单一的发光峰,而n-ZnO纳米棒/MgO/p-GaN异质结LED的电致发光光谱由一个从近紫外到蓝绿光区的宽发光带组成。结合光致发光(PL)谱和Anderson能带模型,深入分析了n-ZnO纳米棒/p-GaN异质结的载流子复合机制。     

Ultraviolet ZnO Nanorod/P-GaN-Heterostructured Light-Emitting Diodes

Both i-ZnO and n-ZnO : In nanorod arrays were grown on a p-GaN layer with an anodic alumina membrane template using a vapor cooling condensation method. Electroluminescence emissions were observed from the resulting p-n (p-GaN/n-ZnO : In nanorod array) and p-i-n (p-GaN/i-ZnO nanorod array/n-ZnO : In nanorod array) heterostructured light-emitting diodes (LEDs). The ultraviolet emission peak at 386 nm observed in the p-i-n heterostructured LEDs was attributed to radiative recombination of the near-band edge in the i-ZnO nanorods. Using power-law fitted current–voltage relationships, it was shown that a space-charge-limited current and associated effects occurred in the p-n and p-i-n nanorod heterostructured LEDs.