一种DSP桶形移位器的设计与优化方法

移位器单元是数字信号处理器中的重要运算部件,提出了一种桶形移位器的设计实现,应用新的移位器级同互联方案,并采用改进的2-1选择器对其电路的结构做了进一步优化.实验及仿真结果表明,提出的方案对移位器的功耗和面积有了较大改善,从而有效地提高了处理器的性能.采用本移位器设计的数字信号处理器已在SMIC0.18μm CMOS工艺下流片成功.     

桶形移位器在AVS熵解码器中的应用及仿真

AVS视频解码器作为一种媒体解码器,对实时性有较高的要求,这就要求解码器有较快的解码速度.针对这一技术需要,在AVS熵解码器的设计中,提出了一种用于码流截取的桶形移位器的设计方案.采用Verilog HDL语言进行设计和仿真,实现了码流的正确截取.本设计方案通过采用累加器和移位器的组合来实现数据传输,考虑了解码时延不同...     

一种低功耗BIST测试产生器方案

低功耗设计呼唤低功耗的测试策略。文章提出了一种在不损失固定型故障覆盖率的前提下降低测试功耗的内建自测试测试产生器方案，该方案在原始线性反馈移位寄存器的基础上添加简单的控制逻辑，对LFSR的输出和时钟进行调整，从而得到了准单输入跳变的测试向量集，使得待测电路的平均功耗大大降低，给出了以ISCAS'85/89部分基准电路为对象的实验结果，电路的平均测试功耗降幅在54．4％－98．0％之间，证明了该方案的有效性。     

内建自测试中移位器的设计及其应用

本文提出了一种新的方法和综合技术用来去除多扫描链内建测试中由线形反馈移位寄存器引起的测试向量线性关联性，利用本方法可以高效的设计内建自测试中移位器并且保证足够扫描链间的位移和每条扫描通道尽少量的门数开销。     

一种有效的双矢量测试BIST实现方案

文章提出了一种简单有效的双矢量测试BIST。实现方案．其硬件主要由反馈网络可编程且种子可重置的LF—SR和映射逻辑两部分构成。给出了一种全新的LPSR最优种子及其反馈多项式组合求取算法，该算法具有计算简单且容易实现的特点。最后。使用这种BIST、方案实现了SoC中互联总线间串扰故障的激励检测，证明了该方案在计算量和硬件开销方面的优越性。     

一种超高速八位移位寄存器

介绍了一种超高速八位移位寄存器的设计和工艺制造技术。采用单元结构设计方法进行逻辑设计、电路设计、版图设计和整体设计,用3μm双埋层对通pn结隔离ECL技术进行工艺制作,其最高工作频率达到400MHz以上,工作温度范围为-55℃～85℃,比常规的TTL或者COMS移位寄存器工作频率高40倍。     

一种超前进位加法器的新颖BIST架构

针对超前时进位加法器（CLA），提出了一种高效的BIST架构。这种新的架构结合了确定性测试和伪随机测试的优点，并避免了各自的短处。同时，还提出了一个测试向量集，并充分利用了CLA加法器内部结构的规整性，向量集规模较小，便于片内集成。最后，提出了一种计算特征值的新方法。     

基于MCU的可测试性设计

根据ＭＣＵ结构非常复杂且具有指令系统的特点,没有采用一般数字电路设计的从结构出发的ＤＦＴ技术,而是设定了ＭＣＵ的３种工作模式,提出了一种在ＭＣＵ中加入规模很小的模式选择电路,对部分电路作较小改动,就可以对芯片内的各块电路进行功能测试的方法。在完成了ＭＣＵ的可测性设计后进行了仿真,结果表明电路能正常工作在各种模式下。     

24位BOOTH乘法器核的一种有效BIST方法

针对24位BOOTH乘法器核的可测性问题，提出了一种有效的BIST(built-in self-test)设计方案。这种方案只需要对乘法器进行少量的改动，缺陷测试覆盖率可以达到95％左右。该方案还可以应用到其他嵌入式核的可测性设计中。     

基于LFSR优化的BIST低功耗设计

在BIST(内建自测试)过程中,线性反馈移位寄存器作为测试矢量生成器,为保障故障覆盖率,会产生很长的测试矢量,从而消耗了大量功耗.在分析BIST结构和功耗模型的基础上,针对test-per-scan和test-per-clock两大BIST类型,介绍了几种基于LFSR(线性反馈移位寄存器)优化的低功耗BIST测试方法,设计和改进可测性设计电路,研究合理的测试策略和测试矢量生成技术,实现测试低功耗要求.     

An Effective Deterministic BIST Scheme for Shifter/Accumulator Pairs in Datapaths

In this paper an effective Built-In Self-Test (BIST) scheme for the shifter-accumulator pair (accumulation performed either by an adder or an ALU) which appears very often in embedded processor, microprocessor or DSP datapaths is introduced. The BIST scheme provides very high fault coverage (>99%) with respect to the stuck-at fault model for any datapath width with a regular, very small and counter-generated deterministic test set, as it is verified by a comprehensive set of experiments.     

An effective BIST scheme for SRAM full speed test

This article presents a novel built-in self-test (BIST) scheme at full speed test where access time test is performed. Based on normal BIST circuits, we harness an all digital phase locked loop to generate a high-frequency clock for static random access memory (SRAM) performance test at full speed. A delay chain is incorporated to achieve the four-phase clock. As inputs to SRAM, clock, address, data are generated in terms of the four-phase clock. Key performance parameters, such as access time, address setup and hold times, are measured. The test chip has been fabricated by United Microelectronics Corporation 55?nm CMOS logic standard process. According to test results, the maximum test frequency is about 1.3?GHz, and the test precision is about 35?ps at the typical process corner with supply voltage 1.0?V and temperature 25°C.     

Noise-Insensitive Digital BIST for any PLL or DLL

PLLs are the heart of most SoCs, so their performance affects many tests. Practical, published PLL BIST approaches cannot measure <10 ps RMS jitter or >1 GHz. This paper describes how a SerDes undersampling DFT technique was adapted to test multiple PLLs and DLLs for jitter, phase error, output frequency, duty cycle, lock time, and lock range. Two techniques for cancelling random and systematic noise are also described. The multi-GHz range, sub-picosecond jitter noise floor, and minimal silicon area are better than for any previous silicon-proven DFT or BIST that needs no calibration or analog circuitry. FPGA implementation results are provided.

An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures

In this paper the implementation of the test strategy in a so-called Very Long Instruction Word Transport Triggered Architecture (VLIW-TTA) is discussed. The complete test strategy is derived referring to the results of test synthesis, carried out in the early phase of the design. It takes the area/throughput parameters into account. The test strategy, exploiting the regularity and modularity of the VLIW-TTA structure, remains general for an arbitrary application and instantiation of the TTA processor and is based on the partial scan approach along with the functional test. The test-time analysis, in order to justify our approach and show the superiority over the classical full-scan, has been performed. The results of our strategy are shown in a few examples at the end of the paper.