Fabrication and properties of AgInTe2 thin films

AgInTe₂ thin films were deposited onto glass substrates by pulsed laser ablation. Their structure, composition, and transmission and reflection spectra in the range 0.5 to 2.5 Μm were studied. The absorption coefficient, energies of band-to-band transitions, and parameters of crystal-field and spin-orbit splittings were determined. The results obtained for the AgInTe₂ films are in good agreement with the data for bulk crystals.     

The optical properties of CuInS2 thin films

The optical absorption in flash-evaporated CuInS₂ thin films was studied in the photon energy range from 0.5 to about 4.2 eV. CuInS₂ was found to be a direct gap semiconductor with a gap energy of 1.524±0.005 eV at room temperature. The ground state energy of the free exciton was found to be about 8 meV. An indirect allowed transition was observed at 1.565±0.005 eV and was ascribed to an optical transition from the valence band maxima at the boundary of the Brillouin zone to the lowest conduction band minimum at the zone centre. Three further optical transitions which were probably due to the copper d states in the valence band were found at energies well above the fundamental edge.     

The optical properties of sprayed CdS thin films

In the study presented in this paper we attempted to interpret the reflectance and the transmittance of sprayed CdS films. Assuming a model based on multilayer film theory we showed that sprayed CdS film is a combination of multilayer stacks of crystallites and gaseous inclusions.     

The optical properties of zirconium diboride thin films

The optical properties of evaporated thin films of zirconium diboride were investigated from 4.1 to 11.3 eV. The optical constants were determined by reflectance measurements made at near-normal and oblique angles of incidence. The existence and energy of interband transitions and the plasma frequency are inferred from these results.     

HfO2薄膜的制备与光学性能

采用射频磁控反应溅射法，以高纯热压HfO2陶瓷为靶材，在Si衬底上成功制备出HfO2薄膜。系统研究了工艺参数对薄膜沉积速率的影响规律，并对薄膜的光学性能进行了研究。结果表明，射频功率对薄膜沉积速率的影响最为明显，O2／Ar流量比和衬底温度对沉积速率的作用不明显，所制备薄膜的折射率较高在近红外波段趋于1．95，在500-1650nm波段范围内薄膜几乎无吸收，透过率较高。     

CuInS2薄膜的制备及光学特性

真空共蒸发在玻璃衬底上制备CuInS2薄膜.研究不同Cu、In、S元素配比、不同热处理条件对薄膜的结构、化学计量比及光学性能的影响.实验结果给出:在元素配比中S的原子比x选择极为重要(实验选0.2≤x≤2),本实验Cu、In、S最佳原子比为1:0.1:1.2.用x(Cu).x(In):x(S)=1:0.1:1.2原子比...     

Structure and optical properties of CuGaSe2 thin films

The structure and optical properties of vacuum-deposited films of CuGaSe₂ were studied at various substrate temperatures. Stoichiometric films could be obtained at substrate temperatures as low as 450 K. Epitaxial growth was observed on single-crystal NaCl substrates at temperatures above 500 K. The optical transition energies obtained at 1.68, 1.78 and 1.92 eV were in good agreement with previous results.     

The optical properties of CuGa0.5In0.5Se2 thin films

CuGa_0.5In_0.5Se₂ thin films with thickness in the range 50 to 280 nm were deposited by thermal evaporation of prereacted material on glass substrates. The films were found to be polycrystalline with single phase having chalcopyrite structure as that of bulk material. The optical constants of these films were determined by transmittance and reflectance measurements at normal incidence for light in the wavelength range 400 to 1200 nm. Three characteristic energy gaps of 1.30, 1.55 and 2.46 eV were obtained from an analysis of the optical absorption spectrum. The optical constants of the films appear to be independent of the substrate temperature.     

热致变色VO2薄膜的制备及光学性能研究

利用等离子体发射光谱监测系统(PEM)控制钒的等离子强度,在石英基底上磁控溅射制备了VO2薄膜。采用XRD、XPS、SEM、紫外-可见-近红外分光光度计及傅立叶红外分光光度计研究薄膜的结构、光学及相变特性。结果表明,所制备的VO2薄膜具有(011)取向,VO2薄膜的热滞回线宽度为25℃,可见光透过率和太阳光调节率分别可达Tlum,l=34.1%、Tlum,h=35.3%和ΔTsol=6.8%,相变前后,红外光区的反射率变化最大值可达44.4%。     

Preparation and optical properties of phase-change VO2 thin films

In this work, VO₂ thin films were prepared on three kinds of substrates by the sol-gel dipcoating method followed by heat treatment under vacuum. These thin films were analysed by x-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) techniques. The infrared and ultraviolet-visible spectra of the VO₂ thin films were also recorded during heating and cooling between room temperature and 100°C. The experimental results show that VO₂ thin films thus prepared exhibit thermally induced reversible phase transition, and the largest changes in transmittance and reflectivity are approximately 58 and 25%, respectively, in the case of vacuum heat treatment at 400°C and silica glass substrates. The refractive index (n) decreases and the absorption coefficient (k) increases when heating these thin films from room temperature to 100°C, and vice versa for cooling. The reasons why the optical constants and infrared absorption spectra change so remarkably are discussed.     

Some optical properties of intrinsic and doped UO2 thin films

Thin films of depleted uranium dioxide were made using the sol–gel approach. Films were deposited onto sapphire and MgO substrates that were 0.1 mm thick. Film thickness ranged from 1540 Å to 2470 Å. Intrinsic films were made as were films doped with aluminum, fluorine, phosphorus, nitrogen, and boron. Dopant concentrations ranged from 10¹⁹ to 10²¹ atoms/cc. Optical transmission data obtained on these samples revealed a range in bandgap from 2.0 to 2.5 eV identifying this as a wide bandgap semiconductor.     

Electrical and optical properties of In2Se3 thin films

In₂Se₃ thin films were grown with good stoichiometry at a substrate temperature around 460 K in the α phase and were shown to remain in the β phase above 480 K. The Hall coefficient and the d.c. conductivity of polycrystalline In₂Se₃ films grown on Pyrex and mica substrates were studied in the temperature range 77–530 K. After thermal treatment above 473 K of the α phase thin film, the electrical resistivity decreased and the sample remained in an irreversible phase. This is explained in terms of structural changes at high temperatures. The mobility behaviour of the β phase annealed thin films is illustrated. We use the Petritz barrier model to explain the activation energy of the mobility as due to the grain boundaries of the polycrystallites.The optical properties (refractive index and absorption coefficient) are also reported. The direct band gaps of In₂Se₃ thin films are 1.43 eV and 1.55 eV for the α phase and β phase respectively. These values are obtained from transmission measurements and are confirmed through photoconductivity measurements.     

4.6 Some optical properties of thin Cd3As2 films

The transmission of vacuum deposited Cd₃As₂ films has been measured in the spectral range 0.6–15 ωm. The absorption coefficient α has been calculated from the data for crystalline films obtained at substrate temperature T_s = 440 K and also for amorphous films obtained on substrates at T_s = 300?393 K. The position of the low-energy absorption edge in the spectral range 0.1–0.3 eV is discussed and the value Δ_g^opt = 0.06 eV for indirect transion Γ → Γ₁₅ is obtained for crystalline films. For amorphous films, a shift of the minimum absorption edge to $\text{Δ}\text{E}{}_{\mathrm{g}}{}^{\mathrm{opt}}\text{? 0.4?0.5}\text{eV}$ was observed. For higher energies two direct transitions have been established: the first at E₁ = 0.9 eV in the photon energy range 0.9–1.2 eV.and the second at E₂ = 1.2?1.3 eV in the photon energy range 1.3?1.6 eV. The last value is in good agreement with the value calculated by Lin Chung and with reflectivity data; it corresponds to the transition Γ₁₅ → X₁ in the hypothetical band model of Lin Chung. Differences in the reflective index values for crystalline and amorphous Cd₃ As₂ are also discussed.     

Structural and optical properties of CdGa2Se4 thin films

CdGa₂Se₄ thin films were prepared by vapour deposition onto either room temperature or preheated quartz and glass substrates (T _S) or they were deposited at room temperature and then annealed at about (T _A) 623 K. The films thus prepared were crystalline with a thiogallate tetragonal structure. The optical constants (the refractive index n and the absorption index, k) were determined for CdGa₂Se₄ films deposited onto quartz substrates held at either room temperature or at T _S = 573 K. These constants were also determined for preannealed films (T _A = 623 K). Plots of (hv)² = f(hv) and (hv)^1/2 = g(hv) were linear, indicating the existence of both direct and indirect optical transitions. It was found that the values of E _g ^d and E _g ^ind for as-deposited CdGa₂Se₄ films were 2.46 and 1.91 eV, respectively. The corresponding values for the annealed films and the films deposited at T _S = 573 K were 2.56 and 2.06 eV, respectively.     

Structural and optical properties of Zn3P2 thin films

Conditions have been developed for the deposition of a stoichiometric thin film of zinc phosphide (Zn₃P₂) using electron beam evaporation. Structural properties of as-deposited and annealed thin films of zinc phosphide have been studied using electron and X-ray diffraction. The as-deposited film is non-crystalline, structural ordering starts on annealing at 200° C and the film becomes crystalline at 300° C with the structure matching that of the bulk material. Optical absorption has been investigated over the range 1 to 3 eV with emphasis on the region of interband absorption. The thin film absorption edge is found to be exponential for lower values of absorption coefficient. Analysis of thin film data showed that Zn₃P₂ is a direct-band-gap material. On annealing there is a shift in the band edge towards higher energy. NCL Communication No. 3571.     

Structural and optical properties of Zn doped CuInS2 thin films

Copper indium sulphide (CIS) films were deposited by spray pyrolysis onto glass substrates from aqueous solutions of copper (II) sulphate, indium chloride and thiourea using compressed air as the carrier gas. The copper/indium molar ratio (Cu/In) in the solution 1(1:1) and the sulphur/copper ratio (S/Cu) was fixed at 4. Structural properties of these films were characterized. The effects of Zn (0–5%) molecular weight compared with CuInS₂ Source and different substrate temperatures on films properties were investigated using X-ray diffraction (XRD) and optical transmission spectra. Optical characteristics of the CuInS₂ films have been analysed using spectrophotometer in the wavelength range 300–1100 nm. The absorption spectra of the films showed that this compound is a direct bandgap material and gap values varied between 1·55 and 1·57 eV, depending on the substrate temperatures. Zn-doped samples have a bandgap energy of 1·55–1·95 eV. It was observed that there is an increase in optical bandgap with increasing Zn % molecular weight. The optical constants of the deposited films were obtained from the analysis of the experimentally recorded transmission and absorption spectral data. The refractive index, n and dielectric constants, ε ₁ and ε ₂, were also discussed and calculated as a function of investigated wavelength range and found it dependent on Zn incorporation. We found that the Zn-doped CuInS₂ thin films exhibit P-type conductivity and we predict that Zn species can be considered as suitable candidates for use as doped acceptors to fabricate CuInS₂-based solar cells. The paper presents a study concerning the influence of deposition parameters (temperature of the substrate and concentration of Zn (1–5)% from 0·16 M ZnCl₂) on the quality of CuInS₂ thin films achieved by spray pyrolysis on glass substrate from solutions containing 0·02 M CuCl₂·2H₂O, 0·16 M thiourea and 0·08 M In₂Cl₃·5H₂O.     

Structural and optical properties of GaGeTe thin films

Smooth and pinhole-free thin films of Ga₅Ge₁₉Te₇₆ have been obtained by vacuum evaporation. The as-deposited films are amorphous. Thermal annealing at 222°C leads to an amorphous-to-crystalline transition. A maximum contrast of 30% in reflectivity (measured at 1 µm) has been obtained on phase transition from amorphous to crystalline state. The optical constants and the bandgap are reported.