无线控制式原子力显微镜系统

提出了一种基于嵌入式系统和WiFi无线控制的接触模式原子力显微镜(AFM)系统。该AFM系统直接由迷你型移动电源给扫描与反馈电路及嵌入式系统等供电;嵌入式系统由微型电脑树莓派和微小型ADDA模块构成,通过WiFi与笔记本电脑实现无线数据通信。利用这一方法,成功研发了无线控制式AFM系统,并开展了微纳米样品的扫描成像实验。实验结果表明,该AFM系统的横向分辨率达到纳米量级,纵向分辨率达到0.1nm,最大扫描范围为3.6μm×3.6μm。该系统的显著特点是无需交流市电供电,无需直流高压电源,也无需与计算机之间的线缆连接,可在约100m远处通过无线控制的方式实现AFM的扫描成像。这一新型AFM系统,不仅能够在微纳米技术的常规领域得到应用,而且在野外考察、隔离环境、真空条件、气体氛围环境及星际探测等特殊领域具有广阔的应用前景。     

A compact CCD‐monitored atomic force microscope with optical vision and improved performances

A novel CCD‐monitored atomic force microscope (AFM) with optical vision and improved performances has been developed. Compact optical paths are specifically devised for both tip‐sample microscopic monitoring and cantilever's deflection detecting with minimized volume and optimal light‐amplifying ratio. The ingeniously designed AFM probe with such optical paths enables quick and safe tip‐sample approaching, convenient and effective tip‐sample positioning, and high quality image scanning. An image stitching method is also developed to build a wider‐range AFM image under monitoring. Experiments show that this AFM system can offer real‐time optical vision for tip‐sample monitoring with wide visual field and/or high lateral optical resolution by simply switching the objective; meanwhile, it has the elegant performances of nanometer resolution, high stability, and high scan speed. Furthermore, it is capable of conducting wider‐range image measurement while keeping nanometer resolution. Microsc. Res. Tech. 76:931–935, 2013. © 2013 Wiley Periodicals, Inc.     

Fibre-top atomic force microscope probe with optical near-field detection capabilities

We present a fibre-top probe fabricated by carving a tipped cantilever on an optical fibre, with the tip machined in correspondence of the fibre core. When approached to an optical prism illuminated under total internal reflection conditions, the tip of the cantilever detects the optical tunnelling signal, while the light coupled from the opposite end of the fibre measures the deflection of the cantilever. Our results suggest that fibre-top technology can be used for the development of a new generation of hybrid probes that can combine atomic force microscopy with scanning near field optical microscopy.     

Atomic force microscope tip cleaning by using gratings as micro‐washboards

The sharpness of atomic force microscope (AFM) tips is essential for acquiring high quality AFM images. However, AFM tips would easily get contaminated during scanning and storage at ambient condition, which influences image resolution and causes image distortion. Replacing the probe frequently is a solution, but uneconomical. To solve this problem, several tip cleaning methods have been proposed but there is space for further improvement. Therefore, this article developed a method of tip cleaning by using a one‐dimensional grating (600 lines/mm) as a micro‐washboard to “wash” contaminated tips. We demonstrate that the contaminants can be scrubbed away by rapidly scanning such micro‐washboard against the tip in the aids of Z‐dithering (10–20 Hz) exerted on the washboard. This method is highly efficient and proved to be superior to traditional ones. Experiments show that AFM images acquired with “washed” tips have higher resolution and less distortion compared with images acquired using contaminated tips, even comparable to those scanned by new ones. Microsc. Res. Tech. 76:1131–1134, 2013. © 2013 Wiley Periodicals, Inc.     

Study on water‐dispersible colloids in saline–alkali soils by atomic force microscopy and spectrometric methods

Recent studies have revealed that water‐dispersible colloids play an important role in the transport of nutrients and contaminants in soils. In this study, water‐dispersible colloids extracted from saline–alkali soils have been characterized by atomic force microscopy (AFM), X‐ray diffraction (XRD), X‐ray photoelectron spectroscopy (XPS), and UV absorption spectra. AFM observation indicated that the water‐dispersible colloids contain some large plates and many small spherical particles. XRD, XPS, and UV absorption measurement revealed that the water‐dispersible colloids are composed of kaolinite, illite, calcite, quartz and humic acid. In addition, UV absorption measurement demonstrated that the humic acids are associated with clay minerals. Water‐dispersible colloids in the saline–alkali soils after hydrolyzed polymaleic anhydride treatment and an agricultural soil (nonsaline–alkali soil) were also investigated for comparison. The obtained results implied that the saline–alkali condition facilitates the formation of a large quantity of colloids. The use of AFM combined with spectrometric methods in the present study provides new knowledge on the colloid characteristics of saline–alkali soils. Microsc. Res. Tech. 79:525–531, 2016. © 2016 Wiley Periodicals, Inc.     

Visualization of single proteins from stripped native cell membranes: A protocol for high‐resolution atomic force microscopy

Atomic force microscopy (AFM) proved to be able to obtain high‐resolution three‐dimensional images of single‐membrane proteins, isolated, crystallized, or included in reconstructed model membranes. The extension of this technique to native systems, such as the protein immersed in a cell membrane, needs a careful manipulation of the biological sample to meet the experimental constraints for high‐resolution AFM imaging. In this article, a general protocol for sample preparation is presented, based on the mechanical stretch of the cell membrane. The effectiveness for AFM imaging has been tested on the basis of an integrated optical and AFM approach and the proposed method has been applied to cells expressing cystic fibrosis transmembrane conductance regulator, a channel involved in cystic fibrosis, showing the possibility to identify and analyze single proteins in the plasma membrane. Microsc. Res. Tech. 76:723–732, 2013. © 2013 Wiley Periodicals, Inc.     

Development of a shear‐force scanning near‐field cathodoluminescence microscope for characterization of nanostructures’ optical properties

An original scanning near‐field cathodoluminescence microscope for nanostructure characterization has been developed and successfully tested. By using a bimorph piezoelectric stack both as actuator and detector, the developed setup constitutes a real improvement compared to previously reported SEM‐based solutions. The technique combines a scanning probe and a scanning electron microscope in order to simultaneously offer near‐field cathodoluminescence and topographic images of the sample. Share‐force topography and cathodoluminescence measurements on GaN, SiC and ZnO nanostructures using the developed setup are presented showing a nanometric resolution in both topography and cathodoluminescence images with increased sensitivity compared to classical luminescence techniques.     

Analysis of the atomic force microscopy vibration behavior using the Timoshenko theory by multi‐scale method in the air environment

This article deals with the modeling and simulation of the vibration behavior of piezoelectric micro‐cantilever (MC) based on the Timoshenko theory and using multi‐scale (MTS) method in the air environment. In this regard, the results are compared with the previous literature, such as the finite element method and the MTS method. The analysis of the piezoelectric MC vibrating behavior is investigated in a dynamical mode including non‐contact and tapping modes. The dynamics of this system is affected by interferential forces between probe tip and sample surface, such as van der Waals, capillary, and contact forces. According to the results, the forces applied to the probe tip reduce the amplitude and the resonance frequency. The simulation of surface topography in non‐contact mode and tapping for rectangular and wedge‐shaped roughness in the air environment are presented. Various experiments have been conducted in Ara research Company using the atomic force microscopy device in the amplitude mode. In the NSC15 Cantilever, the first natural frequency is derived from the results of the MC simulation based on Timoshenko beam theory, the practical results are 295.85 and 296.12 kHz, and the error rate is 0.09; at higher natural frequencies, the error rate has been increased. The γ _f coefficient is a measure of the nonlinear effects on the system; the effect of the piezoelectric length and width on γ _f coefficient is also investigated.     

Detecting changes in arthritic fibroblast‐like synoviocytes using atomic force microscopy

The morphological and quantitative differences between arthritic fibroblast‐like synoviocytes (FLS) and normal FLS were determined as an effective diagnostic tool for rheumatoid arthritis (RA), and confirmed using atomic force microscopy (AFM). Collagen‐induced arthritic (CIA) mice and normal mice were prepared and FLS were isolated by enzymatic digestion from the synovial tissue of sacrificed mice at 5‐week and 8‐week pathogenesis periods. Analysis of cell morphology using AFM revealed that the surface roughness around the nucleus and around the branched cytoplasm was significantly higher in CIA FLS (P < 0.05) than that in normal FLS. In addition, the roughness of two different sites on the arthritic FLS increased with an increase in the duration of pathogenesis. These results strongly suggest that AFM can be widely used as a diagnostic tool in cytopathology to detect the early signs of RA and various others diseases at the intercellular level. Microsc. Res. Tech. 78:982–988, 2015. © 2015 Wiley Periodicals, Inc.     

An atomic force microscopy statistical analysis of laser‐induced azo‐polyimide periodic tridimensional nanogrooves

The surface morphology of azo‐polyimide films was investigated after 355nm Nd: YAG laser irradiation with two different incident fluencies. Atomic force microscopy (AFM) was employed to correlate the laser‐induced tridimensional nanogrooved surface relief with the incident fluence and the number of irradiation pulses. The height images revealed that the grooves depth increased even tens of times by increasing the incident fluence, using the same numbers of irradiation pulses. For low incident fluence, the films were uniformly patterned till 100 pulses of irradiation. Instead, when using higher fluence, after 15 pulses of irradiation the accuracy of the surface relief definition was reduced. This behavior could be explained by means of two different mechanisms, one that suppose the film photo‐fluidization due to the cis‐trans isomerization processes of the azo‐groups and the second one responsible for the directional mass displacement. The dominant surface direction and parameters like isotropy, periodicity, and period were evaluated from the polar representation for texture analysis, revealing the appearance of ordered and directionated nanostructures for most of the experimental conditions. Also, the graphical studies of the functional volume parameters have evidenced the improvement of the relief structuration during surface nanostructuration. The correlation of these statistical texture parameters with the irradiation characteristics is important in controlling the alignment of either the liquid crystals or the cells/tissues on patterned azo‐polyimide surfaces for optoelectronic devices and implantable biomaterials, respectively. Microsc. Res. Tech. 76:914–923, 2013. © 2013 Wiley Periodicals, Inc.     

Neural network sliding mode controller of atomic force microscope‐based manipulation with different cantilever probes

Development of nanotechnology has given rise to various applications, including the nano‐manipulation process within small‐size environments. The implementation of such processes requires the use of tools and proper equipment and understanding of various factors influencing it. One such tool is the atomic force microscope (AFM) and its probe, used for imaging surfaces and manipulation tools. The AFM probe is the most important element of the AFM with a key role in system function. The dynamic analysis and control of AFM are necessary to increase efficiency. In this paper, a model of AFM is reviewed and rewritten by considering various cantilever probes, including rectangular, V‐shaped, and dagger. The AFM actuator was modeled and analyzed on uncertain conditions. The position of the stage was controlled to the desired position through the desired motion profiles. To overcome the problem of model nonlinearity, a neural network (NN) sliding mode controller was used to optimize the controller parameter and provide the desired output. The simulation of system was performed by the effective parameters, its control was implemented, and the results were analyzed. The simulation revealed that the modified sliding mode controller with learnable NN improved controller performance by decreasing the rise time and eliminating the overshot.     

The evaluation of surface topography changes in nanoscaled 2,6‐diphenyl anthracene thin films by atomic force microscopy

The physical properties of electronic devices made by 2,6‐diphenyl anthracene (DPA) are influenced by the microtexture of DPA surfaces. This work focused on the experimental investigation of the 3‐D surface microtexture of DPA thin films deposited on OTS (octadecyltrichlorosilane), HMDS (Hexamethyldisilasane), OTMS (octadecyltrimethoxysilane), and Si/SiO₂ (300 nm SiO₂ thickness) substrates with 5 and 50 nm thicknesses and 5 and 10 μm scan size. The thin film surfaces were recorded using atomic force microscopy (AFM) and their images were stereometrically analyzed to obtain statistical parameters, in accordance with ASME B46.1‐2009 and ISO 25178‐2: 2012. The results showed the effect of different manufacturing parameters on microtexture values where the granular structure is confirmed in all films. In addition, root mean square is increased by increasing the thickness from 5 to 50 nm for all types of substrates.