Thermoelectric Properties of Sb-Doped Mg<Subscript>2</Subscript>Si<Subscript>0.3</Subscript>Sn<Subscript>0.7</Subscript>

Mg₂(Si_0.3Sn_0.7)_1−y Sb _y (0 ≤ y ≤ 0.04) solid solutions were prepared by a two-step solid-state reaction method combined with the spark plasma sintering technique. Investigations indicate that the Sb doping amount has a significant impact on the thermoelectric properties of Mg₂(Si_0.3Sn_0.7)_1−y Sb _y compounds. As the Sb fraction y increases, the electron concentration and electrical conductivity of Mg₂(Si_0.3Sn_0.7)_1−y Sb _y first increase and then decrease, and both reach their highest value at y = 0.025. The sample with y = 0.025, possessing the highest electrical conductivity and one of the higher Seebeck coefficient values among all the samples, has the highest power factor, being 3.45 mW m⁻¹ K⁻² to 3.69 mW m⁻¹ K⁻² in the temperature range of 300 K to 660 K. Meanwhile, Sb doping can significantly reduce the lattice thermal conductivity (κ _ph) of Mg₂(Si_0.3Sn_0.7)_1−y Sb _y due to increased point defect scattering, and κ _ph for Sb-doped samples is 10% to 20% lower than that of the nondoped sample for 300 K < T < 400 K. Mg₂(Si_0.3Sn_0.7)_0.975Sb_0.025 possesses the highest power factor and one of the lower κ _ph values among all the samples, and reaches the highest ZT value: 1.0 at 640 K.     

Effect of Sb Doping on the Thermoelectric Properties of Mg<Subscript>2</Subscript>Si<Subscript>0.7</Subscript>Sn<Subscript>0.3</Subscript> Solid Solutions

This study focuses on Sb-doped Mg₂(Si,Sn) thermoelectric material. Samples were successfully fabricated using a hybrid synthesis method consisting of three different processes: induction melting, solid-state reaction, and a hot-press sintering technique. We found that the carrier concentration increased with Sb content, while the Seebeck coefficient exhibited a decreasing trend. Sb doping was shown to improve the power factor and thermoelectric figure of merit compared with the undoped material, yielding a peak figure of merit (ZT) of ~0.55 at 620 K, while leaving the band gap of Mg₂Si_0.7Sn_0.3 almost unchanged.     

Valence Band Studies of <Emphasis Type=Italic>p</Emphasis>- and <Emphasis Type=Italic>n</Emphasis>-Type Ba<Subscript>8</Subscript>Ga<Subscript>16</Subscript>Ge<Subscript>30</Subscript> Using High-Resolution Photoelectron Spectroscopy

The electronic states of p- and n-type Ba₈Ga₁₆Ge₃₀ (BGG) are studied by high-resolution x-ray photoelectron spectroscopy. In BGG, three bands are resolved in the valence band region. Theoretical calculations show that the three band structures in the valence band are mainly constructed by the Ge/Ga 4s and 4p wavefunctions with little contribution from Ba 5s, 5p, and 5d. The valence band around the Fermi level region of n-type BGG is sensitive to temperature, while that of p-BGG is stable when the temperature changes. The data indicate that the endohedral Ba in p- and n-type BGG rattle with different modes due to the different hybridization with the orbitals of the framework polyhedra.     

Thermoelectric Properties of <Emphasis Type="Italic">p</Emphasis>-Type Mg<Subscript>2.00</Subscript>Si<Subscript>0.25</Subscript>Sn<Subscript>0.75</Subscript> with Li and Ag Double Doping

Mg₂Si_1−x Sn _x -system solid solutions are ecofriendly semiconductors that are promising materials for thermoelectric generators in the middle temperature range. To produce a thermoelectric device, high-performance p- and n-type materials must be balanced. In this paper, p-type Mg_2.00Si_0.25Sn_0.75 with Li and Ag double doping was prepared by the liquid–solid reaction method and hot-pressing. Effects of Li and Ag double doping on thermoelectric properties were investigated in the temperature range from room temperature to 850 K. All sintered compacts were identified as single-phase solid solutions with anti-fluorite structure. The carrier concentration increased with the double doping. The temperature dependence of resistivity of the double-doped samples was similar to that of a metal. The seebeck coefficient increased with temperature to a maximum value and then decreased in the intrinsic region. Thermal conductivity decreased linearly with increasing temperature, reaching a minimum near the intrinsic region, and then increased rapidly because of the contribution of the bipolar component. The dimensionless figure of merit reached 0.32 at 610 K for Mg_2.00Si_0.25Sn_0.75 double-doped with Li-5000 ppm and Ag-20000 ppm.     

Temperature-dependent conductivity and photoconductivity of <Emphasis Type=Italic>p</Emphasis>-CuI crystals

The effect of the vacuum annealing of p-CuI crystals on their resistivity, transmittance, temperature-dependent conductivity, and photoconductivity in the visible and ultraviolet spectral regions is studied. It is shown that the conductivity and transmittance of CuI increase at low annealing temperatures and decrease, as the temperature of vacuum annealing is increased over 60 min. It is established that these systematic features are connected with the formation of intrinsic donor or acceptor defects in the CuI crystal lattice.     

Waveguide photonic crystals with characteristics controlled with <Emphasis Type=Italic>p</Emphasis>-<Emphasis Type=Italic>i</Emphasis>-<Emphasis Type=Italic>n</Emphasis> diodes

A one-dimensional waveguide photonic structure—specifically, a photonic crystal with a controllable frequency characteristic—is designed. The central frequency of the spectral window of the photonic crystal can be tuned by choosing the parameters of disturbance of periodicity in the photonic crystal, whereas the transmission coefficient at a particular frequency can be controlled by varying the voltage at a p-i-n diode. It is shown that the possibility exists of using the waveguide photonic crystal to design a microwave device operating in the 3-cm-wavelength region, with a transmission band of 70 MHz at a level 3 dB and the transmission coefficient controllable in the range from −1.5 to −25 dB under variations in the forward voltage bias at the p-i-n diode from zero to 700 mV.     

Metal-insulator-semiconductor barriers with a nanometer-thick aluminum nitride insulator on <Emphasis Type=Italic>p</Emphasis>-type silicon

The state of the interface between p-silicon and a nanometer-thick insulator is analyzed. DLTS spectra, obtained with deep centers in the bulk of the structure and its surface states recharged, are examined. The nature of the noise as a function of the reverse bias is determined for evaluating the possibility of using the structure as a nuclear radiation detector. A conclusion is drawn that the barrier used in the structure has a higher quality when nanometer-thick aluminum nitride films are deposited by dc, rather than ac, magnetron sputtering.     

Study of the <Emphasis Type=Italic>p</Emphasis>-Ge-<Emphasis Type=Italic>n</Emphasis>-GaAs heterojunction under hydrostatic pressure

The current-voltage characteristic of the p-Ge-n-GaAs heterojunction is experimentally studied under hydrostatic pressure as high as 8 GPa and temperature of 300 K. The baric coefficient of the edge of the valence band of Ge is calculated using the experimental results.     

Electroluminescence in <Emphasis Type=Italic>p</Emphasis>-InAs/AlSb/InAsSb/AlSb/<Emphasis Type=Italic>p</Emphasis>(<Emphasis Type=Italic>n</Emphasis>)-GaSb type II heterostructures with deep quantum wells at the interface

Luminescent characteristics of asymmetric p-InAs/AlSb/InAsSb/AlSb/p-GaSb type II heterostructures with deep quantum wells at the heterointerface are studied. The heterostructures were grown by metalorganic vapor phase epitaxy. Intense positive and negative luminescence was observed in the range of photon energies of 0.3–0.4 eV with a forward and reverse bias, respectively. Dependences of the spectra and intensities for positive and negative luminescence on the pumping current and on the temperature are studied in the range of 77–380 K. It is established that, at a temperature higher than 75°C, intensity of negative luminescence surpasses that of positive luminescence by 60%. The suggested heterostructures can be used as lightemitting diodes (photodiodes) with switched positive and negative luminescence in the mid-IR spectral range of 3–4 μm.     

Planar <Emphasis Type=Italic>n</Emphasis>-on-<Emphasis Type=Italic>p</Emphasis> HgCdTe FPAs for LWIR and VLWIR Applications

Mainly driven by space applications, mercury cadmium telluride (MCT) focal-plane arrays (FPAs) have been successfully developed for very long wavelengths (λ _CO > 14 μm at 55 K). For this purpose, the standard n-on-p technology based on MCT grown by liquid-phase epitaxy (LPE) and involving vacancy doping has been modified to extrinsic doping by a monovalent acceptor. Due to the planar diode geometry obtained by ion implantation, most of the carrier generation volume is located in the p-type region with a thickness of approximately 8 μm. According to our understanding, the Shockley–Read centers connected with the Hg vacancies are thus significantly reduced. This situation should lead to longer minority-carrier lifetimes and smaller generation rates under equilibrium conditions, therefore yielding lower dark current. We indeed observe a reduction by a factor of approximately 15 by using extrinsic doping. Recent dark current data obtained in the temperature range from 55 K to 85 K on 288 × 384 FPAs with λ _CO(60 K) = 12 μm, either intrinsically or extrinsically doped, corroborate this finding. These data, new results on a 112 × 112 pixel demonstrator array with λ _CO(55 K) = 14.4 μm, and earlier measurements are compared with Tennant’s Rule 07 established for p-on-n technology.     

Electron scattering by acceptor centers in <Emphasis Type=Italic>p</Emphasis>-Ag<Subscript>2</Subscript>Te at low temperatures

Resonant electron scattering in p-Ag₂Te at acceptor concentrations N _a < 4.2 × 10¹⁶ cm⁻³ has been observed in the temperature range of 50–80 K. The contribution of the resonant scattering to the temperature dependences of the conductivity σ(T) and thermopower α₀(T) has been calculated. It is shown that this contribution exceeds that of charge carrier scattering by acoustic phonons.     

Effect of High-Density Plasma Process Parameters on Carrier Transport Properties in <Emphasis Type="Italic">p</Emphasis>-to-<Emphasis Type="Italic">n</Emphasis> Type Converted Hg<Subscript>0.7</Subscript>Cd<Subscript>0.3</Subscript>Te Layer

Exposure of p-type HgCdTe material to Ar/H₂-based plasma is known to result in p-to-n conductivity-type conversion. While this phenomenon is generally undesirable when aiming to perform physical etching for device delineation and electrical isolation, it can be used in a novel process for formation of n-on-p junctions. The properties of this n-type converted material are dependent on the condition of the plasma to which it is exposed. This paper investigates the effect of varying the plasma process parameters in an inductively coupled plasma reactive ion etching (ICPRIE) tool on the carrier transport properties of the p-to-n type converted material. Quantitative mobility spectrum analysis of variable-field Hall and resistivity data has been used to extract the carrier transport properties. In the parameter space investigated, the n-type converted layer carrier transport properties and depth have been found to be most sensitive to the plasma process pressure and temperature. The levels of both RIE and ICP power have also been found to have a significant influence.     

A filter of <Emphasis Type=Italic>H</Emphasis><Subscript>0<Emphasis Type=Italic>n</Emphasis></Subscript> modes in a multimode rectangular waveguide

A technique is developed for calculating the electrodynamic characteristics of a filter of H _0n modes in the case of various configurations of the filter and various combinations of its mechanical and electric parameters. In numerical computations, the complete set of the filter parameters is taken into account. It is shown that the number of absorbing elements in the filter can be reduced from three to two and that, simultaneously, the quality characteristics of the filter can be improved.     

Study of the current-voltage characteristic of the <Emphasis Type=Italic>n</Emphasis>-CdS/<Emphasis Type=Italic>p</Emphasis>-CdTe heterostructure depending on temperature

Current-voltage characteristics of the n-CdS/p-CdTe heterostructure are studied at different temperatures. It is established that the forward portion of the current-voltage characteristic of these structures at low voltages (as high as 0.5 V) is described by the exponential dependence, while at high voltages (as high as 2.6 V), there is a portion of sublinear growth of the current with voltage. Experimental results are interpreted based on the theory of the effect of injection depletion. It is shown that the product of mobility of majority carriers by the concentration of deep centers increases as the temperature is increased.     

Photosensitivity of <Emphasis Type=Italic>n</Emphasis>-CdS/<Emphasis Type=Italic>p</Emphasis>-CdTe heterojunctions obtained by chemical surface deposition of CdS

A new technology of chemical surface deposition is developed, and thin CdS films (35–100 nm) on the p-CdTe substrates are obtained. Electrical and photoelectric properties of n-CdS/p-CdTe heterojunctions are studied, and it is shown that the developed method provides high efficiency of photoconversion in the range restricted by the CdTe and CdS band gaps. It is shown that the method of chemical surface deposition of CdS can be used in the design of thin-film n-CdS/p-CdTe.     

Thermoelectric Properties of In<Subscript>0.3</Subscript>Ga<Subscript>0.7</Subscript>N Alloys

We report on the experimental investigation of the potential of InGaN alloys as thermoelectric (TE) materials. We have grown undoped and Si-doped In_0.3Ga_0.7N alloys by metalorganic chemical vapor deposition and measured the Seebeck coefficient and electrical conductivity of the grown films with the aim of maximizing the power factor (P). It was found that P decreases as electron concentration (n) increases. The maximum value for P was found to be 7.3 × 10⁻⁴ W/m K² at 750 K in an undoped sample with corresponding values of Seebeck coefficient and electrical conductivity of 280 μV/K and 93␣(Ω cm)⁻¹, respectively. Further enhancement in P is expected by improving the InGaN material quality and conductivity control by reducing background electron concentration.     

Thermoelectric Properties of NaCo<Subscript>2–<Emphasis Type="Italic">x</Emphasis></Subscript>Fe<Subscript><Emphasis Type="Italic">x</Emphasis></Subscript>O<Subscript><Emphasis Type="Italic">y</Emphasis></Subscript>

NaCo₂O₄ has one of the highest figures of merit among all ceramic thermoelectric materials. Because of its large thermopower and low resistivity, the ceramic oxide NaCo₂O₄ is a promising candidate for potential thermoelectric applications. NaCo₂O₄ is, moreover, a ceramic compound with high decomposition temperature and chemical stability in air and it does not contain any toxic elements. Like all 3-d transition ions, Co ions have multiple spin and oxidation states. In this investigation, thermopower and electrical conductivity of NaCo₂O₄ as a function of substitution of Co by Fe ions were measured. Fe substitution for Co causes resistivity to increase, whereas the Seebeck coefficient remained nearly invariant, especially above 330 K. An erratum to this article can be found at     

Synthesis and Characterization of <Emphasis Type="Italic">p</Emphasis>-Type Pb<Subscript>0.5</Subscript>Sn<Subscript>0.5</Subscript>Te Thermoelectric Power Generation Elements by Mechanical Alloying

A mechanical alloying (MA) process to transform elemental powders into solid Pb_0.5Sn_0.5Te with thermoelectric functionality comparable to melt-alloyed material is described. The room-temperature doping level and mobility as well as temperature-dependent electrical conductivity, Seebeck coefficient, and thermal conductivity are reported. Estimated values of lattice thermal conductivity (0.7 W m⁻¹ K⁻¹) are lower than some reports of functional melt-alloyed PbSnTe-based material, providing evidence that MA can engender the combination of properties resulting in highly functional thermoelectric material. Though doping level and Sn composition have not been optimized, this material exhibits a ZT value >0.5 at 550 K.     

Electrical properties of the <Emphasis Type="Italic">p</Emphasis><Superscript>+</Superscript>-Bi<Subscript>2</Subscript>Te<Subscript>3</Subscript>-<Emphasis Type="Italic">p</Emphasis>-GaSe isotype heterostructure

Electrical properties of a p⁺-Bi₂Te₃-p-GaSe isotype heterostructure fabricated for the first time are reported. A qualitative model is suggested which explains the emergence of negative differential conductivity for a forward-biased structure and for a reverse-biased structure, which is also illuminated.     

Thermoelectric Power and <Emphasis Type=Italic>ZT</Emphasis> in Conducting Organic Semiconductor

A recent report on poly(3,4-ethylenedioxythiophene-tosylate) (PEDOT.Tos) suggested that the thermoelectric figure of merit (ZT) could be enhanced when the percentage oxidation was chemically altered. This invokes the question of whether the carrier density or the mobility was modified. In this work, we analyzed data reported by Bibnova et al. (Nat. Mater. 10, 429, 2011) and extracted the transport parameters using three-dimensional (3D) and two-dimensional (2D) models. Our results indicate that the increase in the power factor (S ² σ) was due primarily to upward extension in the range of thermoelectric power. A changeover from lattice scattering to ionized impurity scattering in PEDOT.Tos allowed the equation governing the thermoelectric power to be valid at higher carrier densities, resulting in an increase in the power factor. ZT was also enhanced in PEDOT.Tos due to the low intrinsic thermal conductivity (~0.37 W/m K). The peak value of ZT (~0.3) was found close to the regime where the semiconductor turned “metallic,” beyond which ZT would decrease. We are of the opinion that charge-to-charge scattering (which normally would lower the power factor in highly doped semiconductors) remain subdued in PEDOT.Tos due potentially to electronic screening and a lack of long-range order. We used the reported data to compute the carrier density and mobility assuming ionized impurity scattering and found the peak power factor to occur for carrier density of ~1 × 10²⁶ m⁻³ and mobility of ~5 × 10⁻⁴ m²/V s.