Photoluminescence properties of thallium-containing GeSe<Subscript>2</Subscript> and GeSe<Subscript>3</Subscript> vitreous semiconductors

The photoluminescence properties of thallium-containing vitreous semiconductor systems with stoichiometric and nonstoichiometric compositions (GeSe₂)_1–x Tl _x and (GeSe₃)_1–x Tl _x (0 ? x ? 0.1) are studied at a temperature of T = 77 K. Intrinsic defects with negative correlation energy are responsible for the Gaussian shape of the photoluminescence spectra. It is established that an increase in x in the systems does not affect the shape of the spectrum, does not generate new emission bands, shifts the photoluminescence spectra to the region of low energies, reduces the intensity of radiation, and increases its half-width. Kinetics of the fatigue of photoluminescence is different for both systems and is characterized by one curve irrespective of Tl content in the systems.     

Structural transformations and optical properties of As<Subscript>2</Subscript>S<Subscript>3</Subscript> chalcogenide glasses

The effects of melt temperature T _i and quenching rate V _i on the structure and optical properties of As₂S₃ glasses is studied. It is found that the glass band gap increases with T _i and V _i , whereas a decrease is observed in the glass density, refractive index (from 2.71 to 2.48), and two-photon absorption coefficient (from 0.37 to 0.15 cm/MW), which is accompanied by an increase in the optical-breakdown damage threshold.     

Electronic Processes in CdIn<Subscript>2</Subscript>Te<Subscript>4</Subscript> Crystals

The results of investigations of electrical, optical, and photoelectric properties of CdIn₂Te⁴ crystals, which were grown by the Bridgman method are presented. It is shown that electrical conductivity is determined mainly by electrons with the effective mass m_n = 0.44m₀ and the mobility 120–140 cm²/(V s), which weakly depends on temperature. CdIn₂Te₄ behaves as a partially compensated semiconductor with the donor-center ionization energy E_d = 0.38 eV and the compensation level K = N_a/N_d = 0.36. The absorption-coefficient spectra at the energy hν < E_g = 1.27 eV are subject to the Urbach rule with a typical energy of 18–25 meV. The photoconductivity depends on the sample thickness. The diffusion length, the charge-carrier lifetime, and the surface-recombination rate are determined from the photoconductivity spectra.     

Optical Properties of K<Subscript>2</Subscript>O-Li<Subscript>2</Subscript>O-WO<Subscript>3</Subscript>-B<Subscript>2</Subscript>O<Subscript>3</Subscript> Glasses: Evidence of Mixed Alkali Effect

Glass with compositions xK₂O-(30 ? x)Li₂O-10WO₃-60B₂O₃ for 0 ≤ x ≤ 30 mol.% have been prepared using the normal melt quenching technique. The optical reflection and absorption spectra were recorded at room temperature in the wavelength range 300–800 nm. From the absorption edge studies, the values of the optical band gap (E _opt) and Urbach energy (ΔE) have been evaluated. The values of E _opt and ΔE vary non-linearly with composition parameter, showing the mixed alkali effect. The dispersion of the refractive index is discussed in terms of the single oscillator Wemple Di-Domenico model.     

Transport coefficients of <Emphasis Type="Italic">n</Emphasis>-Bi<Subscript>2</Subscript>Te<Subscript>2.7</Subscript>Se<Subscript>0.3</Subscript> in a two-band model of the electron spectrum

The Hall factor and thermoelectric properties of an n-Bi₂Te_2.7Se_0.3 solid solution with the roomtemperature Seebeck coefficient |S| = 212 μV/K have been studied in the temperature range 77–350 K. The observed temperature dependences demonstrate a number of specific features, which were earlier found in samples with a lower electron density N. The effect of these specific features on the thermoelectric figure of merit Z appears to be more favorable for the sample under study: this sample is most efficient in the temperature range 120–340 K, and the average value of ZT is 0.71. It is found that a rise in the density N enhances the factor responsible for the effective mass decreasing as the temperature increases. This effect appears when the analysis is carried out in terms of a single-band parabolic model with N = const(T). This finding suggests that the most probable reason for the unusual behavior of these properties is the complex structure of the electron spectrum. Temperature dependences obtained from calculations of the transport coefficients show good agreement with the experimental data for two samples of the mentioned composition with different electron densities. The calculations have been performed in terms of a two-band model and an acoustic scattering mechanism and take into account the anisotropy and nonparabolicity of the light-electron spectrum.     

Effect of thallium doping on the mobility of electrons in Bi<Subscript>2</Subscript>Se<Subscript>3</Subscript> and holes in Sb<Subscript>2</Subscript>Te<Subscript>3</Subscript>

The Shubnikov–de Haas effect and the Hall effect in n-Bi_2–xTl_xSe₃ (x = 0, 0.01, 0.02, 0.04) and p-Sb_2–xTl_xTe₃ (x = 0, 0.005, 0.015, 0.05) single crystals are studied. The carrier mobilities and their changes upon Tl doping are calculated by the Fourier spectra of oscillations. It is found shown that Tl doping decreases the electron concentration in n-Bi_2–xTl_xSe₃ and increases the electron mobility. In p-Sb_2–xTl_xTe₃, both the hole concentration and mobility decrease upon Tl doping. The change in the crystal defect concentration, which leads to these effects, is discussed.     

An impurity band in Hg<Subscript>3</Subscript>In<Subscript>2</Subscript>Te<Subscript>6</Subscript> crystals doped with silicon

The influence of silicon impurity on the energy-band spectrum in the Hg₃In₂Te₆ semiconductor compound, which incorporated a high concentration of stoichiometric vacancies, was studied on the basis of the results of electrical and optical measurements. It is shown that silicon impurity forms an impurity band of donor states whose density can be approximated by a Gaussian distribution with a peak at E_c-0.29 eV. The emergence of the impurity band is accompanied with the formation of a quasi-continuous spectrum of localized states in the band gap (E_g=0.74 eV); the density of these states is shown to increase as the doping level increases. All states merge into a continuous band if the impurity concentration N_Si>4.5×10¹⁷ cm^?3. Experimental data are explained on the basis of the effect of impurity self-compensation, in which case donor impurity states arise simultaneously with acceptor states of defects.     

Photoconductivity of the Pb<Subscript>0.75</Subscript>Sn<Subscript>0.25</Subscript>Te:In alloy in an alternating electric field

Kinetics of variations in the components of total impedance for single-crystal Pb_0.75Sn_0.25Te:In samples is investigated upon switching on and switching off of the illumination source at temperature 4.2 K and frequency 10⁶ Hz. The calculation carried out in the context of representation of equivalent circuits showed that the parameters of a parallel R _p C _p chain, which approximates the sample behavior, correlate strictly. In the region of low resistances R _p , the values of C _p increase abruptly following the law C _p ∝ R _p ^?2 . It is of no importance what method of decreasing the resistance is used—heating of the sample or its illumination at low temperature. The obtained results were analyzed taking into account the contribution of the impurity subsystem to conductivity and the possible manifestation of Maxwell-Wagner-type effects.     

Sectoral transition between modes <Emphasis Type="Italic">H</Emphasis><Subscript>10</Subscript> and <Emphasis Type="Italic">H</Emphasis><Subscript>01</Subscript>

The excitation of main parasitic modes E ₁₁, H ₁₁, and H ₂₁, which have cutoff sections in a sectoral transition between modes H ₁₀ and H ₀₁, is investigated. It is shown that, for magnetic modes, including modes H ₁₁ and H ₂₁, it is unnecessary to use the Airy equation and that this circumstance simplifies the design relationships. The energies of these modes are calculated as functions of the transition parameters.     

Fabrication and photoelectric properties of oxide/CuIn<Subscript>5</Subscript>Se<Subscript>8</Subscript> heterojunctions

Single crystals of the n-CuIn₅Se₈ compound of hexagonal modification have been grown by direct crystallization from melt. On the basis of the experimental study of its thermal interaction with air oxygen, a method for fabricating new oxide/n-CuIn₅Se₈ heterojunctions is proposed. Electrical and photoelectric properties of the structures obtained have been investigated. It is shown that the interaction of n-CuIn₅Se₈ of hexagonal modification with air oxygen makes it possible to obtain heterojunctions with high photosensitivity. The new technology can be used in the design of broadband optical radiation converters based on n-CuIn₅Se₈ crystals.     

Reflectance spectra of <Emphasis Type="Italic">p</Emphasis>-Bi<Subscript>2</Subscript>Te<Subscript>3</Subscript>:Sn crystals in a wide IR region

The reflectance spectra of a p-Bi₂Te₃:Sn crystal are recorded in the range 50–7900 cm^–1. The spectra possess features characteristic of charge-carrier plasma oscillations and a contribution of phonons. It is shown that the dielectric function that is used in the context of Drude–Lorentz theory and includes the contributions of hole plasma oscillations and two phonons adequately describes the experimental data obtained at room temperature and at a temperature of T = 78 K.     

SiO<Subscript><Emphasis Type="Italic">x</Emphasis></Subscript> layer formation during plasma sputtering of Si and SiO<Subscript>2</Subscript> targets

Deposition of SiO _x layers of variable composition onto silicon wafers was performed by co-sputtering of spaced Si and SiO₂ targets in argon plasma. Coordinate dependences of the thickness and refractive index of separately deposited Si and SiO₂ layers and the SiO _x layer grown during co-sputtering of targets were determined using optical techniques. It was shown that the SiO _x layer composition is not equal to a simple sum of thicknesses of separately deposited Si and SiO₂ layers. The coordinate dependences of the Si and SiO₂ layer thicknesses were calculated. To fit the calculated and experimental data, it is necessary to assume that no less than 10% of silicon is converted to dioxide during co-sputtering. A comparison of the coordinate dependences of the IR absorbance in SiO₂ and SiO _x layers with experimental ellipsometric data confirmed the presence of excess oxygen in the SiO _x layer. Taking into account such partial oxidation of sputtered silicon, composition isolines in the substrate plane were calculated. After annealing of the SiO _x layer at 1200°C, photoluminescence was observed in a wafer area predicted by calculations, which was caused by the formation of quantum-size Si nanocrystallites. The photoluminescence intensity was maximum at x = 1.78 ± 0.3, which is close to the composition optimum for ion-beam synthesis of nanocrystals.     

Effect of the magnetic phase transition on the charge transport in layered semiconductor ferromagnets TlCrS<Subscript>2</Subscript> and TlCrSe<Subscript>2</Subscript>

TlCrS₂ and TlCrSe₂ crystals were synthesized by solid-state reaction. X-ray diffraction analysis showed that TlCrS₂ and TlCrSe₂ compounds crystallize in the hexagonal crystal system with lattice parameters a = 3.538 Å, c = 21.962 Å, c/a ≈ 6.207, z = 3; a = 3.6999 Å, c = 22.6901 Å, c/a ≈ 6.133, z = 3; and X-ray densities ρ _x = 6.705 and 6.209 g/cm³, respectively. Magnetic and electric studies in a temperature range of 77–400 K showed that TlCrS₂ and TlCrSe₂ are semiconductor ferromagnets. Rather large deviations of the experimental effective magnetic moment of TlCrS₂ (3.26 μ_B) and TlCrSe₂ (3.05 μ_B) from the theoretical one (3.85 μ_B) are attributed to two-dimensional magnetic ordering in the paramagnetic region of strongly layered ferromagnets TlCrS₂ and TlCrSe₂. The effect of the magnetic phase’s transition on the charge transport in TlCrS₂ and TlCrSe₂ is detected.     

<Emphasis Type="Italic">p</Emphasis><Superscript>+</Superscript>-Si-<Emphasis Type="Italic">n</Emphasis>-CdF<Subscript>2</Subscript> heterojunctions

Boron diffusion and the vapor-phase deposition of silicon layers are used to prepare ultrashallow p⁺-n junctions and p⁺-Si-n-CdF₂ heterostructures on an n-CdF₂ crystal surface. Forward portions of the I–V characteristics of the p⁺-n junctions and p⁺-Si-n-CdF₂ heterojunctions reveal the CdF₂ band gap (7.8 eV), as well as allow the identification of the valence-band structure of cadmium fluoride crystals. Under conditions in which forward bias is applied to the p⁺-Si-n-CdF₂ heterojunctions, electroluminescence spectra are measured for the first time in the visible spectral region.     

Dielectric Properties of (Bi<Subscript>0.5</Subscript>K<Subscript>0.5</Subscript>)ZrO<Subscript>3</Subscript> Modified (K<Subscript>0.5</Subscript>Na<Subscript>0.5</Subscript>)NbO<Subscript>3</Subscript> Ceramics as High-Temperature Ceramic Capacitors

(1???x)K_0.5Na_0.5NbO₃-x(Bi_0.5K_0.5)ZrO₃ [abbreviated as (1???x)KNN-xBKZ, 0?≤?x?≤?0.08] lead-free ceramics have been fabricated by a solid-state processing route. Based on the x-ray diffraction data and temperature-dependent dielectric characteristics, an orthorhombic phase for x?≤?0.03 and single rhombohedral one for x?≥?0.05 at room temperature were determined. The cell volume firstly increases, then decreases and finally increases with increasing BKZ, depending on ionic size and crystallographic structure. For the sample of x?=?0.05, a temperature-stable high permittivity (~?1736?±?15%) along with low dielectric loss tangent (≤?5%) is recorded from 158°C to 407°C. In addition, the activation energies of dielectric relaxation and dc conductivity at high temperatures were characterized by impedance spectroscopy. A combined effect of lattice distortion and oxygen vacancies on the magnitude of activation energies was discussed.     

Ab initio calculations of the electron spectrum and density of states of TlFeS<Subscript>2</Subscript> and TlFeSe<Subscript>2</Subscript> crystals

The results of ab initio calculations of the electron spectrum of TlFeS₂ and TlFeSe₂ crystals in the antiferromagnetic phase are reported. Calculations are carried out in the context of the density functional theory. The origin of the bands of s, p, and d electron states of Tl, Fe, S, and Se atoms is studied. It is established that, in the antiferromagnetic phase, the crystals possess semiconductor properties. The band gaps are found to be 0.05 and 0.34 eV for TlFeS₂ and TlFeSe₂ crystals, respectively.     

Variation in optical-absorption edge in SiN<Subscript><Emphasis Type="Italic">x</Emphasis></Subscript> layers with silicon clusters

Using optical methods, data on optical constants are obtained for silicon nitride films synthesized by plasma-chemical vapor deposition (PCVD). Models for calculating the permittivity in the model of inhomogeneous phase mixture of silicon and silicon nitride are considered. It is found that the optical-absorption edge (E _g) and the photoluminescence peak shift to longer wavelengths with increasing nitrogen atomic fraction x in sin _x films. When x approaches the value 4/3 characteristic for stoichiometric silicon nitride Si₃N₄, a nonlinear sharp increase in E _g is observed. Using Raman scattering, Si-Si bonds are revealed, which confirms the direct formation of silicon clusters during the film deposition. The relation between the composition of nonstoichiometric silicon nitride films, values of permittivity, and the optical-band width is established for light transmission.     

Role of Si-doped Al<Subscript>0.3</Subscript>Ga<Subscript>0.7</Subscript>As layers in the high-frequency conductivity of GaAs/Al<Subscript>0.3</Subscript>Ga<Subscript>0.7</Subscript>As heterostructures under conditions of the quantum hall effect

The complex high-frequency conductivity of GaAs/Al_0.3Ga_0.7As heterostructures that are δ-doped and modulation-doped with silicon was investigated by acoustic methods under conditions of the integer quantum Hall effect. Both the real (σ₁) and imaginary (σ₂) parts of the complex conductivity σ(ω, H)=σ_i?iσ₂ were determined from the dependences of the absorption and velocity of surface acoustic waves on magnetic field. It is shown that, in the heterostructures with electron density n_s=(1.3–7)×10¹¹ cm^?2 and mobility μ=(1–2)×10⁵ cm²/(V s), the high-frequency conductivity near the centers of the Hall plateau is due to electron hopping between localized states. It is established that, with filling numbers 2 and 4, the conductivity of the Al_0.3Ga_0.7As:Si layer efficiently shunts the high-frequency hopping conductivity of the two-dimensional interface layer. A method of separating the contributions of the interface and Al_0.3Ga_0.7As:Si layers to the hopping conductivity σ(ω, H) is developed. The localization length of electrons in the interface layer is determined on the basis of the nearest neighbor hopping model. It is shown that, near the centers of the Hall plateau, both σ(ω, H) and n_s depend on the cooling rate of a GaAs/Al_0.3Ga_0.7As sample. As a result, the sample “remembers” the cooling conditions. Infrared light and static strain also change both σ(ω, H) and n_s. We attribute this behavior to the presence of two-electron defects (so-called DX^? centers) in the Al_0.3Ga_0.7As:Si layer.     

Fabrication and photosensitivity of heterojunctions based on CuIn<Subscript>3</Subscript>Se<Subscript>5</Subscript> crystals

Heterojunctions based on p-CuIn₃Se₅ crystals are fabricated by magnetron sputtering of an n-ZnO:Al target and by putting naturally cleaved n-GaSe thin wafers onto polished surfaces of p-CuIn₃Se₅ wafers. The current-voltage characteristics and mechanisms of current flow in the diodes under study are analyzed. The photovoltaic effect revealed in the fabricated structures is discussed. It is shown that the fabricated photosensitive heterojunctions are promising for the development of selective analyzers of linearly polarized radiation.     

Schottky barriers based on <Emphasis Type="Italic">n</Emphasis>-In<Subscript>2</Subscript>S<Subscript>3</Subscript> films obtained by laser-induced evaporation

The method of evaporation of starting targets with subsequent deposition onto glass substrates at temperatures of 480–720 K is used to grow homogeneous thin (0.6–1.5 μm) n-In₂S₃ films on which the In/n-In₂S₃ Schottky barriers were formed for the first time; evaporation was induced by a pulsed laser. The temperature dependence of resistivity of the films with the n-type conductivity was studied and the activation energy of donor centers in these films was determined. Spectral dependences of the photoconversion quantum efficiency η(?ω) for the barriers obtained were studied. An analysis of the spectral dependences η(?ω) made it possible to identify the type of band-to-band transitions and estimate the band gap in the In₂S₃ films. It is concluded that the thin In₂S₃ films can be used in broadband photoconverters of optical radiation.