共查询到20条相似文献,搜索用时 62 毫秒
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以乙炔(C2H2)作为碳源,采用化学气相沉积法(CVD)在经过草酸溶液腐蚀的铜基板表面制备出纳米碳纤维薄膜。采用扫描电子显微镜(SEM)和X射线粉末衍射仪(XRD)对产物进行结构与形貌表征,并对碳纤维薄膜进行其在基板上的附着性测试。结果表明,草酸腐蚀时间、化学气相沉积反应时间的变化等因素对纳米碳纤维薄膜的生长与形貌有一定影响。在反应温度为350℃时,铜基板表面制备出了一层均匀的纳米碳纤维薄膜,纤维直径为300~400 nm,薄膜的厚度为20~30μm。制备的纳米碳纤维薄膜对基板有良好的附着性。 相似文献
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喷雾热解法制备SnO2:Sb透明导电薄膜 总被引:7,自引:5,他引:7
采用喷雾热解技术制备出了光电性能优良的SnO_2:Sb透明导电薄膜,对薄膜的结构特性、光电性质以及制备条件对薄膜性能的影响进行了研究。并进一步研究了喷雾热解法中薄膜的形成过程和工艺参数对薄膜微观结构和性能的影响。实验结果表明:在Sb掺杂量为11%(摩尔分数)和基板温度为500℃的条件下,SnO_2:Sb薄膜具有最佳的光电性能,平均可见光透过率为82%,方块电阻达13.4Ω/□,电阻率为4.9×10~(-4)Ω·cm。 相似文献
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以Ti(OC3H7)4为先驱体,SnO2:F镀膜玻璃为基板,采用常压化学气相沉积法制备了TiO2/SnO2:F复合薄膜.用扫描电镜、X射线衍射、紫外-可见-近红外透射光谱等手段对样品的物相和性能进行了研究.结果表明:金红石相的SnO2:F底膜促进了TiO2金红石相的形成;当基板温度为480 ℃时,TiO2/SnO2:F复合薄膜出现针状结构,但随着基板温度继续升高,针状结构消失.样品的可见光透过率随基板温度而变化,其值为60%~90%,基本满足建筑物的采光要求.当基板温度为530 ℃时,TiO2/SnO2:F复合薄膜的光催化性能最好. 相似文献
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镀SiO2膜玻璃基片上SnO2:Sb薄膜的溶胶-凝胶法制备及表征 总被引:1,自引:1,他引:0
用溶胶-凝胶法在已镀SiO2膜的钠钙硅玻璃和没有镀SiO2的钠钙硅玻璃基片上镀制了锑掺杂摩尔分数为8.0%的二氧化锡薄膜。对不同热处理温度下薄膜样品的结构和性能进行了表征。结果表明:在673~823K范围内热处理60min时,薄膜以四方相金红石结构存在;随着热处理温度的提高,晶面衍射峰由宽化趋向尖锐,结晶逐渐完善;薄膜中的Sn以 4价的形式存在,掺杂的Sb以 5和 3价形式存在;当温度为673K和723K时,凝胶中的C没有完全燃尽,以C—O和C—O形式存在于薄膜中。镀膜样品的可见光平均透过率随热处理温度的升高而增大;在热处理温度相同时,预先镀有SiO2膜的玻璃基片上制备的锑掺杂二氧化锡(ATO)薄膜的方块电阻较没有镀SiO2的小。 相似文献
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用溶胶凝胶法在已镀SiO2膜的钠钙硅玻璃和没有镀SiO2的钠钙硅玻璃基片上镀制了锑掺杂摩尔分数为8.0%的二氧化锡薄膜。对不同热处理温度下薄膜样品的结构和性能进行了表征。结果表明:在673~823K范围内热处理60min时,薄膜以四方相金红石结构存在;随着热处理温度的提高,晶面衍射峰由宽化趋向尖锐,结晶逐渐完善;薄膜中的Sn以+4价的形式存在,掺杂的Sb以+5和+3价形式存在;当温度为673K和723K时,凝胶中的C没有完全燃尽,以C—O和CO形式存在于薄膜中。镀膜样品的可见光平均透过率随热处理温度的升高而增大;在热处理温度相同时,预先镀有SiO2膜的玻璃基片上制备的锑掺杂二氧化锡(ATO)薄膜的方块电阻较没有镀SiO2的小。 相似文献
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为了获得高质量的SnO2薄膜,我们需要制备高密度、高导电的优质SnO2靶材。这里以分析纯的SnO2、Sb2O5粉体为制备原料,采用冷等静压加上常压烧结方法制备高导电性Sb∶SnO2(ATO)陶瓷靶材。用X射线衍射(XRD)和扫描电子显微镜(SEM)分析靶材的化学成分和微观形貌并系统研究了不同的成型压力对靶材电学特性和致密度的影响。结果表明:成型压力的大小对于ATO靶材本身的致密度及电学特性都有很大的影响。成型压力为15MPa时,ATO靶材的电阻率最小,为0.38Ω.cm;SnO2靶材的收缩率达10.71%,靶材的致密度为95%;靶材可在射频磁控溅射仪下正常工作,并成功在玻璃基片上沉积性能良好的高红外反射透明导电SnO2薄膜。此制备过程操作方便,工艺简单,降低了靶材的成本,从而能够大大扩大透明导电薄膜的应用领域。 相似文献
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锑掺杂量对ATO薄膜结构及光、电性能的影响 总被引:1,自引:0,他引:1
以四氯化锡和三氯化锑为主要原料,采用溶胶-凝胶法制备了不同锑掺杂量的纳米锑掺杂二氧化锡(ATO)薄膜。分别利用XRD、FESEM、紫外可见分光光度计和四探针电阻仪对晶体结构、薄膜形貌、光透过率和薄膜方块电阻进行表征,考察锑掺杂量对ATO薄膜晶体结构、晶粒尺寸、光透过率和导电性能的影响。结果表明:所制备的ATO薄膜为(110)面择优取向的四方相锡石结构,晶粒尺寸小于26 nm,当锑掺杂量为10%(物质的量分数)时,ATO薄膜具有最小的方块电阻(60.1 Ω/□),可见光透过率大于85%。 相似文献
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采用气溶胶辅助化学气相沉积法(AACVD)在玻璃衬底上沉积F掺杂SnO_2(FTO)薄膜,研究了前驱液中不同F/Sn摩尔比制备的FTO薄膜的结构、表面形貌、光学、电学及光致发光性能。结果表明:所制备FTO薄膜均为(200)面择优取向的多晶四方金红石相结构;前驱液中F/Sn摩尔比的增加,会导致(110)面的衍射峰强度增加,薄膜表面堆积颗粒形状发生变化,薄膜样品光学透过率提升;当F/Sn摩尔比=40%时,FTO薄膜具有最大的载流子浓度1.031×10~(21) cm~(–3)以及最小的电阻率3.42×10~(–4)?·cm,这可归结为适量F的存在产生不同的缺陷影响。(200)面择优取向FTO薄膜光致发光谱可用于表征不同缺陷形式的跃迁。 相似文献
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以钼酸钠和硒粉为原料,采用水热法制备了MoSe2.通过XRD、SEM和TEM对MoSe2进行了表征,并对MoSe2光电探测器的光电特性进行了测试.结果表明,MoSe2为粒径约200 nm的花状微球;MoSe2器件在520 nm激光波长下,在光强为0.5 mW时的响应度最高,为7.5×10–5 A/W,对应的光探测率为1×107 cm·Hz1/2/W,光响应度和光探测率随着光强的增加而增大.此外,MoSe2光电探测器在405 nm激光下能实现快速响应,其上升时间为47 ms,下降时间为45 ms. 相似文献
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《Ceramics International》2020,46(14):22057-22066
To understand the wetting behavior and interfacial phenomena between molten superalloys and ceramic materials, the wettability and interfacial reactions of a low Hf-containing Nickel-based superalloy on the Al2O3-based, SiO2-based, ZrSiO4, and CoAl2O4 substrates were studied using the sessile drop method at 1773 K. The wetting angles of the alloy on the Al2O3-based, SiO2-based, ZrSiO4, and CoAl2O4 substrates were 141.4°, 143.5°, 135.7°, and 128.4°, respectively. This indicated that the wettability of the alloy on the Al2O3-based substrate was comparable to that on the SiO2-based substrate, and the wettability of the CoAl2O4 system was the best among the four systems. The microstructure characteristics of the interface implied that Hf has a strong tendency to react with ceramic substrates, even at low contents. Additionally, the interfacial reactions transformed the Al2O3-based, SiO2-based, ZrSiO4, and CoAl2O4 ceramic substrates into (Al2O3 + HfO2), (Al2O3 + HfO2), (Al2O3 + HfO2 + ZrO2), and (Al2O3 + HfO2 + Co), respectively, which were in contact with the alloys. The experimental results demonstrated that the wettability of the system was governed by the properties of the reaction products. 相似文献
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采用不同疏松度的工业纯钛TA2为基材制作RuO2-TiO2阳极涂层. 对不同疏松度基材进行了金相、物相、密度、硬度和电阻率分析,并对所制钛阳极的组织结构、形貌特征、电催化活性和耐腐蚀性进行了比较. 结果表明,疏松度大(疏松)的纯钛TA2硬度比疏松度小(密实)的高60 Hv,电阻率高将近0.2 W×mm;不同基材对阳极涂层的晶体结构影响不大,采用疏松纯钛TA2所制电极的涂层由于刻蚀程度难以控制,涂层表面结构较粗糙,电极的电催化活性差,电化学性能略差,析氯电位提高了约10 mV,强化寿命比密实基体短100 min左右,且容易剥落失效. 相似文献
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《Ceramics International》2022,48(5):6131-6137
In this work, the ferroelectric characteristics of ZrO2 thin films grown on ITO-coated glass have been investigated. The ferroelectric nature of the ZrO2 films has been studied by polarization-electric field (P-E) hysteresis loops and found to be optimum for the films processed by rapid thermal annealing at 600 °C. The increase in the annealing temperature improves the ferroelectric properties through the increase of the in-plane strain that causes the formation of the ferroelectric orthorhombic phase. The formation of the orthorhombic phase was confirmed through high-resolution transmission electron microscopy. The effect of the electric field on the polarization switching kinetics of ZrO2 films has been investigated revealing that the switching kinetics follows the nucleation limited switching (NLS) model. The activation fields estimated from the peak values of the polarization currents (im) and the time (tm) at which im occurs are in good agreement with the values obtained from the switching characteristic time of the NLS model. This work paves the way towards the integration of (pseudo)-binary oxide thin films on cheap substrates like glass for the next-generation of non-volatile memories. 相似文献
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Yuka Matsuura Fumiya Yoshii Tsubasa Otsuka Kenji Kadowaki Masataka Ijiri Yoshito Takemoto Kensei Terashima Takanori Wakita Takayoshi Yokoya Yuji Muraoka 《Journal of the European Ceramic Society》2018,38(15):5043-5050
We present multilayer formation via spinodal decomposition in rutile TiO2-VO2 (TVO) epitaxial films on sapphire substrates. (001)- and (101)-oriented TVO solid-solution films are grown epitaxially on TiO2/Al2O3 using a pulsed laser deposition technique and annealed inside the spinodal region. X-ray diffraction measurements and scanning transmission electron microscopy (STEM) observations show that the films are phase-separated along the [001] direction and lamellar structures are formed in a parallel or slanted direction to the sapphire substrates depending on the film orientation. The results indicate the multilayer formation via spinodal decomposition in the TVO films. STEM investigations also reveal a relatively high Ti concentration in the decomposed phases, reflecting the influence of lattice deformation on the phase decomposition in the films. Our work shows that spinodal decomposition is a promising approach for the formation of a multilayer structure in TVO films and helps deepen understanding the spinodal decomposition in TVO system. 相似文献
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In this work, we presented a simple strategy to fabricate medium dielectric constant and low-loss composites for microwave substrate applications. MgO-LiF co-doped Li2TiO3 (LT) powders were fabricated by the solid-state reaction route and modified by perfluorooctyltriethoxysilane (F8261). The LT/polytetrafluoroethylene (PTFE) composites were fabricated by cold pressing and hot treatment. The XPS and contact angle analysis indicated that the fluorinated group was introduced to LT particle successfully. The effects of modified LT powders content on the dielectric, thermal, and mechanical properties of composites were investigated. As the modified LT content increases, the dielectric constant, dielectric loss, and temperature coefficient of dielectric constant (τε) increase while the bending strength and coefficient of thermal expansion (CTE) decrease, which is attributed to the higher dielectric constant of LT ceramic, more pores, stable τε of LT ceramic, interface defects and low CTE of LT ceramic, respectively. The composites with 60 wt % LT exhibit the best microwave dielectric properties: εr = 6.8, tanδ = 0.001, τε = −29.6 ppm °C−1 at 8 GHz and acceptable coefficient of thermal expansion (28.3 ppm °C−1). Therefore, modified LT powders filled PTFE composites are potential materials for high-frequency microwave substrate applications. © 2019 Wiley Periodicals, Inc. J. Appl. Polym. Sci. 2019 , 136, 47980. 相似文献
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采用Sol-Gel法制备了Al2 O3-SiO2 -TiO2 -ZrO2 复合多孔膜 ,并在不同基体上进行了涂膜实验研究。结果表明 ,以孔隙率为46.8%、最可几孔径为几个微米的α -Al2 O3作基体 ,可以制备出膜厚为 1~ 2 μm纳米级孔径的Al2 O3-SiO2 -TiO2 -ZrO2 复合多孔膜 ,Al2 O3复合膜与α -Al2 O3基体的结合性最好。通过对α -Al2 O3基体分析发现 ,基体的成型压力、烧成后基体的孔径大小以及膜与基体之间的应力作用对Al2 O3-SiO2 -TiO2 -ZrO2 复合多孔膜形成影响甚大。对膜与基体的结合强度进行了研究 ,结果表明 ,膜的热稳定性高 ,耐酸、耐碱性好 ,相对硬度介于 6~ 7之间 相似文献