Insulator passivation of In0.2Ga0.8As-GaAssurface quantum wells

The electronic passivation of (100) In_0.2Ga_0.8 As-GaAs surface quantum wells (QWs) using in situ deposition of an amorphous, insulating Ga₂O₃ film has been investigated and compared to standard Al_0.45Ga_0.55As passivation. Nonradiative lifetimes τ_r=1.1±0.2 and 1.2±0.2 ns have been inferred from the dependence of the internal quantum efficiency η on optical excitation density P₀' for the Ga₂O₃ and Al_0.45Ga_0.55As passivated In_0.02 Ga_0.8As-GaAs surface QW, respectively. Beyond identical internal quantum efficiency, the amorphous Ga₂O₃ insulator passivation simplifies device processing, eludes problems arising from lattice-mismatched interfaces, and virtually eliminates band bending in electronic and optoelectronic devices based on a low dimensional system such as quantum wells, wires, and dots     

正照射延伸波长In0.8Ga0.2As红外焦平面探测器

为了研究延伸波长In0.8Ga0.2As PIN短波红外探测器的温度响应光电特性,采用闭管扩散的平面型器件工艺,在金属有机化学气相外延（MOCVD）外延生长的NIN型InAs0.6P0.4/In0.8Ga0.2As/InAs0.6P0.4 buf./InP材料上制备了正照射延伸波长2561线列InGaAs红外焦平面探测器,研究了探测器在不同温度下的I-V特性、光谱响应特性和探测率。结果表明,随着温度的降低,在小偏压下,器件的正向暗电流由产生复合电流为主逐渐变为以扩散电流为主。在260~300 K温度范围内,反向电流主要由扩散电流和产生复合电流组成,当温度低于180 K时,器件的反向电流主要为隧穿电流。室温下器件响应截止波长和峰值波长分别为2.57 m和2.09 m,峰值探测率为7.25108 cmHz1/2/W,峰值响应率为0.95 A/W,量子效率为56.9%。焦平面的峰值探测率在153 K达到峰值,约为1.111011 cmHz1/2/W,响应非均匀性为5.28%。     

A Novel Dilute Antimony Channel In0.2Ga0.8AsSb/GaAs HEMT

This letter reports, for the first time, a high-electron mobility transistor (HEMT) using a dilute antimony In_0.2Ga_0.8 AsSb channel, which is grown by a molecular-beam epitaxy system. The interfacial quality within the InGaAsSb/GaAs quantum well of the HEMT device was effectively improved by introducing the surfactantlike Sb atoms during the growth of the InGaAs layer. The improved heterostructural quality and electron transport properties have also been verified by various surface characterization techniques. In comparison, the proposed HEMT with (without) the incorporation of Sb atoms has demonstrated the maximum extrinsic transconductance g_m,max of 227 (180) mS/mm, a drain saturation current density I_DSS of 218 (170) mA/mm, a gate-voltage swing of 1.215 (1.15) V, a cutoff frequency f_T of 25 (20.6) GHz, and the maximum oscillation frequency f_max of 28.3 (25.6) GHz at 300 K with gate dimensions of 1.2times200 mum²     

Device linearity improvement byAl0.3Ga0.7As/In0.2Ga0.8Asheterostructure doped-channel FETs

The linearities of pseudomorphic heterostructure Al_0.3Ga_0.7As/In_0.2Ga_0.8As doped-channel FETs (DCFETs) and HEMTs were evaluated by DC and RF testings. Due to the absence of parallel conduction in the doped-channel approach, as compared to the modulation-doped structure, a wide and flat device performance together with a high current density was achieved. This improvement of device linearity suggests that doped-channel designs are suitable for high frequency power device application     

Device linearity comparisons between doped-channel andmodulation-doped designs in pseudomorphic Al0.3Ga0.7As/In0.2Ga0.8As heterostructures

The linearities of pseudomorphic Al_0.3Ga_0.7As/In_0.2Ga_0.8As doped-channel FET's were characterized by comparing the characteristics of modulation-doped field-effect transistors (FET's) based on dc and microwave evaluations. By using an undoped high-bandgap layer beneath the gate, the so-called parasitic MESFET-type conduction, which is common in HEMT's, can therefore be eliminated in doped-channel designs. Therefore, a wide and flat device performance together with a high current driving capability can be achieved in DCFET's. This linearity improvement in device performance suggests that doped-channel designs are more suitable for application in microwave power devices     

Mid-IR vertical-cavity surface-emitting lasers

We theoretically investigate the feasibility and potential performance of optically and electrically pumped vertical-cavity surface-emitting lasers (VCSELs) emitting in the mid-IR spectral region. Our model includes spontaneous, stimulated, and nonradiative recombination, numerical dispersion relations and optical matrix elements from a multiband finite-element algorithm, carrier and lattice heating, three-dimensional heat flow, electrical injection, photon propagation, and diffraction. Each modeled structure consists of a distributed Bragg reflector (DBR) semiconductor bottom mirror, a λ, 2λ, or 3λ optical cavity incorporating the type-II active region, and a dielectric top mirror through which the output beam is emitted. The optically pumped VCSEL structure with a 10-μm-diameter spot is predicted to operate up to a heat-sink temperature of 250 K and to be capable of producing >2 mW of CW output power. Furthermore, by collimating the pump beam with a microlens array, gain-guided VCSEL arrays with output powers in the watt range should be attainable. Comparable powers and operating temperatures are predicted for patterned devices with electrical injection through annular contacts. By far the most attractive properties are expected for structures employing a type-II interband cascade active region with electron recycling. The simulation predicts single-element threshold currents of 150 μA at 200 K and 1.1 mA at 300 K and CW output powers of 4.7 and 1.2 mW, respectively     

Fabrication of In0.25Ga0.75As/InGaAsPstrained SQW lasers on In0.05Ga0.95As ternarysubstrate

A uniform In_0.05Ga_0.95As ternary substrate was grown by using liquid encapsulated Czochralski (LEC) technique with a method of supplying GaAs source material at a constant temperature, and InGaAs/InGaAsP strained single quantum well (SQW) lasers were fabricated on the substrate for the first time. The lasers lased at 1.03 μm and exhibited low threshold current density of 222 A/cm² and excellent characteristic temperature of 221 K, showing that the ternary substrate has a sufficient quality for laser fabrication     

Effects of growth temperature on high-quality In0.2Ga0.8N layers by plasma-assisted molecular beam epitaxy

High-quality In_0.2Ga_0.8N epilayers were grown on a GaN template at temperatures of 520 and 580℃ via plasma-assisted molecular beam epitaxy. The X-ray rocking curve full widths at half maximum (FWHM) of (10.2) reflections is 936 arcsec for the 50-nm-thick InGaN layers at the lower temperature. When the growth temperature increases to 580℃, the FWHM of (00.2) reflections for these samples is very narrow and keeps similar, while significant improvement of (10.2) reflections with an FWHM value of 612 arcsec has been observed. This improved quality in InGaN layers grown at 580℃ is also reflected by the much larger size of the crystalline column from the AFM results, stronger emission intensity as well as a decreased FWHM of room temperature PL from 136 to 93.9 meV.     

Photoluminescence and photoluminescence excitation spectra of In0.2Ga0.8N-GaN quantum wells: comparison betweenexperimental and theoretical studies

InGaN-GaN represents an important heterostructure with applications in electronics and optoelectronics. It also offers a system where we can study the effects of interface roughness, alloy clustering, and the piezoelectric effect. In the paper, we examine how these factors influence the photoluminescence and excitation photoluminescence in InGaN-GaN quantum wells. We examine the Stokes shift as a function of the excitation level and doping and relate the values to the piezoelectric effect and disorder in the system. Detailed comparisons are made with experimental results     

长波长GaInNAs垂直腔面发射激光器

新出现的直接跃迁GaInNAs与具有高反射率的AlAs／GaAs分布布拉格反射镜相结合构成了GaAs基长波长(1．3—1．6μm)垂直腔面发射激光器(VCSEL)，将成为光纤通信、光互联和光信息处理等的关键元件。本文从材料的选取、外延技术和GaInNAs VCSEL国外和国内的发展状况等方面对长波长GaInNAs VCSEL进行了综合阐述。     

Avalanche multiplication characteristics ofAl0.8Ga0.2As diodes

The avalanche multiplication characteristics of Al_0.8Ga _0.2As have been investigated in a series of p-i-n and n-i-p diodes with i-region widths, w, varying from 1 μm to 0.025 μm. The electron ionization coefficient, α, is found to be consistently higher than the hole ionization coefficient, β, over the entire range of electric fields investigated. By contrast with Al_xGa _1-xAs (x⩽0.6) a significant difference between the electron and hole initiated multiplication characteristics of very thin Al_0.8Ga_0.2As diodes (w=0.025 μm) was observed. Dead space effects in the diodes with w⩽0.1 μm were found to reduce the multiplication at low bias below the values predicted from bulk ionization coefficients. Effective α and β that are independent of w have been deduced from measurements and are able to reproduce accurately the multiplication characteristics of diodes with w⩾0.1 μm and breakdown voltages of all diodes with good accuracy. By performing a simple correction for the dead space, the multiplication characteristics of even thinner diodes were also predicted with reasonable accuracy     

Electrically gain-switched vertical-cavity surface-emitting lasers

The authors report electrical gain-switching of a packaged vertical-cavity surface-emitting laser (VCSEL). Pulse durations as short as 24 ps at repetition rates up to 2 GHz were obtained from a four-quantum-well GaAs/AlGaAs VCSEL, which emits 0.8 mW continuous wave power in a single mode at room temperature and has a current threshold of 5 mA. Simultaneous measurement of the optical spectrum showed an almost transform limited linewidth indicating ultralow chirp. Optical pumping with subpicosecond pulses of the same packaged devices, held at a constant electrical bias, yielded 22 ps pulses, in good agreement with the electrical pumping. Simple calculations show that the pulse duration obtained by gain-switching is limited by the design constraints necessary to operate the VCSEL continuous wave at room temperature with low-threshold current, high-quantum efficiency, and reasonable output power     

High-speed modulation of vertical-cavity surface-emitting lasers

The IM (intensity modulation) and FM (frequency modulation) characteristics of vertical-cavity surface-emitting lasers are studied. The laser has high FM efficiency and broad IM bandwidth (near 8 GHz) at a very low bias (4.5 mA). Five Gb/s pseudorandom direct intensity modulation of this laser with open eyes is demonstrated.<>     

Single- and double-heterojunction pseudomorphic In0.5(Al0.3Ga0.7)0.5P/In0.2Ga0.8As high electron mobility transistors grown by gas sourcemolecular beam epitaxy

In_0.5(Al_0.3Ga_0.7)_0.5 P/In_0.2Ga_0.8As single- and double-heterojunction pseudomorphic high electron mobility transistors (SH-PHEMTs and DH-PHEMTs) on GaAs grown by gas-source molecular beam epitaxy (GSMBE) were demonstrated for the first time. SH-PHEMTs with a 1-μm gate-length showed a peak extrinsic transconductance g_m of 293 mS/mm and a full channel current density I_max of 350 mA/mm. The corresponding values of g_m and I_max were 320 mS/mm and 550 mA/mm, respectively, for the DH-PHEMTs. A short-circuit current gain (H₂₁) cutoff frequency f_T of 21 GHz and a maximum oscillation frequency f_max of 64 GHz were obtained from a 1 μm DH device. The improved device performance is attributed to the large ΔE_c provided by the In_0.5(Al_0.3Ga_0.7)_0.5P/In _0.2Ga_0.8As heterojunctions. These results demonstrated that In_0.5(Al_0.3Ga_0.7)_0.5P/In _0.2Ga_0.8As PHEMT's are promising candidates for microwave power applications     

Dynamic behavior of vertical-cavity surface-emitting lasers

A quasi-three-dimensional dynamic model of index-guided vertical-cavity surface-emitting lasers is developed. Detailed structure of Bragg reflectors and lateral optical confinement are considered into the model. A three-dimensional waveguide problem is reduced to one dimension by using the effective-index method. The dynamic response of optical field is solved by the time-domain algorithm. In addition, the lateral variation of carrier concentration, refractive index, and spontaneous-emission profile are also determined in a self consistent manner. Using this model, the influence of carrier transport and hot carriers on the dynamic behavior of vertical-cavity surface emitting lasers is studied. It is found that these nonlinearities have significant influence on the relaxation-oscillation frequency and modulation bandwidth of the devices     

850nm大功率垂直腔面发射激光器

针对传统顶发射垂直腔面发射激光器(VCSEL)的散热、电极生长以及Au丝引线等难题,研究了一种非闭合型的大功率VCSEL结构,不仅解决了上述问题,还简化了工艺步骤,避免了一些工艺对已形成器件结构造成的损伤,提高了激光器的可靠性以及电流注入效率。利用该结构制作的激光器室温下连续输出最大功率达到46 mW,激射波长为849.5 nm,激射光谱半高宽(FWHM)为0.6 nm;在150 mA的注入电流下,发散角为10°。在室温5、0μs脉冲条件下,测得的最高输出光功率为69 mW。     

Small-dimension power-efficient high-speed vertical-cavity surface-emitting lasers

Small-dimension power-efficient high-speed oxide-confined 980 nm vertical-cavity surface-emitting lasers (VCSELs) with record-high bandwidth/power-dissipation ratio of 12.5 GHz/mW have been demonstrated. The devices show a modulation bandwidth of 15 GHz at a bias current 0.9 mA, corresponding to only 1.2 mW power dissipation     

Transverse-mode control of vertical-cavity surface-emitting lasers

Transverse-mode control of vertical-cavity surface-emitting lasers (VCSELs) has been investigated. A theoretical model takes into account the distributions of carriers, optical field, and temperature. Using a method of finding self-consistent solutions for the carrier diffusion, optical field, and thermal conduction equations, we have studied the influence of current spreading, injected current density, gain-guided aperture, and window diameter on the transverse modes. The calculated results agree well with those of experiments and show that the transverse-mode evolution of VCSELs depends on the changes of gain and refractive index induced by carriers and heating; decreasing temperature rise and profile width, current spreading, and gain-guided aperture dimension, increasing homogeneity of the injected carriers at the lasing region, and decreasing window diameter are effective methods to suppress high-order transverse modes.     

ESD-induced degradation of vertical-cavity surface-emitting lasers

The sensitivity of proton implanted, vertical-cavity surface emitting lasers (VCSELs) to electrostatic discharge (ESD) pulses is investigated under human body model test conditions. Rather low degradation threshold pulse amplitudes were observed in forward bias (+1500 V) as well as reverse bias (-800 V) step stress tests. Monitoring both the electrical and optical parameters of the VCSELs during ESD stress, it was found that in forward bias ESD stress tests the optical degradation precedes the electrical degradation     

Nonlinear dynamics of vertical-cavity surface-emitting lasers

The dependence of the transient response of a vertical-cavity surface-emitting laser (VCSEL) on its aperture size is investigated subject to direct current modulation and external optical feedback. It is shown that lasers with small aperture size suppress higher order bifurcations and chaos even under large-signal modulation and external optical feedback. Furthermore, the noise characteristics of VCSELs under the influence of external optical feedback are studied via the calculation of relative intensity noise. It is found that the level of external optical feedback for the onset of coherence collapse is high for devices with small aperture size. On the other hand, the small-signal response of lasers is also analyzed through the calculation of third-order harmonic distortion. It is shown that harmonic distortion is minimized in small devices. Therefore, VCSELs with small aperture size have better immunity to irregular response under direct current modulation and external optical feedback