有机薄膜电致发光器件

将无机薄膜电致发光器件和有机薄膜电致发光器件作了一个比较,并给出了有机薄膜我器件的基本结构及其功能层材料选择的依据。最后分析了一个实际制备的双层器件。     

利用磷光材料提高有机薄膜电致发光效率的研究进展

激活有机分子三重态可提高有机电致发光薄膜器件的发光效率。概述了有机电致磷光薄膜器件的结构、材料、提高器件电致发光效率的原理,目前的研究状况、存在的问题和研究的发展趋势。     

有机电致发光薄膜器件的研究

有机电致发光薄膜具有制备方便,驱动电压低,发光亮度高,可以与聚合物基底匹配等优点,成为目前世界显示技术的一大研究热点。论述了有机发光薄膜器件的结构、工作机理及其薄膜电致,光致发光的特性,论述了薄膜发光器件的电学特性与光学特性及其器件在脉冲电压波形驱动下的电光特性,提出了应用于显示技术的有机电致发光薄膜器件的电学于光学特性的优化方法。     

关于有机薄膜电致发光机理的定性分析

观测了有机电致发光薄膜器件的电流变化和相对应的发光变化特性 ,并作了定性分析 ,提出了类 PN结正向导通发光的有机薄膜电致发光机理的模型     

有机电致发光薄膜器件的研究

有机电致发光薄膜具有制备方便,驱动电压低,发光亮度高,可以和合物基底匹配等优点,成为目前世界显示技术的一大研究热点。论述了有机发光薄膜器件的结构、工作机理及其膜电致发光薄膜电致,光致发光的特性,论述了薄膜发光器件的电学科技司与光学特性及其器件在脉冲电压波形驱动下的电光特性,提出了应用于显示技术的有机电致光薄膜器件的电不于光学特性的优化方法。     

喹啉梓有机电致发光薄膜器件的时间特性分析

用喹啉锌作发光材料,制备出Ｇｌａｓｓ／ＩＴＯ／Ｚｎｑ２／Ａ１结构的有机电致发光薄膜器件,分析并测量了它的伏安时间特性,电光时间特性,并与ＬＥＤ器件的电致发光时间特性进行了比较。实验表明有机薄膜发光的电光时间效应与ＬＥＤ器件相比有其特殊性。     

喹啉锌有机电致发光薄膜器件的时间特性分析

用喹啉锌（Ｚｎｑ２）作发光材料,制备出Ｇｌａｓｓ／ＩＴＯ／Ｚｎｑ２／Ａ１ 结构的有机电致发光薄膜器件,分析并测量了它的伏安时间特性,电光时间特性,并与ＬＥＤ器件的电致发光时间特性进行了比较。实验表明有机薄膜发光的电光时间效应与ＬＥＤ器件相比有其特殊性。     

有机电致发光器件的回顾和发展

综述了有机电致发光薄膜器件 ( OTFEL )的发展过程和 OTFEL的器件制备和结构 ,总结了有机小分子 (包括金属螯合物 ,稀土有机物 ,有机染料 ) ,聚合物 (主要是共轭高聚物 )制成的器件结构 ,发光光谱和亮度。文末展望了OTFEL 的发展前景。     

稀土有机配合物作发光层的有机电致发光薄膜的研究进展

概述了稀土有机配合物电致发光薄膜器件的材料、结构、发光机理。介绍了目前研究的状况、出现的问题以及研究的发展趋势     

用喔星锌作发光层的有机电致发光薄膜器件的研究

用喔星锌（Ｚｎｑ２）作发光材料，做出Ｇｌａｓｓ／ＩＴＯ／Ｚｎｑ２／Ａｌ结构的有机电致发光薄膜器件，测量了它的伏安特性，电光特性曲线及其电致发光光谱，同时也测量了喔星锌在粉末和薄膜状态下的荧光光谱、激发光谱、吸收光谱。     

Study of energy transfer from excited TPD to Alq in organic electroluminescent devices by time-resolved fluorescence spectroscopy using a scanning near-field optical atomic force microscope

We demonstrate the direct measurement of molecular diffusion at organic/organic interfaces of organic electroluminescence devices by use of a scanning near-field optical atomic force microscope. Our preliminary study shows that the degradation of an electroluminescence device is partly caused by crystallization of the organic layers. Because the initial stage of degradation cannot be observed by microscopic methods, nanoscale optical properties of the interface in multilayer systems are currently receiving a great deal of attention. Defects of organic electroluminescence devices were investigated using a scanning near-field optical atomic force microscope. This instrument is capable of measuring both a topographic and a fluorescence image at the same time. The defect area and other areas are clearly observed and time-resolved near-field fluorescence spectra demonstrate emission of the different species. These results suggest that defects occur at the organic solid interface, and that energy transfer occurs from excited TPD, as donor, to Alq, as acceptor.     

Dependence of surface morphology on molecular structure and its influence on the properties of OLEDs

Most organic light-emitting diodes (OLEDs) have a multilayer structure composed of organic layers such as a hole injection layer (HIL), a hole transport layer (HTL), an emission layer (EML), an electron transport layer (ETL) and an electron injection layer (EIL) sandwiched between two electrodes. The organic layers are thin solid films with a thickness from a few nano meters to a few tenths nano meter, respectively. Surface morphology of an organic thin solid film in OLEDs depends on the molecular structure of the organic material and has an affect on device performance. To analyze the effect of surface morphology of an organic thin solid film on fluorescence and electroluminescence (EL) properties, thin solid films of 4-(dicyanomethylene)-2-methyl-6-(julolidin-4-yl-vinyl)-4H-pyran (DCM2) and new red fluorophores, (2E,2′E)-3,3′-[4,4″-bis(dimethylamino)-1,1′:4′,1″-terphenyl-2′,5′-diyl]bis[2-(2-thienyl)acrylonitrile] (ABCV-Th) and (2Z,2′Z)-3,3′-[4,4″-bis(dimethylamino)-1,1′:4′,1″-terphenyl-2′,5′-diyl]bis(2-phenylacrylonitrile) (ABCV-P) were investigated by atomic force microscopy (AFM). The samples for EL and AFM measurement were fabricated by the high-vacuum thermal deposition (8×10⁻⁷ Torr) of organic materials onto the surface of indium tin oxide (ITO)-coated glass substrate, in which the layer structures of samples for AFM measurement and those for EL measurement were ITO/NPB (40 nm)/red emitters (80 nm) and ITO/NPB (40 nm)/red emitters (80 nm)/BCP (30 nm)/Liq (2 nm)/Al (100 nm), respectively. The analysis based on AFM measurements well supported that the photoluminescence properties and the device performance were very much dependent upon surface morphology of an organic thin layer.     

Profile measurement of a wide-area resist surface using a multi-ball cantilever system

In the semiconductor industry, a device that can measure the surface profile of thin film like photoresist with high accuracy and high speed is needed. Since the surface of photoresist is very smooth and deformable, a device is required that will measure vertically with nanometer resolution and not damage the film during the measurement. We developed an apparatus using a multi-ball cantilever and white light interferometer to measure the surface profile of thin film. However, this system, as assessed with a scanning method, suffers from the presence of a moving stage and systematic sensor errors. Therefore, this paper describes an approach using a multi-ball cantilever as coupled distance sensors together with an autocollimator as an additional angle measuring device, which has the potential for self-calibration of a multi-ball cantilever. Using this method, we constructed an experimental apparatus and made measurements on resist film. The results demonstrated the feasibility of the constructed multi-ball cantilever system with the autocollimator for measuring thin film with high accuracy.     

基于覆膜技术的片材与薄膜结合装置结构设计研究

文中以覆膜机核心装置——片材与薄膜结合装置为研究对象,根据薄膜与片材的输送要求对辊筒支撑零件、斜楔距离调整组件、张紧轮装置等结构进行设计,采用剖分式轴承、自锁圆螺母与止推垫圈解决辊筒径向和轴向定位问题,并能做到拆装方便。从而实现结合装置结构紧凑,布局合理,工作稳定可靠。     

超磁致伸缩薄膜磁致伸缩耦合机理的有限元分析

从微观能量角度分析了超磁致伸缩薄膜的磁致伸缩机理,建立了超磁致伸缩薄膜的非线性强磁—机械耦合模型。设计了简支梁式超磁致伸缩薄膜的驱动磁场并对其进行实验研究。通过Ansys有限元分析软件对简支梁式超磁致伸缩薄膜驱动模型进行了模拟分析,最终得到的薄膜的内部磁场分布结构及固有频率。结果表明,采用椭圆积分法得到薄膜内部磁场分布的数学模拟计算结果与有限元仿真结果基本一致。     

Optimized preparation of cross-sectional TEM specimens of organic thin films

We present a route for the preparation of cross-sectional TEM specimens of crystalline organic thin films which minimizes the mechanical, chemical and thermal load of the organic film during preparation and allows to take TEM images with molecular resolution. A typical example of a thin film of diindenoperylene capped with a thin layer of gold is shown to demonstrate the application of the technique for the investigation of metal-organic interfaces.     

微腔对有机发光的影响的研究

利用介质膜反射镜 ,在光泵浦有机小分子薄膜微腔的研究中 ,观察到了谱线窄化、峰值强度增强、方向性集中于腔轴、控制发射波长和荧光寿命的缩短等一系列腔效应。其中用软膜反射镜 ,消除了镀制过程中热辐射对有机发光材料的影响 ,谱线半宽最窄达3.4nm,窄化了 2 5倍 ;峰值强度最大增强了 1 6倍。