A QHE-based system for calibrating impedance standards

Coaxial transformer bridges applied to a newly formed system for calibrating impedance standards are described. In this system, an R-R bridge characterizes reference quantum Hall devices as well as directly links them to 12906.4 /spl Omega/ or 10000 /spl Omega/ standard resistors. These resistors, in turn, serve as reference standards in capacitance calibrations made by a multifrequency quadrature R-C bridge and a C-C bridge. Finally, by means of a multifrequency double-balance L bridge, 1- and 10-nF capacitors calibrated in this manner are linked to inductance standards whose values range from 1 to 100 mH.     

Towards accurate measurement of the frequency dependence of capacitance and resistance standards up to 10 MHz

Progress toward an understanding of the frequency dependence of capacitance and resistance standards at frequencies up to 10 MHz is presented. A qualitative comparison is also made for capacitance and dissipation factor measurements between the National Physical Laboratory (NPL) high-frequency four terminal-pair (4TP) bridge and a commercial impedance analyzer for the first time. A set of novel high-frequency calculable coaxial resistance standards, of nominal 100 /spl Omega/ and 1 k/spl Omega/ values, have been developed and their calculated frequency dependence up to 1 MHz is given.     

Measurement Automation to Implement Evaluation Procedure of Four-Terminal-Pair Capacitance Standards Using S-Parameters

The evaluation procedure of four-terminal-pair capacitance standards using S-parameters is very complex as it involves the measurement of different parameters by multiple instruments. It also involves complex computation of effective capacitance as a function of frequency and its associated uncertainty in measurement. The reported paper presents the development of measurement automation program to implement evaluation procedure of four-terminal-pair capacitance standards of values varying between 1 and 1000 pF up to 30 MHz. The measurement automation increases the functionality with a comprehensive and flexible tool set for data acquisition, analysis, reporting and representation of results. The sequence of operations performed by the developed measurement automation program is described in detail. The program configures and measures S-parameters, converts S-parameters into corresponding impedance and admittance parameters, determines series and parallel resonance frequencies. Thereafter, it determines residual capacitive and residual inductive parameters and finally computes the effective value of each capacitance standard as a function of frequency along with the associated uncertainty in measurement. Measurement automation has provided precise and efficient way for the implementation of evaluation procedure of capacitance standards.     

10-nF capacitance transfer standard

New dielectric capacitance standards with a nominal value of 10 nF, suitable to be employed in the reproduction of the farad unit starting from the quantum Hall resistance, have been constructed. The standards are based on commercial chip capacitance components encased in a thermostat, and are defined as four terminal-pair impedance standards. The capacitance value is within 50/spl middot/10/sup -6/ relative to nominal; dissipation factor is about 8 /spl middot/ 10/sup -5/ at 1 kHz. The relative temperature coefficient of the capacitance value versus external ambient temperature is expected to be /spl ap/1/spl middot/10/sup -8/ K/sup -1/ near 23 /spl deg/C.     

Compact inductance standard

A portable Maxwell-Wien bridge as a part of the Korea Research Institute of Standards and Science (KRISS) inductance standard has been developed. Two auxiliary resistive-capacitive networks (analogous to a "Wagner ground") provide excellent stability of the bridge balance and impose less strict requirements on the components of the networks. Removable capacitance and ac/dc resistance standards used in the bridge arms make it possible to realize the inductance unit in terms of capacitance and resistance in the frequency range 500 Hz to 3 kHz. Investigations of the standard and results of preliminary (trial) comparison with the Mendeleyev Institute for Metrology demonstrate that the bridge can be used for measurement of 10 and 100 mH inductance standards with an uncertainty within (1-3) /spl mu/H/H at frequencies of 1 and 1.6 kHz. The use of this bridge as a constituent part of a transportable standard gives an opportunity to eliminate any uncertainty arising from instability of the standard inductors.     

四端对标准电容器频率特性的校验理论及测定方法

对四端对阻抗测量仪在其使用频段内进行校准,须确定四端对标准电容器的频率特性。空气介质四端对标准电容器频率特性的校验理论,是从四端对标准器阻抗矩阵出发,按四端对导纳定义进行简化后,再用网络分析仪在较高频率对有关参数进行测定,分析计算后将确定的频率特性曲线回归到100kHz～13MHz范围内。给出标准电寄器1000pF、100pF、10pF、1pF的频率特性曲线及不确定度分析,它将作为阻抗高频段计量的溯源依据。     

NIM新一代二端对电容电桥装置

基于一种交流电桥自动辅助平衡方法,中国计量科学研究院(NIM)研制了新一代二端对电容电桥装置。电桥采用固定比率的感应耦合比率臂电桥,通过复用比率,用单一电桥即实现了计算电容过渡和电容10:1传递;采用一种改进的靴带法实现电桥感应比率臂比率的精确校验。该装置用于电容单位的量值复现和标准电容器的高准度量值传递。利用新一代二端对电容电桥装置,可从计算电容装置复现1 pF电容值,并实现电容 1~100 pF的十进制量值传递,电容量值传递相对标准不确定度可达5×10^-9(1592 Hz)。采用该电桥参加了10 pF和100 pF电容国际关键比对(CCEM.K4-2017),中国比对成绩优异,数据均非常接近关键比对参考值(KCRV),其中100 pF的结果最接近KCRV,与KCRV取得了很好的一致性,从而获得国际互认。     

Correction of Systematic Errors Due to the Voltage Leads in an AC Josephson Voltage Standard

The National Institute of Standards and Technology (NIST) has recently reported the first application of a quantum ac Josephson voltage standard for the calibration of thermal transfer standards in the 1- to 10-kHz frequency range. This paper describes preliminary work on extending its frequency calibration range up to 100 kHz by correcting the systematic errors due to voltage leads. A ground loop created by the dc blocks, which is a previously unaccounted source of high-frequency systematic error, has been identified, and its effects are partially mitigated.      

An interpolation scheme for precision intermediate frequency reflection coefficient measurement

The theoretical basis and the practical implementation of an objective approach to voltage reflection coefficient (VRC) interpolation in the development of radio frequency coaxial impedance standards are presented. Variants of the scheme apply to three impedances commonly used to calibrate vector reflectometers and vector network analyzers. The scheme permits impedance standards to be characterized in the intermediate frequency (IF) range (where, broadly speaking, IF refers to the frequency range 10 kHz to 100 MHz) in terms of their VRC values and associated measurement uncertainties. The scheme allows the use of commercially available devices (rather than specially constructed calculable devices) as impedance standards with VRC values traceable to national measurement standards. Measurement results are presented which illustrate the capabilities of the scheme.     

PWB compatible high value integral capacitors by MOCVD

The 1998 National Electronics Manufacturing Technology Roadmap indicates that a capacitance density of 50 nF cm^–2 will be required in 2001 for successful implementation of integral passive technology in the microelectronics packaging industries. Higher permittivity polymer/ceramic nanocomposites have been proven to be a viable option for integral capacitors on printed wiring boards (PWB). Although the nanocomposite materials are in their developmental stage, it is unlikely that this materials system could meet such high capacitance needs and still utilize a large area manufacturable process. In this study, an alternative metal organic chemical vapor deposition (MOCVD) technique has been implemented to deposit TiO₂ thin film dielectrics at temperatures below 180 °C with higher capacitance densities. Two different metal-dielectric-metal type parallel plate capacitor structures have been fabricated on silicon and PWB substrates for relatively high frequency (45 MHz–1 GHz) and low frequency (100 Hz–1 MHz) characterization. Copper was used as the ground and upper electrodes with a 10 nm Cr adhesion layer between the dielectric and the electrodes. Capacitance was measured using a Keithley LCZ meter and a HP4194 impedance gain-phase analzer at the lower frequency range. Specific capacitance as high as 200 nF cm^–2 was achieved at 1 MHz from devices built on silicon substrates and at 100 kHz from devices on PWB substrates. For the first time, thin film TiO₂ on PWB substrates is reported at temperatures below 180 °C using MOCVD.     

Characterization of Capacitance Standards at High Frequency at National Physical Laboratory,India

Four-terminal-pair air dielectric capacitance standards with nominal values of 1000 and 100 pF have been characterized up-to 10 MHz at NPLI. The procedure employed involves the determination of all capacitive and inductive parameters of the simple electrical-equivalent-circuit-model of these capacitance standards. The effective capacitance of each standard has also been computed as a function of frequency from 1 kHz to 10 MHz. The capacitive parameters have been measured at 1 kHz while inductive parameters have been estimated up to 10 MHz using linear regression analysis by employing least-squares-approximation method. The paper highlights the computation procedure of impedance terms which further requires the determination of various capacitive and inductive terms involved in the calculation of effective capacitance. The method employed for the estimation of inductive parameters as a function of frequency is also discussed in detail. The present work will help in the establishment of metrological traceability of capacitance standards at high-frequency at NPLI which will be further used to establish calibration facility for LCR meters and RF impedance analyzers for capacitance parameter up-to 10 MHz.     

Calculated frequency characteristic of GR1482 inductance standardsbetween 100 Hz and 100 kHz

The Physikalisch-Technische Bundesansalt (PTB) calibrates inductance standards in the frequency range from 100 Hz to 100 kHz and beyond. The relative uncertainties achieved range from less than 5×10^-5 to 5×10^-4 (2σ) depending on the frequency and the value of the standards. Because of the strong frequency dependence of the inductance standards it is of interest to use a suitable equivalent circuit to calculate the most accurate approximation for the frequency variation. A model is presented which allows the values of a GR1482 inductance standard to be calculated over the whole frequency range from 100 Hz to 100 kHz within the measurement uncertainties     

计算电容屏蔽电极位移测量的不确定度评估

计算电容是电学阻抗单位复现的基准装置,是电容、电感和交流电阻的溯源依据.它是电磁计量领域内除量子电压、量子电阻基准之外准确度最高的装置.计算电容装置实现微小电容值(0.2至0.6 pF)精确测量的关键在于对其屏蔽电极位移的高准确度测量.从计算电容屏蔽电极位移测量的基本原理出发,系统分析了屏蔽电极位移测量结果的影响因素,...     

Evaluation of the frequency dependence of the resistance and capacitance standards in the BIPM quadrature bridge

The Bureau International des Poids et Mesures (BIPM) has established a measurement chain allowing calibration of capacitance standards in terms of the quantized Hall resistance (QHR). An important element in the chain is a quadrature bridge linking a pair of ac resistors of values 2R/sub K/ /spl ap/ 51.6 k/spl Omega/ to a pair of capacitance standards. The quadrature bridge can be operated at five different frequencies: 513, 1027, 1541, 3082, and 6164 Hz. For such measurements, we use different ratios (1/1, 4/1 and 1/4) for the main inductive voltage divider in the quadrature bridge and three different pairs of capacitors of values 3000, 2000, and 1000 pF. A calculable coaxial resistance of 1290.6 /spl Omega/ (R/sub K//20) is used as a reference to evaluate the frequency dependence of the 51.6-k/spl Omega/ resistances. This allows the calibration of capacitance standards at the five different frequencies. The measured frequency dependences of 10 and 100 pF capacitance standards are reported.     

Improved capacitance measurements with respect to a 1-pF cross-capacitor from 200 to 2000 Hz

This paper describes frequency dependence measurements of fused-silica capacitance standards from 200 to 2000 Hz, using a 1-pF cross-capacitor as the reference. The measured frequency dependence of fused-silica capacitors was found to vary significantly, ranging from a change of less than 0.2 /spl mu/F/F for one standard to a change of 0.8 /spl mu/F/F for another over the frequency range. Increasing capacitances with decreasing frequency from 1592 Hz for all tested fused-silica capacitors indicates that dielectric relaxation due to dielectric bulk and/or interfacial defects is the dominant source of frequency dependence. The relative combined standard uncertainty at 200 Hz (the largest in the frequency range) is 0.07 /spl mu/F/F, which is smaller by about a factor of three than the uncertainty reported previously from the National Institute of Standards and Technology (NIST).     

Au nanoparticle conjugation for impedance and capacitance signal amplification in biosensors

Amplification of the electrochemical impedance and capacitance signals in a biosensor is demonstrated for the model fluorescein/anti-fluorescein system. Following immobilization of fluorescein onto Au through formation of a self-assembled monolayer, goat anti-fluorescein conjugated with 10-nm Au nanoparticles is introduced into the system. This results in an increase in the capacitance of approximately 400 nF/cm(2), whereas no change can be observed for goat anti-fluorescein without the Au nanoparticle conjugate. An even greater sensitivity is obtained by introduction of a redox probe, [Fe(CN)6]3-/4-, whereby the charge-transfer resistance (R(ct)) is reduced to approximately 25% of its original value. This allows construction of high-sensitivity electrochemical impedance biosensors at a single low frequency, where the signal is sensitive to the interfacial R(ct). This change in the electrochemical impedance signal upon binding to goat anti-fluorescein conjugated with Au nanoparticles can be attributed to the much higher electrochemical activity of Au surfaces relative to the underlying organic layer.     

Analysis of a Direct Interface Circuit for Capacitive Sensors

We present the theoretical analysis and performance results of a direct microcontroller unit (MCU) interface circuit for capacitive sensors based on the charge-transfer method, when stray capacitances are considered. The interface circuit can implement two alternative two-point calibration techniques that reduce the effects of stray capacitance, temperature, and MCU parameters that depend on the power supply voltage. The best measurement deviation achieved from 0 $^{circ}hbox{C}$ to 50 $^{circ}hbox{C}$ and for power supply voltage from 4.0 to 5 V is below 0.01 full-scale range (FSR) for the two subranges from 10 to 100 pF and from 100 pF to 1 nF and 0.08 FSR for the subrange from 2 to 10 pF.      

An Automatic System for AC/DC Calibration

An automatic ac/dc difference calibration system using direct measurement of thermoelement EMFs is described. The system operates over a frequency range from 20 Hz to 100 kHz, covering the voltage range from 0.5 V to 1 kV. For all voltages, the total uncertainty (including the uncertainty of the specific reference thermal converters used) is 50 ppm at frequencies from 20 Hz to 20 kHz, inclusive, and 100 ppm at higher frequencies up to 100 kHz. In addition to ac/dc difference testing, the system can be used to measure some important characteristics of thermoelements, as well as to calibrate ac voltage calibrators and precision voltmeters. Results of intercomparisons between the new system and the manual NBS calibration system, using single-range, coaxial-type, thermal voltage converters as transfer standards, are reported. The results indicate that the ac/dc differences measured are accurate to well within the combined total uncertainty limits of the two systems.     

Modified Calibration Coefficients of Two-Port CPW Standards with Superstrate Effects

Calibration standards are used for the calibration of a vector network analyzer to characterize the microwave components under test. For the direct characterization of coplanar waveguide components, two-port CPW open, short and line are proposed to complement the existing calibration techniques. The developed CPW standards are characterized in the frequency range of 10 MHz to 10 GHz. As these are planar structures, effects of small superstrates on the calibration coefficients of open and short are studied also. The CPW line has shown slight changes in impedance due to superstrates, whereas a few calibration coefficients of open and short standards showed dependence on superstrates. Similar observations are noted by improving the polynomial models of CPW open and short standards up to fifth and sixth order, respectively, which better matches for CPW standards. The reported results are helpful to estimate any change in the measurement uncertainty on using such calibration standards due to superstrates.     

New Fused-Silica-Dielectric 10-and 100-pF Capacitors and a System for Their Measurement

New instruments have been designed to bring to standards laboratories the improved accuracy of capacitor calibrations developed by the National Bureau of Standards. The new 10-and 100-pF reference standard capacitors, based upon an NBS design, use a fused-silica dielectric with gold electrodes to provide the time and voltage stability required for calibrations to parts in 107. To maintain the capacitor temperature constant to within 0.01 °C, one model of the capacitors is designed for use in an oil bath, the other model is fitted with a new, stable, thermostatically controlled air bath. The system to measure these capacitors with a precision of parts in 108 consists of a bridge, detector, and oscillator. For these special measurements and for the general calibration of a wide range of capacitors, the new transformer-ratio-arm bridge has 12 capacitance decades and a range of 10 MAF-10-7 pF, and five conductance decades and a range of 103110-10 tmho. The new phasesensitive detector and power oscillator provide high sensitivity to bridge imbalance over the frequency range 10 Hz-100 kHz.